JPH04274350A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPH04274350A
JPH04274350A JP3485691A JP3485691A JPH04274350A JP H04274350 A JPH04274350 A JP H04274350A JP 3485691 A JP3485691 A JP 3485691A JP 3485691 A JP3485691 A JP 3485691A JP H04274350 A JPH04274350 A JP H04274350A
Authority
JP
Japan
Prior art keywords
case
base plate
metal base
semiconductor device
sealing resin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3485691A
Other languages
Japanese (ja)
Inventor
Fumio Nagaaze
文男 長畦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP3485691A priority Critical patent/JPH04274350A/en
Publication of JPH04274350A publication Critical patent/JPH04274350A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To prevent a stripping shake of a semiconductor element even force is applied between a base plate and an external and an external lead-out terminal by engagedly joining a metal base plate with a case, the case with resin for sealing and the sealing resin with an external terming. CONSTITUTION:A semiconductor element 2 and an external lead-out terminal 3 are mounted on a metal base plate 1 by soldering to assemble a case 4 on the metal base plate 1. In this assembling process, the case 4 is put on the metal, base plate 1 from above, and a rivet leg part 4a of the case 4 is inserted into a rivet hole 1a so as to adhere the case 4 to the metal base plate 1 and heat a tip of the rivet leg part 4a from the rear side of the metal base plate 1 in this state for being taperedly shaped. Thereby, the metal base 1 and the case 4 are jointed by riveting. Next, the inside of the case 4 is filled with sealing resin 5 for being hardened.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は、電力用半導体モジュー
ルなど、半導体素子を組み込んだパッケージのケース内
に封止樹脂を充填したモールド形半導体装置の構造に関
する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to the structure of a molded semiconductor device, such as a power semiconductor module, in which the case of a package incorporating a semiconductor element is filled with a sealing resin.

【0002】0002

【従来の技術】頭記したモールド形半導体装置として図
3に示す構造のものが知られている。図において、1は
放熱板および電極端子を兼ねた金属ベース板(銅板)、
2は金属ベース板1に半田付けしてマウントした半導体
素子、3は半導体素子2の上面に起立させて半田付けし
た外部導出端子、4は半導体素子2を包囲して金属ベー
ス板1の上に取付けた樹脂製のケース、5はケース4の
内方に充填した封止用樹脂(エポキシ樹脂)であり、こ
こで金属ベース板1とケース4との間が接着剤6で接合
されている。
2. Description of the Related Art As the above-mentioned mold type semiconductor device, a structure shown in FIG. 3 is known. In the figure, 1 is a metal base plate (copper plate) that also serves as a heat sink and an electrode terminal;
2 is a semiconductor element soldered and mounted on the metal base plate 1; 3 is an external lead-out terminal that is stood up on the upper surface of the semiconductor element 2 and soldered; 4 is a semiconductor element surrounding the semiconductor element 2 and mounted on the metal base plate 1. The attached resin case 5 is a sealing resin (epoxy resin) filled inside the case 4, and the metal base plate 1 and the case 4 are bonded together with an adhesive 6.

【0003】0003

【発明が解決しようとする課題】ところで、前記構造の
半導体装置では、実際の取扱い作業でしばしば次記のよ
うなトラブルの発生することが経験的に知見されている
。すなわち、半導体装置を使用場所に取付ける際に、金
属ベース板1と外部導出端子3との間に多少無理な引張
り力を加えると半導体素子2に剥離割れが簡単に生じて
しまう。
By the way, it has been empirically found that with the semiconductor device having the above structure, the following troubles often occur during actual handling operations. That is, if a somewhat excessive tensile force is applied between the metal base plate 1 and the external lead-out terminals 3 when the semiconductor device is installed at the place of use, the semiconductor element 2 will easily suffer from peeling cracks.

【0004】このような半導体素子の剥離割れの発生原
因について発明者等が究明したところ、その原因は次記
の点にあることが判明した。すなわち、金属ベース板1
,外部導出端子3は通常銅を用いているために封止用樹
脂5との結着力が低く、また、接着剤6で接合した金属
ベース板1と樹脂製ケース4と間の結合力も引張りに対
して比較的弱い。そのために、金属ベース板1と外部導
出端子3との間に多少無理な引張り力を加えると、ケー
ス4,封止用樹脂5が金属ベース1から剥がれて外部導
出端子3を組立位置に止めておく拘束力が消失し、その
結果として外部導出端子が引張り方向に動いて外部導出
端子3と半田付けされている半導体素子2に引張り応力
が直接作用するようになり、半導体素子に剥離割れが生
じる。
[0004] The inventors investigated the cause of such exfoliation cracks in semiconductor elements and found that the cause lies in the following points. That is, metal base plate 1
, Since the external lead-out terminal 3 is usually made of copper, its bonding force with the sealing resin 5 is low, and the bonding force between the metal base plate 1 and the resin case 4 bonded with the adhesive 6 is also tensile. relatively weak against Therefore, if a somewhat excessive tensile force is applied between the metal base plate 1 and the external lead-out terminal 3, the case 4 and the sealing resin 5 will be peeled off from the metal base 1, and the external lead-out terminal 3 will be stopped in the assembled position. As a result, the external lead-out terminal moves in the tensile direction, and tensile stress directly acts on the semiconductor element 2 soldered to the external lead-out terminal 3, causing peeling cracks in the semiconductor element. .

【0005】本発明は上記の点にかんがみなされたもの
であり、組立構造に改良の手を加えることにより、金属
ベース板と外部導出端子との間に多少無理な引張り力を
加えても簡単に半導体素子に剥離割れの生じることのな
い堅固な構造の半導体装置を提供することを目的とする
The present invention has been made in consideration of the above points, and by improving the assembly structure, it is possible to easily apply a somewhat excessive tensile force between the metal base plate and the external lead-out terminal. An object of the present invention is to provide a semiconductor device with a solid structure in which peeling cracks do not occur in semiconductor elements.

【0006】[0006]

【課題を解決するための手段】上記課題を解決するため
に、本発明の半導体装置においては、金属ベース板とケ
ースとの間、ケースと封止用樹脂との間、および封止用
樹脂と外部導出端子との間をそれぞれ係止結合手段を介
して結合するものとする。
[Means for Solving the Problems] In order to solve the above problems, in the semiconductor device of the present invention, there are The external lead-out terminals are connected to each other via locking and connecting means.

【0007】ここで、金属ベース板とケースとの間を係
止結合する手段として、金属ベース板にリベット穴を開
口するとともに、該リベット穴に対向してケースの下端
面に突設してリベット脚部を形成し、該リベット脚部を
前記リベット穴に挿入して裏面側からかしめ結合する。 また、ケースと封止用樹脂との間を係止結合する手段と
して、ケースの内壁面に横方向の溝部を形成して封止用
樹脂と係止結合する。さらに、封止用樹脂と外部導出端
子との間を係止結合する手段として、封止用樹脂の層内
に埋没する外部導出端子の部分に貫通穴を穿孔して封止
樹脂と係止結合するものとする。
Here, as a means for locking and connecting the metal base plate and the case, a rivet hole is formed in the metal base plate, and a rivet is provided protruding from the lower end surface of the case opposite to the rivet hole. Legs are formed, and the rivet legs are inserted into the rivet holes and caulked from the back side. Further, as a means for locking and connecting the case and the sealing resin, a horizontal groove is formed on the inner wall surface of the case to lock and connect the case and the sealing resin. Furthermore, as a means for locking and connecting the sealing resin and the external lead-out terminal, a through hole is drilled in the portion of the external lead-out terminal that is buried in the layer of the sealing resin and lockingly connects the sealing resin and the lead-out terminal. It shall be.

【0008】[0008]

【作用】上記の構造において、まず、外部導出端子と封
止用樹脂との間では、外部導出端子の貫通穴に封止樹脂
が入り込んでおり、その投錨効果により両者間が強固に
結合される。また、封止樹脂とケースとの間では、樹脂
がケース内壁の溝部に食い込んでおり、前記と同様な投
錨効果により両者が相対的に縦方向にずれ動くのを阻止
する。さらに、ケースと金属ベース板との間では、金属
ベースのリベット穴にケースのリベット脚部を挿入して
リベット締めしているので、強固な結合状態が確保され
る。これにより、半導体装置全体で外部導出端子と金属
ベース板との間には封止樹脂,ケースを介して一体的,
かつ堅固な係止結合状態が確保される。したがって、金
属ベース板と外部導出端子との間に引張り応力が加わっ
ても、各部の係止結合部が破断しない限り外部導出端子
が金属ベースに対して引張り方向に動くことがなく、半
導体素子の剥離割れを確実に防止できる。
[Function] In the above structure, first, between the external lead-out terminal and the sealing resin, the sealing resin enters the through hole of the external lead-out terminal, and its anchoring effect firmly connects the two. . Further, between the sealing resin and the case, the resin bites into the groove in the inner wall of the case, and the anchoring effect similar to that described above prevents the two from shifting relative to each other in the vertical direction. Furthermore, since the rivet legs of the case are inserted into the rivet holes of the metal base and the rivets are tightened between the case and the metal base plate, a strong connection is ensured. As a result, in the entire semiconductor device, the external terminals and the metal base plate are integrally connected via the sealing resin and the case.
Moreover, a firm locking and coupling state is ensured. Therefore, even if tensile stress is applied between the metal base plate and the external lead-out terminal, the external lead-out terminal will not move in the tensile direction with respect to the metal base unless the locking joints of each part are broken, and the semiconductor element Peeling cracks can be reliably prevented.

【0009】[0009]

【実施例】図1,図2は本発明実施例の構成を示すもの
であり、図3に対応する同一部材には同じ符号が付して
ある。図1,図2において、まず、半導体装置の構成部
品のうち、図3の構造と異なる点について述べると、金
属ベース板1には左右両側に二箇所ずつ合計4箇所に段
付き状のリベット穴1aが穿孔されている。一方、ケー
ス4の下面には前記リベット穴1aと対応する4箇所に
円柱突起のリベット脚部4aが設けてあり、さらにケー
ス4の内壁面の全域には横方向にのびた複数条の溝部4
bが形成されている。なお、リベット脚部4a,溝部4
bは樹脂成形品のケース4をモールド成形する際に同時
成形する。さらに、外部導出端子3には、封止樹脂5の
層内に埋没する領域部分に貫通穴3aが穿孔してある。
DESCRIPTION OF THE PREFERRED EMBODIMENTS FIGS. 1 and 2 show the structure of an embodiment of the present invention, and the same members corresponding to those in FIG. 3 are given the same reference numerals. 1 and 2, among the components of the semiconductor device, we will first discuss the points that differ from the structure in FIG. 1a is perforated. On the other hand, the lower surface of the case 4 is provided with cylindrical protruding rivet legs 4a at four locations corresponding to the rivet holes 1a, and furthermore, the entire inner wall surface of the case 4 has a plurality of grooves 4 extending laterally.
b is formed. In addition, the rivet leg portion 4a and the groove portion 4
b is molded at the same time as the case 4, which is a resin molded product, is molded. Furthermore, a through hole 3 a is bored in the external lead terminal 3 in a region buried in the layer of the sealing resin 5 .

【0010】次に半導体装置の組立手順を説明すると、
まず金属ベース板1に半導体素子2,外部導出端子3を
半田付けして実装し、続いて金属ベース板1にケース4
を組立てる。この組立工程では、ケース4を上方から金
属ベース板1の上に被せ、さらに前記のリベット穴1a
にケース4のリベット脚部4aを挿入してケース4と金
属ベース板1とを密着させ、この状態で金属ベース板1
の裏面側からリベット脚部4aの先端を加熱して図示の
ように楔状に整形する。これにより金属ベース1とケー
ス4との間がリベット締め結合される。次に、ケース4
の内部に封止用樹脂5を充填,硬化させると半導体装置
が完成する。
Next, the assembly procedure of the semiconductor device will be explained.
First, the semiconductor element 2 and the external lead-out terminals 3 are soldered and mounted on the metal base plate 1, and then the case 4 is mounted on the metal base plate 1.
Assemble. In this assembly process, the case 4 is placed on the metal base plate 1 from above, and the rivet holes 1a are
Insert the rivet leg 4a of the case 4 into the metal base plate 1 to bring the case 4 and the metal base plate 1 into close contact with each other.
The tip of the rivet leg 4a is heated from the back side of the rivet leg 4a to shape it into a wedge shape as shown in the figure. As a result, the metal base 1 and the case 4 are connected by riveting. Next, case 4
When the sealing resin 5 is filled into the inside and hardened, the semiconductor device is completed.

【0011】この組立状態では、封止用樹脂5が外部導
出端子3の貫通穴3a,およびケース4の内壁面の溝部
4bにそれぞれ入り込んでおり、さらに金属ベース板1
とケース4との間が前記のようにリベット締めされてい
る。つまり、金属ベース板1と外部導出端子3との間が
、半導体素子2を介して半田付けされた接合部とは別に
、前記のように組立てられたケース4,封止樹脂5を介
して堅固に係止結合される。これにより、組立状態で金
属ベース板1と外部導出端子3の間に引張り力を加えた
場合でも、半導体素子2との間の半田接合部に引張り応
力が作用することはなく、ケース4,封止用樹脂5を含
む各部品相互間の係止結合部で受け止められる。したが
って、部品相互間の係止結合部が破断するような過大な
力が加わらない限り、金属ベース板1と外部導出端子3
とが相対的に動くことはなく、半導体素子2を剥離割れ
から確実に保護できる。
In this assembled state, the sealing resin 5 has entered the through hole 3a of the external lead terminal 3 and the groove 4b of the inner wall surface of the case 4, and the sealing resin 5 has also entered the metal base plate 1.
and the case 4 are fastened with rivets as described above. In other words, the connection between the metal base plate 1 and the external lead-out terminal 3 is made firm through the case 4 assembled as described above and the sealing resin 5, in addition to the soldered joint through the semiconductor element 2. It is locked and coupled to. As a result, even if a tensile force is applied between the metal base plate 1 and the external lead-out terminal 3 in the assembled state, the tensile stress will not be applied to the solder joint between the semiconductor element 2 and the case 4 and the seal. It is received at the locking joint between each component including the locking resin 5. Therefore, unless an excessive force is applied that would break the locking joint between the parts, the metal base plate 1 and the external lead-out terminal 3
2 do not move relative to each other, and the semiconductor element 2 can be reliably protected from peeling cracks.

【0012】0012

【発明の効果】本発明の半導体装置は、以上説明したよ
うに構成されているので、例えば半導体装置を使用場所
に取付けるなどの際に、金属ベース板と外部導出端子と
の間に多少無理な引張り力が加わっても外部導出端子が
ずれ動くことはなく、これにより半導体素子の剥離割れ
を確実に防止することができ、製品の信頼性が大幅に向
上する。
[Effects of the Invention] Since the semiconductor device of the present invention is constructed as described above, for example, when installing the semiconductor device at the place where it is used, there may be some force between the metal base plate and the external lead-out terminal. Even when a tensile force is applied, the external lead-out terminal does not shift and move, thereby reliably preventing peeling cracks in the semiconductor element and greatly improving product reliability.

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】本発明実施例の構成断面図[Fig. 1] A cross-sectional view of the configuration of an embodiment of the present invention

【図2】図1の平面図[Figure 2] Plan view of Figure 1

【図3】従来における半導体装置の構成断面図[Figure 3] A cross-sectional view of the configuration of a conventional semiconductor device

【符号の説明】[Explanation of symbols]

1    金属ベース板 2    半導体素子 3    外部導出端子 3a  貫通穴 4    ケース 4a  リベット脚部 4b  溝部 5    封止用樹脂 1 Metal base plate 2 Semiconductor device 3 External lead-out terminal 3a Through hole 4 Case 4a Rivet leg 4b Groove 5 Sealing resin

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】金属ベース板と、該金属ベース板上にマウ
ントした半導体素子と、半導体素子の上面に起立接合し
た外部導出端子と、半導体素子を包囲して金属ベース板
に取付けたケースと、ケースの内部に充填した封止用樹
脂とからなる半導体装置において、金属ベース板とケー
スとの間、ケースと封止用樹脂との間、および封止用樹
脂と外部導出端子との間をそれぞれ係止結合手段を介し
て結合したことを特徴とする半導体装置。
1. A metal base plate, a semiconductor element mounted on the metal base plate, an external lead-out terminal vertically connected to the upper surface of the semiconductor element, and a case surrounding the semiconductor element and attached to the metal base plate; In a semiconductor device consisting of a sealing resin filled inside the case, there are A semiconductor device characterized in that it is coupled via locking coupling means.
【請求項2】請求項1に記載の半導体装置において、金
属ベース板とケースとの間の係止結合手段として、金属
ベース板にリベット穴を開口するとともに、該リベット
穴に対向してケースの下端面に突設してリベット脚部を
形成し、該リベット脚部を前記リベット穴に挿入して裏
面側からかしめ結合したことを特徴とする半導体装置。
2. In the semiconductor device according to claim 1, a rivet hole is formed in the metal base plate as a locking connection means between the metal base plate and the case, and a rivet hole is formed in the case opposite to the rivet hole. A semiconductor device characterized in that a rivet leg is formed protruding from a lower end surface, the rivet leg is inserted into the rivet hole, and the rivet leg is caulked from the back side.
【請求項3】請求項1に記載の半導体装置において、ケ
ースと封止用樹脂との間の係止結合手段として、ケース
の内壁面に横方向の溝部を形成して封止用樹脂と係止結
合したことを特徴とする半導体装置。
3. In the semiconductor device according to claim 1, a horizontal groove is formed in the inner wall surface of the case to engage the sealing resin as a locking connection means between the case and the sealing resin. A semiconductor device characterized by being fixedly coupled.
【請求項4】請求項1に記載の半導体装置において、封
止用樹脂と外部導出端子との間の係止結合手段として、
封止用樹脂の層内に埋没された外部導出端子の部分に貫
通穴を穿孔して封止樹脂と係止結合したことを特徴とす
る半導体装置。
4. The semiconductor device according to claim 1, as a locking connection means between the sealing resin and the external lead-out terminal.
1. A semiconductor device characterized in that a through hole is formed in a portion of an external lead-out terminal buried in a layer of a sealing resin so as to be locked and connected to the sealing resin.
JP3485691A 1991-03-01 1991-03-01 Semiconductor device Pending JPH04274350A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3485691A JPH04274350A (en) 1991-03-01 1991-03-01 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3485691A JPH04274350A (en) 1991-03-01 1991-03-01 Semiconductor device

Publications (1)

Publication Number Publication Date
JPH04274350A true JPH04274350A (en) 1992-09-30

Family

ID=12425823

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3485691A Pending JPH04274350A (en) 1991-03-01 1991-03-01 Semiconductor device

Country Status (1)

Country Link
JP (1) JPH04274350A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0608051A2 (en) * 1993-01-13 1994-07-27 Fuji Electric Co. Ltd. Resin-sealed semiconductor device
JP2009016884A (en) * 2008-10-22 2009-01-22 Kyocera Corp Electronic component

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0608051A2 (en) * 1993-01-13 1994-07-27 Fuji Electric Co. Ltd. Resin-sealed semiconductor device
EP0608051A3 (en) * 1993-01-13 1994-09-21 Fuji Electric Co Ltd Resin-sealed semiconductor device.
US5606200A (en) * 1993-01-13 1997-02-25 Fuji Electric Co., Ltd. Resin sealed semiconductor device with improved structural integrity
JP2009016884A (en) * 2008-10-22 2009-01-22 Kyocera Corp Electronic component

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