JPH04290906A - Shape measuring device - Google Patents

Shape measuring device

Info

Publication number
JPH04290906A
JPH04290906A JP10501591A JP10501591A JPH04290906A JP H04290906 A JPH04290906 A JP H04290906A JP 10501591 A JP10501591 A JP 10501591A JP 10501591 A JP10501591 A JP 10501591A JP H04290906 A JPH04290906 A JP H04290906A
Authority
JP
Japan
Prior art keywords
measured
stage
measuring
head
moving
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10501591A
Other languages
Japanese (ja)
Inventor
Junpei Tsujiuchi
辻内 順平
Katsuyuki Okada
勝行 岡田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujinon Corp
Original Assignee
Fuji Photo Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Photo Optical Co Ltd filed Critical Fuji Photo Optical Co Ltd
Priority to JP10501591A priority Critical patent/JPH04290906A/en
Priority to US07/852,595 priority patent/US5343410A/en
Publication of JPH04290906A publication Critical patent/JPH04290906A/en
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To measure a surface having a wide spread larger than the aperture continuously, precisely, without a gap by moving a measuring head to an applicable divisions one by one under electrical control, and photographing the interference pattern with adjoining divisions overlapped partially. CONSTITUTION:By a supporting member 6 a stage 2 is pinched slidably upon a base board 1 which has undergone a mirror face processing, and an object to be measured 9 is put precisely in place on the surface of the stage 2. A measuring head 3 is secured to a slider 14 which can slide in the X-axis direction along a guide bar 7. A light source (preferably, He-Ne laser) and a measuring means (for example, electric charge coupling element) to photograph the interference pattern formed by laser beam are accommodated in this head 3, and the photographed interference pattern is recorded by a recording means. The head 3 is moved in the X-axis and Y-axis directions by No.1, No.2 moving means 10 and 11, respectively, so that it travels to the centers of different divisions of the measuring surface 9a one by one. A control means controls the light source and also controls operation of motors 12, 15 of the No.1, No.2 control means 10, 11.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】この発明は、光学測定装置が備え
たレンズ系の開口以上に大きな比較的大型の被測定面を
測定することができる形状測定装置に関するものである
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a shape measuring device capable of measuring a relatively large surface to be measured, which is larger than the aperture of a lens system included in the optical measuring device.

【0002】0002

【従来の技術】各種部品、製品等(以下被測定物とよぶ
)の平面度や曲面の形状を高精度に測定するための手段
として、例えば干渉計が多用されている。この干渉計を
用いて平板状の被測定物の平面度を測定する場合、被測
定物の測定面に向けてレーザ光を照射・投光し、被測定
物にて反射して戻るレーザ光により形成される干渉縞の
模様から、精度よく測定面の凹凸が測定できるものであ
る。
2. Description of the Related Art Interferometers, for example, are often used as means for measuring the flatness and curved shape of various parts, products, etc. (hereinafter referred to as objects to be measured) with high precision. When measuring the flatness of a flat object to be measured using this interferometer, a laser beam is irradiated and projected toward the measurement surface of the object, and the laser beam is reflected back by the object. The unevenness of the measurement surface can be measured with high accuracy from the pattern of interference fringes formed.

【0003】0003

【発明が解決しようとする課題】ところで、ところで、
その干渉計は、開口が最大でも50mm程度と有限であ
り、開口以上の広い被測定領域全体を連続して精度良く
測定することは不可能であった。そこで、干渉計の開口
以上の大きな広がりを有する被測定面を測定しようとす
ると、被測定物を移動し、測定作業を複数回に分けて行
なうことが考えられる。
[Problem to be solved by the invention] By the way,
The interferometer has a finite aperture of about 50 mm at most, and it has been impossible to continuously and accurately measure the entire measurement area wider than the aperture. Therefore, when attempting to measure a surface to be measured that has a larger expanse than the aperture of the interferometer, it is conceivable to move the object to be measured and perform the measurement work in multiple steps.

【0004】しかしながら、この測定作業を何度も繰り
返す場合には、その観測領域を移動する際に、■被測定
面が上下に微少な振動動作をおこしたりすること、■測
定領域が現在どの部位であるかの認識を見誤るおそれが
あること、■測定領域間の境界部分に大きな誤差を生じ
たりするおそれがあること、■多数回の測定作業を繰り
返すうちに測定洩れを生ずることがある等の問題を生じ
る。
[0004] However, when this measurement work is repeated many times, when moving the observation area, there are two problems: (1) the surface to be measured may cause slight vibrations up and down, and (2) the measurement area may be ■ There is a risk of making a large error at the boundary between measurement areas. ■ There is a risk of missing measurements when repeating the measurement process many times, etc. This causes problems.

【0005】また、この測定作業を繰り返して行う場合
には、例えば測定対象として厚さ1cmの板ガラスを使
用すると、このガラスの線膨張率がおよそ1×10−5
〔deg−1〕であることから、測定面の温度が僅か1
℃変化するだけでも1/10μmの膨張収縮が生じてし
まう。 このような事情から、測定作業は、できるだけ能率よく
迅速に行うことが重要であり、特に作業者の体温が微妙
に影響して測定面に無視できない膨張変化をもらたすこ
とも考えられる。
[0005] Furthermore, when performing this measurement repeatedly, for example, if a plate glass with a thickness of 1 cm is used as the measurement object, the coefficient of linear expansion of this glass is approximately 1 x 10-5.
[deg-1], so the temperature of the measurement surface is only 1
Even a change in temperature causes expansion and contraction of 1/10 μm. Under these circumstances, it is important to carry out the measurement work as efficiently and quickly as possible, and in particular, the body temperature of the worker may have a subtle influence, causing a non-negligible expansion change on the measurement surface.

【0006】そこで、この発明は、上記した問題点を解
消することを目的とするものであり、換言すれば、干渉
計の開口以上の大きな広がりを有する被測定物であって
も、その被測定面全域を間隙なく連続的に、速やかに、
かつ高精度の測定を行うことが可能な形状測定装置を提
供することを目的とするものである。
Therefore, the present invention aims to solve the above-mentioned problems.In other words, even if the object to be measured has a wide area larger than the aperture of the interferometer, it is possible to Continuously and quickly over the entire surface without any gaps.
Another object of the present invention is to provide a shape measuring device that can perform highly accurate measurements.

【0007】[0007]

【課題を解決するための手段】即ち、この発明の形状測
定装置は、光源と、上面に測定すべき被測定物を載置し
て移動可能に設けられたステージと、前記光源から前記
被測定物の被測定面に照射された光により、前記被測定
物の厚さに応じて形成された縞を測定する測定手段を備
え前記ステージの上方で前記ステージに沿って移動可能
に設けられた測定ヘッドと、前記測定ヘッドを前記被測
定物の被測定面に沿って移動させる移動手段と、前記測
定ヘッドにより順に(測定される被測定面の測定領域が
一部重複して)測定されるように前記移動手段の作動を
制御する制御手段とを備えたものである。
[Means for Solving the Problems] That is, the shape measuring device of the present invention includes a light source, a stage movably provided with an object to be measured placed on its upper surface, and a stage from which the object to be measured is placed from the light source. The measuring device is provided above the stage and is movable along the stage, and includes a measuring means for measuring stripes formed according to the thickness of the object to be measured using light irradiated onto the surface of the object to be measured. a head, a moving means for moving the measuring head along the surface to be measured of the object to be measured, and a moving means for moving the measuring head along the surface to be measured of the object to be measured; and control means for controlling the operation of the moving means.

【0008】[0008]

【作用】この発明の形状測定装置は、制御手段の電気的
制御により、移動手段を適宜迅速に作動させて測定ヘッ
ドを各分割域の所定位置へ逐次移動し、各分割域におい
て測定する被測定面の測定領域が少なくとも隣接する分
割域の測定領域を一部重複するようにしながら各分割域
において撮影手段が干渉縞を撮影していく。
[Operation] The shape measuring device of the present invention operates the moving means appropriately and rapidly under electrical control of the control means to sequentially move the measurement head to a predetermined position in each divided region, and measures the object to be measured in each divided region. The photographing means photographs the interference fringes in each divided region such that the measurement region of the surface at least partially overlaps the measurement region of the adjacent divided region.

【0009】[0009]

【実施例】以下、この発明の一実施例について添付図面
を参照しながら説明する。図1はこの発明に係る形状測
定装置を示すものであり、この形状測定装置は、基台1
と、ステージ2と、測定ヘッド3と、移動手段4と、制
御手段5(図2参照)とから構成されている。
DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the accompanying drawings. FIG. 1 shows a shape measuring device according to the present invention, and this shape measuring device includes a base 1
, a stage 2, a measurement head 3, a moving means 4, and a control means 5 (see FIG. 2).

【0010】基台1は、上下両面が高精度の平面度を有
するように鏡面加工された平板が用いられており、この
実施例では床面と接する下面には振動吸収用のゴム体(
図略)が四隅に固着されている。そして、この基台1の
上面(以下これを基準面とよず)1aには、一対の支持
体6が固着されていると共に、その支持体6間に滑動自
在に挟持した状態でステージ2が搭載されている。なお
、一対の支持体6間には、上部側にガイドバー7が一対
架設されている。
The base 1 is a flat plate mirror-finished so that both the upper and lower surfaces have highly accurate flatness, and in this embodiment, a vibration-absorbing rubber body (
(omitted) are fixed to the four corners. A pair of supports 6 are fixed to the upper surface (hereinafter referred to as the reference surface) 1a of the base 1, and a stage 2 is slidably held between the supports 6. It is installed. Note that a pair of guide bars 7 are installed on the upper side between the pair of supports 6.

【0011】ステージ2は、上下両面が高精度の平面度
を有するように鏡面加工されており、両側面には支持体
6の嵌合突起6aに嵌合し、ステージ2移動の際のガイ
ドとなる溝2aが刻設されている。また、このステージ
2には、後に説明する移動手段4のスクリュシャフト1
6が螺合するネジ孔2bが溝2aと平行な方向に切られ
ている。なお、このステージ2上面の所定位置には、被
測定面9aを測定するため被測定物9が正確に載置され
ている。
[0011] The stage 2 has both upper and lower surfaces mirror-finished to have highly accurate flatness, and both sides are fitted with fitting protrusions 6a of the support 6 to serve as guides when the stage 2 moves. A groove 2a is carved therein. This stage 2 also includes a screw shaft 1 of a moving means 4, which will be explained later.
A screw hole 2b into which the screw 6 is screwed is cut in a direction parallel to the groove 2a. Note that the object to be measured 9 is accurately placed at a predetermined position on the upper surface of the stage 2 in order to measure the surface to be measured 9a.

【0012】測定ヘッド3は、支持体6間をガイドバー
7に沿って左右方向のX軸方向にスライド自在のスライ
ダ14に取付けられており、本体内部には光源8(図2
参照),測定手段及びその他の光学系(共に図示せず)
が設けられている。光源8は、被測定面9aに向けて波
長λのレーザ光(参照光)を照射・投光させるためのも
のであり、この実施例ではヘリウム・ネオン(He −
Ne )レーザが用いられている。測定手段は、レーザ
光により投光された被測定面9aの面状態に応じて形成
される干渉縞を撮影させるためのものであり、この実施
例ではCCD(電荷結合素子)が使用されており、図示
外の記録手段にその撮影された縞模様が記憶されるよう
になっている。なお、この測定ヘッドに内蔵し干渉縞を
形成させるための手段として、特にコヒーレントな光う
使用する必要がなく、例えばモアレ縞を形成させる場合
には、キセノンランプ等のような通常の光源から出射す
る光であってもよい。
The measuring head 3 is attached to a slider 14 that can freely slide between the supports 6 along a guide bar 7 in the left-right direction of the X-axis, and a light source 8 (see FIG.
), measurement means and other optical systems (both not shown)
is provided. The light source 8 is for irradiating/projecting a laser beam (reference beam) with a wavelength λ toward the surface to be measured 9a, and in this embodiment, helium neon (He −
Ne ) laser is used. The measuring means is for photographing interference fringes formed according to the surface condition of the surface to be measured 9a projected by the laser beam, and in this embodiment, a CCD (charge coupled device) is used. The photographed striped pattern is stored in a recording means (not shown). Note that there is no need to use coherent light as a means for forming interference fringes built into this measuring head; for example, when forming moiré fringes, it is necessary to emit light from a normal light source such as a xenon lamp. It may be light that

【0013】移動手段4は、被測定面9aの多数に分割
された各分割域毎に測定ヘッド3の中心位置を逐次移動
させていくためのものである。この実施例では、図3に
示すように、例えば第n番目の分割域αn を測定する
際に、その隣接する分割域、つまりαk,αk+1,α
n+1 に測定領域βの一部が及びようにするため、測
定ヘッド3の中心位置Cn ’が分割域αn の中心位
置Cn から僅かにずれるように移動させる構成となっ
ている。そして、この実施例の移動手段4では、その移
動動作を迅速に、かつ正確に行うため、X軸方向移動に
ついては第1移動手段10により、またX軸と直交する
Y軸方向移動については、第2移動手段11により行う
ように構成させている。第1移動手段10は、支持体6
に固設したステップモータ12と、このモータ12によ
って回転するスクリュシャフト13とから構成されてい
る。なお、そのスクリュシャフト13は、スライダ14
の略中央部にネジ切られたネジ孔に螺合するようになっ
ている。一方、第2移動手段11は、基準面1aに固設
したステップモータ15と、このモータ15により回転
するスクリュシャフト16とから構成されている。
The moving means 4 is for sequentially moving the center position of the measuring head 3 for each of the many divided regions of the surface to be measured 9a. In this embodiment, as shown in FIG. 3, when measuring the n-th divided area αn, for example, the adjacent divided areas
In order to make part of the measurement area β cover n+1, the center position Cn' of the measurement head 3 is moved so as to be slightly shifted from the center position Cn of the divided area αn. In order to perform the moving operation quickly and accurately, the moving means 4 of this embodiment uses the first moving means 10 for movement in the X-axis direction, and for movement in the Y-axis direction perpendicular to the X-axis. It is configured to be carried out by the second moving means 11. The first moving means 10 includes a support 6
It consists of a step motor 12 fixedly attached to the motor 12, and a screw shaft 13 rotated by the motor 12. Note that the screw shaft 13 is connected to the slider 14
It is designed to be screwed into a screw hole cut approximately in the center of the body. On the other hand, the second moving means 11 includes a step motor 15 fixed to the reference surface 1a and a screw shaft 16 rotated by the motor 15.

【0014】制御手段5は、光源8の制御とともに第1
,第2制御手段10,11の各モータ12,15の作動
を制御するものであり、主走査、つまりX軸方向への測
定ヘッド3の移動についてはモータ12を所定時間間隔
毎に測定時間だけ駆動制御し、また幅走査、つまり−Y
方向へのステージ2の移動についてはモータ15を所定
時間間隔毎に特定時間だけ駆動制御するように構成され
ている。従って、この実施例によれば、制御手段5によ
って第1,第2移動手段10,11を効率的に駆動し、
つまり主走査、幅走査を夫々第1,第2移動手段10,
11に分担させて行うことにより、極めて合理的に最少
時間で移動動作を行うことができる。以上の説明におい
ては、ステージと観測ヘッド各々を移動可能に設けたが
、一方を固定して他方を二次元的に移動させてもよい。 更には、本発明は干渉計に限らずモアレカメラ等にも適
用できる。なお、この発明においてレーザを使用する場
合には、波長633μmのHe−Neレーザや、波長8
80μmの半導体レーザを用いるのが好ましい。
The control means 5 controls the light source 8 as well as the first
, the operation of the motors 12 and 15 of the second control means 10 and 11, and for main scanning, that is, movement of the measuring head 3 in the Drive control and width scanning, that is -Y
Regarding the movement of the stage 2 in the direction, the motor 15 is configured to be driven and controlled for a specific time at every predetermined time interval. Therefore, according to this embodiment, the first and second moving means 10 and 11 are efficiently driven by the control means 5,
That is, the main scanning and the width scanning are carried out by the first and second moving means 10, respectively.
By having 11 perform the movement, it is possible to carry out the movement operation in a very rational manner in the minimum amount of time. In the above description, the stage and observation head were each provided movably, but one may be fixed and the other may be moved two-dimensionally. Furthermore, the present invention is applicable not only to interferometers but also to moiré cameras and the like. In addition, when using a laser in this invention, a He-Ne laser with a wavelength of 633 μm or a laser with a wavelength of 8
Preferably, an 80 μm semiconductor laser is used.

【0015】[0015]

【発明の効果】以上説明してきたように、この発明に係
る形状測定装置によれば、制御手段の電気的制御により
移動手段を適宜迅速に作動させて観測ヘッドを被測定面
の各領域の所定位置に順次機械的に移動させることがで
きるので、従来の手作業による移動作業と異なり、測定
開口以上の大きな広がりを有する被測定面であっても、
被測定面を隙間なく連続的に精度良く測定できる。しか
も、測定を極めてスムースに速く行える。
As explained above, according to the shape measuring device according to the present invention, the moving means is suitably and rapidly operated by electrical control of the control means to move the observation head to a predetermined position in each region of the surface to be measured. Since it can be mechanically moved to different positions in sequence, unlike conventional manual movement work, even if the surface to be measured has a larger expanse than the measurement aperture,
The surface to be measured can be measured continuously and accurately without any gaps. Furthermore, measurements can be performed extremely smoothly and quickly.

【図面の簡単な説明】[Brief explanation of drawings]

【図1】この発明に係る形状測定装置を示す斜視図であ
る。
FIG. 1 is a perspective view showing a shape measuring device according to the present invention.

【図2】この発明に係る制御手段の電気部品等との接続
状態を示すブロック図である。
FIG. 2 is a block diagram showing the state of connection of the control means to electrical components, etc. according to the present invention.

【図3】この発明に係る観測ヘッドにより各被測定面の
測定すべき領域を示す説明図である。
FIG. 3 is an explanatory diagram showing regions to be measured on each surface to be measured by the observation head according to the present invention.

【符号の説明】[Explanation of symbols]

1  基台 1a  基準面 9  被測定物 2  ステージ 3  観測ヘッド 4(10,11)  移動手段 5  制御手段 1 Base 1a Reference surface 9 Object to be measured 2 Stage 3 Observation head 4(10,11) Transportation means 5 Control means

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】  光源と、上面に測定すべき被測定物を
載置して移動可能に設けられたステージと、前記光源か
ら前記被測定物の被測定面に照射された光により、前記
被測定物の厚さに応じて形成された縞を測定する測定手
段を備え前記ステージの上方で前記ステージに沿って移
動可能に設けられた測定ヘッドと、前記測定ヘッドを前
記被測定物の被測定面に沿って移動させる移動手段と、
前記測定ヘッドにより順に(測定される被測定面の測定
領域が一部重複して)測定されるように前記移動手段の
作動を制御する制御手段とを備えたことを特徴とする形
状測定装置
1. A light source, a stage movably provided with an object to be measured placed on the upper surface, and a stage that is movably provided with a surface to be measured of the object to be measured. a measurement head that is provided above the stage and movable along the stage and includes a measuring means for measuring stripes formed according to the thickness of the object to be measured; a means of movement for moving along a surface;
A shape measuring device comprising: a control means for controlling the operation of the moving means so that the measurement head sequentially measures (with some of the measurement areas of the surface to be measured overlapping)
JP10501591A 1991-03-19 1991-03-19 Shape measuring device Pending JPH04290906A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP10501591A JPH04290906A (en) 1991-03-19 1991-03-19 Shape measuring device
US07/852,595 US5343410A (en) 1991-03-19 1992-03-17 Method for divisional measurement of object surface, and method for joining object surface sub-areas measured by same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10501591A JPH04290906A (en) 1991-03-19 1991-03-19 Shape measuring device

Publications (1)

Publication Number Publication Date
JPH04290906A true JPH04290906A (en) 1992-10-15

Family

ID=14396243

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10501591A Pending JPH04290906A (en) 1991-03-19 1991-03-19 Shape measuring device

Country Status (1)

Country Link
JP (1) JPH04290906A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003529743A (en) * 1999-06-18 2003-10-07 ケーエルエー−テンカー テクノロジィース コーポレイション Measurement with double-sided measurement inspection tools including scanning, splicing, and vibration isolation

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4979553A (en) * 1972-12-06 1974-08-01
JPS6115231A (en) * 1984-06-30 1986-01-23 Tokyo Juki Ind Co Ltd Electronic device for information processing
JPS6168752A (en) * 1984-09-12 1986-04-09 Toshiba Corp Cassette tape recorder device
JPS62146339A (en) * 1986-09-05 1987-06-30 積水ハウス株式会社 Heat accumulation floor
JPH02130404A (en) * 1988-11-10 1990-05-18 Matsushita Electric Works Ltd Image processing

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4979553A (en) * 1972-12-06 1974-08-01
JPS6115231A (en) * 1984-06-30 1986-01-23 Tokyo Juki Ind Co Ltd Electronic device for information processing
JPS6168752A (en) * 1984-09-12 1986-04-09 Toshiba Corp Cassette tape recorder device
JPS62146339A (en) * 1986-09-05 1987-06-30 積水ハウス株式会社 Heat accumulation floor
JPH02130404A (en) * 1988-11-10 1990-05-18 Matsushita Electric Works Ltd Image processing

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003529743A (en) * 1999-06-18 2003-10-07 ケーエルエー−テンカー テクノロジィース コーポレイション Measurement with double-sided measurement inspection tools including scanning, splicing, and vibration isolation

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