JPH039623B2 - - Google Patents
Info
- Publication number
- JPH039623B2 JPH039623B2 JP60178226A JP17822685A JPH039623B2 JP H039623 B2 JPH039623 B2 JP H039623B2 JP 60178226 A JP60178226 A JP 60178226A JP 17822685 A JP17822685 A JP 17822685A JP H039623 B2 JPH039623 B2 JP H039623B2
- Authority
- JP
- Japan
- Prior art keywords
- probe card
- probe
- light
- printed wiring
- card body
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000523 sample Substances 0.000 claims description 49
- 230000003287 optical effect Effects 0.000 claims description 9
- 230000005540 biological transmission Effects 0.000 claims description 7
- 230000005611 electricity Effects 0.000 claims description 6
- 239000004065 semiconductor Substances 0.000 description 17
- 238000006243 chemical reaction Methods 0.000 description 9
- 239000011888 foil Substances 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 230000000694 effects Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 229920003002 synthetic resin Polymers 0.000 description 2
- 239000000057 synthetic resin Substances 0.000 description 2
- 229910000906 Bronze Inorganic materials 0.000 description 1
- 229910000881 Cu alloy Inorganic materials 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60178226A JPS6237940A (ja) | 1985-08-12 | 1985-08-12 | プロ−ブカ−ド |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60178226A JPS6237940A (ja) | 1985-08-12 | 1985-08-12 | プロ−ブカ−ド |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6237940A JPS6237940A (ja) | 1987-02-18 |
JPH039623B2 true JPH039623B2 (de) | 1991-02-08 |
Family
ID=16044795
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60178226A Granted JPS6237940A (ja) | 1985-08-12 | 1985-08-12 | プロ−ブカ−ド |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6237940A (de) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1999040449A1 (fr) * | 1998-02-05 | 1999-08-12 | Advantest Corporation | Circuit d'attaque excite optiquement, detecteur de tension de type a sortie optique et materiel de test de circuits integres utilisant ces dispositifs |
GB2340233A (en) * | 1998-02-05 | 2000-02-16 | Advantest Corp | Current measuring method,current sensor,and IC tester using the same current sensor |
JP5230280B2 (ja) * | 2008-06-16 | 2013-07-10 | 新光電気工業株式会社 | プローブカード及び回路試験装置 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5149688A (de) * | 1974-10-25 | 1976-04-30 | Seiko Instr & Electronics | |
JPS5340192A (en) * | 1976-09-24 | 1978-04-12 | Toshiba Corp | Separate type protection device |
-
1985
- 1985-08-12 JP JP60178226A patent/JPS6237940A/ja active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5149688A (de) * | 1974-10-25 | 1976-04-30 | Seiko Instr & Electronics | |
JPS5340192A (en) * | 1976-09-24 | 1978-04-12 | Toshiba Corp | Separate type protection device |
Also Published As
Publication number | Publication date |
---|---|
JPS6237940A (ja) | 1987-02-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |