JPH04154140A - Automatic inspection apparatus of electronic component provided with parallel leads - Google Patents

Abstract

PURPOSE:To make an inspection apparatus small-sized and to enhance the reliability of a measuring operation by a method wherein a molded electronic component is conveyed forcibly instead of being conveyed by gravity and a plurality of processes of the electronic component such as an electronic measurement process, an inspection process, a stamping process by means of a laser, a taping process and the like are executed collectively inside the same plane which is perpendicular to the transfer direction of the electronic component. CONSTITUTION:A ball feeder 4 used as the supply part of an electronic component 3 is constituted of a vibrating device 10 and an alignment dish 11 provided with a spiral arrangement sheet 12 at the inside. The electronic component 3 provided with a plurality of leads 13 in the same direction is put at random into the same plane of the dish 11. Then, the device 10 is turned and vibrated; the leads 13 are arranged in a definite direction and are transferred by using the arrangement plate 12; the head part of the component 3 which has reached the upper end is gripped by using a linear feeder 6; and only the leads 13 are made to protrude downward. After that, the component 3 reaches a measuring mechanism part 7 by using a cam mechanism 8; and the component 3 which has been fed is measured one by one. When its measuring operation is finished, the component is dropped into a housing case.

Description

Detailed Description of the Invention [Industrial Application Field] The present invention is applicable to electrical measurement and inspection of molded electronic components of discrete device caps having multiple parallel leads in the same direction, marking by laser, and inspection of markings. confirmation, selection,
This invention relates to an automatic inspection device for electronic components that integrates multiple processes such as backing and taping.

[Prior Art] As an example of this type of device for measuring and sorting the characteristics of molded electronic components having parallel leads such as transistors, diodes, resistors, capacitors, etc.
A characteristic measuring device disclosed in the above publication is known. This characteristic measuring device is equipped with a chute installed at a required angle with respect to the parts feeder, through which the electronic component is dropped by its own weight and guided to the characteristic work position, and the contact needle is brought into contact with the lead of the electronic component. The structure is such that the characteristics can be measured by

[Problems to be Solved by the Invention] However, in such conventional characteristic measuring devices, the electronic components are transferred to the working position by gravity transport, so the transfer speed of the electronic components is slow < (0 ,3m
II/xt), there was a problem in that high-speed measurement was not possible. In addition, since it is not forced feeding, accurate individual feeding is not possible due to causes such as electronic components getting caught in the chute, and as a result, multiple items are fed at one time, resulting in incorrect measurements and misclassifications. In addition, device jams occurred due to device jamming, which lowered the operating rate and caused problems with reliability. Furthermore, when measuring two or more types of characteristics, it is necessary to arrange the contact needles in parallel in the direction of transport of the electronic component, which increases the size of the apparatus.

Therefore, the present invention has been made in view of the above-mentioned conventional problems, and its purpose is to forcibly transport electronic components instead of gravity transport, and to transport electronic components on the same plane perpendicular to the direction of transport of the electronic components. By measuring inside the machine, it is possible to speed up the transfer and make it more compact.In addition, it is possible to reliably measure and classify each item, and to check the clarity of the characters while stamping, which improves the reliability of the device. An object of the present invention is to provide an automatic inspection device for electronic components having parallel leads.

[Means for Solving the Problems] The present invention has been made to achieve the above object, and a first aspect of the present invention is to transfer electronic components that are aligned and fed by a bowl feeder, stick, etc. to a device feeding position. a linear feeder having an approximately horizontal or inclined angle; a separation means for separating the most advanced electronic component supplied to the device supply position from the second and subsequent electronic components; a driving source; and approximately perpendicular to the direction of transport by the linear feeder. a disk located in a plane that is intermittently rotated at a constant angle by the drive source; and a state-of-the-art electron beam provided on the disk at a distance of approximately the same angle as the above-mentioned angle in the circumferential direction and sent from the device supply position. A plurality of holding means and electronics are provided around the disk to hold the parts and sequentially lead them to a plurality of working positions and classification/storage positions provided for the purpose of electrically measuring electrical parts, detecting marking patterns using a laser, etc. at least one of the following: a lead support that contacts and separates from the leads of the component; a vacuum suction device provided to maintain the position and reliable operation of the electronic component when the holding means holds the electronic component; and at least one of the working positions. By having a measuring element disposed in a measuring element for measuring the characteristics of an electronic component, a plurality of cams that rotate in response to rotational transmission from the driving source, and an actuating member that is operated at the appropriate timing by each cam,
It is constructed of a cam mechanism that operates the separating means when separating and supplying electronic components and opens the holding means located at the device supply position and the classification storage position.

The second invention is a linear feeder having a substantially horizontal or inclined angle that transfers electronic components arranged and supplied by a bowl feeder, stick, etc. to a device supply position, and a linear feeder that transports the most advanced electronic components supplied to the device supply position. a separating means for separating electronic components from the second electronic component onward; a driving source; a disk that is located in a plane substantially perpendicular to the direction of transport by the linear feeder and is intermittently rotated by a certain angle by the driving source; approximately the same angle as the above angle in the direction - angle M
rmt, to hold the most advanced electronic components fed from the device supply position, and a plurality of disks provided around the disk for the purpose of electrical measurement of the electrical components, laser marking pattern detection, etc. A plurality of holding means that sequentially lead to a working position and a classification storage position; a lead support that contacts and separates the lead of an electronic component; and a lead support that maintains the position and reliable operation of the electronic component when the holding means holds the electronic component. a vacuum suction device provided at the work position; a measuring element disposed at at least one of the working positions for measuring the characteristics of the electronic component; and a plurality of cams that rotate in response to rotational transmission from the drive source. By having an actuating member timed by a cam, the separating means is actuated when electronic components are separated and fed, and the holding means in the device feeding position and the sorting storage position are opened, and the lead support and the holding means are opened during measurement. It consists of a cam mechanism that brings the probe into contact with the lead of the electronic component.

[Function] In the present invention, the bowl feeder applies vibration to the electronic components to align them and feed them into the linear feeder. In the case of a stick, the aligned devices in the stick are fed into a linear feeder.

The linear feeder applies vibrations to electronic components in the front-rear direction and forcibly transports them to the device supply position. The disk is equipped with a plurality of holding means for holding electronic components, and is intermittently rotated by a certain angle to sequentially guide the electronic components to a working position and a sorting/storage position.

It is also possible to stamp the measured device at the stamping position, check the clarity of the characters at the next position, and then guide it to the classification storage position.

The cam mechanism separates electronic components one by one, presses them against the holding means, and stops them at the device supply position and classification storage position by operating each operating member in a timely manner as the cam rotates. The holding means is operated to open, and the lead support and the probe are brought into contact with and separated from the leads of the electronic component.

[Example] Hereinafter, the present invention will be described in detail based on an example shown in the drawings.

FIG. 1 is a schematic perspective view showing an embodiment of an automatic inspection device according to the present invention, FIG. 2 is a perspective view of a cam mechanism, FIG. 3 is an external perspective view of the device, and FIG. 4 is a device supply position, FIG. 3 is a diagram showing the positional relationship between a working position and a classification/storage position, and the state of electronic components. In this embodiment, a device of the present invention will be described which is intended for an electronic component such as a transistor having a plurality of leads (for example, three leads) in the same direction.

In FIG. 3, the automatic inspection equipment W1 includes a box-shaped housing 2 with an open front, and a bowl feeder 4 and a control unit 5 constituting a supply unit for electronic components 3 are stacked on the negative side. A linear feeder 6, a measuring mechanism section 7 for electronic components 3, and a cam mechanism 8 are disposed on the top surface, and a storage booth 9 for storing electronic components 3 measured and sorted by the measuring mechanism section 7 is disposed inside. has been done.

The bowl feeder 4 is a conventionally known one, and includes a vibrating bag W1.
0, and an alignment plate 11 having a spiral organizing plate 12 on the inner surface, and during the alignment [111] the electronic device having a plurality of leads 13 (see FIG. 1) in the same plane and in the same direction. The parts 3 are randomly introduced and are sequentially transferred upward on the organizing plate 12 with the leads 13 aligned in a certain direction as a result of rotational vibration by the vibrating bag W10. The base end of the linear feeder 6 is connected to the upper end of the yN M buried tray 11 in a tangential direction to the upper end of the sorting plate 12, and the electronic components 3 that have reached the upper end of the sorting plate 12 are The leads 13 are inserted and held with their heads into guide grooves (not shown) of the linear feeder 6, and are sequentially fed into the linear feeder 6 with only the leads 13 protruding below the guide groove.

The linear feeder 6 is conventionally known, and as shown in FIG. 1, it includes a chute 14 installed substantially horizontally on the housing #2, a vibrating device 15 that vibrates the chute 14 in the left-right direction (longitudinal direction), and a pool. As the vibrating bag 215 vibrates, the electronic component 3 whose head is fitted into the guide groove of the chute 14 is forcibly transferred at a constant speed. The tip position of the chute 14 is the device supply position A (FIG. 4), and the electronic component 3 that has reached this point fA contacts a stopper (not shown) and temporarily stops and waits.

The pool sensor 16 is provided in the middle of the chute 14 to detect the electronic component 3, and when there is no electronic component 3 at this sensor position, it sends a signal, and based on this, the I11 control section 5
operates the bowl feeder 4 to feed the electronic components 3 into the chute 14.

In FIG. 1, the measurement mechanism section 7 includes a drive motor 17
The rotation of the output shaft 18 is transmitted to the disk 20 via the indexer 19 and to the cam mechanism 8 via the belt 21 and the like.

The indexer 19 is fixed to a frame 23 installed on the housing 2, and rotates the disk 20 at a predetermined angle at regular intervals by rotation transmission from the drive motor 17.
For example, it is rotated intermittently by 1/8 rotation (45°) in the direction of the arrow in FIG. On the outer periphery of the disk 20, eight holding means 24 (only four shown in FIG. 4) for holding the electronic components 3 sent out from the chute 14 are provided at equal intervals in the circumferential direction. . As a means for sending out electronic components 3 by using the chute 14 and air feeding from the chute 14, a vacuum suction tube 31 is guided to the tip of the chute 14, and the most advanced device 3 of the chute 14 is sucked from this, and the device 3 is Eliminates interference caused by mold burrs,
The presence or absence of suction by the vacuum suction tube 31 is detected by a vacuum pressure sensor (not shown). This attracted device 3 is pushed out a little by a lever 62 driven by a cam mechanism to be described later, thereby ensuring that the holding means 24 easily and accurately holds the device 3, thereby ensuring reliability in measurements, stamping, etc. I'm trying to improve it.

The holding means 24 for the electronic component 3 is provided with a support 25 fixedly arranged on the disk 20 and in proximity to the support 25, as shown in FIG.
It is composed of a clamper 26 that presses against the The clamper 26 is formed in an abbreviated shape, and its bent portion is connected to the disk 20 by a shaft 27 that projects from the disk 20.
The cover spring 2 is rotatably supported in a plane parallel to the plane of
9 gives the same effect behavior in the closing direction.

Further, a rotatable roller 30 is attached to the opposite end of the clamper 26 from the pressing portion that presses the electronic component 3 .

Furthermore, eight glue dowels 32 are disposed on the disk 20 near each of the holding means 24. As shown in FIGS. 1, 2, and 4, this lead support 32 holds the leads 13 in a fixed position when measuring the characteristics of the electronic component 3, presses the probe 33 against the leads 13, and maintains a predetermined contact pressure. It is attached to one arm of a lever 34 that is formed into a substantially T-shape. An arm of the lever 34 opposite to the arm to which the lead support 32 is attached is rotatably supported by the disc 20 via a shaft 35, and the other arm is supported around a fixed cam 37. A roller 38 is mounted which contacts the surface. The lever 34 is given a clockwise rotation behavior in FIG. 2 by the spring 39, so that the roller 38
When the electronic component 3 reaches the working position 1ZBl (Fig. 4) as the disk 20 rotates, the roller 38 moves from the small diameter portion 37a of the fixed cam 37 to the large diameter portion 37b (first ), the lead support 32 is rotated counterclockwise against the spring 39 to move the lead support 32 onto the electronic component 3.
It is configured to be pressed against the lead 13 from below.

The measuring element 33 includes, for example, two contact needles 33 that contact the lead 13 of the electronic component 3 that has reached the working position Bl from above.
a, and is fixed to the frame 23 and electrically connected to a measuring device (not shown).

In this case, the working position WBt is a position above the disk 20 as shown in FIG.
The shifted position, that is, the position where the position directly below the disk 20 is shifted 45 degrees counterclockwise from the classification storage position C1 working position BI, is the second working position If B 2, and the other positions FI D l to D4 are It is considered to be the idle position. However, B
, ,B2. It is also possible to measure the electrical characteristics at the B2 position, inspect the seal at B2, and inspect the seal at B2 or B3, and the degree of freedom in combinations allows for a variety of inspection processes.

Additionally, by using an appropriate sensor, the D□ position can be used to reconfirm that the electronic component is securely held, contributing to high reliability in motion measurement.

The fixed cam 37 is disposed on the housing 2 to face the left side of the disk 20 and substantially parallel thereto, and has a portion of its circumferential surface corresponding to between the first and second working positions 81 to 82. is the large diameter portion 37b, and the other portion is the small diameter portion 3.
7a, and in a state where the roller 38 falls into this small diameter portion 37b, the lead support 32 supports the electronic component 3.
It is separated from the lead 13 of.

In FIGS. 1 and 2, the cam mechanism 8 includes a camshaft 48 which is substantially parallel to the chute 14 and to which rotation of the drive motor 17 is transmitted via a belt 21, pulleys 45, 46, tension rollers 47, etc. Five cams 50 to 54 are fitted and fixed to the shaft 48 at appropriate intervals in the axial direction.

The cam 50 on the left end is called an individual cam and forms a first cam mechanism, whereby the most advanced electronic component 31 and the second electronic component 3 guided to the tip of the chute 14 are connected to each other.
A separation claw (separation means) 55 for separating the 0-2 and the 0-2 separation claw 55 is attached to one end of a lever 57 that is rotated as the individual cam 50 rotates. The lever 57 is formed in an L-shape, and its bent portion is rotatably supported on a shaft 56 disposed parallel to the camshaft 48, with the separation claw 55 at one end and the separation claw 55 at the other end. has individual cam 5
rollers 58 that contact the cam surfaces of 0 are provided, respectively;
The lever spring 60 provides a rotational habit in the counterclockwise direction in FIG. 2, that is, in the direction of pressing the roller 58 against the individual cam 50.

The separation claw 55 separates the electronic component 3 at the device supply position A.
The tip is bent downward into a hook shape beyond the upper part to form an L-shape, and as the individual cam 5o rotates, the rotary lever 57 is rotated clockwise against the spring 6o by a predetermined angle. Then, it enters the chute 14 and its tip is inserted between the most advanced electronic component 31 and the second electronic component 3-2 to separate them.

The second cam from the left (device button cam) 51 is
A second step for advancing and retracting the pushing member 62 that pushes the electronic component 3 sucked and held by the suction tube 31 (FIG. 1) into the holding means 24 stopped at the device supply position 1 fA.
The pushing member 62 is attached to one end of a lever 63, and its tip face faces the support 25 of the holding means 24 at an appropriate distance. The lever 63 is formed in an L-shape, and its bent portion is rotatably supported on the shaft 56, and a roller 64 is provided at the end opposite to the side to which the pushing member 62 is attached. It is being And this lever 63 is
The spring 65 imparts a counterclockwise rotation behavior in FIG. As a result, the pushing member 6S moves forward and presses the electronic component 3 against the support 25 for an instant.

Third cam 52 from the left (clamper opre cam)
is a holding means 2 that stops at the device supply position A;
A lever 67 formed in an L-shape is rotatably disposed on the front i-shaft 56 to correspond to this. There is. One end of the lever 67 is integrally provided with a clamper pressing material 68 whose tip end face is closely opposed to the roller 30 which is attached to the clamper 26, and the other end is attached to the cam surface of the clamper opener cam 52. A contact point 69 is provided. The lever 67 is given a clockwise rotation behavior in FIG. At the time of delivery, the clamper opener cam 52 is rotated clockwise to press the pressing member 68 against the roller 30. For this reason, the clamper 26
As shown by the two-dot chain line in FIG. 4, it opens counterclockwise at a predetermined angle against the force of the spring 29, allowing the pushing member 62 to push the electronic component 3 onto the support 25.

Note that, as a matter of course, the operation of opening the clamper 26 by the pressing member 68 is performed before the forward movement of the pushing member 62 starts. Further, when the electronic component 3 is pressed against the support 25 by the forward movement of the pushing member 62, the pushing member 68 is moved as the clamper opener cam 52 rotates.
The roller 30 is rotated back clockwise to release the pressed state of the roller 30.

Therefore, the clamper 26 is rotated back clockwise by the force of the spring 29 as shown by the solid line in FIG. sandwich the parts.

The fourth cam from the left (device release cam 53 is
The holding means 24 has completed the characteristic measurement, stamping, and checking of the electronic component 3 and has reached the separated storage position C and stopped.
A lever 72 is rotatably provided on the shaft 56 to form a fourth cam mechanism for opening the electronic component 3 and releasing the electronic component 3. The lever 72 is formed in an L-shape, and one end thereof extends to the classification and storage position WC, and is integrally provided with a release member 73 that closely opposes the roller 30 of the clamper 26, and the other end thereof extends to the device release position WC. cam 5
A roller 75 that contacts the cam surface of No. 3 is housed. When the lever 72 is rotated clockwise in FIG. 2 with the rotation of the device release cam 53, the spring 74 pushes up the release member 73, thereby causing the clamper 24 of the holding means 24 in the classification storage position C to is rotated counterclockwise in FIG. 4 to open and release the electronic component 3 from the support 25. Therefore, the electronic component 3 passes through the funnel chute 75 and is dropped and stored in the storage case 9. In this case, the electronic components 3 are sorted according to their characteristics and stored in predetermined chambers within the storage case 9.

The rightmost cam (measuring element driving cam) 54 is the measuring element driving cam 54.
The fifth cam m ellipse is used to operate the probe opener 76 that brings the contact needle 33a into contact with the lead 13 when measuring the characteristics of the electronic component 3.The rotation of this cam 54 swings through the lever 77. The swing motion of the swing cam 78 is transmitted to the cam 78, and the swing motion of the swing cam 78 is further transmitted to the probe opener 76 via a lever 80.

The lever 77 is rotatably disposed on the shaft 56,
At one end of the swing cam 78 -r! I! A long groove 83 into which a bottle 81 protruding from the surface is inserted via a roller 82
A roller 85 is provided at the other end to contact the cam surface of the probe drive cam 54, and a spring 86 imparts a counterclockwise rotation behavior in FIG.

The swing cam 78 is rotatably supported by an output shaft 89 of the indexer on the opposite side of the fixed cam 37 with the disk 2o in between, and
When the lever 77 rotates counterclockwise as the lever 77 rotates, it is rotated clockwise by a predetermined angle, for example, about 15° to 20°,
When the characteristic measurement of the electronic component 3 is completed, it is returned to its original state. A recess 90 is provided in a part of the circumferential surface of the swing cam 78.

The lever 80 is approximately V-shaped, and its bent portion is rotatably supported by a horizontal shaft 92 protruding from the frame 23 (FIG. 1). A roller 93, which is normally located just in front of the four parts 90 on the surface, is rotatably provided, and the contact needle 33a of the measuring element 33 is mounted on the other end.
An L-shaped opener mounting member 96 having three probe openers 76 inserted therebetween is provided, and a spring 97 provides rotational behavior in the direction of pressing the roller 93 against the swing cam 78. . When the roller 93 falls into the recess 90 as the rocking cam 78 rotates clockwise during characteristic measurement of the electronic component 3, the lever 80 is actuated counterclockwise by a predetermined angle and the probe opener 76 is moved. reduce. Therefore, the contact needle 33a of the probe 33 is connected to the probe opener 7.
6, and its tip is elastically deformed downward by the electronic component 3.
is pressed against the lead 13 from above with a predetermined pressure to measure characteristics, for example, measurement of amplification factor.

In this way, the cam mechanism 8 consisting of the first to fifth cam mechanisms operates as the operating members (57, 57,
63, 67, 72, 77, 80, etc.) are operated in synchronization with each intermittent rotation of the disk 20, thereby separating and pushing the electronic component 3 at the device supply position afA, and holding the electronic component 3 by the holding means 24. holding part 3;
In the closing operation, the contacting operation of the lead support 32 and the contact needle 33a with respect to the lead 13 at the working position WBs and B2 is performed.

Note that the above embodiment has two working positions B 1 and B 2 .
However, it can be increased or decreased as appropriate depending on the measurement items of the electronic component 3. If the number is increased, any of the idle positions Dl to D4 may be used as the working position, and if necessary, the idle position D2 or It is also possible to provide a stamp means or a stamp check means to display an inspection mark on the electronic component 3 after the measurement is completed.

In the above embodiment, the probe opener 76 that brings the contact needle 33a into contact with the lead 13 when measuring the characteristics of the electronic component 3 using the probe 33 is operated by the fifth cam mechanism. It is not specific to
It may be operated by an air cylinder, a motor, or the like.

[Effects of the Invention] As explained above, the automatic inspection apparatus for electronic components having parallel leads according to the present invention is configured to transfer electronic components ejected from a bowl feeder, stick, etc. using a linear feeder and a disk. So,
The transfer speed can be faster than the conventional self-weight drop, and since the movement is emphasized, electronic components are not caught in the chute or at the device supply position, and are not delayed, allowing for stable and constant transfer. Moreover, since the electronic components are held and measured one by one by the holding means,
There is no need to grab or store two pieces at the same time, improving the reliability of measurement.Furthermore, since there are multiple holding means on the disk surface and the measuring pieces are arranged circumferentially, Even if the number of measuring mechanisms increases, there is no need to increase the length of the measuring mechanism, and the device can be made more compact, which has great effects. Note that the same effect can be expected by supplying devices using a stick, magazine, or the like instead of a bowl feeder.

[BRIEF DESCRIPTION OF THE DRAWINGS] Fig. 1 is a schematic perspective view showing an embodiment of an automatic inspection device according to the present invention, Fig. 2 is a perspective view of a cam mechanism, and Fig. 3 is an external perspective view of the device. FIG. 4 is a diagram showing the positional relationship between the device supply position, the working position, and the separated storage position, and the state of the electronic components. 2... Housing, 3... Electronic components, 4... Bowl feeder, 5... III control section, 6... Linear feeder,
7... Measuring mechanism section, 8... Cam mechanism, 9... Storage case, 10.15... Vibration device, 13... Lead, 17... Drive motor, 19... Indexer, 20
...Disk, 24...Holding means, 25...Support, 26...-Clamper, 32...Lead support, 37...Fixed cam, 50-54-...Cam, 55
... Separation claw, 76 ... Probe opener, 78 ... Rocking cam, A ... Denocent chair supply position, B1. B2 ・
...Working position, C...Classification storage position. Patent applicant Tese Nku Co., Ltd.

Claims (2)

[Claims] (1) A linear feeder with a substantially horizontal or inclined angle that transfers electronic components that are aligned and fed by a bowl feeder, stick, etc. to a device supply position, and a linear feeder that transfers the most advanced electronic components that are fed to the device supply position from the second a separating means for separating electronic components; a driving source; a disk that is located in a plane substantially perpendicular to the direction of transport by the linear feeder and is intermittently rotated by a predetermined angle by the driving source; The disk is provided at a distance approximately the same angle as the above-mentioned angle to hold the most advanced electronic components fed from the device supply position, and is used around the disk for electrical measurement of electrical components, laser marking pattern detection, etc. A plurality of holding means that sequentially lead to a plurality of work positions and classification storage positions provided for the purpose; a lead support that contacts and separates the lead of the electronic component; and a lead support that contacts and separates the lead of the electronic component; a vacuum suction device provided to maintain reliable operation; a measuring element disposed at at least one of the working positions to measure the characteristics of the electronic component; and a measuring element that rotates in response to rotational transmission from the drive source. By having a plurality of cams and actuating members that are operated at appropriate timings by each cam, the separation means is operated when electronic components are separated and supplied, and the holding means at the device supply position and the classification storage position are operated. An automatic inspection device for electronic components having parallel leads, characterized by comprising a cam mechanism for opening. (2) A linear feeder with an approximately horizontal or 0 degree inclination that transports electronic components that are aligned and supplied by bowl feeders, sticks, etc. to the device supply position, and a second or subsequent one that transports the most advanced electronic components that are supplied to the device supply position. a separating means for separating the electronic components from the electronic components; a drive source; a disk that is in a plane substantially perpendicular to the direction of transport by the linear feeder and is intermittently rotated by a predetermined angle by the drive source; The purpose is to hold the most advanced electronic components fed from the device supply position, which are spaced apart from each other by approximately the same angle as the above-mentioned angle, and to be used around the disk for electrical measurement of the electrical components, laser marking pattern detection, etc. A plurality of holding means that sequentially guide the leads to a plurality of work positions and classification storage positions provided in a vacuum suction device provided to maintain the same operation; a measuring probe disposed at at least one of the working positions to measure the characteristics of the electronic component; By having two cams and an actuating member that is operated with timing by each cam, the separating means is operated when electronic components are separated and supplied, and the holding means at the device supplying position and the sorting storage position are opened, An automatic inspection device for electronic components having parallel leads, characterized by comprising a cam mechanism that brings the lead support and probe into contact with the leads of the electronic component during measurement.