JPH04310851A - Device for inspecting soldering appearance - Google Patents
Device for inspecting soldering appearanceInfo
- Publication number
- JPH04310851A JPH04310851A JP3076655A JP7665591A JPH04310851A JP H04310851 A JPH04310851 A JP H04310851A JP 3076655 A JP3076655 A JP 3076655A JP 7665591 A JP7665591 A JP 7665591A JP H04310851 A JPH04310851 A JP H04310851A
- Authority
- JP
- Japan
- Prior art keywords
- camera
- light
- data
- captures
- pass
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005476 soldering Methods 0.000 title claims description 14
- 238000007689 inspection Methods 0.000 claims abstract description 24
- 238000005286 illumination Methods 0.000 claims description 22
- 238000006243 chemical reaction Methods 0.000 claims description 15
- 230000007547 defect Effects 0.000 abstract description 2
- 238000004806 packaging method and process Methods 0.000 abstract 1
- 230000002950 deficient Effects 0.000 description 11
- 238000004364 calculation method Methods 0.000 description 3
- 238000013500 data storage Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000000605 extraction Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
Abstract
Description
【0001】0001
【産業上の利用分野】本発明ははんだ付け外観検査装置
、特に、プリント基板上に実装された表面実装部品の実
装位置を認識し正確な位置に検査ウィンドウを発生し、
外観を検査することを特徴とするはんだ付け外観検査装
置に関する。[Industrial Field of Application] The present invention relates to a soldering appearance inspection device, in particular, a device for recognizing the mounting position of surface mount components mounted on a printed circuit board and generating an inspection window at an accurate position.
The present invention relates to a soldering appearance inspection device characterized by inspecting the appearance.
【0002】0002
【従来の技術】従来の技術としては、例えば、特開平2
−10251公報に示されているような検査装置がある
。この検査装置は、図5に示すように、プリント基板1
上に実装されている部品2に照明を照射するリング状照
明装置28と、反射光の画像を取り込むカメラ29と、
カメラ29の出力データを二値化する二値化回路30と
、反射光の明部領域を抽出する領域抽出回路31と、領
域抽出回路31の出力データから良否判定を行う判定回
路32を有している。[Prior Art] As a conventional technique, for example,
There is an inspection device as shown in Publication No.-10251. As shown in FIG. 5, this inspection device includes a printed circuit board 1
A ring-shaped illumination device 28 that illuminates the component 2 mounted above, a camera 29 that captures an image of reflected light,
It has a binarization circuit 30 that binarizes the output data of the camera 29, an area extraction circuit 31 that extracts a bright area of reflected light, and a determination circuit 32 that makes a pass/fail judgment from the output data of the area extraction circuit 31. ing.
【0003】カメラ29は、照明装置28が部品2に照
射した時の反射光を取り込み画像データを二値化回路3
0に出力する。二値化回路30は画像データを二値化す
る。ここで、はんだ付け部が良品の場合は、二値化した
画像データの中に少数の大きくて明るい領域があり、は
んだ付け部が不良品の場合は、二値化した画像データは
複雑に入り組んだ多数の小さい明部領域を含むという特
徴がある。以上のことから判定回路32は、明部領域の
数が多いときは不良と判定し、少ないときは良品と判定
する。The camera 29 captures the reflected light when the illumination device 28 irradiates the component 2 and converts the image data into a binarization circuit 3.
Output to 0. The binarization circuit 30 binarizes the image data. Here, if the soldered part is good, there are a few large and bright areas in the binarized image data, and if the soldered part is defective, the binarized image data is complicated and complicated. It is characterized by containing many small bright regions. Based on the above, the determination circuit 32 determines that the product is defective when the number of bright areas is large, and determines that the product is non-defective when the number of bright areas is small.
【0004】0004
【発明が解決しようとする課題】上述した、従来の技術
は、SOP(スモール オンライン パッケージ)
等の2方向にリードが伸びている部品のはんだ付け状態
を検査する場合、良品基準の範囲内でリード方向に実装
ずれがあると、検査箇所がその分ずれるという欠点があ
った。また、リード先端のはんだ付け部が良品のときで
も、フィレット形状が複雑で画像データの明部領域の数
が不良品のときよりも多い場合があり良否判定ミスが多
いという欠点があった。[Problems to be Solved by the Invention] The above-mentioned conventional technology is based on SOP (Small Online Package).
When inspecting the soldering condition of a component whose leads extend in two directions, such as a component with leads extending in two directions, there is a drawback that if there is a mounting deviation in the lead direction within the acceptable quality standard, the inspection location will be shifted by that amount. Further, even when the soldered portion at the tip of the lead is a good product, the fillet shape is complex and the number of bright areas in the image data is sometimes greater than when it is a defective product, so there is a drawback that there are many errors in determining the quality.
【0005】[0005]
【課題を解決するための手段】本発明のはんだ付け外観
検査装置は、プリント基板上に実装されている表面実装
部品の座標データを蓄えるメモリ部と、実装部品の胴体
部のディンプルを照らす照明と、前記照明による反射光
を取り込むカメラと、前記カメラが取り込んだ画像のア
ナログ濃淡信号をディジタル値に変換するA/D変換回
路と、前記A/D変換回路より得られたデータと該メモ
リ部のデータから実装ずれ量を計算する演算回路と、実
装ずれの良否判定を行う実装ずれ良否判定回路と、リー
ドの両側の側面を照らす照明と、前記照明による反射光
を取り込むサイド・カメラと、前記サイド・カメラが取
り込んだ画像のアナログ濃淡信号をディジタル値に変換
するA/D変換回路と、前記A/D変換回路より得られ
たデータと良否判定基準と照らし合わせ良否を判定する
良否判定回路とを含んで構成される。[Means for Solving the Problems] The soldering appearance inspection device of the present invention includes a memory section that stores coordinate data of surface-mounted components mounted on a printed circuit board, and a light that illuminates dimples on the body of the mounted component. , a camera that captures reflected light from the illumination, an A/D conversion circuit that converts analog grayscale signals of images captured by the camera into digital values, and data obtained from the A/D conversion circuit and the memory section. an arithmetic circuit that calculates the amount of mounting deviation from data; a mounting deviation judgment circuit that judges the quality of the mounting deviation; lighting that illuminates both sides of the lead; a side camera that captures light reflected by the lighting; - An A/D conversion circuit that converts the analog grayscale signal of the image captured by the camera into a digital value, and a pass/fail judgment circuit that compares the data obtained from the A/D conversion circuit with a pass/fail judgment standard to judge whether it is good or bad. It consists of:
【0006】[0006]
【実施例】次に、本発明について、図面を参照して詳細
に説明する。図1は、本発明の一実施例を示すブロック
図である。DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be explained in detail with reference to the drawings. FIG. 1 is a block diagram showing one embodiment of the present invention.
【0007】図1に示すはんだ付け外観検査装置は、実
装部品2の胴体部のディンプル3を照らす位置認識用照
明部4と、照明部4の照明光5によって得られる反射光
6を取り込むカメラ7と、カメラ7の出力である画像デ
ータbをディジタル値に変換するA/D変換回路8と、
A/D変換回路8の出力データを蓄える実装位置データ
・メモリ9と、位置データ・メモリ9に蓄えられた実装
位置データcと座標データ格納メモリ10に格納されて
いる座標データaとを比較して実装位置のずれ量dx,
dyを計算する実装ずれ量演算回路11と、良品として
許容できるずれ量の最大値とずれ量dx,dyとを比較
する実装ずれ良否判定回路12と、リードの両側に照明
光を照射する照明部15と、該照明光によって得られる
反射光を取り込むサイド・カメラ18〜21と、カメラ
18〜21の出力である画像データe〜hをディジタル
値に変換するA/D変換回路22と、実装部品のリード
の両側に検査ウィンドウを発生し、A/D変換回路22
の出力データi,iiをもとに良否判定を行なうはんだ
付け部良否判定回路23とを含んで構成される。The soldering appearance inspection apparatus shown in FIG. 1 includes a position recognition illumination section 4 that illuminates the dimples 3 on the body of the mounted component 2, and a camera 7 that takes in reflected light 6 obtained from the illumination light 5 of the illumination section 4. and an A/D conversion circuit 8 that converts image data b, which is the output of the camera 7, into digital values.
The mounting position data memory 9 stores the output data of the A/D conversion circuit 8, and the mounting position data c stored in the position data memory 9 and the coordinate data a stored in the coordinate data storage memory 10 are compared. The amount of deviation dx of the mounting position,
A mounting deviation calculation circuit 11 that calculates dy, a mounting deviation quality determination circuit 12 that compares the deviation amount dx, dy with the maximum allowable deviation amount for a non-defective product, and an illumination unit that irradiates illumination light to both sides of the lead. 15, side cameras 18 to 21 that capture reflected light obtained by the illumination light, an A/D conversion circuit 22 that converts image data e to h output from the cameras 18 to 21 into digital values, and mounted components. generates inspection windows on both sides of the leads of the A/D conversion circuit 22.
The soldering part quality determination circuit 23 performs quality determination based on the output data i and ii of the soldering part.
【0008】ほぼ真上に設置された位置認識用照明部4
は、ディンプル3に照明光5を照射し、カメラ7は反射
光8の画像を取り込む。カメラ7の出力である画像デー
タbをA/D変換回路8が、ディジタル・データに変換
し実装位置データ・メモリ9に蓄える。次に実装ずれ量
演算回路11が、図2に示すように位置データ・メモリ
9に蓄えられた実装位置データcと座標データ格納メモ
リ10に格納されている座標データaとを比較して実装
位置のずれ量dx,dyを計算する。実装ずれ良否判定
回路12は、ずれ量dx,dyとそれぞれの良品として
許容できるずれ量の最大値とを比較することによって、
実装ずれの良否判定を行う。[0008] Position recognition illumination unit 4 installed almost directly above
irradiates the dimple 3 with illumination light 5, and the camera 7 captures an image of the reflected light 8. An A/D conversion circuit 8 converts image data b, which is the output of the camera 7, into digital data and stores it in a mounting position data memory 9. Next, as shown in FIG. 2, the mounting deviation calculation circuit 11 compares the mounting position data c stored in the position data memory 9 with the coordinate data a stored in the coordinate data storage memory 10 to determine the mounting position. Calculate the amount of deviation dx, dy. The mounting deviation quality determination circuit 12 compares the deviation amounts dx and dy with the maximum value of the deviation amount that can be accepted as a non-defective product.
Determine whether or not there is any mounting misalignment.
【0009】判定回路12の判定が良品の場合は、実装
位置のずれ量dx,dyを考慮して図3(a),(b)
のようにリードの両側に検査ウィンドウを発生させる。
位置認識用照明部4と同じ高さ及び同じ軸をもち径が大
きいリング状照明部15は、図3(a)のようにリード
の両側に斜めからの照明光13,14を照射する。ここ
で、はんだ付け部が良品であれば、強い反射光16,1
7がサイド・カメラ18,19に戻るが、はんだ付け部
が不良であれば、図4(a),(b)のように反射光1
6,17は乱反射してサイド・カメラ18,19には微
弱の光しか戻らない。したがって、はんだ付け部が良品
の場合は、A/D変換回路22がサイド・カメラ18,
19の出力である画像データe,fをディジタル値に変
換した後の出力データi,iiは、比較的大きな値にな
り、不良品の場合は比較的小さな値になる。If the determination circuit 12 determines that the product is good, the results shown in FIGS.
Generate inspection windows on both sides of the lead as in A ring-shaped illumination section 15 having the same height and the same axis as the position recognition illumination section 4 and having a large diameter irradiates oblique illumination lights 13 and 14 on both sides of the lead as shown in FIG. 3(a). Here, if the soldered part is good, the strong reflected light 16,1
7 returns to the side cameras 18 and 19, but if the soldered part is defective, the reflected light 1 will return as shown in FIGS. 4(a) and 4(b).
6 and 17 are diffusely reflected and only weak light returns to the side cameras 18 and 19. Therefore, if the soldered parts are in good condition, the A/D conversion circuit 22 is connected to the side camera 18,
The output data i, ii after converting the image data e, f, which is the output of step 19, into digital values becomes a relatively large value, and in the case of a defective product, it becomes a relatively small value.
【0010】はんだ付け部良否判定回路23は、例えば
、検査ウィンドウ内のディジタル出力データi,iiの
総和が、あらかじめ設定しておくしきい値よりも大きい
値であれば“良品”、小さい値であれば“不良品”と判
定する。For example, the soldered part quality determination circuit 23 determines that if the sum of the digital output data i and ii within the inspection window is larger than a preset threshold value, it is a "good product"; If so, it is determined that the product is “defective”.
【0011】[0011]
【発明の効果】本発明のはんだ付け外観検査装置は、実
装部品の胴体部のディンプルの座標データにより、実装
ずれ量を認識する機能を含んでいるため、正確な位置に
検査ウィンドウを発生させるという効果を有する。さら
に、リード先端のフィレット部の代わりにリード両側の
側面に検査ウィンドウを発生させるため、はんだ付け状
態の良否判定がしやすく欠陥検出率が向上するという効
果を有する。[Effects of the Invention] The soldering appearance inspection device of the present invention includes a function of recognizing the amount of mounting deviation based on the coordinate data of the dimples on the body of the mounted component, and therefore generates an inspection window at an accurate position. have an effect. Furthermore, since inspection windows are generated on the side surfaces on both sides of the lead instead of the fillet portion at the tip of the lead, it is possible to easily judge whether the soldering condition is good or bad and improve the defect detection rate.
【図1】本発明の一実施例を示すブロック図である。FIG. 1 is a block diagram showing one embodiment of the present invention.
【図2】実装ずれ認識の原理を示す上面図である。FIG. 2 is a top view showing the principle of mounting deviation recognition.
【図3】(a),(b)ははんだ付け部が良品の場合の
反射光の様子を示す正面図および側面図である。FIGS. 3(a) and 3(b) are a front view and a side view showing the state of reflected light when the soldered part is non-defective.
【図4】(a),(b)ははんだ付け部が不良品の場合
の反射光の様子を示す正面図および側面図である。FIGS. 4(a) and 4(b) are a front view and a side view showing the state of reflected light when the soldered part is a defective product.
【図5】従来の一例を示すブロック図である。FIG. 5 is a block diagram showing a conventional example.
1 基板
2 実装部品
3 ディンプル
4 位置認識用照明部
5,13,14 照明光
6,16,17 反射光
7,29 カメラ
8,22 A/D変換回路
9 実装位置データ・メモリ
10 座標データ格納メモリ
11 実装ずれ量演算回路
12 実装ずれ良否判定回路
15 はんだ付け部照明部
18,19,20,21 サイド・カメラ23
はんだ付け部良否判定回路24 リード
25 パッド
26 検査ウィンドウ
27 はんだ
28 リング状照明装置
30 二値化回路
31 領域抽出回路
32 判定回路
a 座標データ
b,e,f,g,h 画像データc 実装
位置データ
dx,dy 実装位置のずれ量
i,ii ディジタル・データ1 Board 2 Mounted component 3 Dimple 4 Position recognition illumination section 5, 13, 14 Illumination light 6, 16, 17 Reflected light 7, 29 Camera 8, 22 A/D conversion circuit 9 Mounting position data memory 10 Coordinate data storage memory 11 Mounting deviation amount calculation circuit 12 Mounting deviation quality judgment circuit 15 Soldering section illumination section 18, 19, 20, 21 Side camera 23
Soldered part quality judgment circuit 24 Lead 25 Pad 26 Inspection window 27 Solder 28 Ring-shaped illumination device 30 Binarization circuit 31 Area extraction circuit 32 Judgment circuit a Coordinate data b, e, f, g, h Image data c Mounting position data dx, dy Mounting position deviation amount i, ii Digital data
Claims (3)
実装部品の座標データを蓄えるメモリ部と、実装部品の
胴体部のディンプルを照らす照明と、前記照明による反
射光を取り込むカメラと、前記カメラが取り込んだ画像
のアナログ濃淡信号をディジタル値に変換するA/D変
換回路と、前記A/D変換回路より得られたデータと該
メモリ部のデータから実装ずれ量を計算する演算回路と
、実装ずれの良否判定を行う実装ずれ良否判定回路と、
リードの両側の側面を照らす照明と、前記照明による反
射光を取り込むサイド・カメラと、前記サイド・カメラ
が取り込んだ画像のアナログ濃淡信号をディジタル値に
変換するA/D変換回路と、前記A/D変換回路より得
られたデータと良否判定基準と照らし合わせ良否を判定
する良否判定回路とを含むことを特徴とするはんだ付け
外観検査装置。1. A memory unit that stores coordinate data of a surface mount component mounted on a printed circuit board, a light that illuminates a dimple on a body of the mounted component, a camera that captures light reflected by the light, and a camera that captures light reflected from the light. An A/D conversion circuit that converts the analog grayscale signal of the captured image into a digital value, an arithmetic circuit that calculates the mounting deviation amount from the data obtained from the A/D conversion circuit and the data in the memory section, and the mounting deviation. a mounting deviation pass/fail judgment circuit for judging the pass/fail of the
a side camera that captures light reflected by the illumination; an A/D conversion circuit that converts analog grayscale signals of images captured by the side camera into digital values; 1. A soldering appearance inspection device comprising a pass/fail judgment circuit that compares data obtained from a D conversion circuit with a pass/fail judgment standard to judge pass/fail.
胴体部のディンプルに照明光を照射する照明装置と、そ
の反射光を取り込むカメラと、前記カメラの画像データ
により実装位置を認識する認識手段と、前記認識手段に
より正確な位置に検査ウィンドウを発生する発生手段と
を含むことを特徴とするはんだ付け外観検査装置。[Claim 2] IC mounted on a printed circuit board
An illumination device that irradiates illumination light onto the dimples of the body, a camera that captures the reflected light, a recognition device that recognizes a mounting position based on image data from the camera, and an inspection window that is generated at an accurate position by the recognition device. 1. A soldering appearance inspection device comprising a generating means.
ドの側面に照射光を照射する照明装置と、その反射光の
画像を取り込むカメラと、リードの側面に検査ウィンド
ウを発生しそのウィンドウ内の画像データをもとに良否
判定を行う良否判定手段とを含むことを特徴とするはん
だ付け外観検査装置。3. An illumination device that irradiates the side surface of a lead of a surface-mounted component on a printed circuit board, a camera that captures an image of the reflected light, and an inspection window that generates an inspection window on the side surface of the lead and an image within the window. 1. A soldering appearance inspection apparatus comprising: a quality determination means for determining quality based on data.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3076655A JPH04310851A (en) | 1991-04-10 | 1991-04-10 | Device for inspecting soldering appearance |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3076655A JPH04310851A (en) | 1991-04-10 | 1991-04-10 | Device for inspecting soldering appearance |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH04310851A true JPH04310851A (en) | 1992-11-02 |
Family
ID=13611420
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3076655A Pending JPH04310851A (en) | 1991-04-10 | 1991-04-10 | Device for inspecting soldering appearance |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH04310851A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010528318A (en) * | 2007-05-29 | 2010-08-19 | コグネックス・テクノロジー・アンド・インベストメント・コーポレーション | 3D assembly inspection with 2D images |
KR101222788B1 (en) * | 2010-08-18 | 2013-01-15 | 삼성전기주식회사 | Dimple inspection device and method thereof |
JP2020040089A (en) * | 2018-09-10 | 2020-03-19 | オー・エム・シー株式会社 | Laser type soldering method and device |
-
1991
- 1991-04-10 JP JP3076655A patent/JPH04310851A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010528318A (en) * | 2007-05-29 | 2010-08-19 | コグネックス・テクノロジー・アンド・インベストメント・コーポレーション | 3D assembly inspection with 2D images |
KR101222788B1 (en) * | 2010-08-18 | 2013-01-15 | 삼성전기주식회사 | Dimple inspection device and method thereof |
JP2020040089A (en) * | 2018-09-10 | 2020-03-19 | オー・エム・シー株式会社 | Laser type soldering method and device |
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