JPH04140650A - Apparatus for inspecting printed circuit board - Google Patents

Apparatus for inspecting printed circuit board

Info

Publication number
JPH04140650A
JPH04140650A JP26048090A JP26048090A JPH04140650A JP H04140650 A JPH04140650 A JP H04140650A JP 26048090 A JP26048090 A JP 26048090A JP 26048090 A JP26048090 A JP 26048090A JP H04140650 A JPH04140650 A JP H04140650A
Authority
JP
Japan
Prior art keywords
image data
soldering
defective
soldered
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP26048090A
Other languages
Japanese (ja)
Inventor
Jiyunichi Tatehora
淳一 舘洞
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP26048090A priority Critical patent/JPH04140650A/en
Publication of JPH04140650A publication Critical patent/JPH04140650A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To efficiently determine whether soldering is good or defective in a short time by detecting rises in temperature of all soldered parts by image data and comparing the image data with stored image data of a good product. CONSTITUTION:A laser generator 4 applies laser light by a control signal of an interface unit 9. An infrared camera 5 measures temperature of a soldered part 7, makes distribution of the temperature into a visual signal, and an image processing circuit 8 converts the visual signal obtained by the camera 5 into a digital signal and also calculates data of an image data storage unit 11. The soldered part 7 to which the laser light from the generator 4 has been applied generates heat to emit infrared rays while the camera 5 converts the emission amount into a visual signal and sends it to the circuit 8. The circuit 8 converts the visual signal into a digital signal and stores in the storage unit 11, and by logic calculation with the data to be inspected and stored data of a good product, it is possible to efficiently determine whether soldering is good or defective in a short time.

Description

【発明の詳細な説明】 〔発明の目的〕 (産業上の利用分野) 本発明はプリント板のはんだ付けの良否を効率良く判定
するプリント板検査装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Object of the Invention] (Industrial Application Field) The present invention relates to a printed board inspection device that efficiently determines the quality of soldering on a printed board.

(従来の技術) プリント板の高密度化、大容量化、小型化が急ピッチで
進められ、それに伴ない部品の小型化が図られ、表面実
装技術が広く使用されてきた。
(Prior Art) The density, capacity, and size of printed circuit boards have been rapidly increased, and as a result, components have been made smaller and surface mounting technology has come into wide use.

このような産業上の要求を背景にプリント配線板と電子
部品を接続するはんだ付の微細化が行なわれている。し
かし、はんだによる接続技術ははんだブリッジ、ブロー
ホール等の製造欠陥を発生する。しかしはんだ欠陥を発
見する方法はr人間が目視で検査する方法」が主である
ため、はんだ付け個所の微細化に伴ないはんだ付部分の
検査は、人間の目視では不可能となってきている。
Against the background of such industrial demands, miniaturization of soldering for connecting printed wiring boards and electronic components is being carried out. However, solder connection techniques produce manufacturing defects such as solder bridges and blowholes. However, the main method of detecting solder defects is through visual inspection by humans, and as soldering points become smaller, it is becoming impossible to inspect soldered areas by human visual inspection. .

又、目視検査に代わるものとして、第4図に示すような
レーザを利用した検査装置が開発されてきた。この原理
は、はんだ付け部分7にレーザーを照射し、照射面で生
じる温度上昇を赤外線検出器21により検出し、一定温
度に上昇する時間を測定してはんだ付の良否判定を行な
うものである。
Furthermore, as an alternative to visual inspection, an inspection device using a laser as shown in FIG. 4 has been developed. This principle is to irradiate the soldering part 7 with a laser, detect the temperature rise that occurs on the irradiated surface with the infrared detector 21, and measure the time it takes for the temperature to rise to a certain level to determine whether the soldering is good or bad.

(発明が解決しようとする課題) しかし、従来の検査方法では良否の判定に時間がかかり
、また1判定の内容が不明確であるという問題がある。
(Problems to be Solved by the Invention) However, conventional inspection methods have problems in that it takes time to determine pass/fail, and the content of one determination is unclear.

すなわち、従来の検査方法では1ポイントの検査に要す
る時間が1.00m5程度必要であり、点数が増える程
時間がかかる。また、レーザー照射面の温度上昇が一定
時間内に認められるか否かで良否判定を行なうため不良
内容が明確でなく、又、はんだ付けの過不足でも温度上
昇時間にばらつきが生じ良好なはんだ付け状態でも不良
と判定したりして測定精度に問題があった。
That is, in the conventional inspection method, the time required to inspect one point is about 1.00 m5, and as the number of points increases, it takes more time. In addition, since pass/fail judgment is made based on whether or not the temperature rise of the laser irradiated surface is observed within a certain period of time, the details of the defect are not clear, and the temperature rise time may vary due to oversoldering or undersoldering. There were problems with measurement accuracy, as the product was judged to be defective even when the product was in poor condition.

本発明は上記問題点に鑑みてなされたもので、短時間に
効率良くはんだ付けの良否を判定し、しかも不良状態の
判定も行うことのできるプリント板検査装置を得ること
を目的としている。
The present invention has been made in view of the above-mentioned problems, and an object of the present invention is to provide a printed board inspection device that can efficiently determine the quality of soldering in a short time and can also determine defective states.

〔発明の構成〕[Structure of the invention]

(課題を解決するための手段及び作用)本発明は、上記
目的を達成するために、多数の電子部品がはんだ付けに
よって実装されたプリント板のはんだ付け部にレーザー
光を照射し、その温度上昇からはんだ付け部の良否を判
定する装置において、多数のはんだ付け部に順次レーザ
ー光をスキャン照射する手段と、全部のはんだ付け部の
温度上昇を画像データで検出する赤外線カメラと、上記
画像データを予め記憶された良品の画像データと比較し
てはんだ付け部の不良個所及び不良状態を判定する画像
処理手段を設けたプリント板検査装置である。
(Means and Effects for Solving the Problems) In order to achieve the above object, the present invention irradiates a laser beam onto a soldered part of a printed circuit board on which a large number of electronic components are mounted by soldering, thereby increasing the temperature of the soldered part. A device for determining the quality of soldered parts from scratch includes means for sequentially scanning and irradiating a large number of soldered parts with laser light, an infrared camera for detecting temperature rises in all soldered parts using image data, and This printed board inspection device is equipped with an image processing means that compares with pre-stored image data of non-defective products to determine defective locations and defective states of soldered parts.

(実施例) 本発明の一実施例を図面を参照して説明する。(Example) An embodiment of the present invention will be described with reference to the drawings.

第1図は本発明による実施例のブロック図である。FIG. 1 is a block diagram of an embodiment according to the invention.

1ははんだ付検査装置の命令9判定、処理9表示、デー
タの入出力を行う計算機、2はXY子テーブル構部3に
対して計算機1より受けた位置データをもとに位置制御
信号を出力するXY子テーブル御部。4はインターフェ
ース部9の制御信号によりレーザー光を照射するレーザ
ー発生器。6ははんだ付け検査部7でレーザー発生器よ
り照射されたレーザー光が焦点を結ぶよう調節するレー
ザー光調節レンズ。5ははんだ付け検査部7の温度を測
定し温度の分布状態を映像信号にする赤外線カメラ。8
は、赤外線カメラ5で得られた映像信号をデジタル信号
に変換するとともに画像データ記憶部11のデータを演
算しかつはんだ付けの良否判定をする画像処理回路。1
1は、映像信号をデジタル化した未加工のデータを保管
する被試験データ記憶部とはんだ付け良否判定の基準値
を保管する良品データ記憶部と良否判定結果を保管する
比較データ記憶部の3つからなる画像データ記憶部。9
は計算機1の指令によりレーザー発生器4への指令送出
と画像処理回路8への制御命令の送出と処理結果を受信
し計算機1へはんだ付け良否判定結果を送出する機能を
果すインターフェース部。10は、画像処理回路8のデ
ータを映像化する表示装置である。
1 is a computer that performs command 9 judgment, processing 9 display, and data input/output of the soldering inspection device; 2 outputs a position control signal to the XY child table structure 3 based on the position data received from the computer 1; XY child table gobe. 4 is a laser generator that irradiates laser light according to a control signal from the interface section 9; Reference numeral 6 denotes a laser light adjustment lens that adjusts the focus of the laser light emitted from the laser generator in the soldering inspection section 7. 5 is an infrared camera that measures the temperature of the soldering inspection section 7 and converts the temperature distribution state into a video signal. 8
An image processing circuit converts the video signal obtained by the infrared camera 5 into a digital signal, calculates data in the image data storage section 11, and determines the quality of soldering. 1
1 consists of three parts: a test data storage section that stores unprocessed data obtained by digitizing video signals, a non-defective data storage section that stores standard values for soldering pass/fail judgments, and a comparison data storage section that stores pass/fail judgment results. An image data storage unit consisting of. 9
Reference numeral 1 denotes an interface unit which performs the functions of sending commands to the laser generator 4 and control commands to the image processing circuit 8, receiving processing results, and sending a soldering quality determination result to the computer 1 according to the commands of the computer 1. 10 is a display device that visualizes the data of the image processing circuit 8.

計算機1は検査を開始しようとするはんだ付け部位置デ
ータを検査情報記憶12より読み込みXY子テーブル御
部2に出力する。XY子テーブル御部2はXY子テーブ
ル構部3を制御しはんだ付け部位置データをもとにレー
ザー発生器4より照射するレーザー光の照射面がはんだ
付け検査部7に焦点を結ぶように動かす。指定位置への
動作が終了すると計算機1はインターフェース部9を介
してレーザー発生器4ヘレーザー照射を開始させるスタ
ート信号を出す。そして命令を受けたレーザー発生器は
指定された時間だけレーザー光を照射する。レーザー光
はレーザー光調節レンズ6を通り反射鏡13で焦点を結
ぶよう調整されている。反射鏡駆動部14はインターフ
ェース部9からの制御信号により反射鏡13の角度を変
え、XY子テーブル構部3を動かさなくても、レーザー
光照射点を変えることができ、多数のはんだ付け検査部
7の場所を高速スキャンを繰返し同時に加熱することが
できる。レーザー光が照射されたはんだ付け検査部7は
発熱し赤外線を放射する。放射量はレーザー光の強度と
照射時間、照射面の熱容量に左右される。レーザー光の
強度と照射時間が一定であれば、電子部品とはんだ付け
状態により決定される熱容量で決まる赤外線放射量を測
定し、はんだ付けの良否判定ができる。赤外線カメラ5
ではんだ付け検査部の赤外線放射量は映像信号に変換さ
れ画像処理回路8に送られる。
The computer 1 reads soldering part position data for which inspection is to be started from the inspection information storage 12 and outputs it to the XY child table controller 2. The XY child table control unit 2 controls the XY child table structure 3 and moves it based on the soldering part position data so that the irradiation surface of the laser beam irradiated from the laser generator 4 focuses on the soldering inspection part 7. . When the movement to the specified position is completed, the computer 1 issues a start signal to the laser generator 4 via the interface section 9 to start laser irradiation. The laser generator receives the command and emits laser light for the specified time. The laser beam is adjusted so as to pass through a laser beam adjustment lens 6 and be focused by a reflecting mirror 13. The reflector drive unit 14 changes the angle of the reflector 13 according to the control signal from the interface unit 9, and can change the laser beam irradiation point without moving the XY child table structure 3. 7 locations can be heated simultaneously by repeating high-speed scanning. The soldering inspection section 7 irradiated with the laser light generates heat and emits infrared rays. The amount of radiation depends on the intensity of the laser beam, the irradiation time, and the heat capacity of the irradiated surface. If the intensity and irradiation time of the laser beam are constant, it is possible to determine the quality of soldering by measuring the amount of infrared radiation, which is determined by the heat capacity determined by the electronic component and the soldering state. Infrared camera 5
The amount of infrared radiation from the soldering inspection section is converted into a video signal and sent to the image processing circuit 8.

画像処理回路8では、赤外線カメラ5より送られてきた
映像信号をデジタル信号に変換し画像データ記憶部11
の被試験データ領域に保管する。さらに画像処理回路8
はこの被試験データとあらかじめ保管しておいたはんだ
付け良否判定の基準となる良品データを論理演算するこ
とにより比較データを算出し、この比較データを分析し
はんだ付けの良否判定をする。そしてインターフェース
回路9を通して計算機1に良否判定結果を送出する。
The image processing circuit 8 converts the video signal sent from the infrared camera 5 into a digital signal and stores it in the image data storage section 11.
Stored in the data area under test. Furthermore, the image processing circuit 8
calculates comparison data by performing a logical operation on this test data and previously stored non-defective data that serves as a standard for determining the quality of soldering, and analyzes this comparison data to determine the quality of soldering. Then, the pass/fail determination result is sent to the computer 1 through the interface circuit 9.

又、表示装置10は、はんだ付け部の画像と異常値内容
を表示する。このような働きによりはんだ付けの検査を
実施する。
Further, the display device 10 displays an image of the soldering part and the contents of the abnormal value. Soldering inspection is carried out by this function.

第2図は、はんだ付け検査部7を具体的に示した図で、
角チツプ抵抗器7aがプリント基板7bのパット7cに
はんだ7dによって取付けられた例である。
FIG. 2 is a diagram specifically showing the soldering inspection section 7.
This is an example in which a square chip resistor 7a is attached to a pad 7c of a printed circuit board 7b with solder 7d.

また、その下にレーザー照射後のはんだ付け部の温度分
布を示したものである。A、Hの矢印はレーザー光の照
射位置を示す。A側ははんだ不足、B側ははんだ過多の
状態例である。この場合、A側は照射点の熱容量が小さ
く温度ピークTAが高く、B側は熱容量が大きく温度ピ
ークTBが低くなる。温度ピーク下工が所定範囲内(T
L<T工〈THンであるとき、その検査部工をはんだ付
け良好と判断しそれ以外を不良と判断する。
The temperature distribution of the soldered part after laser irradiation is also shown below. Arrows A and H indicate the irradiation position of the laser beam. The A side is an example of a lack of solder, and the B side is an example of an excess of solder. In this case, the A side has a small heat capacity at the irradiation point and a high temperature peak TA, and the B side has a large heat capacity and a low temperature peak TB. The temperature peak work is within the specified range (T
When L<T<TH>, the inspection department is judged to have good soldering, and the others are judged to be defective.

第3図(a)は、sopタイプのICl3のリード16
がプリント基板7bのパッド7cにはんだ付けされた状
態を検査する場合の例である。
Figure 3(a) shows the lead 16 of sop type ICl3.
This is an example of inspecting the state in which the pad 7c of the printed circuit board 7b is soldered.

同図C部は、ICリード16aがオープンの不良。Section C in the figure shows a defective IC lead 16a that is open.

同図り部ははんだブリッジ不良の例である。この状態で
レーザ光が挿着パット7C上のはんだ接合部7dに照射
されると、第3図(b)のような画像データが検出され
、画像データ記憶部11に保管される。
The illustrated area is an example of a solder bridge defect. When the solder joint 7d on the insertion pad 7C is irradiated with laser light in this state, image data as shown in FIG. 3(b) is detected and stored in the image data storage section 11.

この画像データは、画像データ記憶部11に別に保管さ
れている第3図(c)に示す良品の画像データと比較さ
れ、排他的論理和処理により第3図(d)のような0部
とD部の異常個所のみ抽出された画像データが得られる
This image data is compared with the image data of a non-defective item shown in FIG. 3(c), which is stored separately in the image data storage unit 11, and is determined to have a 0 copy as shown in FIG. 3(d) by exclusive OR processing. Image data is obtained in which only the abnormal portion of portion D is extracted.

これによりはんだ付け部の異常個所を容易に判断するこ
とができる。また、第3図の(b)と(d)の画像デー
タの論理積から第3図(e)の画像データを得、(d)
の画像データと比較して異常データが消えてしまう0部
は未はんだ不良、残っているD部ははんだブリッジ不良
と判定することができる。
This makes it possible to easily determine abnormalities in the soldered portion. Furthermore, the image data in FIG. 3(e) is obtained from the AND of the image data in FIG. 3(b) and (d), and the image data in FIG. 3(d) is
It can be determined that part 0, where the abnormal data disappears, is defective due to unsoldering, and part D, which remains, is defective due to solder bridging.

〔発明の効果〕〔Effect of the invention〕

本発明によれば多数のはんだ接合部にレーザー光を順次
スキャン照射してその温度上昇を赤外線カメラで検出し
、その画像を一括処理することにより検査時間が短縮さ
れ、又1画像データを解析しはんだ付け不良の個所や種
類、はんだ接合面の形状を識別することができる。効率
良くはんだ付けの良否を判定することのできるプリント
板検査装置を得ることができる。
According to the present invention, a large number of solder joints are sequentially scanned with laser light, the temperature rise is detected by an infrared camera, and the images are processed all at once, thereby shortening the inspection time. It is possible to identify the location and type of soldering defects and the shape of the solder joint surface. It is possible to obtain a printed board inspection device that can efficiently determine the quality of soldering.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は1本発明の一実施例の構成図、第2図、第3図
は上記実施例によりはんだ付け不良の抽出過程を説明す
るための図、第4図は従来技術の説明図である。 1・・・計算機 2・・・XY子テーブル御部 3・・・xy子テーブル構部 4・・・レーザ発生器 6・・・レーザー光調節レンズ 7・・・はんだ付け検査部  8・・・画像処理回路9
・・・インターフェース部 10・・・表示装置11・
・・画像データ記憶部  工2・・・検査情報記憶13
・・・反射鏡       14・・・反射鏡駆動部5
・・・赤外線カメラ
Figure 1 is a block diagram of one embodiment of the present invention, Figures 2 and 3 are diagrams for explaining the process of extracting soldering defects according to the above embodiment, and Figure 4 is an explanatory diagram of the prior art. be. 1...Calculator 2...XY child table control section 3...XY child table structure section 4...Laser generator 6...Laser light adjustment lens 7...Soldering inspection section 8... Image processing circuit 9
...Interface section 10...Display device 11.
...Image data storage unit Engineering 2...Inspection information storage 13
...Reflector 14...Reflector drive unit 5
...Infrared camera

Claims (1)

【特許請求の範囲】[Claims]  多数の電子部品がはんだ付けによって実装されたプリ
ント板のはんだ付け部にレーザー光を照射し、その温度
上昇からはんだ付け部の良否を判定する装置において、
多数のはんだ付け部に順次レーザー光をスキャン照射す
る手段と、全部のはんだ付け部の温度上昇を画像データ
で検出する赤外線カメラと、上記画像データを予め記憶
された良品の画像データと比較してはんだ付け部の不良
個所及び不良状態を判定する画像処理手段を設けたこと
を特徴とするプリント板検査装置。
A device that irradiates laser light onto the soldered parts of a printed circuit board on which many electronic components are soldered, and determines the quality of the soldered parts based on the temperature rise.
A means to sequentially scan and irradiate a large number of soldered parts with laser light, an infrared camera that detects the temperature rise of all soldered parts using image data, and a comparison of the above image data with pre-stored image data of non-defective products. 1. A printed board inspection device comprising image processing means for determining defective locations and defective states of soldered parts.
JP26048090A 1990-10-01 1990-10-01 Apparatus for inspecting printed circuit board Pending JPH04140650A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26048090A JPH04140650A (en) 1990-10-01 1990-10-01 Apparatus for inspecting printed circuit board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26048090A JPH04140650A (en) 1990-10-01 1990-10-01 Apparatus for inspecting printed circuit board

Publications (1)

Publication Number Publication Date
JPH04140650A true JPH04140650A (en) 1992-05-14

Family

ID=17348544

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26048090A Pending JPH04140650A (en) 1990-10-01 1990-10-01 Apparatus for inspecting printed circuit board

Country Status (1)

Country Link
JP (1) JPH04140650A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0832226A (en) * 1994-07-21 1996-02-02 Nec Gumma Ltd Method and apparatus for laser reflow
GB2358466A (en) * 2000-01-18 2001-07-25 Cindy Maria Marcella Motmans Testing interconnections in an electronic circuit assembly by thermal conduction detection.

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0832226A (en) * 1994-07-21 1996-02-02 Nec Gumma Ltd Method and apparatus for laser reflow
GB2358466A (en) * 2000-01-18 2001-07-25 Cindy Maria Marcella Motmans Testing interconnections in an electronic circuit assembly by thermal conduction detection.

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