JPH041460B2 - - Google Patents
Info
- Publication number
- JPH041460B2 JPH041460B2 JP62073095A JP7309587A JPH041460B2 JP H041460 B2 JPH041460 B2 JP H041460B2 JP 62073095 A JP62073095 A JP 62073095A JP 7309587 A JP7309587 A JP 7309587A JP H041460 B2 JPH041460 B2 JP H041460B2
- Authority
- JP
- Japan
- Prior art keywords
- mass spectrometer
- magnetic field
- slit
- electric field
- ions
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000005684 electric field Effects 0.000 claims description 27
- 150000002500 ions Chemical class 0.000 description 32
- 238000004885 tandem mass spectrometry Methods 0.000 description 9
- 230000003287 optical effect Effects 0.000 description 8
- 238000000034 method Methods 0.000 description 5
- 238000004949 mass spectrometry Methods 0.000 description 4
- 238000012937 correction Methods 0.000 description 3
- 238000001514 detection method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 238000010494 dissociation reaction Methods 0.000 description 2
- 230000005593 dissociations Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000013467 fragmentation Methods 0.000 description 2
- 238000006062 fragmentation reaction Methods 0.000 description 2
- 238000010884 ion-beam technique Methods 0.000 description 2
- 230000009977 dual effect Effects 0.000 description 1
- 239000004615 ingredient Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000002243 precursor Substances 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
Landscapes
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62073095A JPS63239759A (ja) | 1987-03-27 | 1987-03-27 | 質量分析装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62073095A JPS63239759A (ja) | 1987-03-27 | 1987-03-27 | 質量分析装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63239759A JPS63239759A (ja) | 1988-10-05 |
| JPH041460B2 true JPH041460B2 (enrdf_load_stackoverflow) | 1992-01-13 |
Family
ID=13508428
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62073095A Granted JPS63239759A (ja) | 1987-03-27 | 1987-03-27 | 質量分析装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63239759A (enrdf_load_stackoverflow) |
-
1987
- 1987-03-27 JP JP62073095A patent/JPS63239759A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63239759A (ja) | 1988-10-05 |
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