JPH04257212A - Surface mounting type electronic component - Google Patents

Surface mounting type electronic component

Info

Publication number
JPH04257212A
JPH04257212A JP3937091A JP3937091A JPH04257212A JP H04257212 A JPH04257212 A JP H04257212A JP 3937091 A JP3937091 A JP 3937091A JP 3937091 A JP3937091 A JP 3937091A JP H04257212 A JPH04257212 A JP H04257212A
Authority
JP
Japan
Prior art keywords
metal cap
electronic component
solder
ceramic capacitor
electrode part
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3937091A
Other languages
Japanese (ja)
Inventor
Kiyoshi Matsuda
清 松田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Marcon Electronics Co Ltd
Original Assignee
Marcon Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Marcon Electronics Co Ltd filed Critical Marcon Electronics Co Ltd
Priority to JP3937091A priority Critical patent/JPH04257212A/en
Publication of JPH04257212A publication Critical patent/JPH04257212A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G2/00Details of capacitors not covered by a single one of groups H01G4/00-H01G11/00
    • H01G2/02Mountings
    • H01G2/06Mountings specially adapted for mounting on a printed-circuit support
    • H01G2/065Mountings specially adapted for mounting on a printed-circuit support for surface mounting, e.g. chip capacitors

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Ceramic Capacitors (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)

Abstract

PURPOSE:To prevent unfavorableness in a device body and in the joint of a device and a circuit board by enabling a sufficient buffer of tensile stress generated by a difference in coefficient of thermal expansion between the circuit board and a device. CONSTITUTION:A U-shaped metal cap 3 of high solder wettability is fitted to the electrode part 2 of a device 1 (ceramic capacitor), so that the cross-sectional structure of this metal cap 3 is doubled by bending. The internal and external layers of this metal cap 3 are so structured as to be not fixed at the part except one side that is a bent part at least; further, the electrode part 2 and the internal layer of the metal cap 3 are connected with a conductive adhesive or solder 4.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は、表面実装型電子部品に
係り、特に外部接続部における熱衝撃性の向上を実現す
るための技術改良に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to surface-mounted electronic components, and more particularly to technical improvements for improving thermal shock resistance at external connections.

【0002】0002

【従来の技術】近年の著しい技術開発に伴い、基板表面
に実装される各種電子部品の小型・薄型化、及びそれに
よる高密度実装化が進んでいる。図3は、このような表
面実装型電子部品の一例として、角型チップセラミック
コンデンサを示す図である。この図3に示すように、セ
ラミックコンデンサ素子1の端部には、AgまたはAg
/Pdを主成分とする外部電極2が形成されている。こ
のような角型チップセラミックコンデンサを基板に実装
する際には、外部電極2を、フローまたはリフローによ
り基板にハンダ付けしている。
BACKGROUND OF THE INVENTION With remarkable technological developments in recent years, various electronic components mounted on the surface of a substrate are becoming smaller and thinner, and as a result, higher density packaging is progressing. FIG. 3 is a diagram showing a square chip ceramic capacitor as an example of such a surface-mounted electronic component. As shown in FIG. 3, the ends of the ceramic capacitor element 1 are made of Ag or
An external electrode 2 whose main component is Pd is formed. When mounting such a square chip ceramic capacitor on a board, the external electrodes 2 are soldered to the board by flow or reflow.

【0003】一方、表面高密度実装化の進展に伴い、発
熱部品の集中化も進み、この集中配置された発熱部品の
発熱による各種電子部品や基板の局部過熱及びそれに伴
う劣化・損傷を防止することが要求されている。このた
めの放熱方法としては、基板上に専用の放熱部を設けた
り、或いは、基板自体を、熱放散能力の優れた材料によ
って構成することが考えられている。後者の方法として
は、例えば、アルミニウム基板の使用が検討されている
On the other hand, with the progress of high-density surface mounting, the concentration of heat-generating components has also progressed, and it is necessary to prevent local overheating of various electronic components and circuit boards due to the heat generated by these concentrated heat-generating components, as well as deterioration and damage caused by the heat generation. That is required. As a heat dissipation method for this purpose, it has been considered to provide a dedicated heat dissipation section on the substrate, or to construct the substrate itself from a material with excellent heat dissipation ability. For the latter method, for example, the use of an aluminum substrate is being considered.

【0004】0004

【発明が解決しようとする課題】しかしながら、上記の
ような従来構造の角型チップセラミックコンデンサをア
ルミニウム基板に実装した場合、接続部である外部電極
部は、熱衝撃に対する致命的な弱点部となる。すなわち
、アルミニウム基板とセラミックコンデンサを構成する
セラミックとは、一桁異なる熱膨脹係数を有しているた
め、両者の接続部となる外部電極部には、加熱・冷却に
伴い、大きな引っ張り・圧縮応力が発生する。そのため
、実装基板に冷熱サイクルが加わると、セラミックコン
デンサ素子にクラックが発生したり、基板とのハンダ接
続部が剥離するなどの不具合を生じてしまう。このよう
な不具合は、特に引っ張り応力に起因するところが大き
い。なお、このような接続部における熱応力による不具
合の問題は、セラミックコンデンサに限らず、基板に実
装される他の各種電子部品にも同様に存在している。
[Problems to be Solved by the Invention] However, when a square chip ceramic capacitor with the conventional structure as described above is mounted on an aluminum substrate, the external electrode part, which is the connection part, becomes a fatal weak point against thermal shock. . In other words, since the aluminum substrate and the ceramic constituting the ceramic capacitor have coefficients of thermal expansion that differ by an order of magnitude, the external electrode section that connects the two is subject to large tensile and compressive stresses as they are heated and cooled. Occur. Therefore, when a thermal cycle is applied to the mounting board, problems such as cracks occurring in the ceramic capacitor element and peeling of the solder connection with the board occur. Such defects are mainly caused by tensile stress. It should be noted that the problem of defects due to thermal stress at the connection portions is not limited to ceramic capacitors, but also exists in various other electronic components mounted on a board.

【0005】本発明は、このような従来技術の課題を解
決するために提案されたものであり、その目的は、基板
への実装時において、熱衝撃が加わった場合に、基板と
素子との熱膨脹係数の差によって発生する引っ張り応力
を、簡単な緩衝構造にて十分に緩衝可能とすることによ
り、素子本体や素子と基板との接続部に不具合を生じな
いようにすることである。そして、より一般的な目的は
、基板実装時における熱衝撃性に優れ、しかも、小型・
薄型・高密度実装化に貢献し得るような、優れた表面実
装型電子部品を提供することである。なお、本発明の目
的の対象は、代表的には、セラミックコンデンサである
が、これに限定されるものではなく、同様に外部電極を
有する他の各種表面実装型電子部品も、同様に本発明の
目的の対象である。
The present invention was proposed in order to solve the problems of the prior art, and its purpose is to prevent the bond between the board and the element when thermal shock is applied during mounting on the board. The object of the present invention is to sufficiently buffer the tensile stress caused by the difference in coefficients of thermal expansion with a simple buffer structure, thereby preventing defects from occurring in the element body or the connection between the element and the substrate. The more general purpose is to have excellent thermal shock resistance when mounted on a board, and to be small and compact.
Our objective is to provide superior surface-mounted electronic components that can contribute to thinner, higher-density packaging. Although the object of the present invention is typically a ceramic capacitor, it is not limited to this, and the present invention can also be applied to various other surface-mounted electronic components having external electrodes. is the object of the purpose of

【0006】[0006]

【課題を解決するための手段】本発明の表面実装型電子
部品は、素子の電極部にハンダ濡れ性のよいコ字形状の
金属キャップが嵌合され、この金属キャップの断面構造
が、折り曲げによる内外2層構造とされ、且つこの金属
キャップの内層と外層が、少なくとも折り曲げ部である
一辺を除く部分では互いに固着されていない構造とされ
、さらに、電極部と金属キャップの内層が、導電性接着
剤またはハンダで接続されていることを特徴としている
[Means for Solving the Problems] In the surface-mounted electronic component of the present invention, a U-shaped metal cap with good solder wettability is fitted to the electrode portion of the element, and the cross-sectional structure of the metal cap is changed by bending. It has a two-layer structure, an inner layer and an outer layer, and the inner layer and outer layer of the metal cap are not bonded to each other except for at least one side, which is the bent portion, and the electrode portion and the inner layer of the metal cap are bonded with conductive adhesive. It is characterized by being connected with adhesive or solder.

【0007】[0007]

【作用】以上のような構成を有する本発明の表面実装型
電子部品においては、素子の電極部に接続されている金
属キャップが、内外2層構造であり、その大部分は互い
に固着されていないため、層同士はかなりの自由度を持
って相対移動可能である。加えて、この金属キャップの
内層は、素子の電極部に接続されているため、残る外層
を基板に直接ハンダ付けすれば、加熱・冷却に伴う熱膨
脹係数の差によって発生する引っ張り応力は、金属キャ
ップの内層と外層の相対移動によって吸収される。従っ
て、熱衝撃が加わった場合に、素子本体及び素子と基板
との接続部に不具合を生じることがない。なお、一般的
に、基板の膨脹係数は素子の膨脹係数よりはるかに大き
いため、内層と外層の相対移動は、通常は開放動作であ
る。
[Operation] In the surface-mounted electronic component of the present invention having the above-described configuration, the metal cap connected to the electrode portion of the element has a two-layer structure, the inner and outer layers, most of which are not fixed to each other. Therefore, the layers can be moved relative to each other with a considerable degree of freedom. In addition, since the inner layer of this metal cap is connected to the electrode part of the element, if the remaining outer layer is soldered directly to the board, the tensile stress caused by the difference in thermal expansion coefficients caused by heating and cooling will be absorbed by the metal cap. absorbed by the relative movement between the inner and outer layers of the Therefore, when a thermal shock is applied, there is no problem in the element body and the connection portion between the element and the substrate. Note that the relative movement between the inner layer and the outer layer is usually an opening operation, since the expansion coefficient of the substrate is generally much larger than that of the device.

【0008】[0008]

【実施例】以下、本発明による表面実装型電子部品の一
実施例について、図1及び図2を参照して具体的に説明
する。なお、図1及び図2に示す実施例は、本発明によ
る表面実装型電子部品を角型チップセラミックコンデン
サに適用してなる実施例である。
DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the surface-mounted electronic component according to the present invention will be described in detail below with reference to FIGS. 1 and 2. The embodiment shown in FIGS. 1 and 2 is an embodiment in which a surface-mounted electronic component according to the present invention is applied to a square chip ceramic capacitor.

【0009】すなわち、図1に示すように、まず、外形
寸法が7.5×6.3×2.5mm、容量定格が25V
/10μFであるような、セラミックコンデンサ素子1
を用意した。このセラミックコンデンサ素子1は、図3
に示した従来技術と同様、AgまたはAg/Pbを主成
分とする、ハンダ付け可能な外部電極2を有している。 一方、42ニッケル合金の主材料の表面に銀メッキが施
されてなるシート状部材を、ほぼ中央部で折り曲げて2
層構造とし、さらに、2辺で折り曲げてコ字形状として
、金属キャップ3を形成した。そして、このような金属
キャップ3の内層部の表面(外部電極2への嵌合面)に
、ハンダペースト4を塗布し、この後、金属キャップ3
を素子1の外部電極2に嵌合した。続いて、この嵌合部
を、ハンダの融点以上に加熱して、金属キャップ3と外
部電極2を接合した。
That is, as shown in FIG. 1, the external dimensions are 7.5 x 6.3 x 2.5 mm and the capacity rating is 25 V.
/10 μF, ceramic capacitor element 1
prepared. This ceramic capacitor element 1 is shown in FIG.
Similar to the prior art shown in 1, this embodiment has a solderable external electrode 2 whose main component is Ag or Ag/Pb. On the other hand, a sheet-like member made of 42 nickel alloy with silver plating applied to the surface was bent at approximately the center and
The metal cap 3 was formed into a layered structure and further bent at two sides to form a U-shape. Then, solder paste 4 is applied to the surface of the inner layer part of the metal cap 3 (the surface that fits into the external electrode 2), and then the metal cap 3 is
was fitted to the external electrode 2 of the element 1. Subsequently, this fitting portion was heated to a temperature higher than the melting point of the solder to join the metal cap 3 and the external electrode 2.

【0010】以上のようにして作成した本発明による金
属キャップ付きのセラミックコンデンサ(本発明品)を
、図2に示すように、厚さ1mmのアルミニウム基板5
上にリフローにより実装した。なお、図2中、6は、金
属キャップ3とアルミニウム基板5とを接続するハンダ
であり、7は、アルミニウム基板5上に形成された電極
パターンである。一方、比較用として、図3に示したよ
うな従来の金属キャップを持たない、同一外形寸法・同
一容量定格のセラミックコンデンサ(従来品)を用意し
、同様に厚さ1mmのアルミニウム基板上にリフローに
より実装した。
As shown in FIG. 2, the ceramic capacitor with a metal cap according to the present invention (product of the present invention) produced as described above is attached to an aluminum substrate 5 with a thickness of 1 mm.
It was mounted on top by reflow. In addition, in FIG. 2, 6 is solder that connects the metal cap 3 and the aluminum substrate 5, and 7 is an electrode pattern formed on the aluminum substrate 5. On the other hand, for comparison, we prepared a ceramic capacitor (conventional product) with the same external dimensions and the same capacity rating without the conventional metal cap as shown in Figure 3, and similarly reflowed it on an aluminum substrate with a thickness of 1 mm. Implemented by.

【0011】そして、このように同じ基板に実装した本
発明品と従来品の各100個の試料について、−55℃
,+125℃各15分サイクルの条件で、ヒートサイク
ルテストを実施した。以下の表1は、この試験結果を、
10サイクル単位の累積不良個数によって示している。 なお、この場合の不良品の判別基準は、ハンダ接合部の
剥離または電極部の亀裂による容量低下率であり、容量
低下率が10%以上となった場合にこれを不良品とした
[0011] As described above, 100 samples each of the present invention product and the conventional product mounted on the same substrate were tested at -55°C.
, +125°C for 15 minutes each. Table 1 below shows the results of this test.
It is indicated by the cumulative number of defective products in units of 10 cycles. In this case, the criterion for determining a defective product is the capacity reduction rate due to peeling of the solder joint or cracking of the electrode part, and if the capacity reduction rate is 10% or more, it is determined to be a defective product.

【0012】0012

【表1】 この表1に示すように、従来品においては、10サイク
ルで早くも20個(20%)もの不良品が発生し、50
サイクルでは試料品の全てが不良品となってしまってい
る。これに対し、本発明品においては、100回のヒー
トサイクルテストの後においても1個の不良品も発生し
ていない。この結果は、本発明品の特徴である金属キャ
ップによって、基板と素子との熱膨脹係数の差によって
発生する引っ張り応力を十分に吸収できることを実証し
ている。
[Table 1] As shown in Table 1, with conventional products, as many as 20 (20%) defective products occur in 10 cycles, and 50
During the cycle, all of the sample products ended up being defective. In contrast, in the product of the present invention, not a single defective product was produced even after 100 heat cycle tests. This result proves that the metal cap, which is a feature of the product of the present invention, can sufficiently absorb the tensile stress caused by the difference in coefficient of thermal expansion between the substrate and the element.

【0013】なお、本発明は、前記実施例に限定される
ものではなく、例えば、金属キャップの内層と外層の内
面が互いに固着されていないような、完全な内外2層構
造が保持される限りにおいて、金属キャップの内層と外
層の外周部を固着することも可能である。また、金属キ
ャップの具体的な材質は自由に変更可能であり、電極部
と金属キャップの内層とを、導電性接着材で接続するこ
とも可能である。さらに、本発明は、セラミックコンデ
ンサに限定されるものではなく、同様の外部電極を有す
る他の各種表面実装型電子部品にも同様に適用可能であ
り、同様に優れた作用効果を得られるものである。
It should be noted that the present invention is not limited to the above-mentioned embodiments; for example, as long as a complete two-layer structure is maintained, such as the inner and outer surfaces of the metal cap are not bonded to each other. In this case, it is also possible to fix the outer periphery of the inner layer and the outer layer of the metal cap. Further, the specific material of the metal cap can be changed freely, and it is also possible to connect the electrode part and the inner layer of the metal cap with a conductive adhesive. Furthermore, the present invention is not limited to ceramic capacitors, but can be similarly applied to various other surface-mounted electronic components having similar external electrodes, and similarly excellent effects can be obtained. be.

【0014】[0014]

【発明の効果】以上述べたように、本発明においては、
素子の電極部に2層構造の金属キャップを嵌合し、その
内層を素子の電極部に接続すると共に、外層を基板に接
続して素子を基板に実装することにより、熱衝撃が加わ
った場合に、基板と素子との熱膨脹係数の差によって発
生する引っ張り応力を十分に緩衝できるため、素子本体
や素子と基板との接続部に不具合を生じることがない。 従って、基板実装時における熱衝撃性に優れ、しかも、
小型・薄型・高密度実装化に貢献し得るような、優れた
表面実装型電子部品を提供することができる。
[Effects of the Invention] As described above, in the present invention,
When a thermal shock is applied by fitting a two-layer metal cap to the electrode part of the element, connecting the inner layer to the electrode part of the element, and connecting the outer layer to the board and mounting the element on the board. In addition, since the tensile stress generated due to the difference in thermal expansion coefficient between the substrate and the element can be sufficiently buffered, there is no problem in the element body or the connection between the element and the substrate. Therefore, it has excellent thermal shock resistance when mounted on a board, and
It is possible to provide excellent surface-mounted electronic components that can contribute to miniaturization, thinness, and high-density packaging.

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】本発明による表面実装型電子部品の一実施例を
示す斜視図。
FIG. 1 is a perspective view showing an embodiment of a surface-mounted electronic component according to the present invention.

【図2】図1の電子部品を基板に実装した状態を示す側
面図。
FIG. 2 is a side view showing a state in which the electronic component shown in FIG. 1 is mounted on a board.

【図3】従来の表面実装型電子部品の一例を示す斜視図
FIG. 3 is a perspective view showing an example of a conventional surface-mounted electronic component.

【符号の説明】[Explanation of symbols]

1  セラミックコンデンサ素子 2  外部電極 3  金属キャップ 4  ハンダ 5  アルミニウム基板 6  ハンダ 7  電極パターン 1 Ceramic capacitor element 2 External electrode 3 Metal cap 4 Solder 5 Aluminum substrate 6 Solder 7 Electrode pattern

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】  素子の電極部にハンダ濡れ性のよいコ
字形状の金属キャップが嵌合され、この金属キャップの
断面構造が、折り曲げによる内外2層構造とされ、且つ
この金属キャップの内層と外層が、少なくとも折り曲げ
部である一辺を除く部分では互いに固着されていない構
造とされ、さらに、電極部と金属キャップの内層が、導
電性接着剤またはハンダで接続されていることを特徴と
する表面実装型電子部品。
Claim 1: A U-shaped metal cap with good solder wettability is fitted to the electrode part of the element, and the cross-sectional structure of this metal cap is made into a two-layered structure by bending, an inner layer and an inner layer of the metal cap. A surface characterized by having a structure in which the outer layers are not fixed to each other except for at least one side, which is a bent part, and further, the electrode part and the inner layer of the metal cap are connected with a conductive adhesive or solder. Mounted electronic components.
JP3937091A 1991-02-08 1991-02-08 Surface mounting type electronic component Pending JPH04257212A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3937091A JPH04257212A (en) 1991-02-08 1991-02-08 Surface mounting type electronic component

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3937091A JPH04257212A (en) 1991-02-08 1991-02-08 Surface mounting type electronic component

Publications (1)

Publication Number Publication Date
JPH04257212A true JPH04257212A (en) 1992-09-11

Family

ID=12551170

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3937091A Pending JPH04257212A (en) 1991-02-08 1991-02-08 Surface mounting type electronic component

Country Status (1)

Country Link
JP (1) JPH04257212A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2354113A (en) * 1999-09-09 2001-03-14 Murata Manufacturing Co Ceramic electronic component

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2354113A (en) * 1999-09-09 2001-03-14 Murata Manufacturing Co Ceramic electronic component
GB2354113B (en) * 1999-09-09 2001-09-12 Murata Manufacturing Co Ceramic electronic component
US6388864B1 (en) 1999-09-09 2002-05-14 Murata Manufacturing Co., Ltd. Ceramic electronic component

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