JPH04338B2 - - Google Patents

Info

Publication number
JPH04338B2
JPH04338B2 JP57218171A JP21817182A JPH04338B2 JP H04338 B2 JPH04338 B2 JP H04338B2 JP 57218171 A JP57218171 A JP 57218171A JP 21817182 A JP21817182 A JP 21817182A JP H04338 B2 JPH04338 B2 JP H04338B2
Authority
JP
Japan
Prior art keywords
magnetic field
strength
ion
lens
sweeping
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57218171A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59108255A (ja
Inventor
Yoshihiro Nukina
Morio Ishihara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Denshi KK filed Critical Nihon Denshi KK
Priority to JP57218171A priority Critical patent/JPS59108255A/ja
Publication of JPS59108255A publication Critical patent/JPS59108255A/ja
Publication of JPH04338B2 publication Critical patent/JPH04338B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/32—Static spectrometers using double focusing
    • H01J49/326—Static spectrometers using double focusing with magnetic and electrostatic sectors of 90 degrees

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP57218171A 1982-12-13 1982-12-13 質量分析装置 Granted JPS59108255A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57218171A JPS59108255A (ja) 1982-12-13 1982-12-13 質量分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57218171A JPS59108255A (ja) 1982-12-13 1982-12-13 質量分析装置

Publications (2)

Publication Number Publication Date
JPS59108255A JPS59108255A (ja) 1984-06-22
JPH04338B2 true JPH04338B2 (de) 1992-01-07

Family

ID=16715734

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57218171A Granted JPS59108255A (ja) 1982-12-13 1982-12-13 質量分析装置

Country Status (1)

Country Link
JP (1) JPS59108255A (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01304650A (ja) * 1988-06-01 1989-12-08 Hitachi Ltd 質量分析計
CN106404882B (zh) * 2016-08-31 2019-08-23 兰州空间技术物理研究所 一种基于柱形电场分析器的磁偏转质谱计

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5220089A (en) * 1975-08-08 1977-02-15 Hitachi Ltd Ion detecting device for mass spectometers
JPS5494092A (en) * 1978-01-06 1979-07-25 Hitachi Ltd Mass analyzer

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5220089A (en) * 1975-08-08 1977-02-15 Hitachi Ltd Ion detecting device for mass spectometers
JPS5494092A (en) * 1978-01-06 1979-07-25 Hitachi Ltd Mass analyzer

Also Published As

Publication number Publication date
JPS59108255A (ja) 1984-06-22

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