JPH0423335Y2 - - Google Patents
Info
- Publication number
- JPH0423335Y2 JPH0423335Y2 JP11618085U JP11618085U JPH0423335Y2 JP H0423335 Y2 JPH0423335 Y2 JP H0423335Y2 JP 11618085 U JP11618085 U JP 11618085U JP 11618085 U JP11618085 U JP 11618085U JP H0423335 Y2 JPH0423335 Y2 JP H0423335Y2
- Authority
- JP
- Japan
- Prior art keywords
- rail
- optical semiconductor
- leads
- receiving element
- guide
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 claims description 30
- 230000003287 optical effect Effects 0.000 claims description 28
- 238000005452 bending Methods 0.000 claims description 18
- 238000007689 inspection Methods 0.000 claims description 8
- 230000005484 gravity Effects 0.000 claims description 3
- 230000002950 deficient Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000032258 transport Effects 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11618085U JPH0423335Y2 (OSRAM) | 1985-07-29 | 1985-07-29 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11618085U JPH0423335Y2 (OSRAM) | 1985-07-29 | 1985-07-29 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6226055U JPS6226055U (OSRAM) | 1987-02-17 |
| JPH0423335Y2 true JPH0423335Y2 (OSRAM) | 1992-05-29 |
Family
ID=31000528
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11618085U Expired JPH0423335Y2 (OSRAM) | 1985-07-29 | 1985-07-29 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0423335Y2 (OSRAM) |
-
1985
- 1985-07-29 JP JP11618085U patent/JPH0423335Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6226055U (OSRAM) | 1987-02-17 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH0423335Y2 (OSRAM) | ||
| JPWO2016067503A1 (ja) | 生産処理装置、生産処理方法、プログラム及びワークの製造方法 | |
| JP3732635B2 (ja) | プリント配線板検査装置 | |
| CN221960350U (zh) | 一种盖玻片机构 | |
| JPS6240434Y2 (OSRAM) | ||
| JPS5923423Y2 (ja) | リ−ドの曲がつたｉｃの検出排除装置 | |
| JPH08128816A (ja) | リード検査方法 | |
| KR100266782B1 (ko) | 전해콘덴서 검사장치 | |
| CN215598259U (zh) | 一种检测治具 | |
| JP2002107306A (ja) | チップコンデンサ外観・電気特性検査方法および装置 | |
| CN207135392U (zh) | 一种自主防尘的电路板 | |
| JPH08306830A (ja) | 特性選別装置のｉｃパッケージ位置決め方法及びその構造 | |
| JPS58143241A (ja) | 半導体装置の検査装置 | |
| JPH06224270A (ja) | 半導体検査装置及びウェハ | |
| JPH11326423A (ja) | 半導体モジュール基板用テストハンドラとモジュール基板の取り出し方法 | |
| JPH06160063A (ja) | 表面検査方法 | |
| KR0164582B1 (ko) | 아이시 칩의 리드체킹방법 및 장치 | |
| JPH0878497A (ja) | 移載装置 | |
| CN120870626A (zh) | 测试头 | |
| JPH05129479A (ja) | Ｉｃソケツト | |
| JPH05190629A (ja) | 半導体装置のリード曲がり検査装置 | |
| JPH0613799A (ja) | 部品挿入方法 | |
| JPH0520395U (ja) | 軸状電子部品の選別装置 | |
| JPH03217096A (ja) | 部品装着方法 | |
| JPH0266435A (ja) | 素子自動選別方法及びその装置 |