JPH04298019A - Quantum well structure and its manufacture - Google Patents
Quantum well structure and its manufactureInfo
- Publication number
- JPH04298019A JPH04298019A JP3063437A JP6343791A JPH04298019A JP H04298019 A JPH04298019 A JP H04298019A JP 3063437 A JP3063437 A JP 3063437A JP 6343791 A JP6343791 A JP 6343791A JP H04298019 A JPH04298019 A JP H04298019A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor layer
- quantum well
- well structure
- semiconductor
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004519 manufacturing process Methods 0.000 title description 8
- 239000004065 semiconductor Substances 0.000 claims abstract description 44
- 239000000758 substrate Substances 0.000 claims abstract description 11
- 238000005530 etching Methods 0.000 claims abstract description 10
- 239000011796 hollow space material Substances 0.000 claims description 3
- 239000000463 material Substances 0.000 claims description 2
- 230000000694 effects Effects 0.000 abstract description 10
- 230000004888 barrier function Effects 0.000 abstract description 9
- 230000005640 de Broglie wave Effects 0.000 abstract 1
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 description 7
- 238000000034 method Methods 0.000 description 6
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 4
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 229910004205 SiNX Inorganic materials 0.000 description 1
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 1
- 229910052681 coesite Inorganic materials 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- 125000005842 heteroatom Chemical class 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
Abstract
Description
【0001】0001
【産業上の利用分野】本発明は、発光デバイス、電子走
行デバイス等に使用する量子井戸構造体及びその製造方
法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a quantum well structure used in light emitting devices, electron transport devices, etc., and a method for manufacturing the same.
【0002】0002
【従来の技術】従来の量子井戸構造体は、例えばバンド
ギャップのことなる2種の半導体を積層することにより
構成されていた。このような量子井戸構造体では、ドブ
ロイ波長程度の厚さを有し、かつ、小さなバンドギャッ
プを有する半導体層を、大きなバンドギャップを有する
半導体層で挟むことが一般的に行われていた。このため
、このような量子井戸構造体における量子効果は、これ
ら大小バンドギャップの差に起因するヘテロ障壁が大き
いほど大きくなるという特徴があった。2. Description of the Related Art Conventional quantum well structures have been constructed by laminating, for example, two types of semiconductors with different band gaps. In such a quantum well structure, a semiconductor layer having a thickness on the order of the de Broglie wavelength and a small bandgap is generally sandwiched between semiconductor layers having a large bandgap. For this reason, the quantum effect in such a quantum well structure has a characteristic that the larger the heterobarrier caused by the difference in the band gap, the larger the quantum effect becomes.
【0003】0003
【発明が解決しようとする課題】しかしながら、上記の
量子井戸構造体のような半導体同士の接合では、このヘ
テロ障壁が高々1eV程度であったため、十分な量子効
果を達成することができない場合があった。[Problems to be Solved by the Invention] However, in the junction between semiconductors such as the quantum well structure described above, this hetero barrier is about 1 eV at most, so it may not be possible to achieve a sufficient quantum effect. Ta.
【0004】そこで本発明は、十分な量子効果を達成す
ることができる量子井戸構造体であって、これを組み込
んだ発光デバイス、電子走行デバイス等の諸特性の向上
を可能にする量子井戸構造体およびその製造方法を提供
することを目的とする。Therefore, the present invention provides a quantum well structure that can achieve a sufficient quantum effect, and that makes it possible to improve various characteristics of light emitting devices, electron transport devices, etc. incorporating the quantum well structure. The purpose is to provide a method for producing the same.
【0005】[0005]
【課題を解決するための手段】上記目的を達成するため
、本発明に係る量子井戸構造体は、(a)ド・ブロイ波
長程度の厚さを有する層状の半導体領域と、(b)半導
体領域の一部を基板上の中空に支持する支持手段とを備
えることとしている。[Means for Solving the Problems] In order to achieve the above object, a quantum well structure according to the present invention includes (a) a layered semiconductor region having a thickness of approximately the de Broglie wavelength; and (b) a semiconductor region. and support means for supporting a portion of the substrate in a hollow space above the substrate.
【0006】また、本発明に係る量子井戸構造体の製造
方法は、(a)基板上に第1の半導体層を成長する工程
と、(b)第1の半導体層上にド・ブロイ波長程度の厚
さを有する第2の半導体層を成長する工程と、(c)第
1および第2の半導体層の所定部分にエッチングを施し
、第1および第2の半導体層を含むメサ状領域を形成す
る工程と、(d)メサ状領域の段差部分に開口を有する
マスクを形成する工程と、(e)マスクの開口に材料選
択性のエッチングを施し、第1の半導体層の所定部分を
除去する工程とを備えることとしている。The method for manufacturing a quantum well structure according to the present invention also includes the steps of (a) growing a first semiconductor layer on a substrate; (c) etching predetermined portions of the first and second semiconductor layers to form a mesa-shaped region including the first and second semiconductor layers; (d) forming a mask having an opening in the stepped portion of the mesa-shaped region; and (e) performing material-selective etching on the opening of the mask to remove a predetermined portion of the first semiconductor layer. It is planned to have a process.
【0007】[0007]
【作用】上記の量子井戸構造体によれば、支持手段がド
・ブロイ波長程度の厚さを有する層状の半導体領域の一
部を基板上の中空に支持する。このため、中空に支持さ
れた半導体領域の表面には真空障壁が形成され、効果的
な量子効果を得ることができる。According to the quantum well structure described above, the supporting means supports a part of the layered semiconductor region having a thickness of approximately the de Broglie wavelength in a hollow space above the substrate. Therefore, a vacuum barrier is formed on the surface of the semiconductor region supported in the air, and an effective quantum effect can be obtained.
【0008】また、上記の量子井戸構造体の製造方法に
よれば、基板とド・ブロイ波長程度の厚さの第2の半導
体層との間に第2の半導体層を支持することになる第1
の半導体層を予め設け、この第1の半導体層をエッチン
グにより部分的に除去している。このため、第2の半導
体層を簡易に中空に支持することができ、ド・ブロイ波
長程度の厚さの第2の半導体層の表面に量子効果を効果
的に達成し得る真空障壁を形成できる。Further, according to the method for manufacturing a quantum well structure described above, a second semiconductor layer supporting the second semiconductor layer is formed between the substrate and the second semiconductor layer having a thickness of approximately the de Broglie wavelength. 1
A semiconductor layer is provided in advance, and this first semiconductor layer is partially removed by etching. Therefore, the second semiconductor layer can be easily supported in the air, and a vacuum barrier that can effectively achieve the quantum effect can be formed on the surface of the second semiconductor layer with a thickness of approximately the de Broglie wavelength. .
【0009】[0009]
【実施例】図1は、実施例の量子井戸構造体の製造方法
を示す。EXAMPLE FIG. 1 shows a method of manufacturing a quantum well structure according to an example.
【0010】まず、InP基板上10上にInP層12
とGaInAs層14とを交互に格子整合させてエピタ
キシャル成長し、積層構造を形成する(図1(a))。
これらの層12、14の厚さはド・ブロイ波長程度とす
る。次に、層12、14からなる積層構造上に適当なマ
スクを形成してエッチングし、層12、14からなるメ
サ状領域20を形成する(図1(b))。この後、この
メサ状領域20の中央部を横切るような開口領域を残し
てSiO2 、SiNX 等のマスクを形成し、塩酸を
主成分とするエッチング液でこの開口領域にエッチング
を施す。この場合、開口領域内で層12、14の断面が
形成されているので、この断面からInP層12が浸食
される。その後マスクを除去すると量子井戸構造体が得
られる(図1(c))。つまり、残留したInP層12
に支持されたGaInAs層14の上下表面が中空に露
出する。このGaInAs層14が量子井戸層となる。First, an InP layer 12 is formed on an InP substrate 10.
and GaInAs layers 14 are alternately lattice-matched and epitaxially grown to form a laminated structure (FIG. 1(a)). The thickness of these layers 12 and 14 is approximately the de Broglie wavelength. Next, a suitable mask is formed on the laminated structure consisting of the layers 12 and 14 and etching is performed to form a mesa-shaped region 20 consisting of the layers 12 and 14 (FIG. 1(b)). Thereafter, a mask made of SiO2, SiNX, etc. is formed leaving an opening area across the center of the mesa-shaped region 20, and this opening area is etched using an etching solution containing hydrochloric acid as a main component. In this case, since the cross section of the layers 12 and 14 is formed within the opening region, the InP layer 12 is eroded from this cross section. Thereafter, the mask is removed to obtain a quantum well structure (FIG. 1(c)). In other words, the remaining InP layer 12
The upper and lower surfaces of the GaInAs layer 14 supported by the GaInAs layer 14 are exposed in the air. This GaInAs layer 14 becomes a quantum well layer.
【0011】図2は、図1の量子井戸構造体のエネルギ
ー準位を示した図である。FIG. 2 is a diagram showing the energy levels of the quantum well structure of FIG. 1.
【0012】GaInAs層14が残存する半導体領域
は、その両側面が中空に露出しているので、その両側面
に真空障壁が形成されている。したがって、この半導体
領域の伝導帯端Ec の量子準位に存在する電子は、電
子親和力に相当する約5eV程度の理想的なエネルギー
障壁内に閉じ込められる。また、価荷帯端Ev の量子
準位に存在するホールも理想的な障壁内に閉じ込められ
る。
この結果、例えば半導体レーザの閾値電流の低減を達成
することができるなど、発光デバイス、電子走行デバイ
ス等に新規な特性を与えることができ、或いはこれらの
特性向上を図ることができる。The semiconductor region in which the GaInAs layer 14 remains has both side surfaces exposed to the air, so that vacuum barriers are formed on both sides. Therefore, electrons existing in the quantum level of the conduction band edge Ec of this semiconductor region are confined within an ideal energy barrier of about 5 eV, which corresponds to electron affinity. Furthermore, holes existing at the quantum level at the valence band edge Ev are also confined within the ideal barrier. As a result, it is possible to provide new characteristics to light emitting devices, electron transport devices, etc., such as reducing the threshold current of a semiconductor laser, or to improve these characteristics.
【0013】本発明は上記実施例には限られない。例え
ば、InP層12を完全に除去し、GaInAs層14
を支持するためマスクを残存させてもよい。また、塩酸
を主成分とするエッチング液のかわりに燐酸を主成分と
するエッチング液を使用するならば、InP層12では
なくGaInAs層14が浸食される。したがって、G
aInAs層14に支持されたInP層12が量子井戸
層となる。The present invention is not limited to the above embodiments. For example, the InP layer 12 is completely removed and the GaInAs layer 14 is completely removed.
The mask may remain for support. Furthermore, if an etching solution containing phosphoric acid as a main component is used instead of an etching solution containing hydrochloric acid as a main component, the GaInAs layer 14 instead of the InP layer 12 will be eroded. Therefore, G
The InP layer 12 supported by the aInAs layer 14 becomes a quantum well layer.
【0014】[0014]
【発明の効果】本発明の量子井戸構造体によれば、中空
に支持された半導体領域の表面に真空障壁が形成される
。このため、中空に支持された半導体領域内で効果的な
量子効果を得ることができる。この量子井戸構造体を発
光デバイス、電子走行デバイス等に応用するならば、こ
れらのデバイスに新規な特性を与えることができ、これ
らの特性向上を図ることができる。According to the quantum well structure of the present invention, a vacuum barrier is formed on the surface of the semiconductor region supported in the air. Therefore, an effective quantum effect can be obtained within the hollowly supported semiconductor region. If this quantum well structure is applied to light emitting devices, electron transport devices, etc., new characteristics can be imparted to these devices, and these characteristics can be improved.
【0015】また、上記の量子井戸構造体の製造方法に
よれば、基板と第2の半導体層との間に第1の半導体層
を予め設け、この第1の半導体層をエッチングにより部
分的に除去している。このため、ド・ブロイ波長程度の
厚さの第2の半導体層を簡易に中空に支持することがで
き、この第2の半導体層の表面に量子効果を効果的に達
成し得る真空障壁を形成できる。Further, according to the above method for manufacturing a quantum well structure, the first semiconductor layer is provided in advance between the substrate and the second semiconductor layer, and the first semiconductor layer is partially etched. It is being removed. Therefore, the second semiconductor layer having a thickness of approximately the de Broglie wavelength can be easily supported in the air, and a vacuum barrier that can effectively achieve the quantum effect is formed on the surface of the second semiconductor layer. can.
【図1】実施例の量子井戸構造体の製造方法の工程を示
す。FIG. 1 shows steps of a method for manufacturing a quantum well structure according to an example.
【図2】図1(c)の量子井戸構造体の量子井戸構造の
エネルギーバンド図である。FIG. 2 is an energy band diagram of the quantum well structure of the quantum well structure of FIG. 1(c).
10…基板 14…層状の半導体領域 12…支持手段 10...Substrate 14...Layered semiconductor region 12...Supporting means
Claims (2)
状の半導体領域と、該半導体領域の一部を基板上の中空
に支持する支持手段と、を備える量子井戸構造体。1. A quantum well structure comprising a layered semiconductor region having a thickness on the order of the de Broglie wavelength, and support means for supporting a portion of the semiconductor region in a hollow space above a substrate.
程と、前記第1の半導体層上にド・ブロイ波長程度の厚
さを有する第2の半導体層を成長する工程と、前記第1
および第2の半導体層の所定部分にエッチングを施し、
該第1および第2の半導体層を含むメサ状領域を形成す
る工程と、前記メサ状領域の段差部分に開口を有するマ
スクを形成する工程と、前記マスクの開口に材料選択性
のエッチングを施し、前記第1の半導体層の所定部分を
除去する工程と、を備える量子井戸構造体の製造方法。2. A step of growing a first semiconductor layer on a substrate, a step of growing a second semiconductor layer having a thickness of about de Broglie wavelength on the first semiconductor layer, and a step of growing a second semiconductor layer on the first semiconductor layer, 1
and etching a predetermined portion of the second semiconductor layer,
forming a mesa-shaped region including the first and second semiconductor layers; forming a mask having an opening in a stepped portion of the mesa-shaped region; and performing material-selective etching on the opening of the mask. , a step of removing a predetermined portion of the first semiconductor layer.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3063437A JPH04298019A (en) | 1991-03-27 | 1991-03-27 | Quantum well structure and its manufacture |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3063437A JPH04298019A (en) | 1991-03-27 | 1991-03-27 | Quantum well structure and its manufacture |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH04298019A true JPH04298019A (en) | 1992-10-21 |
Family
ID=13229250
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3063437A Pending JPH04298019A (en) | 1991-03-27 | 1991-03-27 | Quantum well structure and its manufacture |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH04298019A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2014017063A1 (en) * | 2012-07-24 | 2014-01-30 | 住友化学株式会社 | Semiconductor substrate, method for manufacturing semiconductor substrate, and method for manufacturing composite substrate |
-
1991
- 1991-03-27 JP JP3063437A patent/JPH04298019A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2014017063A1 (en) * | 2012-07-24 | 2014-01-30 | 住友化学株式会社 | Semiconductor substrate, method for manufacturing semiconductor substrate, and method for manufacturing composite substrate |
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