JPH04338B2 - - Google Patents
Info
- Publication number
- JPH04338B2 JPH04338B2 JP57218171A JP21817182A JPH04338B2 JP H04338 B2 JPH04338 B2 JP H04338B2 JP 57218171 A JP57218171 A JP 57218171A JP 21817182 A JP21817182 A JP 21817182A JP H04338 B2 JPH04338 B2 JP H04338B2
- Authority
- JP
- Japan
- Prior art keywords
- magnetic field
- strength
- ion
- lens
- sweeping
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 150000002500 ions Chemical class 0.000 claims description 42
- 238000004458 analytical method Methods 0.000 claims description 19
- 238000010408 sweeping Methods 0.000 claims description 17
- 230000005684 electric field Effects 0.000 claims description 15
- 239000006185 dispersion Substances 0.000 claims description 5
- 238000004949 mass spectrometry Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 11
- 238000010884 ion-beam technique Methods 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 5
- 230000035945 sensitivity Effects 0.000 description 5
- 238000001819 mass spectrum Methods 0.000 description 4
- 229920006395 saturated elastomer Polymers 0.000 description 3
- 238000001514 detection method Methods 0.000 description 1
- 238000005315 distribution function Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
- H01J49/32—Static spectrometers using double focusing
- H01J49/326—Static spectrometers using double focusing with magnetic and electrostatic sectors of 90 degrees
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57218171A JPS59108255A (ja) | 1982-12-13 | 1982-12-13 | 質量分析装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57218171A JPS59108255A (ja) | 1982-12-13 | 1982-12-13 | 質量分析装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59108255A JPS59108255A (ja) | 1984-06-22 |
JPH04338B2 true JPH04338B2 (de) | 1992-01-07 |
Family
ID=16715734
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57218171A Granted JPS59108255A (ja) | 1982-12-13 | 1982-12-13 | 質量分析装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59108255A (de) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01304650A (ja) * | 1988-06-01 | 1989-12-08 | Hitachi Ltd | 質量分析計 |
CN106404882B (zh) * | 2016-08-31 | 2019-08-23 | 兰州空间技术物理研究所 | 一种基于柱形电场分析器的磁偏转质谱计 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5220089A (en) * | 1975-08-08 | 1977-02-15 | Hitachi Ltd | Ion detecting device for mass spectometers |
JPS5494092A (en) * | 1978-01-06 | 1979-07-25 | Hitachi Ltd | Mass analyzer |
-
1982
- 1982-12-13 JP JP57218171A patent/JPS59108255A/ja active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5220089A (en) * | 1975-08-08 | 1977-02-15 | Hitachi Ltd | Ion detecting device for mass spectometers |
JPS5494092A (en) * | 1978-01-06 | 1979-07-25 | Hitachi Ltd | Mass analyzer |
Also Published As
Publication number | Publication date |
---|---|
JPS59108255A (ja) | 1984-06-22 |
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