JPH04348067A - Cmos semiconductor integrated circuit - Google Patents

Cmos semiconductor integrated circuit

Info

Publication number
JPH04348067A
JPH04348067A JP3116922A JP11692291A JPH04348067A JP H04348067 A JPH04348067 A JP H04348067A JP 3116922 A JP3116922 A JP 3116922A JP 11692291 A JP11692291 A JP 11692291A JP H04348067 A JPH04348067 A JP H04348067A
Authority
JP
Japan
Prior art keywords
cmos
interconnection
wiring
impedance
semiconductor integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3116922A
Other languages
Japanese (ja)
Other versions
JP2546931B2 (en
Inventor
Koji Fukumoto
福本 晃二
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP3116922A priority Critical patent/JP2546931B2/en
Priority to US07/858,280 priority patent/US5341039A/en
Publication of JPH04348067A publication Critical patent/JPH04348067A/en
Application granted granted Critical
Publication of JP2546931B2 publication Critical patent/JP2546931B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE:To adjust the impedance of an interconnection and to restrain a reflected noise in an interconnection at the inside by a method wherein resistances which connect a part near the impedance mismatching part of the interconnection to the side of a power supply and to the side of a ground are formed together with an interconnection which is connected between CMOS circuits. CONSTITUTION:A part near an impedance mismatching part such as a contact hole or a through hole part is terminated by using a resistance which is constituted of a diffusion layer, a polycrystalline silicon layer or a well. Resistances 5, 7 which are constituted of a diffusion layer, a polycrystalline silicon layer or a well are formed together with an interconnection 12. A part near the impedance mismatching part of the interconnection 12 is connected to a power supply 6 via the resistance 5, and it is connected a ground 8 via the resistance 7 so that the impedance of the interconnection 12 can be adjusted. Consequently, the impedance mismatching part of the interconnection can be removed or its mismatching can be suppressed. A CMOS semiconductor integrated circuit which is operated at high speed can be obtained without a problem such as a malfunction due to a reflected noise.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】この発明はCMOS構成の半導体
集積回路に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor integrated circuit having a CMOS configuration.

【0002】0002

【従来の技術】図2は従来のCMOS構成の半導体集積
回路の一例を示す図である。図において、1はCMOS
で構成された回路、2は該CMOS回路1の出力を配線
11を介して受けとるNOTゲート、3はNOTゲート
2の出力を配線12を介して受けとるNOTゲート、4
はNOTゲート3の出力を配線13を介して受けとるC
MOS回路である。
2. Description of the Related Art FIG. 2 is a diagram showing an example of a conventional semiconductor integrated circuit having a CMOS configuration. In the figure, 1 is CMOS
2 is a NOT gate that receives the output of the CMOS circuit 1 via wiring 11; 3 is a NOT gate that receives the output of NOT gate 2 via wiring 12; 4 is a NOT gate that receives the output of NOT gate 2 via wiring 12;
is C which receives the output of NOT gate 3 via wiring 13.
It is a MOS circuit.

【0003】次に動作について説明する。CMOS回路
1から出力された信号はNOTゲート2で反転された情
報となり、NOTゲート3で再び反転され、論理的にC
MOS回路1から出力される論理と同じ論理を有する信
号となり、CMOS回路4に入力される。
Next, the operation will be explained. The signal output from the CMOS circuit 1 becomes information inverted by the NOT gate 2, and is inverted again by the NOT gate 3, logically converting into CMOS circuit 1.
The signal becomes a signal having the same logic as the logic output from the MOS circuit 1 and is input to the CMOS circuit 4.

【0004】ところで、CMOS回路の設計ではどのゲ
ートもノイズの影響を受けにくくするために、電源電位
の2分の1付近に論理しきい値が設定されるよう、CM
OSゲートを構成するPチャネル形MOSトランジスタ
とNチャネル形MOSトランジスタの大きさの比を調整
している。この調整によってノイズマージンの大きなC
MOS回路が構成されている。
By the way, in the design of a CMOS circuit, in order to make any gate less susceptible to noise, the CMOS circuit is
The size ratio of the P-channel MOS transistor and the N-channel MOS transistor constituting the OS gate is adjusted. With this adjustment, C
A MOS circuit is configured.

【0005】[0005]

【発明が解決しようとする課題】従来のCMOS半導体
集積回路は以上のように構成されているが、回路の大規
模化が進むと集積回路内で使用される配線に長いものも
含まれてくることとなり、さらに高速化を目指そうとす
ると、上記のような論理しきい値の設定だけに注意を払
うだけでは解消できないノイズの影響を受けることにな
る。即ち、回路間の配線上でインピーダンスの変わる部
分、例えば配線を複数の金属層で構成している場合は、
異なる金属層を接続するスルーホール部分、また配線を
単一の金属層で構成している場合は、その配線幅が変化
する部分において生ずる反射ノイズの影響が大きくなる
という問題点がある。
[Problem to be Solved by the Invention] Conventional CMOS semiconductor integrated circuits are configured as described above, but as the scale of circuits increases, the wiring used within the integrated circuits includes long wires. Therefore, if you try to further increase the speed, you will be affected by noise that cannot be eliminated by paying attention only to the setting of the logical threshold as described above. In other words, in the case where the impedance changes on the wiring between circuits, for example, when the wiring is composed of multiple metal layers,
When a through-hole section that connects different metal layers, or when wiring is formed of a single metal layer, there is a problem in that the influence of reflected noise that occurs in the portion where the wiring width changes becomes large.

【0006】この発明は上記のような問題点を解消する
ためになされたもので、内部の配線での反射ノイズを抑
制することができるCMOS半導体集積回路を得ること
を目的とする。
The present invention has been made to solve the above-mentioned problems, and it is an object of the present invention to provide a CMOS semiconductor integrated circuit that can suppress reflection noise from internal wiring.

【0007】[0007]

【課題を解決するための手段】この発明に係るCMOS
半導体集積回路は、第1のCMOS回路の出力と第2の
CMOS回路の入力を接続する配線とともに、拡散層あ
るいは多結晶シリコン層あるいはウェルからなる抵抗を
設け、上記配線のインピーダンス不整合となる箇所近傍
を上記抵抗を介して電源側及びグランド側に接続するも
のである。
[Means for solving the problem] CMOS according to the present invention
In a semiconductor integrated circuit, a resistor made of a diffusion layer, a polycrystalline silicon layer, or a well is provided along with wiring connecting the output of a first CMOS circuit and the input of a second CMOS circuit, and the impedance mismatch between the wirings is provided. The vicinity is connected to the power supply side and the ground side via the above-mentioned resistor.

【0008】[0008]

【作用】この発明においては、CMOS回路間を接続す
る配線とともに、上記配線のインピーダンス不整合とな
る箇所近傍を電源側及びグランド側に接続する抵抗を設
け、上記配線のインピーダンスを調整可能としたので、
内部の配線での反射ノイズを抑制することができる。
[Operation] In this invention, in addition to the wiring connecting between the CMOS circuits, a resistor is provided to connect the vicinity of the impedance mismatching point of the wiring to the power supply side and the ground side, so that the impedance of the wiring can be adjusted. ,
Reflection noise from internal wiring can be suppressed.

【0009】[0009]

【実施例】以下、この発明の一実施例を図について説明
する。図1は本発明の一実施例によるCMOS半導体集
積回路を示す図であり、図において、図2の構成要素と
同一部分には同一の符号をつけ、その説明を省略する。 5は配線12のインピーダンス不整合となる部分近傍と
電源6とを接続する抵抗、7は該インピーダンス不整合
部分近傍とグランド8とを接続する抵抗であり、これら
の抵抗5,7は配線12のインピーダンス不整合が低減
されるよう、その値が設定されている。
DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings. FIG. 1 is a diagram showing a CMOS semiconductor integrated circuit according to an embodiment of the present invention. In the diagram, the same components as those in FIG. 2 are given the same reference numerals, and their explanations will be omitted. 5 is a resistor that connects the vicinity of the impedance mismatched portion of the wiring 12 and the power supply 6; 7 is a resistor that connects the vicinity of the impedance mismatched portion and the ground 8; Its value is set so that impedance mismatch is reduced.

【0010】次に動作について説明する。信号の伝達動
作は従来と同様である。つまり、CMOS回路1から出
力された情報は配線11を介してNOTゲート2に入力
され、論理的に反転された情報がNOTゲート2から出
力される。NOTゲート2から出力された情報は配線1
2を介してNOTゲート3に入力される。NOTゲート
3に入力された情報はNOTゲート3において反転され
て配線13を介してCMOS回路4に入力される。
Next, the operation will be explained. The signal transmission operation is the same as the conventional one. That is, information output from the CMOS circuit 1 is input to the NOT gate 2 via the wiring 11, and logically inverted information is output from the NOT gate 2. The information output from NOT gate 2 is sent to wiring 1
2 to the NOT gate 3. Information input to the NOT gate 3 is inverted at the NOT gate 3 and input to the CMOS circuit 4 via the wiring 13.

【0011】以下、上記配線12に着目して本発明の動
作を説明する。集積回路上でNOTゲート2とNOTゲ
ート3は互いに非常に離れた所に位置しており、また配
線12は実際には複数の金属層で構成されている。従っ
て、配線12にはいくつかの箇所に異なる金属層の接続
のためのコンタクトホールあるいはスルーホールと呼ば
れる穴を設けてある。
The operation of the present invention will be described below, focusing on the wiring 12. NOT gate 2 and NOT gate 3 are located very far from each other on the integrated circuit, and interconnect 12 is actually composed of multiple metal layers. Therefore, the wiring 12 is provided with holes called contact holes or through holes at several locations for connecting different metal layers.

【0012】ここで、インピーダンス不整合はだいたい
コンタクトホールあるいはスルーホール部分で生じる。 このようなコンタクトホールあるいはスルーホール部分
のようなインピーダンス不整合となる箇所近傍を拡散層
あるいは多結晶シリコン層あるいはウェルで構成される
抵抗を用いて終端する。つまり、上記不整合となる箇所
近傍を抵抗を介して電源側や接地側に接続することによ
り、不整合となる箇所を取り除くことが可能となる。
[0012] Here, impedance mismatching generally occurs at contact holes or through holes. A resistor formed of a diffusion layer, a polycrystalline silicon layer, or a well is used to terminate the vicinity of a point where impedance mismatch occurs, such as a contact hole or a through hole portion. That is, by connecting the vicinity of the point where the mismatch occurs to the power supply side or the ground side via a resistor, it becomes possible to remove the point where the mismatch occurs.

【0013】このように、本実施例では、配線12とと
もに拡散層あるはい多結晶シリコン層あるいはウェルか
らなる抵抗5,7を設け、配線12のインピーダンス不
整合となる部分近傍を抵抗5を介して電源6に、また抵
抗7を介してグランド8に接続し、配線12のインピー
ダンスを調整可能としたので、配線上の不整合となる箇
所を取り除くあるいは不整合を抑制することができ、高
速で動作するCMOS半導体集積回路において、反射ノ
イズによる誤動作の問題のないものが得られる効果があ
る。
As described above, in this embodiment, resistors 5 and 7 made of a diffusion layer, a polycrystalline silicon layer, or a well are provided together with the wiring 12, and the vicinity of the portion of the wiring 12 where the impedance mismatch occurs is connected via the resistor 5. Since it is connected to the power supply 6 and to the ground 8 via the resistor 7, and the impedance of the wiring 12 can be adjusted, it is possible to remove or suppress mismatching points on the wiring, and it operates at high speed. This has the effect that a CMOS semiconductor integrated circuit that does not have the problem of malfunction due to reflected noise can be obtained.

【0014】なお、上記実施例では配線12が複数の金
属層からなるものを例に挙げて説明したが、本発明は1
層の金属層からなる配線にも適用可能である。つまり、
その配線幅が途中で変化している場合にはやはりインピ
ーダンス不整合が生じることとなり、配線の所定部分を
抵抗を介して電源側及びグランド側に接続することによ
りインピーダンス不整合を抑制することが可能となる。
[0014] In the above embodiment, the wiring 12 is made of a plurality of metal layers.
It is also applicable to wiring made of metal layers. In other words,
If the wiring width changes along the way, impedance mismatch will still occur, and it is possible to suppress impedance mismatch by connecting a predetermined part of the wiring to the power supply side and ground side via a resistor. becomes.

【0015】[0015]

【発明の効果】以上のように、この発明によれば、CM
OS回路間を接続する配線とともに、上記配線のインピ
ーダンス不整合となる箇所近傍を電源側及びグランド側
に接続する抵抗を設け、上記配線のインピーダンスを調
整可能としたので、内部の配線での反射ノイズを抑制す
ることができ、高速動作が可能で、かつ動作において反
射ノイズによる誤動作の問題のないCMOS半導体集積
回路を得ることができる。
[Effects of the Invention] As described above, according to the present invention, CM
In addition to the wiring that connects the OS circuits, we installed a resistor that connects the impedance mismatch points of the wiring to the power supply side and the ground side, making it possible to adjust the impedance of the wiring, thereby reducing reflection noise from internal wiring. It is possible to obtain a CMOS semiconductor integrated circuit which is capable of suppressing noise, is capable of high-speed operation, and has no problem of malfunction due to reflected noise during operation.

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】この発明の一実施例によるCMOS半導体集積
回路を示す図である。
FIG. 1 is a diagram showing a CMOS semiconductor integrated circuit according to an embodiment of the present invention.

【図2】従来のCMOS構成の半導体集積回路を示す図
である。
FIG. 2 is a diagram showing a semiconductor integrated circuit with a conventional CMOS configuration.

【符号の説明】[Explanation of symbols]

1    第1のCMOS回路 2    NOTゲート 3    NOTゲート 4    第2のCMOS回路 5    抵抗 6    電源 7    抵抗 8    グランド 12  配線 1 First CMOS circuit 2 NOT gate 3 NOT gate 4 Second CMOS circuit 5 Resistance 6 Power supply 7 Resistance 8 Grand 12 Wiring

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】  第1,第2のCMOSゲートと、該第
1のCMOSゲートの出力と第2のCMOSゲートの入
力とを接続する導電体の配線層とを有するCMOS構成
の半導体集積回路において、拡散層あるいは多結晶シリ
コン層あるいはウェルにより構成され、上記導電体の配
線層のインピーダンス不整合となる部分近傍と電源側及
びグランド側とを接続する抵抗とを備え、上記導電体の
配線層のインピーダンスを調整可能としたことを特徴と
するCMOS半導体集積回路。
1. A semiconductor integrated circuit having a CMOS configuration, comprising first and second CMOS gates, and a conductive wiring layer connecting the output of the first CMOS gate and the input of the second CMOS gate. , comprising a diffusion layer, a polycrystalline silicon layer, or a well, and a resistor connecting the vicinity of the impedance mismatched portion of the wiring layer of the conductor to the power supply side and the ground side; A CMOS semiconductor integrated circuit characterized by adjustable impedance.
JP3116922A 1990-06-28 1991-04-19 CMOS semiconductor integrated circuit Expired - Fee Related JP2546931B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP3116922A JP2546931B2 (en) 1990-06-28 1991-04-19 CMOS semiconductor integrated circuit
US07/858,280 US5341039A (en) 1991-04-19 1992-03-26 High frequency integrated circuit device including a circuit for decreasing reflected signals in wiring formed on a semiconductor substrate

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP17240890 1990-06-28
JP2-172408 1990-06-28
JP3116922A JP2546931B2 (en) 1990-06-28 1991-04-19 CMOS semiconductor integrated circuit

Publications (2)

Publication Number Publication Date
JPH04348067A true JPH04348067A (en) 1992-12-03
JP2546931B2 JP2546931B2 (en) 1996-10-23

Family

ID=26455150

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3116922A Expired - Fee Related JP2546931B2 (en) 1990-06-28 1991-04-19 CMOS semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JP2546931B2 (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6346009A (en) * 1986-08-13 1988-02-26 Canon Inc Ic device with built-in impedance matching resistor

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6346009A (en) * 1986-08-13 1988-02-26 Canon Inc Ic device with built-in impedance matching resistor

Also Published As

Publication number Publication date
JP2546931B2 (en) 1996-10-23

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