JPH04250601A - Resistance value-regulating method for chip resistor - Google Patents
Resistance value-regulating method for chip resistorInfo
- Publication number
- JPH04250601A JPH04250601A JP3025497A JP2549791A JPH04250601A JP H04250601 A JPH04250601 A JP H04250601A JP 3025497 A JP3025497 A JP 3025497A JP 2549791 A JP2549791 A JP 2549791A JP H04250601 A JPH04250601 A JP H04250601A
- Authority
- JP
- Japan
- Prior art keywords
- resistance value
- chip resistor
- temperature
- resistor
- predetermined
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title abstract description 6
- 238000003303 reheating Methods 0.000 claims abstract description 25
- 238000010304 firing Methods 0.000 claims description 17
- 230000006866 deterioration Effects 0.000 abstract description 5
- 230000001105 regulatory effect Effects 0.000 abstract 1
- 239000011521 glass Substances 0.000 description 5
- 239000011241 protective layer Substances 0.000 description 5
- 239000000463 material Substances 0.000 description 4
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 3
- 229910052573 porcelain Inorganic materials 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 238000009966 trimming Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- SWELZOZIOHGSPA-UHFFFAOYSA-N palladium silver Chemical compound [Pd].[Ag] SWELZOZIOHGSPA-UHFFFAOYSA-N 0.000 description 2
- 230000032683 aging Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 229910001925 ruthenium oxide Inorganic materials 0.000 description 1
- WOCIAKWEIIZHES-UHFFFAOYSA-N ruthenium(iv) oxide Chemical compound O=[Ru]=O WOCIAKWEIIZHES-UHFFFAOYSA-N 0.000 description 1
- 239000011265 semifinished product Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Landscapes
- Apparatuses And Processes For Manufacturing Resistors (AREA)
- Non-Adjustable Resistors (AREA)
Abstract
Description
【０００１】0001
【産業上の利用分野】本発明は、チップ抵抗器の抵抗値
調整方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for adjusting the resistance value of a chip resistor.
【０００２】0002
【従来の技術】チップ抵抗器の抵抗値にはバラツキがあ
り、通常、その抵抗値が基準抵抗値に対し、１００％±
５％以内であれば、規格に合ったものとされる。しかし
、チップ抵抗器の抵抗値が基準抵抗値に対し、１００％
−５％より低く成ったときは、チップ抵抗器の抵抗体を
レーザー光によってトリミングすることによって、その
抵抗値を高くして、その抵抗値が基準抵抗値に対し１０
０％±５パーセント以内に収まるようにしていた。[Prior Art] There is variation in the resistance value of chip resistors, and usually the resistance value is 100% ± of the reference resistance value.
If it is within 5%, it is considered to meet the standard. However, the resistance value of the chip resistor is 100% of the reference resistance value.
If it is lower than -5%, the resistance value of the chip resistor is increased by trimming it with a laser beam, and the resistance value is 10% lower than the reference resistance value.
It was kept within 0%±5%.
【０００３】0003
【発明が解決しようとする課題】かかる従来のチップ抵
抗器の抵抗値の調整方法には次のような欠点があった。
■チップ抵抗器の抵抗値が基準抵抗値の１００％＋５％
を越えるときは、抵抗体のトリミングによる抵抗値の調
整、即ち、抵抗値を低くすることは不可能と成るので、
これは廃棄せざるを得ない。■抵抗体のトリミングによ
る抵抗値の調整は個々のチップ抵抗器毎に行わなければ
ならないので、作業性が悪い。■抵抗体をトリミングす
ると、そのトリミングされた部分における電流密度が他
の部分と異なるため、ノイズの発生や過負荷特性の劣化
を招来することに成る。■チップ抵抗器の抵抗体をトリ
ミングするための専用の加工機を必要とする。■以上の
■〜■により、チップ抵抗器の価格が高く成る。The conventional method for adjusting the resistance value of a chip resistor has the following drawbacks. ■The resistance value of the chip resistor is 100% + 5% of the reference resistance value
When exceeding this value, it is impossible to adjust the resistance value by trimming the resistor, that is, to lower the resistance value.
This has no choice but to be discarded. ■Resistance value adjustment by trimming the resistor has to be done for each individual chip resistor, so work efficiency is poor. (2) When a resistor is trimmed, the current density in the trimmed part is different from that in other parts, resulting in noise generation and deterioration of overload characteristics. ■Requires a special processing machine to trim the resistor of chip resistors. (2) The above (2) to (3) increase the price of the chip resistor.
【０００４】かかる点に鑑み、本発明は、抵抗値を高く
することができるだけでなく、低くすることもでき、多
数のチップ抵抗器の抵抗値の調整を一度で行うことがで
き、抵抗値の調整によって、ノイズの発生や過負荷特性
の劣化を招来せず、作業性が良く、抵抗値調整のための
専用の加工機を必要とせず、従って、低廉なチップ抵抗
器を得ることのできるチップ抵抗器の抵抗値調整方法を
提案しようとするものである。[0004] In view of these points, the present invention not only makes it possible to increase the resistance value, but also makes it possible to decrease the resistance value, and makes it possible to adjust the resistance value of a large number of chip resistors at once. A chip that does not cause noise generation or deterioration of overload characteristics through adjustment, has good workability, does not require a special processing machine for resistance value adjustment, and can therefore produce an inexpensive chip resistor. This paper attempts to propose a method for adjusting the resistance value of a resistor.
【０００５】[0005]
【課題を解決するための手段】本発明によるチップ抵抗
器の抵抗値の調整方法は、所定温度で焼成して得たチッ
プ抵抗器を、所定焼成温度に近く、これより低い所定温
度で再加熱し、チップ抵抗器の抵抗値が基準抵抗値より
高いか、低いか及びその抵抗値に応じて、所定再加熱温
度及びその再加熱時間を選定し、これによりチップ抵抗
器の抵抗値を基準抵抗値に近づけるようにしたものであ
る。[Means for Solving the Problems] A method for adjusting the resistance value of a chip resistor according to the present invention involves reheating a chip resistor obtained by firing at a predetermined temperature at a predetermined temperature close to and lower than the predetermined firing temperature. Then, a predetermined reheating temperature and reheating time are selected depending on whether the resistance value of the chip resistor is higher or lower than the reference resistance value and the resistance value. This is to bring it closer to the value.
【０００６】[0006]
【作用】かかる本発明によれば、所定温度で焼成して得
たチップ抵抗器の抵抗値を測定し、その抵抗値が基準抵
抗値に対し、正負の所定範囲に入っているか否かを判定
し、否であれば、そのチップ抵抗器を再加熱する。その
抵抗値が基準抵抗値より高いか、低いか及び抵抗値に応
じて、そのチップ抵抗器の所定再加熱温度（所定焼成温
度に近く、これより低い温度）及びその再加熱時間を選
定する。かくして、チップ抵抗器の抵抗値を、それが基
準値から正負の所定範囲に収まるように調整することが
できる。[Operation] According to the present invention, the resistance value of a chip resistor obtained by firing at a predetermined temperature is measured, and it is determined whether the resistance value is within a predetermined positive or negative range with respect to a reference resistance value. If not, reheat the chip resistor. Depending on whether the resistance value is higher or lower than the reference resistance value and the resistance value, a predetermined reheating temperature (a temperature close to or lower than the predetermined firing temperature) and the reheating time are selected for the chip resistor. In this way, the resistance value of the chip resistor can be adjusted so that it falls within a predetermined positive and negative range from the reference value.
【０００７】[0007]
【実施例】本発明の実施例の説明に入るまえに、本発明
を適用し得るチップ抵抗器の一例を、図３を参照して説
明する。これは金属系混合皮膜抵抗体を用いた角形（角
平形）チップ抵抗器である。１は矩形の基体で、ガラス
又はガラスを含むアルミナ磁器から成る。２は一対の電
極で、銀パラジウムから成り、基体１の表面の両側にそ
れぞれペーストの印刷等により被着形成されている。３
は抵抗体で、酸化ルテニウム系の抵抗材料から成り、基
体１及び一対の電極２上にペーストの印刷等により被着
形成されている。４は保護層で、ガラス又はガラスを含
むアルミナ磁器から成り、基体１、電極２及び抵抗体３
上に積層又はペーストの印刷等により被着形成されてい
る。５は一対の電極（外部電極）で、銀パラジウムから
成り、上述の電極２にそれぞれ接続される如く、基体１
、電極２及び保護層４の両端部上にペーストの印刷等に
よりそれぞれ被着形成されている。DESCRIPTION OF THE PREFERRED EMBODIMENTS Before starting to explain embodiments of the present invention, an example of a chip resistor to which the present invention can be applied will be explained with reference to FIG. This is a rectangular (square flat) chip resistor using a metal mixed film resistor. 1 is a rectangular base made of glass or alumina porcelain containing glass. A pair of electrodes 2 are made of silver-palladium and are formed on both sides of the surface of the base 1 by printing paste or the like. 3
A resistor is made of a ruthenium oxide-based resistance material, and is formed on the base 1 and the pair of electrodes 2 by printing paste or the like. 4 is a protective layer made of glass or alumina porcelain containing glass, and includes a base 1, an electrode 2, and a resistor 3.
It is formed on the surface by laminating or printing paste. Reference numeral 5 denotes a pair of electrodes (external electrodes) made of silver palladium, and connected to the above-mentioned electrodes 2, respectively.
, are formed on both ends of the electrode 2 and the protective layer 4 by printing paste or the like.
【０００８】かかるチップ抵抗器は、基体を共通として
多数形成された基体１、一対の電極２、抵抗体３から成
る半完成品に、保護層４を被着形成し、その基体１及び
保護層４の両端面部に孔をあけ、その孔にそれぞれ一対
の電極５を被着形成した後、個々のチップ抵抗器に分離
して、その多数のチップ抵抗器を焼成炉内で約８５０°
Ｃで所定時間焼成する。この場合、基体１、電極２、抵
抗体３、保護層４及び電極５の焼成温度が、略同じに、
即ち、ここでは約８５０°Ｃと成るように、その各材料
を選定しておく。尚、基体１は、アルミナ磁器に混入す
るガラスの量を重量で約５０％にすることによって、そ
の焼成温度を約８５０°Ｃにすることができる。[0008] Such a chip resistor is a semi-finished product consisting of a plurality of substrates 1, a pair of electrodes 2, and a resistor 3 having a common substrate, and a protective layer 4 is formed on the substrate. After making holes in both end faces of the 4 and forming a pair of electrodes 5 in each hole, the chip resistors are separated into individual chip resistors and heated at approximately 850 degrees in a firing furnace.
C. for a predetermined time. In this case, the firing temperatures of the base 1, electrode 2, resistor 3, protective layer 4, and electrode 5 are approximately the same,
That is, each material is selected here so that the temperature is approximately 850°C. The firing temperature of the base 1 can be set to about 850° C. by adjusting the amount of glass mixed into the alumina porcelain to about 50% by weight.
【０００９】このように焼成して得られたチップ抵抗器
の抵抗値は、抵抗体３の抵抗率、長さ、幅、厚み、焼成
温度、焼成時間等を選定することによって、決定するこ
とができるが、その抵抗値にはばらつきがある。そこで
、焼成の済んだチップ抵抗器の抵抗値を測定し、その抵
抗値が目的の抵抗値（基準抵抗値）の１００％±５％以
内に収まるものは、合格品とする。The resistance value of the chip resistor obtained by firing in this manner can be determined by selecting the resistivity, length, width, thickness, firing temperature, firing time, etc. of the resistor 3. However, the resistance value varies. Therefore, the resistance value of the fired chip resistor is measured, and if the resistance value is within 100%±5% of the target resistance value (reference resistance value), it is considered a passed product.
【００１０】抵抗値が目的の抵抗値の１００％±５％か
ら外れたチップ抵抗器は、所定範囲の抵抗値毎に分類し
、その分類されたチップ抵抗器を、上述の焼成炉に再び
入れて再加熱する。そして、その再加熱温度及びその再
加熱時間を、後述するようにチップ抵抗器の抵抗値に応
じて選定するが、その再加熱温度は、いずれも、焼成温
度に近く、しかもそれより低い温度である。Chip resistors whose resistance value deviates from 100%±5% of the target resistance value are classified into resistance values within a predetermined range, and the classified chip resistors are put back into the above-mentioned firing furnace. and reheat. Then, the reheating temperature and the reheating time are selected according to the resistance value of the chip resistor as described later, but the reheating temperature is close to the firing temperature and lower than that. be.
【００１１】図１に、８５０°Ｃで焼成処理の終了した
チップ抵抗器（この場合の抵抗体のシート抵抗値は、１
ｋΩ／４ｍｍ２ であった）を、約２０分間再加熱した
場合の特性例（実験による）を示す。この第１図によれ
ば、再加熱温度がそれぞれ７００°Ｃ、６００°Ｃ及び
５００°Ｃ のとき、その各抵抗値変化率がそれぞれ
約＋５．３％（約＋４．７％〜約＋６．２％のばらつき
があった）、約−４．２％（約−５％〜約−４％のばら
つきがあった）、約−３％（約−３．２％〜約−２．８
％のばらつきがあった）であった。尚、焼成温度が８５
０°Ｃの場合、その再加熱温度の下限はせいぜい４００
°Ｃ程度までで、エージング時の、例えば、２００°Ｃ
と極端に低い温度は不可である。又、チップ抵抗器とし
て、温度特性、過負荷特性等の特性劣化を起こさず、電
気的性能を十分に満足するものを得るためには、再加熱
による初期からの抵抗値の変化率は、せいぜい−１５％
〜＋３０％程度までである。FIG. 1 shows a chip resistor that has been fired at 850°C (the sheet resistance value of the resistor in this case is 1
An example of the characteristics (according to an experiment) is shown in the case where a material with a resistance of 100 kΩ/4 mm2 is reheated for about 20 minutes. According to FIG. 1, when the reheating temperatures are 700°C, 600°C, and 500°C, the respective resistance change rates are approximately +5.3% (approximately +4.7% to approximately +6.0%). 2% variation), about -4.2% (about -5% to about -4% variation), about -3% (about -3.2% to about -2.8%)
There was a variation of %). In addition, the firing temperature is 85
In the case of 0°C, the lower limit of the reheating temperature is at most 400°C.
up to about °C, e.g. 200 °C during aging.
Extremely low temperatures are not allowed. In addition, in order to obtain a chip resistor that satisfies the electrical performance without causing deterioration of characteristics such as temperature characteristics and overload characteristics, the rate of change in resistance value from the initial stage due to reheating must be at most -15%
~+30%.
【００１２】又、チップ抵抗器の再加熱に要するする時
間、即ち、再加熱時間を調整することによっても、抵抗
値変化率を変化させることができる。図２に、８５０°
Ｃで焼成処理の終了したチップ抵抗器（この場合の抵抗
体のシート抵抗値は、１ｋΩ／４ｍｍ２ であった）を
５００°Ｃで再加熱し、その再加熱時間を１０分、２０
分、３０分、４０分及び８０分にしたときの、各抵抗値
変化率がそれぞれ約−１．９％（約−２．４％〜約−１
．４％のばらつきがあった）約−２．９％（約−３．４
％〜−２．５％）、約−３．６％（約−３．９％〜−３
．３％のばらつきがあった）、約−５％（約−５．５％
〜約−４．３％のばらつきがあった）及び約−６．６％
（約−７．５％〜約−６％のばらつきがあった）であっ
た。The rate of change in resistance value can also be changed by adjusting the time required to reheat the chip resistor, that is, the reheating time. In Figure 2, 850°
The chip resistor that had been fired at C (the sheet resistance value of the resistor in this case was 1 kΩ/4 mm2) was reheated at 500°C, and the reheating time was 10 minutes and then 20 minutes.
The rate of change in each resistance value was approximately -1.9% (approximately -2.4% to approximately -1
．． There was a variation of 4%) approximately -2.9% (approximately -3.4
% ~ -2.5%), approximately -3.6% (approximately -3.9% ~ -3
．． There was a variation of 3%), approximately -5% (approximately -5.5%
There was a variation of ~about -4.3%) and about -6.6%
(There was a variation of about -7.5% to about -6%).
【００１３】そこで、抵抗値が目的の抵抗値の１００％
±５％から外れたチップ抵抗器の再加熱温度を、その抵
抗値が１００％−５％より低いものに対しては、７００
°Ｃ付近でその抵抗値に応じた所定温度に、その抵抗値
が１００％＋５％より高いものに対しては、６００°Ｃ
付近乃至４５０°Ｃ付近で、その抵抗値に応じた所定温
度、即ち、抵抗値の低いものに対しては比較的高い温度
に、又、抵抗値の高いものに対しては比較的低い温度に
設定する。又、再加熱時間もそれぞれの抵抗値に応じて
調整することによって、抵抗値の調整範囲が広く成る。[0013] Therefore, the resistance value is 100% of the target resistance value.
The reheating temperature for chip resistors that fall outside of ±5% is set at 700% for those whose resistance value is lower than 100% - 5%.
600°C for those whose resistance value is higher than 100%+5%
From around 450°C to a predetermined temperature depending on the resistance value, that is, a relatively high temperature for a low resistance value, and a relatively low temperature for a high resistance value. Set. Further, by adjusting the reheating time according to each resistance value, the adjustment range of the resistance value can be widened.
【００１４】尚、かかる再加熱温度及びその再加熱時間
を設定するに当たっては、予め、製造するチップ抵抗器
の抵抗値変化率−温度特性及び抵抗値変化率−再加熱温
度特性を、実験によって測定しておく必要がある。[0014] In setting the reheating temperature and reheating time, the resistance change rate-temperature characteristics and resistance value change rate-reheating temperature characteristics of the chip resistor to be manufactured are measured in advance through experiments. It is necessary to do so.
【００１５】図２に示したチップ抵抗器は、本発明を適
用し得るチップ抵抗器の一例に過ぎず、その形状、構造
、寸法、材料、抵抗体抵抗値等は任意であり、例えば、
電極５としては、薄膜電極、厚膜電極等が可能であり、
全体の形状としては、角形、円筒形等が可能である。The chip resistor shown in FIG. 2 is only one example of a chip resistor to which the present invention can be applied, and its shape, structure, dimensions, material, resistor resistance value, etc. may be arbitrary. For example, the chip resistor shown in FIG.
The electrode 5 can be a thin film electrode, a thick film electrode, etc.
The overall shape can be square, cylindrical, etc.
【００１６】[0016]
【発明の効果】上述せる本発明チップ抵抗器の抵抗値の
調整方法によれば、所定温度で焼成して得たチップ抵抗
器を、所定焼成温度に近く、これより低い所定温度で再
加熱し、チップ抵抗器の抵抗値が基準抵抗値より高いか
、低いか及びその抵抗値に応じて、所定再加熱温度及び
その再加熱温度をそれぞれ選定し、これによりチップ抵
抗器の抵抗値を基準抵抗値に近づけるにするものである
から、抵抗値を高くすることができるだけでなく、低く
することもでき、多数のチップ抵抗器の抵抗値の調整を
一度で行うことができ、抵抗値の調整によって、ノイズ
の発生や過負荷特性の劣化を招来せず、作業性が良く、
抵抗値調整のための専用の加工機を必要とせず、従って
、低廉なチップ抵抗器を得ることができるものである。Effects of the Invention According to the above-described method for adjusting the resistance value of a chip resistor of the present invention, a chip resistor obtained by firing at a predetermined temperature is reheated at a predetermined temperature close to but lower than the predetermined firing temperature. , a predetermined reheating temperature and the reheating temperature are respectively selected depending on whether the resistance value of the chip resistor is higher or lower than the reference resistance value and the resistance value, and thereby the resistance value of the chip resistor is set to the reference resistance value. Since the resistance value can be made close to the same value, it is possible to not only increase the resistance value, but also to decrease it.The resistance value of many chip resistors can be adjusted at once, and by adjusting the resistance value. , does not cause noise generation or deterioration of overload characteristics, and has good workability.
A dedicated processing machine for adjusting the resistance value is not required, and therefore an inexpensive chip resistor can be obtained.
【図１】チップ抵抗器の抵抗値変化率−温度特性を示す
特性図[Figure 1] Characteristic diagram showing the resistance change rate vs. temperature characteristics of a chip resistor
【図２】チップ抵抗器の抵抗値変化率−再加熱時間特性
を示す特性図[Figure 2] Characteristic diagram showing resistance change rate vs. reheating time characteristics of chip resistor
【図３】本発明を適用し得るチップ抵抗器の一例を示す
斜視図FIG. 3 is a perspective view showing an example of a chip resistor to which the present invention can be applied.
１ 基体 ２ 電極 ３ 抵抗体 ４ 保護層 ５ 電極 1 Base 2 Electrode 3 Resistor 4 Protective layer 5 Electrode
Claims (1)
を、上記所定焼成温度に近く、これより低い所定温度で
再加熱し、上記チップ抵抗器の抵抗値が基準抵抗値より
高いか、低いか及びその抵抗値に応じて、上記所定再加
熱温度及びその再加熱時間を選定し、これにより上記チ
ップ抵抗器の抵抗値を基準抵抗値に近づけるようにした
ことを特徴とするチップ抵抗器の抵抗値の調整方法。1. A chip resistor obtained by firing at a predetermined temperature is reheated at a predetermined temperature close to and lower than the predetermined firing temperature, and the resistance value of the chip resistor is higher than a reference resistance value. The chip resistor is characterized in that the predetermined reheating temperature and its reheating time are selected depending on the resistance value and the resistance value of the chip resistor, thereby bringing the resistance value of the chip resistor closer to the reference resistance value. How to adjust the resistance value.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3025497A JPH04250601A (en) | 1991-01-25 | 1991-01-25 | Resistance value-regulating method for chip resistor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3025497A JPH04250601A (en) | 1991-01-25 | 1991-01-25 | Resistance value-regulating method for chip resistor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH04250601A true JPH04250601A (en) | 1992-09-07 |
Family
ID=12167703
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3025497A Pending JPH04250601A (en) | 1991-01-25 | 1991-01-25 | Resistance value-regulating method for chip resistor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH04250601A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8115587B2 (en) | 2008-03-28 | 2012-02-14 | Murata Manufacturing Co., Ltd. | NTC thermistor ceramic, method for producing NTC thermistor ceramic, and NTC thermistor |
| US10109398B2 (en) | 2014-09-25 | 2018-10-23 | Koa Corporation | Chip resistor and method for producing same |
-
1991
- 1991-01-25 JP JP3025497A patent/JPH04250601A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8115587B2 (en) | 2008-03-28 | 2012-02-14 | Murata Manufacturing Co., Ltd. | NTC thermistor ceramic, method for producing NTC thermistor ceramic, and NTC thermistor |
| US10109398B2 (en) | 2014-09-25 | 2018-10-23 | Koa Corporation | Chip resistor and method for producing same |
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