JPH04236343A - Detecting method of defect of glass edge - Google Patents
Detecting method of defect of glass edgeInfo
- Publication number
- JPH04236343A JPH04236343A JP3018396A JP1839691A JPH04236343A JP H04236343 A JPH04236343 A JP H04236343A JP 3018396 A JP3018396 A JP 3018396A JP 1839691 A JP1839691 A JP 1839691A JP H04236343 A JPH04236343 A JP H04236343A
- Authority
- JP
- Japan
- Prior art keywords
- glass
- difference
- point
- coordinate value
- defect
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 239000011521 glass Substances 0.000 title claims abstract description 34
- 230000007547 defect Effects 0.000 title claims abstract description 20
- 238000000034 method Methods 0.000 title claims abstract description 9
- 238000001514 detection method Methods 0.000 claims description 9
- 238000003384 imaging method Methods 0.000 claims description 4
- 238000005498 polishing Methods 0.000 abstract description 6
- 238000004519 manufacturing process Methods 0.000 abstract description 4
- 230000002950 deficient Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 4
- 239000005357 flat glass Substances 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
- G01N2021/9586—Windscreens
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
Abstract
Description
【0001】0001
【産業上の利用分野】本発明は、自動車用ガラス等の製
造ラインにおいて切断研磨後のガラスエッジに発生する
「カケ」、「ツノ」などの欠点を画像処理技術を用いて
検出するガラスエッジの欠点検出方法に関する。[Industrial Application Field] The present invention uses image processing technology to detect defects such as chips and horns that occur on glass edges after cutting and polishing in automobile glass production lines. This invention relates to a defect detection method.
【0002】0002
【従来の技術】従来、自動車用ガラスの製造ラインにお
いて切断研磨後の平板ガラスの検査は目視によって行わ
れている。2. Description of the Related Art Conventionally, flat glass after cutting and polishing has been visually inspected on an automobile glass production line.
【0003】0003
【発明が解決しようとする課題】切断研磨後の平板ガラ
スのエッジを目視により検査するのでガラス製造ライン
の完全自動化の妨げとなっていた。[Problems to be Solved by the Invention] Since the edges of the flat glass after cutting and polishing are visually inspected, this has hindered the complete automation of the glass manufacturing line.
【0004】0004
【課題を解決するための手段】上記課題を解決すべく本
発明は、ガラスのエッジ部分を撮像装置で画像処理装置
に入力し、所定のアルゴリズムで処理してガラスエッジ
に欠点があるかどうかを判定するものである。また、前
記アルゴリズムは画像処理装置に入力した画像データを
白と黒のみで表現した2値化画像に変換した後に各列の
画素を行の上方から検索して黒から初めて白になる画素
の座標値Aiと下方から検索して黒から初めて白になる
画素の座標値Biを求めると共に座標値Aiと座標値B
iの差Ciと、差Ciととなりの列の差Ci−1との差
分Diを求めてCi=0又はDiが判定値Lよりも大き
いときガラスは欠点を有すると判定することが好ましい
。[Means for Solving the Problems] In order to solve the above problems, the present invention inputs the edge portion of the glass to an image processing device using an imaging device, processes it using a predetermined algorithm, and determines whether or not there is a defect in the glass edge. It is something to judge. In addition, the algorithm converts the image data input to the image processing device into a binary image expressed only in white and black, and then searches the pixels in each column from the top of the row to find the coordinates of the pixel that changes from black to white for the first time. Find the value Ai and the coordinate value Bi of the pixel that changes from black to white by searching from below, and also calculate the coordinate value Ai and the coordinate value B.
It is preferable to determine the difference Ci between i and the difference Di between the difference Ci and the difference Ci-1 in the adjacent column, and when Ci=0 or Di is larger than the determination value L, it is determined that the glass has a defect.
【0005】[0005]
【作用】ガラスエッジに欠点があるかどうかを判定する
。[Operation] Determine whether there is a defect in the glass edge.
【0006】[0006]
【実施例】以下に本発明の実施例を添付図面に基づいて
説明する。図1の(A)は本発明に係るガラスエッジの
欠点検出方法の説明図、図1の(B)は512×512
画素におけるガラスエッジの2値化画像を示す図である
。DESCRIPTION OF THE PREFERRED EMBODIMENTS Examples of the present invention will be described below with reference to the accompanying drawings. FIG. 1(A) is an explanatory diagram of the glass edge defect detection method according to the present invention, and FIG. 1(B) is a 512×512
It is a figure which shows the binarized image of the glass edge in a pixel.
【0007】ガラスエッジの欠点検出方法を実施するた
めの検出装置は、撮像装置であるCCDカメラ1とCC
Dカメラ1より入力されたガラス2のエッジ研磨面3の
画像データを記憶して処理し、「カケ」や「ツノ」など
の欠点が有るか否かを判定する画像処理装置4から構成
されている。CCDカメラ1は産業用ロボット(不図示
)に装着され、大きさや形状の異なる各種ガラス2のエ
ッジ研磨面3近傍の画像をガラス2の全周にわたって撮
ることができるように産業用ロボットにおいてプログラ
ムされている。A detection device for carrying out the glass edge defect detection method includes a CCD camera 1 as an imaging device and a CC
It consists of an image processing device 4 that stores and processes image data of the edge polished surface 3 of the glass 2 inputted from the D camera 1, and determines whether there are defects such as "chips" or "horns". There is. The CCD camera 1 is attached to an industrial robot (not shown) and programmed in the industrial robot so that it can take images of the vicinity of the edge polished surface 3 of various glasses 2 of different sizes and shapes over the entire circumference of the glass 2. ing.
【0008】ガラスエッジの欠点検出方法のアルゴリズ
ムを図2に示すフローチャートに従って説明する。CC
Dカメラ1でガラス2のエッジ研磨面3近傍をガラス2
の全周にわたって撮像し(S1)、CCDカメラ1の出
力である濃淡画像の画像データを画像処理装置4に配設
されたメモリに入力する(S2)。次に、メモリに記憶
された濃淡画像の画像データをあるレベルで2値化し、
白と黒のみで表現した2値化画像5に変換する(S3)
。そして、ノイズ処理ルーチンによって2値化画像内の
ノイズを除去する。(S4)。The algorithm of the method for detecting defects on glass edges will be explained with reference to the flowchart shown in FIG. C.C.
The edge polished surface 3 of the glass 2 is inspected with the D camera 1.
(S1), and image data of a grayscale image output from the CCD camera 1 is input to a memory provided in the image processing device 4 (S2). Next, the image data of the grayscale image stored in the memory is binarized at a certain level,
Convert to binary image 5 expressed only in white and black (S3)
. Then, noise in the binarized image is removed by a noise processing routine. (S4).
【0009】更に、図1の(B)に示すように512×
512画素の2値化画像5の配列画素に対して各列(5
12列)の画素を上方の行からと下方の行から検索して
(S5)、黒から初めて白になる点(画素)の座標値を
求める(S6)。行の上方(矢印X方向)から検索して
求めた点(画素)列をA点列(512個の点列となる)
とし、行の下方(矢印Y方向)から検索して求めた点(
画素)列をB点列(512個の点列となる)とする(S
7)。このように検索しても白の点(画素)がなければ
A点はとなりの点(画素)と同じ座標値としB点はA点
と同じ座標値とする。Furthermore, as shown in FIG. 1(B), 512×
Each column (5
12 columns) from the upper row and from the lower row (S5), and find the coordinate values of the point (pixel) where black becomes white for the first time (S6). The point (pixel) column found by searching from the top of the row (arrow X direction) is the A point column (512 point columns).
The point (
(pixel) sequence is B point sequence (512 dot sequence) (S
7). If a white point (pixel) is not found even after searching in this way, point A is set to have the same coordinate values as the adjacent point (pixel), and point B is set to have the same coordinate values as point A.
【0010】次に、i列(i=1〜512)のA点の座
標値AiとB点の座標値Biの差Ciを求める(S8)
。
この差Ci=Bi−Aiが通常ガラス2の研磨幅になる
。
また、各列のCiに対してとなりの列のCi−1との差
分Di=Ci−Ci−1を求める(S9)。但し、最初
の差分Di=0とする。そして、差Ci=0であればエ
ッジが研磨されていない場合又はエッジ部分が欠けてい
る場合であると判断して(S10)、欠点検出信号を出
力する(S12)。又、差Ci≠0であっても差分Di
が判定値Lよりも大きければ研磨幅が基準より大きい場
合又はエッジ部分が欠け且つガラス面に凹部が発生して
いる場合であると判断して(S11)、欠点検出信号を
出力する(S12)。Next, find the difference Ci between the coordinate value Ai of point A and the coordinate value Bi of point B in column i (i=1 to 512) (S8)
. This difference Ci=Bi-Ai is usually the polishing width of the glass 2. Further, the difference Di=Ci-Ci-1 between Ci in each column and Ci-1 in the adjacent column is determined (S9). However, the first difference Di=0. Then, if the difference Ci=0, it is determined that the edge is not polished or the edge portion is chipped (S10), and a defect detection signal is output (S12). Moreover, even if the difference Ci≠0, the difference Di
If is larger than the judgment value L, it is determined that the polishing width is larger than the standard or that the edge portion is chipped and a recess has occurred on the glass surface (S11), and a defect detection signal is output (S12). .
【0011】[0011]
【発明の効果】以上説明したように本発明によれば、比
較的簡便な装置で、且つ簡単なアルゴリズムで画像デー
タを処理してガラスエッジに欠点が有るかどうかを判定
することができる。また、検査工程の自動化を達成でき
る。As described above, according to the present invention, it is possible to process image data using a relatively simple device and a simple algorithm to determine whether or not there is a defect in the glass edge. Additionally, automation of the inspection process can be achieved.
【図1】(A)は本発明に係るガラスエッジの欠点検出
方法の説明図、(B)は512×512画素におけるガ
ラスエッジの2値化画像を示す図[Fig. 1] (A) is an explanatory diagram of the glass edge defect detection method according to the present invention, and (B) is a diagram showing a binarized image of the glass edge in 512 x 512 pixels.
【図2】ガラスエッジの欠点検出方法におけるアルゴリ
ズムのフローチャートを示す図[Figure 2] Diagram showing a flowchart of the algorithm in the glass edge defect detection method
1…CCDカメラ(撮像装置)、2…ガラス、3…ガラ
スエッジ研磨面、4…画像処理装置、5…2値化画像、
Ai,Bi…座標値、Ci…座標値Aiと座標値Biと
の差、Di…CiとCi−1との差分、L…判定値。1... CCD camera (imaging device), 2... Glass, 3... Glass edge polished surface, 4... Image processing device, 5... Binarized image,
Ai, Bi...coordinate value, Ci...difference between coordinate value Ai and coordinate value Bi, Di...difference between Ci and Ci-1, L...judgment value.
Claims (2)
処理装置に入力し、所定のアルゴリズムで処理してガラ
スエッジに欠点があるかどうかを判定することを特徴と
するガラスエッジの欠点検出方法。1. A method for detecting a defect in a glass edge, comprising inputting an edge portion of the glass to an image processing device using an imaging device, and processing the input using a predetermined algorithm to determine whether or not there is a defect in the glass edge.
力した画像データを白と黒のみで表現した2値化画像に
変換した後に各列の画素を行の上方から検索して黒から
初めて白になる画素の座標値Aiと下方から検索して黒
から初めて白になる画素の座標値Biを求めると共に座
標値Aiと座標値Biの差Ciと、差Ciととなりの列
の差Ci−1との差分Diを求めてCi=0又はDiが
判定値Lよりも大きいときガラスは欠点を有すると判定
する請求項1記載のガラスエッジの欠点検出方法。2. The algorithm converts the image data input to the image processing device into a binary image expressed only in white and black, and then searches the pixels in each column from the top of the row so that the pixels become white only from black. Find the coordinate value Ai of the pixel and the coordinate value Bi of the pixel that becomes white for the first time from black by searching from below, and calculate the difference Ci between the coordinate value Ai and the coordinate value Bi, and the difference Ci-1 between the difference Ci and the adjacent column. 2. The glass edge defect detection method according to claim 1, wherein the difference Di is determined and when Ci=0 or Di is larger than a determination value L, it is determined that the glass has a defect.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3018396A JPH04236343A (en) | 1991-01-18 | 1991-01-18 | Detecting method of defect of glass edge |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3018396A JPH04236343A (en) | 1991-01-18 | 1991-01-18 | Detecting method of defect of glass edge |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH04236343A true JPH04236343A (en) | 1992-08-25 |
Family
ID=11970540
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3018396A Withdrawn JPH04236343A (en) | 1991-01-18 | 1991-01-18 | Detecting method of defect of glass edge |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH04236343A (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005345386A (en) * | 2004-06-04 | 2005-12-15 | Tdk Corp | Inspection method for chip component, and inspection device therefor |
JP2006300663A (en) * | 2005-04-19 | 2006-11-02 | Asahi Glass Co Ltd | Defect detection system |
KR100741258B1 (en) * | 2006-06-22 | 2007-07-19 | 삼성코닝정밀유리 주식회사 | Grinding system for a glass substrate |
CN102590222A (en) * | 2012-03-06 | 2012-07-18 | 英利能源(中国)有限公司 | Photovoltaic component defect detection method and system |
CN103163156A (en) * | 2013-03-21 | 2013-06-19 | 万新光学集团有限公司 | Automatic grading method of lens defects based on machine vision technology |
CN103759644A (en) * | 2014-01-23 | 2014-04-30 | 广州市光机电技术研究院 | Separating and refining type intelligent optical filter surface defect detecting method |
CN106990119A (en) * | 2017-04-27 | 2017-07-28 | 中科慧远视觉技术(洛阳)有限公司 | The vision detection system and detection method of a kind of white glass surface defect of automatic detection |
-
1991
- 1991-01-18 JP JP3018396A patent/JPH04236343A/en not_active Withdrawn
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005345386A (en) * | 2004-06-04 | 2005-12-15 | Tdk Corp | Inspection method for chip component, and inspection device therefor |
JP2006300663A (en) * | 2005-04-19 | 2006-11-02 | Asahi Glass Co Ltd | Defect detection system |
KR100741258B1 (en) * | 2006-06-22 | 2007-07-19 | 삼성코닝정밀유리 주식회사 | Grinding system for a glass substrate |
CN102590222A (en) * | 2012-03-06 | 2012-07-18 | 英利能源(中国)有限公司 | Photovoltaic component defect detection method and system |
CN103163156A (en) * | 2013-03-21 | 2013-06-19 | 万新光学集团有限公司 | Automatic grading method of lens defects based on machine vision technology |
CN103759644A (en) * | 2014-01-23 | 2014-04-30 | 广州市光机电技术研究院 | Separating and refining type intelligent optical filter surface defect detecting method |
CN106990119A (en) * | 2017-04-27 | 2017-07-28 | 中科慧远视觉技术(洛阳)有限公司 | The vision detection system and detection method of a kind of white glass surface defect of automatic detection |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A300 | Application deemed to be withdrawn because no request for examination was validly filed |
Free format text: JAPANESE INTERMEDIATE CODE: A300 Effective date: 19980514 |