JPH0425017A - Vacuum film formation equipment - Google Patents

Vacuum film formation equipment

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Publication number
JPH0425017A
JPH0425017A JP12781390A JP12781390A JPH0425017A JP H0425017 A JPH0425017 A JP H0425017A JP 12781390 A JP12781390 A JP 12781390A JP 12781390 A JP12781390 A JP 12781390A JP H0425017 A JPH0425017 A JP H0425017A
Authority
JP
Japan
Prior art keywords
substrate
electrode
substrate holder
electrodes
film forming
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12781390A
Other languages
Japanese (ja)
Other versions
JP3006029B2 (en
Inventor
Koji Wataya
浩司 渡谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP2127813A priority Critical patent/JP3006029B2/en
Publication of JPH0425017A publication Critical patent/JPH0425017A/en
Application granted granted Critical
Publication of JP3006029B2 publication Critical patent/JP3006029B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

PURPOSE:To increase the number of substrates processed without increasing the size of the equipment by installing counter electrodes so located as to face each other and a substrate holder which is located between the counter electrodes and is electrically insulated and has first and second primary planes to hold a substrate. CONSTITUTION:High-frequency electric power is supplied to electrodes 2 and 3 from a high-frequency supply 15 through a matching circuit 4 to generate a glow discharge between the electrodes 2 and 5 and between the electrodes 3 and 6. As a result of this, a plasma area is formed between the electrode 2 and a substrate holder 7 and between the electrode 3 and a substrate holder 8. Under such a condition, substrates 9 are in the electrically floating condition at the positive plasma potential. As a result, a plasma area is formed between the substrate holder and the electrode 5 and between the substrate holder 8 and the electrode 6. Then, a film is formed on each of the substrates 9 which are held on second primary planes 7b and 8b of the substrate holders 7 and 8.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、基板に成膜処理を行うための真空成膜装置に
関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a vacuum film forming apparatus for performing a film forming process on a substrate.

〔従来の技術及びその課題〕[Conventional technology and its problems]

基板上に薄膜を形成する装置として、たとえばプラズマ
CVD装置等の真空成膜装置が用いられ°ζいる。この
真空成膜装置は、一般に、基板を保持するだめの基板ホ
ルダと、基板ホルダに対向して配置された対向電極とを
有している。成膜処理の際には、基板ホルダに基板を保
持させた状態で、基板ホルダと対向電極との間でグロー
放電を起こさせる。これにより、基板上に膜形成が行わ
れる。
As an apparatus for forming a thin film on a substrate, for example, a vacuum film forming apparatus such as a plasma CVD apparatus is used. This vacuum film forming apparatus generally includes a substrate holder for holding a substrate and a counter electrode disposed opposite to the substrate holder. During the film formation process, glow discharge is caused between the substrate holder and the counter electrode while the substrate is held by the substrate holder. As a result, a film is formed on the substrate.

一方、従来より、基板の処理枚数(すなわち、スループ
ット)向上の要請が強い。ところが、前記従来装置では
、基板の処理枚数には限界がある。
On the other hand, there has been a strong demand for increasing the number of substrates processed (ie, throughput). However, with the conventional apparatus, there is a limit to the number of substrates that can be processed.

そこで、基板ホルダを大形にすることにより基板の処理
枚数を増やすことも考えられるが、基板ホルダを大形に
すると装置全体が大形化するため好ましくない。
Therefore, it is conceivable to increase the number of substrates to be processed by making the substrate holder larger, but making the substrate holder larger is not preferable because it increases the size of the entire apparatus.

本発明の目的は、装置を大形化することなく基板の処理
枚数を向上できる真空成膜装置を提供することにある。
An object of the present invention is to provide a vacuum film forming apparatus that can increase the number of substrates processed without increasing the size of the apparatus.

〔課題を解決するだめの手段〕[Failure to solve the problem]

本発明に係る真空成膜装置は、基板に成膜処理を行うた
めの装置であって、相対向して配置された対向電極と、
基板ホルダとを備えている。前記基板ホルダは、対向電
極の間に配置され、電気的に絶縁されるとともに基板を
保持するための第1゜第2主面を有している。
A vacuum film forming apparatus according to the present invention is an apparatus for performing a film forming process on a substrate, and includes a counter electrode arranged to face each other,
and a substrate holder. The substrate holder is disposed between opposing electrodes, is electrically insulated, and has first and second main surfaces for holding the substrate.

〔作用〕[Effect]

本発明に係る真空成膜装置では、成膜処理すべき基板が
基板ホルダの第1.第2主面に保持される。そして、各
対向電極間で放電を起こさせる。
In the vacuum film forming apparatus according to the present invention, the substrate to be film-formed is placed in the first position of the substrate holder. It is held on the second main surface. Then, a discharge is caused between each opposing electrode.

すると、一方の対向電極とこれに対向する第1主面との
間にプラズマ状態が形成される。これにより、第1主面
に保持された基板に膜形成が行われる。また、この場合
において、基板ホルダは電気的に絶縁されている。この
ため、他方の対向電極とこれに対向する第2主面との間
にもプラズマ状態が形成される。これにより、第2主面
に保持された基板上に膜形成が行われる。
Then, a plasma state is formed between one of the opposing electrodes and the first main surface facing thereto. As a result, film formation is performed on the substrate held on the first main surface. Also, in this case, the substrate holder is electrically insulated. Therefore, a plasma state is also formed between the other opposing electrode and the second main surface facing thereto. As a result, a film is formed on the substrate held on the second main surface.

この場合には、基板ホルダの両主面に保持された各基板
について成膜処理を行うことができるので、−回に処理
される基板の枚数を増加でき、スループットを向上でき
る。また、スループットの向上のために、装置を大形化
する必要がなくなる。
In this case, since the film formation process can be performed on each substrate held on both main surfaces of the substrate holder, the number of substrates processed in one cycle can be increased, and throughput can be improved. Furthermore, there is no need to increase the size of the device in order to improve throughput.

〔実施例] 第1図は本発明の一実施例によるプラズマCVD装置を
示している。ここでは、基板縦置型の平行平板型装置を
例にとる。
[Embodiment] FIG. 1 shows a plasma CVD apparatus according to an embodiment of the present invention. Here, a parallel plate type device with substrates placed vertically will be taken as an example.

第1図において、成膜室1の中央部には、電極(カソー
ド電極)2,3が設けられている。各電極2.3には、
マツチング回路4を介して高周波電源15(周波数13
.56MH2)が接続されている。マツチング回路4は
成膜室1内に発生したプラズマに効率良く電力を供給す
るためのものであり、可変コンデンサ等を含んでいる。
In FIG. 1, electrodes (cathode electrodes) 2 and 3 are provided in the center of a film forming chamber 1. Each electrode 2.3 has
A high frequency power supply 15 (frequency 13
.. 56MH2) is connected. The matching circuit 4 is for efficiently supplying power to the plasma generated in the film forming chamber 1, and includes a variable capacitor and the like.

成膜室1の左右側壁部には、カソード電極2゜3に対向
するように、それぞれアノード電極5゜6が設けられて
いる。アノード電極5,6は、それぞれアースに接続さ
れている。また、アノード電極5,6の裏面側にはヒー
タが設けられ°ζおり、このヒータはヒータ電源に接続
されている。電極2と電極5との間、及び電極3と電極
6との間には、それぞれ基板ホルダ7.8が配置されて
いる。
Anode electrodes 5 and 6 are provided on the left and right side walls of the film forming chamber 1, respectively, so as to face the cathode electrodes 2 and 3. Anode electrodes 5 and 6 are each connected to ground. Further, a heater is provided on the back side of the anode electrodes 5 and 6, and this heater is connected to a heater power source. Substrate holders 7.8 are arranged between electrodes 2 and 5 and between electrodes 3 and 6, respectively.

各基板ホルダ7.8は、それぞれガラス等の絶縁部材に
より支持されており、成膜室l内において電気的に絶縁
され、フローティング状態となっている。また、各基板
ホルダ7.8の第1主面7a。
Each substrate holder 7.8 is supported by an insulating member such as glass, and is electrically insulated and in a floating state within the film forming chamber l. Also, the first major surface 7a of each substrate holder 7.8.

8a及び第2主面7b、8bには、それぞれ基板9を保
持することができるようになっている。また、成膜室1
には排気「110が形成されており、図示しない排気系
に接続され′(いる。
8a and second main surfaces 7b, 8b are capable of holding a substrate 9, respectively. In addition, film forming chamber 1
An exhaust ``110'' is formed in the exhaust ``110'' and is connected to an exhaust system (not shown).

次に、本成膜装置の作動につい°ζ説明する。Next, the operation of this film forming apparatus will be explained.

まず、成膜室1内を真空排気し、成膜室1内に反応ガス
を導入し−(所定の成膜条件に保つ。一方、ヒータをオ
ンにし、基板を所定の温度を維持する。
First, the inside of the film forming chamber 1 is evacuated, a reactive gas is introduced into the film forming chamber 1, and the predetermined film forming conditions are maintained.Meanwhile, the heater is turned on to maintain the substrate at a predetermined temperature.

次に、高周波電源15からマツチング回路4を通して電
極2.3に高周波電力を供給する。すると、電極2と電
極5との間、及び電極3と電極6との間でグロー放電が
発生ずる。これにより、電極2と基板ボルダ7との間、
及び電極3と基板ホルダ8との間にプラズマ領域が形成
される。これにより、各基板ホルダ7.8の各第1主面
7a、Ba上に保持された各基板9−Fに膜形成が行わ
れる。
Next, high frequency power is supplied from the high frequency power supply 15 to the electrodes 2.3 through the matching circuit 4. Then, glow discharge occurs between electrodes 2 and 5 and between electrodes 3 and 6. As a result, between the electrode 2 and the substrate boulder 7,
A plasma region is formed between the electrode 3 and the substrate holder 8. Thereby, film formation is performed on each substrate 9-F held on each first main surface 7a and Ba of each substrate holder 7.8.

一方、この成膜時におけるプラズマポテンシャルと基板
9の位置との対応関係は第2図のようになっていると推
定される。なお、第2図では電極2側について示してい
るが、電極3側についても同様である。第2図におい°
C,縦軸はプラズマポテンシャルを示し、横軸は距離を
示している。これによると、基板9は、+側のプラズマ
ポテンシャルのほぼ中間位置に位置している。なお、第
3図は従来装置の第2図に相当する図である。従来装置
では基板がアースに接続されているため、基板はプラズ
マポテンシャルが0の位置に位置している。
On the other hand, the correspondence between the plasma potential and the position of the substrate 9 during film formation is estimated to be as shown in FIG. Although FIG. 2 shows the electrode 2 side, the same applies to the electrode 3 side. In Figure 2 °
C, the vertical axis shows the plasma potential and the horizontal axis shows the distance. According to this, the substrate 9 is located approximately in the middle of the positive plasma potential. Note that FIG. 3 is a diagram corresponding to FIG. 2 of the conventional device. In the conventional device, the substrate is connected to ground, so the substrate is located at a position where the plasma potential is zero.

このように、本装置では、基板9が+側のプラズマポテ
ンシャルにおいて電気的に浮いた状態にある。この結果
、基板ホルダ7と電極5との間、及び基板ホルダ8と電
極6との間にもプラズマ領域が形成されることになる。
In this way, in this device, the substrate 9 is in an electrically floating state at the positive plasma potential. As a result, plasma regions are also formed between the substrate holder 7 and the electrode 5 and between the substrate holder 8 and the electrode 6.

これにより、基板ホルダ7.8の第2主面7b、Bb上
に保持された基板9上にも膜形成が行われる。
As a result, film formation is also performed on the substrate 9 held on the second main surface 7b, Bb of the substrate holder 7.8.

なお、電極2.3として約650X650mmのものを
用い、電極2と電極5との間、及び電極3と電極6との
間の間隔をそれぞれ約4511II11に保って成膜処
理を行った結果、各基板9につい”ζ成膜速度は約0.
8人/ s e cであった。また、従来装置に仕べ、
イオンダメージの少ない膜が得られるものと思われる。
In addition, as a result of using an electrode 2.3 of approximately 650 x 650 mm and performing the film forming process while maintaining the distance between electrode 2 and electrode 5 and between electrode 3 and electrode 6 at approximately 4511II11, each Regarding the substrate 9, the ζ film formation rate was approximately 0.
There were 8 people/sec. In addition, it is compatible with conventional equipment,
It is thought that a film with less ion damage can be obtained.

このような本実施例では、基板ホルダの両主面上に保持
された各基板について成膜処理が行われるので、装置を
大形化することなく、−回に処理される端板枚数を増加
でき、スループットを向上できる。
In this embodiment, the film forming process is performed on each substrate held on both main surfaces of the substrate holder, so the number of end plates processed in one cycle can be increased without increasing the size of the apparatus. can improve throughput.

〔他の実施例〕[Other Examples]

前記実施例では、縦置型のプラズマCVD装置に本発明
が適用された場合について説明したが、本発明の適用は
これに限定されない。
In the embodiment described above, the present invention is applied to a vertically installed plasma CVD apparatus, but the present invention is not limited to this.

たとえば、第4図に示すような横置型の装置にも同様に
適用できる。なお、第4図に示す装置では、成膜室20
の上部に電極21が配置され、これに対向するアース側
の電極22が成膜室20の上部に配置されている。そし
て、電極2■と電極22との間に基板ホルダ23が配置
されている。
For example, the present invention can be similarly applied to a horizontal type device as shown in FIG. In addition, in the apparatus shown in FIG.
An electrode 21 is placed on the top of the film forming chamber 20 , and an electrode 22 on the ground side opposite thereto is placed on the top of the film forming chamber 20 . A substrate holder 23 is arranged between the electrode 2 and the electrode 22.

基板ボルダ23は、前記実施例装置と同様に絶縁部材に
より成膜室20内に支持されている。この場合において
も、基板ボルダ23の両主面上に保持された各基板9に
ついて成膜処理を行うことができるので、スループット
を向上できる。
The substrate boulder 23 is supported within the film forming chamber 20 by an insulating member similarly to the apparatus of the embodiment. Even in this case, since the film formation process can be performed on each substrate 9 held on both main surfaces of the substrate boulder 23, throughput can be improved.

〔発明の効果〕〔Effect of the invention〕

本発明に係る真空成膜装置によれば、基板ホルダの第1
.第2主面に保持された各基板について成膜処理を行う
ことができるので、−回の処理枚数を増加でき、スルー
プッ1へを向上できる。
According to the vacuum film forming apparatus according to the present invention, the first
.. Since the film formation process can be performed on each substrate held on the second main surface, the number of substrates to be processed can be increased, and the throughput can be improved to 1.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例によるプラズマCVD装置の
縦断面概略構成図、第2図はプラズマポテンシャルと基
板位置との対応関係を示す図、第3図は従来装置の第2
図に相当する図、第4図は本発明の他の実施例によるプ
ラズマCVD装置の縦断面概略構成図である。 2.3・・・電極(カッ−1′電極)、5.6・・・ア
ノード電極、7,8・・・基板ボルダ、7a、8a・・
・第1主面、7b、8b・・・第2主面。 特許出願人 株式会社島律製作所 丼 区
FIG. 1 is a schematic vertical cross-sectional configuration diagram of a plasma CVD apparatus according to an embodiment of the present invention, FIG. 2 is a diagram showing the correspondence relationship between plasma potential and substrate position, and FIG.
FIG. 4, which corresponds to FIG. 4, is a schematic vertical cross-sectional configuration diagram of a plasma CVD apparatus according to another embodiment of the present invention. 2.3... Electrode (Ka-1' electrode), 5.6... Anode electrode, 7, 8... Substrate boulder, 7a, 8a...
- First main surface, 7b, 8b... second main surface. Patent applicant: Shima Ritsu Manufacturing Co., Ltd.

Claims (1)

【特許請求の範囲】[Claims] (1)基板に成膜処理を行うための真空成膜装置であっ
て、 相対向して配置された対向電極と、 前記対向電極の間に配置され、電気的に絶縁されるとと
もに前記基板を保持するための第1、第2主面を有する
基板ホルダと、 を備えた真空成膜装置。
(1) A vacuum film-forming apparatus for performing a film-forming process on a substrate, comprising: a counter electrode disposed opposite to each other; A vacuum film forming apparatus comprising: a substrate holder having first and second main surfaces for holding the substrate;
JP2127813A 1990-05-16 1990-05-16 Vacuum deposition equipment Expired - Fee Related JP3006029B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2127813A JP3006029B2 (en) 1990-05-16 1990-05-16 Vacuum deposition equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2127813A JP3006029B2 (en) 1990-05-16 1990-05-16 Vacuum deposition equipment

Publications (2)

Publication Number Publication Date
JPH0425017A true JPH0425017A (en) 1992-01-28
JP3006029B2 JP3006029B2 (en) 2000-02-07

Family

ID=14969308

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2127813A Expired - Fee Related JP3006029B2 (en) 1990-05-16 1990-05-16 Vacuum deposition equipment

Country Status (1)

Country Link
JP (1) JP3006029B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6267075B1 (en) * 1998-07-09 2001-07-31 Yield Engineering Systems, Inc. Apparatus for cleaning items using gas plasma
JP2008121149A (en) * 2006-11-13 2008-05-29 Kao Corp Fiber product-treating agent
JP2009185419A (en) * 2008-02-07 2009-08-20 Lion Corp Liquid softening agent composition
US20110094446A1 (en) * 2008-06-06 2011-04-28 Ulvac, Inc. Thin-film solar cell manufacturing apparatus
CN102560636A (en) * 2010-12-14 2012-07-11 北京北方微电子基地设备工艺研究中心有限责任公司 Substrate loading device and substrate processing device applying same

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6267075B1 (en) * 1998-07-09 2001-07-31 Yield Engineering Systems, Inc. Apparatus for cleaning items using gas plasma
JP2008121149A (en) * 2006-11-13 2008-05-29 Kao Corp Fiber product-treating agent
JP2009185419A (en) * 2008-02-07 2009-08-20 Lion Corp Liquid softening agent composition
US20110094446A1 (en) * 2008-06-06 2011-04-28 Ulvac, Inc. Thin-film solar cell manufacturing apparatus
CN102560636A (en) * 2010-12-14 2012-07-11 北京北方微电子基地设备工艺研究中心有限责任公司 Substrate loading device and substrate processing device applying same

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