JPH04273193A - Method of coating through hole - Google Patents

Method of coating through hole

Info

Publication number
JPH04273193A
JPH04273193A JP5829691A JP5829691A JPH04273193A JP H04273193 A JPH04273193 A JP H04273193A JP 5829691 A JP5829691 A JP 5829691A JP 5829691 A JP5829691 A JP 5829691A JP H04273193 A JPH04273193 A JP H04273193A
Authority
JP
Japan
Prior art keywords
hole
substrate
deposition
film
vapor deposition
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5829691A
Other languages
Japanese (ja)
Inventor
Shoichi Higuchi
庄一 樋口
Satoshi Sekimoto
関本 敏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Murata Manufacturing Co Ltd
Original Assignee
Murata Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co Ltd filed Critical Murata Manufacturing Co Ltd
Priority to JP5829691A priority Critical patent/JPH04273193A/en
Publication of JPH04273193A publication Critical patent/JPH04273193A/en
Pending legal-status Critical Current

Links

Landscapes

  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)

Abstract

PURPOSE:To provide a formation method of a film in a through-hole which allows deposition substance to deposit without irregularities on a wallside of the through hole of a substrate and improves reliability and producibility of film formation in the through hole in a formation method of a film in the through hole by vacuum deposition. CONSTITUTION:A deposition substance 19 is deposited inside a through hole of a substrate 16 while changing an angle of the substrate 16 to a deposition source 17 and deposition is continued for a fixed time; then, the deposition substance 19 extends throughout inside the through hole of the substrate 16 without irregularities and a part without deposition is eliminated. Accordingly, reliability improves and a film in the through hole can be formed in one deposition operation, thereby producing effects on improvement of producibility and cost down.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】この発明は、電子回路を構成する
基板の表裏を導通させるスルーホールへの被膜形成方法
に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of forming a film on a through hole that provides conduction between the front and back sides of a substrate constituting an electronic circuit.

【0002】0002

【従来の技術】基板に設けられたスルーホールの壁面に
導体膜を形成することにより、基板の両面を電気的に導
通することが行われる。このスルーホールの壁面に導体
膜を形成する方法には電極材料をスルーホール壁面に真
空蒸着により付与する真空蒸着法がある。
2. Description of the Related Art Electrical continuity between both surfaces of a substrate is achieved by forming a conductive film on the walls of a through hole provided in a substrate. A method for forming a conductive film on the wall surface of the through hole includes a vacuum evaporation method in which an electrode material is applied to the wall surface of the through hole by vacuum evaporation.

【0003】図4は従来の真空蒸着方法に用いる装置を
示しており、ドーム状の真空槽1の内部に真空槽内の上
部を覆うドーム状の基板ホルダー2を取付け、該基板ホ
ルダー2の内側には基板3が取付けられる構造となって
いる。
FIG. 4 shows an apparatus used in a conventional vacuum evaporation method, in which a dome-shaped substrate holder 2 is attached inside a dome-shaped vacuum chamber 1 to cover the upper part of the vacuum chamber. The structure is such that a board 3 can be attached to the board 3.

【0004】この基板ホルダー2にスルーホールを有す
る基板3を取付け、真空槽1内の下部中央に蒸着源4を
配置する。
A substrate 3 having through holes is attached to the substrate holder 2, and a vapor deposition source 4 is placed in the center of the lower part of the vacuum chamber 1.

【0005】次に真空槽1内の空気を排気管5より排出
し、真空槽1内を真空にし、蒸着源4より導体膜形成用
の蒸着物質6を真空槽1内で飛散させ、基板3に設けら
れたスルーホールに蒸着させることによりスルーホール
の壁面に導体膜を形成する。
Next, the air in the vacuum chamber 1 is exhausted from the exhaust pipe 5 to create a vacuum inside the vacuum chamber 1, and the vapor deposition material 6 for forming a conductive film is scattered in the vacuum chamber 1 from the vapor deposition source 4, and the substrate 3 is A conductive film is formed on the wall surface of the through hole by vapor deposition in the through hole provided in the through hole.

【0006】[0006]

【発明が解決しようとする課題】このような従来の蒸着
方法では、基板3と蒸着源4との位置関係が一定であり
、基板に飛来する蒸着物質6は、基板面に対して一定の
方向からのみ飛来するので、スルーホール7内に被膜が
形成されない部分ができる。図5はスルーホール7の断
面を、図6はスルーホール7の平面図を示す。矢印は、
蒸着物質6の飛来する方向、斜線部は、被膜が形成され
ている箇所を示す。
[Problems to be Solved by the Invention] In such a conventional vapor deposition method, the positional relationship between the substrate 3 and the vapor deposition source 4 is constant, and the vapor deposition substance 6 flying onto the substrate is directed in a fixed direction with respect to the substrate surface. Since the particles only fly from the surface, there are parts in the through hole 7 where no coating is formed. 5 shows a cross section of the through hole 7, and FIG. 6 shows a plan view of the through hole 7. The arrow is
The direction in which the vapor deposition material 6 flies and the shaded area indicate locations where the coating is formed.

【0007】また、蒸着物質6の膜厚のムラを少なくす
るために、ドーム型の基板ホルダー2は、図4に示すよ
うに真空槽1の頂点に設けた回転軸8により回転させる
ことが多いが、その場合であっても基板への飛来角度は
一定のため、図5及び図6に示すスルーホール7内の蒸
着されない部分が残ることになる。
Furthermore, in order to reduce unevenness in the film thickness of the vapor deposition material 6, the dome-shaped substrate holder 2 is often rotated by a rotating shaft 8 provided at the top of the vacuum chamber 1, as shown in FIG. However, even in that case, since the flying angle to the substrate is constant, a portion of the through hole 7 shown in FIGS. 5 and 6 that is not evaporated remains.

【0008】そのため基板3の取付角度を変えて、数回
に分けて蒸着させねばならず、蒸着作業の手間がかかり
コストアップの原因となっていた。
[0008] Therefore, it is necessary to change the mounting angle of the substrate 3 and carry out the vapor deposition in several steps, which increases the time and effort of the vapor deposition process and causes an increase in cost.

【0009】この発明は上記のような課題を解決するた
めになされたものであり、蒸着物質が基板のスルーホー
ルの壁面にムラなく蒸着し、1回の蒸着作業でスルーホ
ール内の壁面全面の被膜を形成することができ、スルー
ホールへの被膜形成の信頼性と生産性を向上させたスル
ーホールへの被膜形成方法を提供することを目的とする
[0009] This invention was made to solve the above-mentioned problems, and the vapor deposition material is evenly deposited on the wall surface of the through hole of the substrate, and the entire wall surface of the through hole is coated in one vapor deposition operation. An object of the present invention is to provide a method for forming a film on a through hole, which can form a film, and improves the reliability and productivity of film formation on the through hole.

【0010】0010

【課題を解決するための手段】上記のような課題を解決
するため、この発明は、蒸着源に対する基板の角度を変
化させながら、蒸着物質を基板のスルーホール内に蒸着
することによりスルーホールへの被膜を形成する方法で
ある。
[Means for Solving the Problems] In order to solve the above-mentioned problems, the present invention deposits a deposition material into the through holes of a substrate while changing the angle of the substrate with respect to the deposition source. This is a method of forming a film of

【0011】[0011]

【作用】蒸着源に対する基板の角度を変化させながら蒸
着を行なうので、ある一定時間以上蒸着し続けることで
、基板のスルーホール内にムラなく蒸着物質が蒸着し、
蒸着されない部分をなくすことができる。
[Operation] Evaporation is performed while changing the angle of the substrate with respect to the evaporation source, so by continuing to evaporate for more than a certain period of time, the evaporation material is deposited evenly within the through holes of the substrate.
It is possible to eliminate portions that are not deposited.

【0012】0012

【実施例】以下、この発明の実施例を添付図面に基づい
て説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Examples of the present invention will be described below with reference to the accompanying drawings.

【0013】図1はこの発明に係るスルーホールへの被
膜形成方法に用いる真空蒸着装置を示しており、ドーム
状の真空槽11の内部には、外部から挿入された回転自
在の回転軸Aと回転軸Aに固定された保持体12を設け
、さらに保持体12には回転自在の回転軸Bが設けられ
、回転軸Bの内方端には基板ホルダー13が、他方には
、真空槽内壁に固定された円周軌道のレール14と接す
る車輪15が取付けられている。
FIG. 1 shows a vacuum evaporation apparatus used in the method of forming a film on a through hole according to the present invention, in which a dome-shaped vacuum chamber 11 has a rotatable shaft A inserted from the outside, and a rotary shaft A inserted from the outside. A holder 12 fixed to a rotation axis A is provided, and the holder 12 is further provided with a rotatable rotation axis B. A substrate holder 13 is attached to the inner end of the rotation axis B, and a substrate holder 13 is attached to the inner end of the rotation axis B. Wheels 15 are attached to the rails 14 on a circumferential track fixed to the rails 14 .

【0014】尚、図1で表わされた基板ホルダー13は
2つであるが、基板ホルダーの数は任意であり、それ以
上の数の基板ホルダーを設けても構わない。
Although there are two substrate holders 13 shown in FIG. 1, the number of substrate holders is arbitrary, and a larger number of substrate holders may be provided.

【0015】この基板ホルダー13に被膜を形成すべき
基板16を取付け、真空槽11内の下部中央に蒸着すべ
き蒸着源17を配置する。次に真空槽内の空気を排気管
18より排出し、真空槽11内を真空にし、蒸着物質1
9を真空槽11内で飛散させ、基板16に蒸着させる。
A substrate 16 on which a film is to be formed is attached to this substrate holder 13, and a vapor deposition source 17 to be vapor deposited is placed in the center of the lower part of the vacuum chamber 11. Next, the air inside the vacuum chamber is exhausted from the exhaust pipe 18, the inside of the vacuum chamber 11 is evacuated, and the vapor deposition material 1 is
9 is scattered in the vacuum chamber 11 and deposited on the substrate 16.

【0016】この蒸着作業中に回転軸Aにより保持体1
2を回転させると、保持体12に回転自在に取付けられ
た車輪15が、回転につれて真空槽11に固定されたレ
ール14と接しながら移動し、車輪15は回転運動を行
なうことになる。
During this vapor deposition operation, the holder 1 is rotated by the rotating shaft A.
When the vacuum tank 2 is rotated, the wheels 15 rotatably attached to the holder 12 move while contacting the rails 14 fixed to the vacuum chamber 11 as the wheels 15 rotate, and the wheels 15 perform rotational motion.

【0017】車輪15の回転により、車輪15と同じく
回転軸Bに固定された基板ホルダー13も回転軸Bを中
心に回転運動を行なうことになり、基板16は基板ホル
ダー13の回転と同調して回転する。
Due to the rotation of the wheel 15, the substrate holder 13, which is fixed to the rotation axis B like the wheel 15, also rotates around the rotation axis B, and the substrate 16 rotates in synchronization with the rotation of the substrate holder 13. Rotate.

【0018】基板16が回転することにより、基板16
から見た蒸着源17の方向が変化してゆき、基板に蒸着
する蒸着物質の飛来方向も時間と共に変化する。
As the substrate 16 rotates, the substrate 16
The direction of the evaporation source 17 as viewed from above changes, and the flying direction of the evaporation material deposited on the substrate also changes with time.

【0019】こうして、基板16のスルーホール20へ
蒸着する蒸着物質19の飛来する角度が図2に示すよう
に時間と共に変化し、ある一定時間以上蒸着し続けるこ
とで、スルーホール20内の蒸着されない部分が残らな
くなる。
In this way, as shown in FIG. 2, the angle at which the vapor deposition substance 19 flies to the through hole 20 of the substrate 16 changes with time, and if the vapor deposition continues for more than a certain period of time, the inside of the through hole 20 will not be vapor deposited. There will be no parts left.

【0020】[0020]

【発明の効果】以上のように、この発明によると、真空
槽内で基板ホルダーに取付けられた基板の蒸着源に対す
る角度が時間と共に変化するので、蒸着物質が基板のス
ルーホールの壁面にムラなく蒸着し、スルーホールへの
被膜形成の信頼性が向上し、又、1回の蒸着作業でスル
ーホール内の壁面全面の被膜を形成することができよう
になり、スルーホールへの被膜形成工程が削減でき、生
産性の向上とコストダウンの効果がある。
[Effects of the Invention] As described above, according to the present invention, the angle of the substrate attached to the substrate holder in the vacuum chamber with respect to the evaporation source changes with time, so that the evaporation material is distributed evenly onto the wall surface of the through-hole of the substrate. The reliability of film formation on through holes has been improved by vapor deposition, and it has become possible to form a film on the entire wall surface of the through hole in a single vapor deposition process, making the process of forming a film on through holes much easier. This has the effect of improving productivity and reducing costs.

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】この発明方法を実施する際に用いる真空蒸着装
置を示す断面図である。
FIG. 1 is a sectional view showing a vacuum evaporation apparatus used in carrying out the method of the present invention.

【図2】この発明方法によるスルーホールへの導体膜の
形成状態を示す断面図である。
FIG. 2 is a cross-sectional view showing how a conductive film is formed in a through hole by the method of the present invention.

【図3】この発明方法によるスルーホールへの導体膜の
形成状態を示す平面図である。
FIG. 3 is a plan view showing how a conductive film is formed in a through hole according to the method of the present invention.

【図4】従来例によるスルーホールへの導体膜を形成す
る場合に用いる真空蒸着装置の断面図である。
FIG. 4 is a cross-sectional view of a vacuum evaporation apparatus used for forming a conductor film in a through hole according to a conventional example.

【図5】従来例によるスルーホールへの導体膜の形成状
態を示す断面図である。
FIG. 5 is a cross-sectional view showing how a conductive film is formed in a through hole according to a conventional example.

【図6】従来例によるスルーホールへの導体膜の形成状
態を示す平面図である。
FIG. 6 is a plan view showing a state in which a conductive film is formed in a through hole according to a conventional example.

【符号の説明】[Explanation of symbols]

11  真空槽 16  基板 17  蒸着源 20  スルーホール 11 Vacuum chamber 16 Board 17 Vapor deposition source 20 Through hole

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】  真空槽内に蒸着源とスルーホールを有
する基板を収納し、基板の蒸着源に対する角度を変化さ
せながら基板のスルーホールの壁面に蒸着を行なうこと
を特徴とするスルーホールへの被膜形成方法。
1. A method for applying evaporation to a through-hole, characterized in that a evaporation source and a substrate having a through-hole are housed in a vacuum chamber, and evaporation is performed on the wall surface of the through-hole in the substrate while changing the angle of the substrate with respect to the evaporation source. Film formation method.
JP5829691A 1991-02-27 1991-02-27 Method of coating through hole Pending JPH04273193A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5829691A JPH04273193A (en) 1991-02-27 1991-02-27 Method of coating through hole

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5829691A JPH04273193A (en) 1991-02-27 1991-02-27 Method of coating through hole

Publications (1)

Publication Number Publication Date
JPH04273193A true JPH04273193A (en) 1992-09-29

Family

ID=13080259

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5829691A Pending JPH04273193A (en) 1991-02-27 1991-02-27 Method of coating through hole

Country Status (1)

Country Link
JP (1) JPH04273193A (en)

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