JPH0136553B2 - - Google Patents

Info

Publication number
JPH0136553B2
JPH0136553B2 JP60147705A JP14770585A JPH0136553B2 JP H0136553 B2 JPH0136553 B2 JP H0136553B2 JP 60147705 A JP60147705 A JP 60147705A JP 14770585 A JP14770585 A JP 14770585A JP H0136553 B2 JPH0136553 B2 JP H0136553B2
Authority
JP
Japan
Prior art keywords
chain
evaporation
deposition
vacuum chamber
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP60147705A
Other languages
Japanese (ja)
Other versions
JPS6210267A (en
Inventor
Hiroshi Nohara
Shinichi Shirasawa
Hiroyuki Terauchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SEIKOO DENSHI BUHIN KK
Original Assignee
SEIKOO DENSHI BUHIN KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SEIKOO DENSHI BUHIN KK filed Critical SEIKOO DENSHI BUHIN KK
Priority to JP14770585A priority Critical patent/JPS6210267A/en
Publication of JPS6210267A publication Critical patent/JPS6210267A/en
Publication of JPH0136553B2 publication Critical patent/JPH0136553B2/ja
Granted legal-status Critical Current

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Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、時計用ケース、ネクタイピンなどの
装飾品および刃具などに対して薄膜処理を行うイ
オンプレーテイング装置の改良に関するものであ
る。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an improvement in an ion plating apparatus that performs thin film treatment on watch cases, decorative items such as tie pins, cutlery, and the like.

〔従来の技術〕[Conventional technology]

第3図に示すように、内歯車12と外歯車13
などを用いて被蒸着物を自・公転させ、かつ電圧
を内歯車と外歯車などとを介して被蒸着物に印加
し蒸発粒子を加速しながらイオンプレーテイング
処理(以下IP処理という)を行つている。
As shown in FIG. 3, an internal gear 12 and an external gear 13
The ion plating process (hereinafter referred to as IP process) is performed while the evaporation target is made to rotate on its own axis and revolve around the evaporation target, and voltage is applied to the evaporation target via an internal gear and an external gear to accelerate the evaporated particles. It's on.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

IP処理においては、蒸着範囲で被蒸着物に電
圧を印加することが必要である。しかしながら従
来では非蒸着範囲においても被蒸着物に電圧が印
加されているため逆スパツタリングを起こし、被
蒸着物表面があれてしまい、特に装飾品等におい
ては著しく膜品質を低下させるという欠点があつ
た。
In IP processing, it is necessary to apply a voltage to the object to be deposited within the deposition range. However, in the past, voltage was applied to the object to be evaporated even in the non-evaporation range, which caused reverse sputtering, which caused the surface of the object to be evaporated and caused a significant deterioration in film quality, especially for decorative items. .

〔課題を解決するための手段〕[Means to solve the problem]

上記問題点を解決するために本発明では、蒸着
範囲において、被蒸着物に電圧を印加してIP処
理を行い、非蒸着範囲では電圧を解除して被蒸着
物表面のあれを防ぐもので、特に被蒸着物の移送
の構造に関するものである。
In order to solve the above problems, the present invention performs IP treatment by applying a voltage to the object to be evaporated in the evaporation area, and releases the voltage in the non-evaporation area to prevent roughness on the surface of the object to be evaporated. In particular, it relates to the structure of transporting the deposited material.

〔作用〕[Effect]

上記の構造により、蒸着範囲においてIP処理
を行い、非蒸着範囲では電圧が解除されるため逆
スパツタリングを防止することができる。
With the above structure, the IP treatment is performed in the evaporation area, and the voltage is released in the non-evaporation area, so that reverse sputtering can be prevented.

〔実施例〕〔Example〕

以下に、本発明の実施例をチエーンを適用した
構造を例にとつて説明する。
Embodiments of the present invention will be described below, taking as an example a structure to which a chain is applied.

第1図において、イオンプレーテイング装置の
真空槽1の内部に回転枠2が図示してない外部動
力により回転している。回転枠2には被蒸着物取
付治具3を複数個ほぼ等間隔に回動自在に軸支し
て設け、かつ被蒸着物取付治具3の一方にスプロ
ケツト4を付設する。スプロケツト4は略山形を
なす有端の固定チエーン5と噛み合つている。ま
たチエーン5の両端はセラミツクスなどの絶縁材
料でつくられたチエーン取付具6によつて真空槽
1に絶縁しながら固定されている。
In FIG. 1, a rotating frame 2 is rotated by external power (not shown) inside a vacuum chamber 1 of an ion plating apparatus. A plurality of evaporation target attachment jigs 3 are rotatably supported on the rotary frame 2 at approximately equal intervals, and a sprocket 4 is attached to one of the evaporation target attachment jigs 3. The sprocket 4 meshes with a fixed chain 5 having a generally chevron-shaped end. Both ends of the chain 5 are insulated and fixed to the vacuum chamber 1 by chain fixtures 6 made of an insulating material such as ceramics.

また第2図に示すように被蒸着物取付治具3は
回転枠2に、セラミツクスなどの絶縁材料でつく
られたブツシユ7によつて、絶縁されながら回動
自在に軸支されている。
Further, as shown in FIG. 2, the deposition object mounting jig 3 is rotatably supported on the rotating frame 2 while being insulated by a bush 7 made of an insulating material such as ceramics.

またチエーン5には電圧が印加されるようにな
つている。
Further, a voltage is applied to the chain 5.

次に本発明の動作について説明する。 Next, the operation of the present invention will be explained.

まず被蒸着物取付治具3に被蒸着物8を取付
け、真空槽1内を真空にした後、図示してない外
部動力を加える。動力が入ると回転枠2は時計方
向に回転(公転)し、回転枠2に取付けられた被
蒸着物取付治具3の一方に取付けられたスプロケ
ツト4はチエーン5に接する直前までは回転しな
いが、チエーン5に接すると同時に回転を始める
ので、被蒸着物取付治具3と被蒸着物取付治具3
に取付けられた被蒸着物8が回転(公転)を始め
る。被蒸着物8が自転している間はチエーン5か
らスプロケツト4と被蒸着物取付治具3を介し
て、被蒸着物8に電圧が印加されており、蒸着範
囲Aに達すると、蒸着材料容器9に入つている蒸
着材料10がヒーター11によつて加熱され蒸発
粒子は、前記印加電圧により加速されて被着し被
蒸着物8はIP処理される。そしてスプロケツト
4が蒸着範囲Aを超え、蒸着領域の暗部に入る。
そしてチエーン5から離れると自転は解除され
る。これと同時に被蒸着物8から電圧が解除され
逆スパツタリングが防止される。
First, the deposition target 8 is attached to the deposition target attachment jig 3, and after the vacuum chamber 1 is evacuated, external power (not shown) is applied. When power is applied, the rotating frame 2 rotates (revolutions) clockwise, and the sprocket 4 attached to one side of the evaporated object mounting jig 3 attached to the rotating frame 2 does not rotate until just before it touches the chain 5. , starts rotating at the same time as it touches the chain 5, so the evaporation target attachment jig 3 and the evaporation target attachment jig 3
The deposition target 8 attached to the wafer begins to rotate (revolution). While the deposition target 8 is rotating, a voltage is applied to the deposition target 8 from the chain 5 via the sprocket 4 and the deposition target attachment jig 3, and when the deposition range A is reached, the deposition material container is removed. The vapor deposition material 10 contained in the vapor deposition material 9 is heated by the heater 11, and the vaporized particles are accelerated and deposited by the applied voltage, and the object to be vapor deposited 8 is subjected to IP treatment. Then, the sprocket 4 exceeds the vapor deposition range A and enters the dark part of the vapor deposition area.
Then, when it leaves the chain 5, the rotation is canceled. At the same time, the voltage is removed from the deposition target 8 and reverse sputtering is prevented.

以上の作用を繰り返し行い、必要な膜厚まで被
蒸着物8にIP処理することができる。
By repeating the above operations, the deposition target 8 can be subjected to the IP treatment until the required film thickness is reached.

これに対し従来からの内歯車と外歯車を使用す
る方式では、外歯車を被蒸着物取付治具にセラミ
ツクス等の絶縁材料を介して取付ける。また被蒸
着物取付治具は回転枠に絶縁して軸支される。内
歯車も絶縁して取付ける。被蒸着物取付治具の外
歯車を取付けた側の軸は延長されており、前記軸
にブラシによつて電圧を印加すると言う複雑な構
造により蒸着範囲で被蒸着物にIP処理を行い、
非蒸着範囲では電圧を印加しない構造をとること
により、本発明のチエーン方式と同等の機能を得
ることになる。
On the other hand, in the conventional method using an internal gear and an external gear, the external gear is attached to a deposition target attachment jig via an insulating material such as ceramics. Further, the deposition object mounting jig is insulated and pivotally supported by the rotating frame. Also insulate and install the internal gear. The shaft on the side where the external gear of the attachment jig for the deposition object is attached is extended, and a voltage is applied to the shaft using a brush.The IP treatment is applied to the deposition object within the evaporation range using a complicated structure.
By adopting a structure in which no voltage is applied in the non-evaporation range, the same function as the chain system of the present invention can be obtained.

〔発明の効果〕〔Effect of the invention〕

本発明は以上のように、蒸着槽内に絶縁支持さ
れたチエーン構造と、それに電気的と機構的に係
合することにより定められた蒸着範囲でむらなく
被蒸着物にIP処理を行い、非蒸着範囲にあつて
は被蒸着物の電圧を解除して逆スパツタリングを
防止して被蒸着物の表面膜あれを防止して良質の
膜を簡単な構造で作成できるという効果がある。
As described above, the present invention uses a chain structure that is insulated and supported in a vapor deposition tank, and is electrically and mechanically engaged with the chain structure to uniformly perform IP treatment on the object to be vaporized within a predetermined vapor deposition range. In the evaporation range, the voltage on the evaporation target is released, reverse sputtering is prevented, and the surface film of the evaporation target is prevented from being roughened, so that a high-quality film can be formed with a simple structure.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明のイオンプレーテイング装置の
実施例の正面図、第2図は本発明のイオンプレー
テイング装置の被蒸着物取付治具部分の横断面
図、第3図は従来のイオンプレーテイング装置の
正面図である。 1……真空槽、2……回転枠、3……被蒸着物
取付治具、4……スプロケツト、5……チエー
ン、6……チエーン取付具、7……ブツシユ、8
……被蒸着物、9……蒸着材料容器、10……蒸
着材料、11……ヒーター、12……内歯車、1
3……外歯車。
FIG. 1 is a front view of an embodiment of the ion plating apparatus of the present invention, FIG. 2 is a cross-sectional view of the evaporation target attachment jig portion of the ion plating apparatus of the present invention, and FIG. 3 is a conventional ion plating apparatus. FIG. DESCRIPTION OF SYMBOLS 1...Vacuum chamber, 2...Rotating frame, 3...Deposition target attachment jig, 4...Sprocket, 5...Chain, 6...Chain fixture, 7...Bushy, 8
...Deposition object, 9... Vapor deposition material container, 10... Vapor deposition material, 11... Heater, 12... Internal gear, 1
3...External gear.

Claims (1)

【特許請求の範囲】[Claims] 1 真空槽の上方部を蒸着範囲とし、残り下方部
を非蒸着範囲として、被蒸着物を真空槽の外周に
沿つて公転移動させてなるイオンプレーテイング
装置において、前記真空槽の外周に沿つた略山形
の固定チエーンは前記真空槽に絶縁して支持さ
れ、前記チエーンに係合して自転する複数個の被
蒸着物取付治具は回転枠に回動自在に絶縁して軸
支され、前記回転枠の公転に伴つて定められた回
転領域で前記チエーンと前記被蒸着物とが電気的
接続を形成することを特徴とするイオンプレーテ
イング装置。
1. In an ion plating apparatus in which the object to be deposited is orbitally moved along the outer periphery of the vacuum chamber, the upper part of the vacuum chamber is the evaporation area and the remaining lower part is the non-evaporation area. A substantially chevron-shaped stationary chain is insulated and supported by the vacuum chamber, and a plurality of evaporation target attachment jigs that engage with the chain and rotate are rotatably insulated and pivotally supported by the rotating frame. An ion plating apparatus characterized in that the chain and the object to be deposited form an electrical connection in a rotation region determined as a rotation frame revolves.
JP14770585A 1985-07-05 1985-07-05 Ion plating method Granted JPS6210267A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14770585A JPS6210267A (en) 1985-07-05 1985-07-05 Ion plating method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14770585A JPS6210267A (en) 1985-07-05 1985-07-05 Ion plating method

Publications (2)

Publication Number Publication Date
JPS6210267A JPS6210267A (en) 1987-01-19
JPH0136553B2 true JPH0136553B2 (en) 1989-08-01

Family

ID=15436370

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14770585A Granted JPS6210267A (en) 1985-07-05 1985-07-05 Ion plating method

Country Status (1)

Country Link
JP (1) JPS6210267A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5896047B1 (en) * 2015-01-26 2016-03-30 三菱マテリアル株式会社 Film forming apparatus and method for manufacturing cutting tool with coating film

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5253778A (en) * 1975-10-29 1977-04-30 Yoichi Murayama Ion plating apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5253778A (en) * 1975-10-29 1977-04-30 Yoichi Murayama Ion plating apparatus

Also Published As

Publication number Publication date
JPS6210267A (en) 1987-01-19

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