JPH0430488Y2 - - Google Patents
Info
- Publication number
- JPH0430488Y2 JPH0430488Y2 JP1985187733U JP18773385U JPH0430488Y2 JP H0430488 Y2 JPH0430488 Y2 JP H0430488Y2 JP 1985187733 U JP1985187733 U JP 1985187733U JP 18773385 U JP18773385 U JP 18773385U JP H0430488 Y2 JPH0430488 Y2 JP H0430488Y2
- Authority
- JP
- Japan
- Prior art keywords
- ray
- ray generator
- angle
- inspected
- arm member
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985187733U JPH0430488Y2 (enrdf_load_stackoverflow) | 1985-12-05 | 1985-12-05 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985187733U JPH0430488Y2 (enrdf_load_stackoverflow) | 1985-12-05 | 1985-12-05 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62115149U JPS62115149U (enrdf_load_stackoverflow) | 1987-07-22 |
| JPH0430488Y2 true JPH0430488Y2 (enrdf_load_stackoverflow) | 1992-07-23 |
Family
ID=31138468
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1985187733U Expired JPH0430488Y2 (enrdf_load_stackoverflow) | 1985-12-05 | 1985-12-05 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0430488Y2 (enrdf_load_stackoverflow) |
-
1985
- 1985-12-05 JP JP1985187733U patent/JPH0430488Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS62115149U (enrdf_load_stackoverflow) | 1987-07-22 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US7099432B2 (en) | X-ray inspection apparatus and X-ray inspection method | |
| US5792146A (en) | Rectilinear linac phantom pointer system | |
| JP5221604B2 (ja) | X線検査装置 | |
| JPH02503989A (ja) | X線撮影又は同類に関する方法及び装置 | |
| CN1045520A (zh) | X射线检查装置 | |
| JP2006509554A (ja) | 校正手段を持つc−アームx線装置 | |
| JP4386812B2 (ja) | X線検査装置 | |
| JP2015167603A (ja) | 撮影台 | |
| US4349917A (en) | Tomographic method and apparatus | |
| US5712895A (en) | Rotational digital subtraction angiography phantom | |
| CN114295650A (zh) | X射线ct检测装置及检测方法 | |
| JP2004226127A (ja) | 基板検査方法 | |
| JPH0430488Y2 (enrdf_load_stackoverflow) | ||
| US10485494B2 (en) | Holding tray and bucky image capturing table | |
| US5113425A (en) | X-ray inspection system for electronic components | |
| JP2000316845A (ja) | X線診断装置 | |
| CN105554395A (zh) | 用于线阵相机和线型光源的调准检测装置 | |
| US3846632A (en) | Closed-circuit tv inspection x-ray microscope | |
| JP2005353712A (ja) | X線透視カメラを含む半田付装置 | |
| JP2002162370A (ja) | 基板のx線検査方法及びそれに用いるx線検査装置 | |
| JP2001281168A (ja) | X線透視検査装置 | |
| JPH03209119A (ja) | X線ct装置 | |
| JP2013137287A (ja) | 断層撮影装置 | |
| US6309103B1 (en) | X-ray image apparatus having calculating means for calculating the observing area in the subject | |
| JP2000356606A (ja) | X線透過検査装置 |