JPH0435867U - - Google Patents

Info

Publication number
JPH0435867U
JPH0435867U JP7792190U JP7792190U JPH0435867U JP H0435867 U JPH0435867 U JP H0435867U JP 7792190 U JP7792190 U JP 7792190U JP 7792190 U JP7792190 U JP 7792190U JP H0435867 U JPH0435867 U JP H0435867U
Authority
JP
Japan
Prior art keywords
carrier
sides
substrate
polishing
abrasive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7792190U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7792190U priority Critical patent/JPH0435867U/ja
Publication of JPH0435867U publication Critical patent/JPH0435867U/ja
Pending legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案に係る半導体基板両面研磨用キ
ヤリアの一実施例を示す平面図、第2図は半導体
基板両面研磨装置の概略構成説明図、第3図は従
来使用されている半導体基板両面研磨用キヤリア
の平面図である。 1……半導体基板、2……半導体基板両面研磨
用キヤリア、3……上定盤、4……下定盤、5…
…研磨剤供給孔、6……サンギア、7……インタ
ーナルギア、8……基板保持孔、10……研磨剤
通過孔。
FIG. 1 is a plan view showing an embodiment of a carrier for polishing both sides of a semiconductor substrate according to the present invention, FIG. 2 is a schematic diagram of a semiconductor substrate double-side polishing apparatus, and FIG. FIG. 3 is a plan view of a polishing carrier. 1...Semiconductor substrate, 2...Carrier for polishing both sides of semiconductor substrate, 3...Upper surface plate, 4...Lower surface plate, 5...
... Abrasive supply hole, 6 ... Sun gear, 7 ... Internal gear, 8 ... Substrate holding hole, 10 ... Abrasive passage hole.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 半導体基板を保持する基板保持孔を有するとと
もに、研磨剤の供給を受けかつ、互いに逆方向に
回転する上・下定盤間にはさまれて半導体基板の
両面を同時に研磨せしめる半導体基板両面研磨用
キヤリアにおいて、前記キヤリア板面に、基板保
持孔とともに複数個の研磨剤通過孔を併設したこ
とを特徴とする半導体基板研磨両面用キヤリア。
A carrier for double-sided polishing of semiconductor substrates, which has a substrate holding hole for holding a semiconductor substrate, and which is sandwiched between upper and lower surface plates that rotate in opposite directions while being supplied with abrasive to simultaneously polish both sides of the semiconductor substrate. A carrier for polishing both sides of semiconductor substrates, characterized in that a plurality of abrasive passage holes are provided on the carrier plate surface together with substrate holding holes.
JP7792190U 1990-07-23 1990-07-23 Pending JPH0435867U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7792190U JPH0435867U (en) 1990-07-23 1990-07-23

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7792190U JPH0435867U (en) 1990-07-23 1990-07-23

Publications (1)

Publication Number Publication Date
JPH0435867U true JPH0435867U (en) 1992-03-25

Family

ID=31620741

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7792190U Pending JPH0435867U (en) 1990-07-23 1990-07-23

Country Status (1)

Country Link
JP (1) JPH0435867U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004082890A1 (en) * 2003-03-20 2004-09-30 Shin-Etsu Handotai Co. Ltd. Wafer-retaining carrier, double side-grinding device using the same, and double side-grinding method for wafer
JP2016022542A (en) * 2014-07-17 2016-02-08 信越半導体株式会社 Carrier for holding wafer, double-sided polishing method of wafer using the same, and evaluation method and design method of carrier for holding wafer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004082890A1 (en) * 2003-03-20 2004-09-30 Shin-Etsu Handotai Co. Ltd. Wafer-retaining carrier, double side-grinding device using the same, and double side-grinding method for wafer
JP2016022542A (en) * 2014-07-17 2016-02-08 信越半導体株式会社 Carrier for holding wafer, double-sided polishing method of wafer using the same, and evaluation method and design method of carrier for holding wafer

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