JPH04167541A - Positioning method for substrate and device thereof - Google Patents

Positioning method for substrate and device thereof

Info

Publication number
JPH04167541A
JPH04167541A JP2294614A JP29461490A JPH04167541A JP H04167541 A JPH04167541 A JP H04167541A JP 2294614 A JP2294614 A JP 2294614A JP 29461490 A JP29461490 A JP 29461490A JP H04167541 A JPH04167541 A JP H04167541A
Authority
JP
Japan
Prior art keywords
substrate
positioning
guide surface
support rod
smooth
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2294614A
Other languages
Japanese (ja)
Inventor
Masahiro Hirano
平野 正広
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu VLSI Ltd
Fujitsu Ltd
Original Assignee
Fujitsu VLSI Ltd
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu VLSI Ltd, Fujitsu Ltd filed Critical Fujitsu VLSI Ltd
Priority to JP2294614A priority Critical patent/JPH04167541A/en
Publication of JPH04167541A publication Critical patent/JPH04167541A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To make it possible to position a substrate without inflicting a flaw on the surface of the substrate by a method wherein the substrate, which is supported at its lower surface and can be freely slid in the horizontal direction, is made to descend vertically in a smoothly tapered guide surface, which is converged toward its lower part, and is made to follow the guide surface and is positioned. CONSTITUTION:A substrate positioning device is provided with a substrate positioning stage 11 having a smooth guide surface 16a, which is converged toward its lower part and is formed into a tapered form, support rods 12, which are made to slidingly penetrate sliding holes 11b made to penetrate the bottom of the stage 11 in the vertical direction and support horizontally the lower surface of a substrate 30 by their smooth tips, and a support rod moving means 14 for moving the rods 12 in the vertical direction. The substrate 30, which is supported at its lower surface and can be freely slid in the horizontal direction, is made to descend in the smooth guide surface 11a, which is converged toward its lower part and is formed into a tapered form, in the vertical direction, the outer peripheral edge of the substrate 30 is made to abut on the guide surface 11a and the substrate 30 is made to move smoothly in the horizontal direction, is made to follow the guide surface 11a and is positioned. Thereby, it becomes possible to position the substrate 30 without damaging the surface of the substrate 30.

Description

【発明の詳細な説明】 〔概 要〕 基板、半導体ウェーハ等の基板の位置決め方法とその装
置に関し、 基板の表面を損傷することなく予め設定した位置に合わ
せる基板の位置決め方法とその装置の提供を目的とし、 基板を予め設定8した位置に合わせる基板の位置決め方
法に於いて、下面を支持されて水平方向に自在に滑動可
能な基板を、下方に向かって収斂するテーパ状をした滑
らかな案内面内を鉛直方向に下降させ、 〜 案内面に基板の外周縁を当接させて、基板を水平方向に
滑動させて案内面に倣わせて位置決めするように構成す
る。
[Detailed Description of the Invention] [Summary] The present invention relates to a method and device for positioning a substrate such as a substrate or a semiconductor wafer, and provides a method and device for positioning a substrate such that the surface of the substrate is aligned with a preset position without damaging the surface of the substrate. In a method of positioning a board to position the board at a preset position, the board is supported on its lower surface and can freely slide in the horizontal direction, using a smooth guide surface with a tapered shape that converges downward. The inner part is lowered in the vertical direction, the outer peripheral edge of the board is brought into contact with the guide surface, and the board is slid horizontally and positioned by following the guide surface.

また、基板を予め設定した位置に合わせる基板の位置決
め装置に就いては、下方に向かって収斂するテーバ状を
した滑らかな案内面を有する基板位置決め台と、 基板位置決め台の底面を貫通して設けた摺動孔を鉛直方
向に摺動自在に貫通し、滑らかな先端で基板の下面を支
持する支持棒と、 支持棒を鉛直方向に移動する支持棒移動手段とを含んで
構成する。
In addition, the substrate positioning device for aligning the substrate to a preset position includes a substrate positioning table having a tapered smooth guiding surface that converges downward, and a substrate positioning device provided through the bottom surface of the substrate positioning table. The support rod includes a support rod that vertically slides through a sliding hole and supports the lower surface of the substrate with a smooth tip, and a support rod moving means that moves the support rod in the vertical direction.

r産業上の利用分野〕 本発明は、半導体ウェー八等の基板の位置決め方法、特
に基板の表面を損傷することなく予め設定した位置に合
わせる基板の位置決め方法とその装置に間する。
Field of Industrial Application] The present invention relates to a method for positioning a substrate such as a semiconductor wafer, and particularly to a method and apparatus for positioning a substrate to a preset position without damaging the surface of the substrate.

半導体装置のウェーハブロセス工程で点在して配置した
装置間の半導体ウェーハの移動は、通常搬送コンベヤ等
により行っている。
In the wafer processing process for semiconductor devices, semiconductor wafers are usually moved between devices that are arranged at different locations using a conveyor or the like.

そして、搬送コンベヤにより搬送された半導体ウェーハ
は、搬送中の振動等により搬送コンベヤトをランダムに
移動して位置ずれを起こしているのが普通である。
Semiconductor wafers transported by a transport conveyor usually move randomly on the transport conveyor due to vibrations during transport, causing positional deviations.

したがって、かかる状態で搬送された半導体うニームは
、予め定めた位置に位置決めされた後に装置にセットさ
れるのが一般的である。
Therefore, the semiconductor unit transported in such a state is generally positioned in a predetermined position and then set in the device.

〔従来の技術〕[Conventional technology]

次に、従来の位置決め方法とその治具を第3図を参照し
ながら説明する。
Next, a conventional positioning method and its jig will be explained with reference to FIG.

第3図は、従来の半導体ウェーハの位置決め方法とその
治具を説明するための図で、同図(a)は位置決め治具
の平面図、同図(b)は位置決め治具のA−A線断面図
、同図(c)は半導体ウェーへの位置決め方法を模式的
に示す側断面図である。
FIG. 3 is a diagram for explaining a conventional semiconductor wafer positioning method and its jig. FIG. 3(a) is a plan view of the positioning jig, and FIG. A line sectional view, and FIG. 3(c) is a side sectional view schematically showing a method of positioning the semiconductor wafer.

すなわち、従来の位置決め治具20は、同図(a)及び
同図(b)に示すように厚い平板、例えば摩擦係数の小
さいポリテトラフロロエチレン(通称、テフロン)板に
、その表面を厚さ方向に途中まで4鉢状に穿孔して案内
穴20aだけを設けて形成したものである。
That is, the conventional positioning jig 20 is made of a thick flat plate, for example, a polytetrafluoroethylene (commonly known as Teflon) plate with a small coefficient of friction, and the surface thereof is thickened as shown in FIGS. It is formed by drilling four pot-shaped holes halfway in the direction and providing only the guide hole 20a.

なお、案内穴20aの最上端の開口の広さは、半導体ウ
ェーハ30の面積より広く構成されているとともに、最
下端の開口は半導体ウェーハ30より僅かに広く構成さ
れている。
The width of the opening at the top end of the guide hole 20a is configured to be larger than the area of the semiconductor wafer 30, and the opening at the bottom end is configured to be slightly wider than the semiconductor wafer 30.

そして、このように形成した位置決め治具20による半
導体ウェーハ30の基板の位置決めは、同図(c)に示
す如く案内穴20aの直上の位置に保持した半導体ウェ
ーハ30を、矢印りで示すように案内穴2Oa内に自然
落下させて行うものであった。
The substrate of the semiconductor wafer 30 is positioned using the positioning jig 20 formed in this way, as shown in FIG. This was done by letting it fall naturally into the guide hole 2Oa.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

ところが、前述したような半導体ウェーハ30の位置決
め方法は、半導体ウェーハ30を位置決め治具20の案
内穴20aに自然落下させた際の衝撃により、半導体ウ
ェーハ30の表面に傷が入る等の問題が間々発生してい
た。
However, the method for positioning the semiconductor wafer 30 as described above often has problems such as scratches on the surface of the semiconductor wafer 30 due to the impact when the semiconductor wafer 30 is dropped naturally into the guide hole 20a of the positioning jig 20. It was occurring.

本発明は、かかる問題を解消するためになされたもので
、その目的は基板の表面に傷を付けることなく位置決め
できる位置決め方法とその装置のキ是イ共にある。
The present invention was made to solve this problem, and its purpose is to provide a positioning method and apparatus that can position the substrate without damaging the surface thereof.

〔課題を解決するための手段] 前記目的は、第1図及び第2図に示すように下面を支持
されて水平方向に自在に滑動可能な基板30を、下方に
向かって収斂するテーバ状をした滑らかな案内面11a
内を鉛直方向に下降させ、案内面11aに基板30の外
周縁を当接させ、基板30を水平方向に滑動させて案内
面11aに倣わせて位置決めすることを特徴とする基板
の位置決め方法により達成される。
[Means for Solving the Problems] The object is to form a substrate 30 that is supported on its lower surface and can freely slide horizontally, as shown in FIGS. 1 and 2, into a tapered shape that converges downward. smooth guiding surface 11a
According to a method of positioning a board, the substrate 30 is positioned by lowering the inside in the vertical direction, bringing the outer peripheral edge of the board 30 into contact with the guide surface 11a, and sliding the board 30 horizontally to follow the guide surface 11a. achieved.

また、前記目的は、第1図に示すように下方に向かって
収斂するテーバ状をした滑らかな案内面11aを有する
基板位置決め台11と、基板位置決め台11の底面をW
通した摺動孔11bを鉛直方向に摺動自在に貫通し、滑
らかな先端で基板30の下面を水平に支持する支持棒1
2と、支持棒12を鉛直方向に移動する支持棒移動手段
13とを含んでなることを特徴とする基板の位置決め装
置によっても達成される。
Further, as shown in FIG.
A support rod 1 vertically slidably passes through the sliding hole 11b and horizontally supports the lower surface of the substrate 30 with a smooth tip.
2 and a support rod moving means 13 for moving the support rod 12 in the vertical direction.

〔作 用〕[For production]

本発明の基板の位置決め方法とその装置は、基板30の
下面を支持し、基板30を下方に向かって収斂するテー
バ状をした滑らかな案内面11a内を鉛直方向に下降し
、基板30を案内面11aに倣わせて位置決めするもの
である。
The substrate positioning method and apparatus of the present invention support the lower surface of the substrate 30 and guide the substrate 30 by vertically descending within a tapered smooth guide surface 11a that converges downward. The positioning is performed by following the surface 11a.

従って、基板30は自然落下することがないために、基
板30には全く衝撃力が加わることがない。
Therefore, since the substrate 30 does not fall by itself, no impact force is applied to the substrate 30 at all.

斯くして、基板30の表面には全く傷が入る余地はない
こととなる。
In this way, there is no room for scratches on the surface of the substrate 30.

r実 施 例〕 以下、本発明の基板の位置決め装置の一実施例について
は第1図を参照しながら、また未発明の基板の位置決め
方法の一実施例については第2図を参照しながら説明す
る。
Embodiment] Hereinafter, an embodiment of the substrate positioning device of the present invention will be described with reference to FIG. 1, and an embodiment of the yet-to-be-invented substrate positioning method will be described with reference to FIG. 2. do.

第1図は、本発明の基板の位置決め装置の一実施例を説
明するための図で、同図(a)は位置決め装置の平面図
、同図(b)は位置決め装置の模式的断面図である。
FIG. 1 is a diagram for explaining an embodiment of the substrate positioning device of the present invention, where (a) is a plan view of the positioning device, and (b) is a schematic cross-sectional view of the positioning device. be.

第2図は、本発明の基板の位置決め方法の一実施例をT
程順に説明するための模式的断面図である− なお、第2図の(b)図及び(c)図においては、支持
棒駆動装置と支持棒の一部の図示を割愛しであるう すなわち、第1図の(a)図及び(b)図に示す如く未
発明の一実施例の基板の位1決め装置IOは、厚い平板
、例えば摩擦係数の小さいポリテトラフロロエチレン(
通称、テフロン)板の表面を厚さ方向に途中まで播鉢状
に円形に穿孔して、内面が滑らかな案内面11aとなる
案内穴11a゛を設けた後に、案内穴11a’の底面に
当該底面を垂直に貫通した3つの摺動孔11bを案内穴
118′の中心点Cを中心とする円弧線上に120°置
きに設けた基板位置決め台11と、 基板位置決め台11の摺動孔11bを摺動自在に貫通す
るとともに、高さの揃った上部先端で基板、例えば半導
体ウェーハ30の下面を面方向に滑動自在状桃で水平に
支持するポリテトラフロロエチレン製の支持棒12と、 支持棒12を鉛直方向に昇降する支持棒移動手段】3と
を含んで構成したものである。
FIG. 2 shows an embodiment of the substrate positioning method of the present invention.
FIG. 2 is a schematic cross-sectional view for explaining the process step by step. It should be noted that in FIG. As shown in FIGS. 1(a) and 1(b), the substrate positioning device IO of the uninvented embodiment is made of a thick flat plate, such as polytetrafluoroethylene (polytetrafluoroethylene) having a small coefficient of friction.
After drilling the surface of the plate (commonly known as Teflon) into a bowl-like shape part way in the thickness direction to provide a guide hole 11a' whose inner surface becomes a smooth guide surface 11a, a hole is formed on the bottom of the guide hole 11a'. The board positioning table 11 has three sliding holes 11b vertically penetrating the bottom surface, and the sliding holes 11b of the board positioning table 11 are provided at 120° intervals on an arc line centered on the center point C of the guide hole 118'. A support rod 12 made of polytetrafluoroethylene, which extends through the support rod in a slidable manner and horizontally supports the lower surface of a substrate, for example, a semiconductor wafer 30, with an upper tip having a uniform height and is slidable in the surface direction; 12 and a support rod moving means for vertically moving up and down [3].

次に、かかる構成をした本発明の一実施例の位置決め治
具で、半導体ウェーハ30の位置決めを行う方法を第2
図により説明する。
Next, a second method for positioning the semiconductor wafer 30 using the positioning jig according to an embodiment of the present invention having such a configuration will be described.
This will be explained using figures.

まず、基板位置決め台11から先端部を突き出した状態
で一時的に移動を停止している支持棒12の先端で、ハ
ンドリングロボット (図示せず)が吸着して保持して
いる半導体ウェーハ30を当該ハンドリングロボットか
ら受けて、半導体ウェーハ30の下面を支持する〔同図
(a)参照〕。
First, a handling robot (not shown) picks up and holds the semiconductor wafer 30 at the tip of the support rod 12, which has temporarily stopped moving with its tip protruding from the substrate positioning table 11. It receives from the handling robot and supports the lower surface of the semiconductor wafer 30 [see FIG. 3(a)].

この後、支持棒移動手段13が支持棒12を徐々に下降
させると、支持棒12の先端に偏心状態で支持された半
導体ウェーハ30の外周縁は、基板位置決め台11の案
内穴11a゛の播鉢状をした案内面11aに当接し、支
持棒12の先端上を滑らかに滑動して案内面11aに倣
うこととなる〔同図(b)参照〕。
Thereafter, when the support rod moving means 13 gradually lowers the support rod 12, the outer periphery of the semiconductor wafer 30, which is eccentrically supported at the tip of the support rod 12, is placed in the guide hole 11a' of the substrate positioning table 11. It comes into contact with the bowl-shaped guide surface 11a, and smoothly slides on the tip of the support rod 12 to follow the guide surface 11a [see FIG. 13(b)].

そして、かかる状態で支持棒移動手段13により支持棒
12が更に下降して基板位置決め台11の摺動孔11b
内に先端が引っ込んだ状態になると、半導体ウェーハ3
0の全外周縁は基板位置決め台11の案内面11aに当
接して、半導体ウェーハ30は案内面+1aに倣った状
態で正確に位置決めされることとなるr同図(c)参照
〕。
Then, in this state, the support rod 12 is further lowered by the support rod moving means 13, and the slide hole 11b of the substrate positioning table 11 is moved downward.
When the tip is retracted inward, the semiconductor wafer 3
The entire outer periphery of the substrate positioning table 11 contacts the guide surface 11a of the substrate positioning table 11, and the semiconductor wafer 30 is accurately positioned following the guide surface +1a.

斯くして、未発明の基板の位置決め方法とその装置は、
半導体ウェーハの表面に傷を付けることなく、この半導
体ウェーハを所定位Wに位置決めできることとなる。
Thus, the uninvented substrate positioning method and apparatus are
This allows the semiconductor wafer to be positioned at a predetermined position W without damaging the surface of the semiconductor wafer.

〔発明の効果] 以ヒの説明から明らかなように本発明によれば、基板の
表面をpm 4gすることなく位置決めできる位置決め
方法とその装置の提供が可能となる。
[Effects of the Invention] As is clear from the description below, according to the present invention, it is possible to provide a positioning method and apparatus that can position the surface of a substrate without subjecting it to pm 4g.

したがって、本発明の基板の位置決め方法とその装置を
半導体装置のウェーハプロセス工程等に採用することに
より、製造ラインの円滑な稼動と半導体装置等を歩留ま
り良く製造することを可能ならしめることとなる。
Therefore, by employing the substrate positioning method and device of the present invention in wafer processing steps for semiconductor devices, etc., it becomes possible to operate the manufacturing line smoothly and manufacture semiconductor devices, etc. with high yield.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、本発明の基板の位置決め装置の一実施例を説
明するための図、 第2図は、本発明の基板の位置決め方法の一実施例を工
程順に説明するための模式的断面図、第3図は、従来の
半導体ウェーハの位置決め方法とその治具を説明するた
めの図である。 図において、 10は基板の位置決め装置、 11は基板位置決め台、 12は支持棒、 13は支持棒移動手段、 20は基板の位置決め治具、 30は基板(半導体ウェーハ)をそれぞれ示す。 (Ql (11を庚1襞LvtnrL 願【d謝装置3外引1−艷旙例セ銭嘲慣tM酌ta (Q) !!1 th+の (C)聞 tQ)  イtLf 3月−^ラモMf平6bα1(b
)竹!!ン欠めう台、!2杓八へ八へ判断面図(C)半
anト亡7エー八−)イt1 jhtil ee$ 或
ず1う+−JTイfづohmぐし表/l+44ウェー八
?4tLfj大パノ「5ゑt’i^右屓を直tθ呵丁用
め^Cり第3図
FIG. 1 is a diagram for explaining an embodiment of the substrate positioning device of the present invention, and FIG. 2 is a schematic sectional view for explaining an embodiment of the substrate positioning method of the present invention in the order of steps. , FIG. 3 is a diagram for explaining a conventional semiconductor wafer positioning method and its jig. In the figure, 10 is a substrate positioning device, 11 is a substrate positioning stand, 12 is a support rod, 13 is a support rod moving means, 20 is a substrate positioning jig, and 30 is a substrate (semiconductor wafer). (Ql (11 庚 1 fold LvtnrL prayer [d appreciation device 3 external withdrawal 1-艷旙例Se money mocking practice tM consideration ta (Q)!! 1 th+ (C) listening tQ) ItLf March - ^ Ramo Mf flat 6bα1(b
)bamboo! ! I can't stand it! 2 Dip8 to 8 Judgment surface diagram (C) Half ant death 7 A8 -) It1 jhtil ee$ Or 1 U + - JT I f zu hm Gushi table / l + 44 Way 8? 4tLfj large pano ``5ゑt'i^ right side for direct tθ 2nd position ^C Figure 3

Claims (2)

【特許請求の範囲】[Claims] (1)基板を予め設定した位置に合わせる基板の位置決
め方法において、 面を支持されて水平方向に自在に滑動可能な前記基板(
30)を、下方に向かって収斂するテーパ状をした滑ら
かな案内面(11a)内を鉛直方向に下降させ、 前記案内面(11a)に前記基板(30)の外周縁を当
接させて、基板(30)を水平方向に滑動させて案内面
(11a)に倣わせて位置決めすることを特徴とする基
板の位置決め方法。
(1) In a method for positioning a substrate by adjusting the substrate to a preset position, the substrate (
30) is lowered in the vertical direction within a smooth guide surface (11a) with a tapered shape that converges downward, and the outer peripheral edge of the substrate (30) is brought into contact with the guide surface (11a), A method for positioning a substrate, which comprises positioning the substrate (30) by sliding it horizontally to follow a guide surface (11a).
(2)基板を予め設定した位置に合わせる基板の位置決
め装置において、 下方に向かって収斂するテーパ状をした滑らかな案内面
(11a)を有する基板位置決め台(11)と、前記基
板位置決め台(11)の底面を貫通して設けた摺動孔(
11b)を鉛直方向に摺動自在に貫通し、滑らかな先端
で前記基板(30)の下面を支持する支持棒(12)と
、 前記支持棒(12)を鉛直方向に移動する支持棒移動手
段(13)とを含んでなることを特徴とする基板の位置
決め装置。
(2) A substrate positioning device for aligning a substrate to a preset position, which includes a substrate positioning table (11) having a tapered smooth guiding surface (11a) that converges downward, and the substrate positioning table (11). ) through the bottom of the sliding hole (
11b) slidably vertically and supports the lower surface of the substrate (30) with a smooth tip; and a support rod moving means for vertically moving the support rod (12). (13) A substrate positioning device comprising:
JP2294614A 1990-10-31 1990-10-31 Positioning method for substrate and device thereof Pending JPH04167541A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2294614A JPH04167541A (en) 1990-10-31 1990-10-31 Positioning method for substrate and device thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2294614A JPH04167541A (en) 1990-10-31 1990-10-31 Positioning method for substrate and device thereof

Publications (1)

Publication Number Publication Date
JPH04167541A true JPH04167541A (en) 1992-06-15

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Application Number Title Priority Date Filing Date
JP2294614A Pending JPH04167541A (en) 1990-10-31 1990-10-31 Positioning method for substrate and device thereof

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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5885054A (en) * 1996-01-31 1999-03-23 Komatsu Electronics Metals Co. Ltd. Carrying device for semiconductor wafers
US6183189B1 (en) * 1998-11-27 2001-02-06 Chartered Semiconductor Manufacturing, Ltd. Self aligning wafer chuck design for wafer processing tools
WO2007114331A1 (en) * 2006-04-04 2007-10-11 Miraial Co., Ltd. Thin plate container
JP2007281053A (en) * 2006-04-04 2007-10-25 Miraial Kk Thin plate housing container
JP2009206315A (en) * 2008-02-28 2009-09-10 Chugai Ro Co Ltd Substrate mounting device to table
WO2014087762A1 (en) * 2012-12-04 2014-06-12 リソテックジャパン株式会社 Vertical-movement device and small-form-factor manufacturing device
CN107735857A (en) * 2015-06-05 2018-02-23 应用材料公司 Base stand location and slewing and application method

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5885054A (en) * 1996-01-31 1999-03-23 Komatsu Electronics Metals Co. Ltd. Carrying device for semiconductor wafers
US6183189B1 (en) * 1998-11-27 2001-02-06 Chartered Semiconductor Manufacturing, Ltd. Self aligning wafer chuck design for wafer processing tools
SG81267A1 (en) * 1998-11-27 2001-06-19 Chartered Semiconductor Mfg Self aligning wafer chuck design for wafer processing tools
WO2007114331A1 (en) * 2006-04-04 2007-10-11 Miraial Co., Ltd. Thin plate container
JP2007281053A (en) * 2006-04-04 2007-10-25 Miraial Kk Thin plate housing container
JP2009206315A (en) * 2008-02-28 2009-09-10 Chugai Ro Co Ltd Substrate mounting device to table
WO2014087762A1 (en) * 2012-12-04 2014-06-12 リソテックジャパン株式会社 Vertical-movement device and small-form-factor manufacturing device
CN107735857A (en) * 2015-06-05 2018-02-23 应用材料公司 Base stand location and slewing and application method
CN107735857B (en) * 2015-06-05 2022-01-11 应用材料公司 Base positioning and rotating equipment and using method

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