JPH05199101A - Level shift circuit - Google Patents

Level shift circuit

Info

Publication number
JPH05199101A
JPH05199101A JP4008865A JP886592A JPH05199101A JP H05199101 A JPH05199101 A JP H05199101A JP 4008865 A JP4008865 A JP 4008865A JP 886592 A JP886592 A JP 886592A JP H05199101 A JPH05199101 A JP H05199101A
Authority
JP
Japan
Prior art keywords
gate
transistor
resistor
level shift
shift circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4008865A
Other languages
Japanese (ja)
Other versions
JP2771375B2 (en
Inventor
Yoji Takekoshi
洋司 竹腰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC IC Microcomputer Systems Co Ltd
Original Assignee
NEC IC Microcomputer Systems Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC IC Microcomputer Systems Co Ltd filed Critical NEC IC Microcomputer Systems Co Ltd
Priority to JP4008865A priority Critical patent/JP2771375B2/en
Publication of JPH05199101A publication Critical patent/JPH05199101A/en
Application granted granted Critical
Publication of JP2771375B2 publication Critical patent/JP2771375B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PURPOSE:To reduce the chip size by using a resistor between a PMOS transistor(TR) and an NMOS TR in the level shift circuit employing CMOS TRs for a gate resistor of a TR of a next-stage. CONSTITUTION:A resistor R1 (R2) is arranged between drains of TRs P1, N1 (TRs P2, N2) respectively, a gate of the TR P1 connects to a connecting point B and a gate of the TR P2 connects to a connecting point A respectively, a gate of the TR N2 is connected to an output of an invereter INV.3 and a gate of the TR N1 is connected to an input of an invereter INV.3. In the level shift circuit connected as above, the gate resistor of the inverter INV.1 connecting point A employs the resistor R1 and the gate resistor of the inverter INV.2 connecting point B employs the resistor R2 respectively. Thus, the chip size of the circuit shifting the level of multi-signals is reduced.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明はレベルシフト回路に関
し、特にCMOSトランジスタを用いたレベルシフト回
路に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a level shift circuit, and more particularly to a level shift circuit using CMOS transistors.

【0002】[0002]

【従来の技術】従来のこの種のレベルシフト回路は、図
2に示すように、PMOSトランジスタP1,P2,N
MOSトランジスタN1,N2,抵抗R1,R2,及び
インバータINV.1,INV.2,INV.3を有
し、トランジスタP1とN1のドレイン間に抵抗R1
を、トランジスタP2とN2のドレイン間に抵抗R2を
配し、トランジスタP1とP2のソースは第1の電源V
DDに、トランジスタN1とN2のソースは第2の電源
VSSに各々接続され、トランジスタP1のゲートはト
ランジスタN2のドレインと抵抗R2との接点Bに、ト
ランジスタP2のゲートはトランジスタN1のドレイン
と抵抗R1との接点Aに各々接続されており、第3の電
源VCCと第2の電源VSSとの間に配したインバータ
INV.3の入力をトランジスタN1のゲートに、その
出力をトランジスタN2のゲートに接続した構造となっ
ている。
2. Description of the Related Art As shown in FIG. 2, a conventional level shift circuit of this type has PMOS transistors P1, P2, N.
MOS transistors N1, N2, resistors R1, R2, and inverter INV. 1, INV. 2, INV. 3 and has a resistor R1 between the drains of the transistors P1 and N1.
A resistor R2 is arranged between the drains of the transistors P2 and N2, and the sources of the transistors P1 and P2 are the first power source V1.
The sources of the transistors N1 and N2 are connected to the second power source VSS, respectively, and the gate of the transistor P1 is at the contact B between the drain of the transistor N2 and the resistor R2, and the gate of the transistor P2 is at the drain of the transistor N1 and the resistor R1. And an inverter INV. Connected to a contact A between the third power supply VCC and the second power supply VSS. 3 is connected to the gate of the transistor N1 and its output is connected to the gate of the transistor N2.

【0003】また、このレベルシフト回路の出力とし
て、例えば、図2に示すように、電源VDD,VSSと
の間に配したインバータINV.1,INV.2が、そ
れぞれトランジスタN1のドレイン,トランジスタN2
のドレインに接続された構造となっている。
Further, as an output of the level shift circuit, for example, as shown in FIG. 2, an inverter INV. 1, INV. 2 are the drain of the transistor N1 and the transistor N2, respectively.
The structure is connected to the drain of.

【0004】[0004]

【発明が解決しようとする課題】前述した従来のレベル
シフト回路は、例えば入力INがハイレベルからロウレ
ベルに変化した場合、トランジスタN1はONからOF
F状態となり、トランジスタN2はOFFからON状態
となるが、トランジスタP1のゲートの電位はトランジ
スタP2とN2により制御しているため、PMOSトラ
ンジスタの能力を大きくすると(例えばチャネル幅
大)、トランジスタP1のゲート電位はトランジスタP
2とN2の能力比により、ロウレベルになりづらいた
め、トランジスタP2のゲート電位が電源VDDレベル
になるまでは時間がかかり、接点Aの立上り,接点Bの
立下り時間は、インバータ回路の数10倍〜数100倍
程度遅くなって、出力Q1,Q2へ伝送される。
In the conventional level shift circuit described above, for example, when the input IN changes from high level to low level, the transistor N1 changes from ON to OF.
Although the F state is set and the transistor N2 is changed from OFF to ON state, the potential of the gate of the transistor P1 is controlled by the transistors P2 and N2. Therefore, when the capability of the PMOS transistor is increased (for example, the channel width is large), The gate potential is transistor P
Since it is difficult to attain a low level due to the capacity ratio of 2 and N2, it takes time for the gate potential of the transistor P2 to reach the power supply VDD level, and the rise time of the contact A and the fall time of the contact B are several tens of times that of the inverter circuit. ~ Delayed by several hundred times and transmitted to outputs Q1 and Q2.

【0005】逆に、PMOSトランジスタの能力を小さ
くすると(例えばチャネル幅小)、接点Bの立下りは速
くなり、トランジスタP1はON状態となるが、能力が
小さいことから接点Aの立上り時間は、接点Bの立下り
時間と同様には速く出来ないが、立上り,立下り時間の
スピードバランスを考えると、PMOSトランジスタ能
力<NMOSトランジスタ能力となるように設計するの
が常である。
On the contrary, when the capacity of the PMOS transistor is reduced (for example, the channel width is small), the fall of the contact point B becomes faster and the transistor P1 is turned on. However, the rise time of the contact point A is small because the ability is small. It cannot be made as fast as the fall time of the contact B, but in consideration of the speed balance of the rise and fall times, it is usual to design so that PMOS transistor capability <NMOS transistor capability.

【0006】しかし、PMOSトランジスタのチャネル
幅を小さくした場合、チャネル幅に対する製造バラツキ
の影響が大きく、特性に影響してくるため、あまり小さ
くすることが出来ない。そこで、図2に示すように、ト
ランジスタP1,N1間あるいはトランジスタP2,N
2間に、抵抗R1,R2を入れることにより、PMOS
トランジスタのチャネル幅を小さくして能力を下げるこ
とと等価な構成をとるが、レイアウト上抵抗R1とR2
の専有面積が大きく、多信号をレベルシフトする場合、
チップサイズへの影響も出てくる。
However, when the channel width of the PMOS transistor is made small, the manufacturing variation has a large influence on the channel width and affects the characteristics, so that it cannot be made so small. Therefore, as shown in FIG. 2, between the transistors P1 and N1 or between the transistors P2 and N1.
By inserting resistors R1 and R2 between the two,
Although the configuration is equivalent to reducing the channel width of the transistor to reduce the performance, the layout of the resistors R1 and R2
Has a large occupied area and level-shifts multiple signals,
It will also affect the chip size.

【0007】また、抵抗R1,R2を挿入するかわり
に、NMOSトランジスタの能力を大きくすれば、即ち
チャネル幅を大きくすれば、前記方法と同様な特性を得
ることが出来るが、NMOSトランジスタのチャネル幅
を大きくすることによるチップサイズへの影響も同様で
ある。
Also, instead of inserting the resistors R1 and R2, if the capacity of the NMOS transistor is increased, that is, if the channel width is increased, the same characteristics as the above method can be obtained, but the channel width of the NMOS transistor is increased. The effect on the chip size due to the increase of is also the same.

【0008】[0008]

【課題を解決するための手段】本発明のレベルシフト回
路の構成は、第1のPMOSトランジスタと第1のNM
OSトランジスタのドレイン又はソース間に、また第2
のPMOSトランジスタと第2のNMOSトランジスタ
のドレイン又はソース間に、それぞれ第1,第2の抵抗
を配し、前記第1,第2のPMOSトランジスタのソー
ス又はドレインは第1の電源に、また前記第1,第2の
NMOSトランジスタのソース又はドレインは第2の電
源に接続し、前記第1のPMOSトランジスタのゲート
は第2の抵抗と前記第2のNMOSトランジスタのドレ
インまたはソースに、また前記第2のPMOSトランジ
スタのゲートは第1の抵抗と前記第1のNMOSトラン
ジスタのドレイン又はソースにそれぞれ共通接続し、前
記第2のNMOSトランジスタのゲートは、第3の電源
と前記第2の電源間に配したインバータの出力に、また
前記第1のNMOSトランジスタのゲートは前記インバ
ータの入力に接続したレベルシフト回路において、前記
第1,第2の抵抗として、それぞれの次段トランジスタ
のゲートの抵抗を利用した構造を有することを特徴とす
る。
The structure of the level shift circuit of the present invention comprises a first PMOS transistor and a first NM.
Between the drain or the source of the OS transistor, and the second
First and second resistors are respectively arranged between the drains and sources of the PMOS transistor and the second NMOS transistor, and the sources and drains of the first and second PMOS transistors are used for the first power source and The sources or drains of the first and second NMOS transistors are connected to a second power supply, the gate of the first PMOS transistor is connected to the second resistor and the drain or source of the second NMOS transistor, and the second The gate of the second PMOS transistor is commonly connected to the first resistor and the drain or source of the first NMOS transistor, and the gate of the second NMOS transistor is connected between the third power source and the second power source. Connected to the output of the arranged inverter, and the gate of the first NMOS transistor connected to the input of the inverter In the level shift circuit, the first, the second resistor, and having a structure that utilizes the resistance of the gate of each of the next-stage transistor.

【0009】[0009]

【実施例】図1(a)は本発明の一実施例であるレベル
シフト回路の回路図である。
1A is a circuit diagram of a level shift circuit according to an embodiment of the present invention.

【0010】図1(a)において、本実施例は、従来の
図2の構成に対し、接点Aと接点Bのそれぞれの次段イ
ンバータINV.1,INV.2のゲート抵抗を、抵抗
R1,R2として利用した構成となっている。
In FIG. 1A, the present embodiment is different from the conventional configuration of FIG. 2 in that the next-stage inverters INV. 1, INV. The gate resistance of 2 is used as the resistances R1 and R2.

【0011】例えば、図1の(b)にインバータIN
V.1,あるいはINV.2{図1の(a))の簡単な
レイアウト図を示すが、トランジスタP1あるいはP2
のドレインをa点に、またトランジスタN1あるいはN
2のドレインをb点に各々接続することにより、点a,
b間のゲートの抵抗をR1,R2としている。
For example, the inverter IN shown in FIG.
V. 1, or INV. 2 {shown in FIG. 1 (a)) is a simple layout diagram showing the transistor P1 or P2.
To the point a, and the transistor N1 or N
By connecting the drains of 2 to the points b,
The resistance of the gate between b is R1 and R2.

【0012】図1の(b)において、ドレイン(Dra
in)10,ソース(Sourse)11,ゲート(G
ate)12の各領域があり、電源VDD,VSSに接
続され、出力Q1(又はQ2)は右方より取り出され
る。点a,b間はゲート(Gate)12となってお
り、これが抵抗R1(又はR2)となる。
In FIG. 1B, the drain (Dra
in) 10, source (Source) 11, gate (G)
ate) 12, each area is connected to the power supplies VDD and VSS, and the output Q1 (or Q2) is taken out from the right side. A gate 12 is provided between the points a and b, and this serves as the resistor R1 (or R2).

【0013】これにより、回路構成は、図2に示すよう
な従来の回路構成と同一となるため、動作も従来と同一
となる。
As a result, the circuit configuration becomes the same as the conventional circuit configuration as shown in FIG. 2, so that the operation becomes the same as the conventional one.

【0014】また、ゲートを抵抗R1,R2として利用
したインバータINV.1,INV.2の入力信号は、
それぞれ図2に示す従来回路のトランジスタP1とN1
の接点A,及びトランジスタP2とN2の接点Bの信号
と同一であるため、出力Q1,Q2への論理伝達遅延時
間共同一となる。
In addition, the inverter INV. 1, INV. The input signal of 2 is
Transistors P1 and N1 of the conventional circuit shown in FIG. 2 respectively.
Since it is the same as the signal at the contact A at the contact A and the signal at the contact B between the transistors P2 and N2, the logical transmission delay times to the outputs Q1 and Q2 are the same.

【0015】本実施例としては、インバータのゲートを
利用した構成を示しているが、NANDゲートやトラン
スファーゲート等の他の回路のゲートでもよいことはい
うまでもない。
In the present embodiment, the configuration using the gate of the inverter is shown, but it goes without saying that the gate of another circuit such as a NAND gate or a transfer gate may be used.

【0016】[0016]

【発明の効果】以上説明したように、本発明によるレベ
ルシフト回路は、それぞれの次段トランジスタのゲート
抵抗を第1,第2の抵抗として利用しており、新たに抵
抗を挿入する必要がないため、レイアウト上のレベルシ
フト回路の専有面積を小さくすることが出来ることか
ら、特に多信号をレベルシフトする場合においては、チ
ップサイズを小さくすることが出来るという効果があ
る。
As described above, in the level shift circuit according to the present invention, the gate resistance of each succeeding stage transistor is used as the first and second resistances, and it is not necessary to insert a new resistance. Therefore, since the area occupied by the level shift circuit on the layout can be reduced, there is an effect that the chip size can be reduced, especially in the case of level shifting multiple signals.

【図面の簡単な説明】[Brief description of drawings]

【図1】(a),(b)は本発明の一実施例のレベルシ
フト回路のそれぞれ回路図、その一部のレイアウト図で
ある。
1A and 1B are a circuit diagram and a partial layout diagram of a level shift circuit according to an embodiment of the present invention, respectively.

【図2】従来のレベルシフト回路を示す回路図である。FIG. 2 is a circuit diagram showing a conventional level shift circuit.

【符号の説明】[Explanation of symbols]

P1,P2 PMOSトランジスタ N0,N2 NMOSトランジスタ R1,R2 抵抗 INV.1,INV.2,INV.3 インバータ回
路 VDD,VCC,VSS 電源 IN 入力 Q1,Q2 出力
P1, P2 PMOS transistor N0, N2 NMOS transistor R1, R2 resistance INV. 1, INV. 2, INV. 3 Inverter circuit VDD, VCC, VSS Power supply IN input Q1, Q2 output

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 第1のPMOSトランジスタと第1のN
MOSトランジスタのドレイン又はソース間に、また第
2のPMOSトランジスタと第2のNMOSトランジス
タのドレイン又はソース間に、それぞれ第1,第2の抵
抗を配し、前記第1,第2のPMOSトランジスタのソ
ース又はドレインは第1の電源に、また前記第1,第2
のNMOSトランジスタのソース又はドレインは第2の
電源に接続し、前記第1のPMOSトランジスタのゲー
トは第2の抵抗と前記第2のNMOSトランジスタのド
レインまたはソースに、また前記第2のPMOSトラン
ジスタのゲートは第1の抵抗と前記第1のNMOSトラ
ンジスタのドレイン又はソースにそれぞれ共通接続し、
前記第2のNMOSトランジスタのゲートは、第3の電
源と前記第2の電源間に配したインバータの出力に、ま
た前記第1のNMOSトランジスタのゲートは前記イン
バータの入力に接続したレベルシフト回路において、前
記第1,第2の抵抗として、それぞれの次段トランジス
タのゲートの抵抗を利用した構造を有することを特徴と
するレベルシフト回路。
1. A first PMOS transistor and a first N transistor.
First and second resistors are arranged between the drains and sources of the MOS transistors and between the drains and sources of the second PMOS transistor and the second NMOS transistor, respectively, and the first and second PMOS transistors have the same structure. The source or drain is connected to the first power source, and the first and second
The source or drain of the NMOS transistor is connected to a second power supply, the gate of the first PMOS transistor is connected to the second resistor and the drain or source of the second NMOS transistor, and the gate of the second PMOS transistor is connected to the second resistor. The gate is commonly connected to the first resistor and the drain or source of the first NMOS transistor,
In the level shift circuit, the gate of the second NMOS transistor is connected to the output of the inverter arranged between the third power supply and the second power supply, and the gate of the first NMOS transistor is connected to the input of the inverter. A level shift circuit having a structure in which the resistance of the gate of each subsequent-stage transistor is used as the first and second resistances.
JP4008865A 1992-01-22 1992-01-22 Level shift circuit Expired - Fee Related JP2771375B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4008865A JP2771375B2 (en) 1992-01-22 1992-01-22 Level shift circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4008865A JP2771375B2 (en) 1992-01-22 1992-01-22 Level shift circuit

Publications (2)

Publication Number Publication Date
JPH05199101A true JPH05199101A (en) 1993-08-06
JP2771375B2 JP2771375B2 (en) 1998-07-02

Family

ID=11704593

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4008865A Expired - Fee Related JP2771375B2 (en) 1992-01-22 1992-01-22 Level shift circuit

Country Status (1)

Country Link
JP (1) JP2771375B2 (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0687070A2 (en) 1994-06-07 1995-12-13 Siemens Aktiengesellschaft Level conversion circuit
WO2001006658A1 (en) * 1999-07-19 2001-01-25 Infineon Technologies Ag Electronic circuit, especially for a mobile radiotelephone device
JP2002084184A (en) * 2000-09-06 2002-03-22 Seiko Epson Corp Level shift circuit and semiconductor device using the same
JP2002198800A (en) * 2000-12-27 2002-07-12 Sanyo Electric Co Ltd Level shift circuit
JP2005020142A (en) * 2003-06-24 2005-01-20 Fuji Electric Device Technology Co Ltd Mos semiconductor integrated circuit
KR100466971B1 (en) * 1997-10-31 2005-06-07 삼성전자주식회사 Level shifter
US9136846B2 (en) 2011-12-22 2015-09-15 Renesas Electronics Corporation Level shift circuit and drive circuit of display device
US9647645B1 (en) 2016-05-11 2017-05-09 Xcelsem, Llc Low voltage to high voltage level translator that is independent of the high supply voltage

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0687070A2 (en) 1994-06-07 1995-12-13 Siemens Aktiengesellschaft Level conversion circuit
KR100466971B1 (en) * 1997-10-31 2005-06-07 삼성전자주식회사 Level shifter
WO2001006658A1 (en) * 1999-07-19 2001-01-25 Infineon Technologies Ag Electronic circuit, especially for a mobile radiotelephone device
JP2002084184A (en) * 2000-09-06 2002-03-22 Seiko Epson Corp Level shift circuit and semiconductor device using the same
US6633192B2 (en) 2000-09-06 2003-10-14 Seiko Epson Corporation Level shift circuit and semiconductor device using the same
JP2002198800A (en) * 2000-12-27 2002-07-12 Sanyo Electric Co Ltd Level shift circuit
JP2005020142A (en) * 2003-06-24 2005-01-20 Fuji Electric Device Technology Co Ltd Mos semiconductor integrated circuit
US9136846B2 (en) 2011-12-22 2015-09-15 Renesas Electronics Corporation Level shift circuit and drive circuit of display device
US9647645B1 (en) 2016-05-11 2017-05-09 Xcelsem, Llc Low voltage to high voltage level translator that is independent of the high supply voltage

Also Published As

Publication number Publication date
JP2771375B2 (en) 1998-07-02

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