JPH0395893A - Manufacture of phosphor thin film and thin film electroluminescent element - Google Patents

Manufacture of phosphor thin film and thin film electroluminescent element

Info

Publication number
JPH0395893A
JPH0395893A JP1232531A JP23253189A JPH0395893A JP H0395893 A JPH0395893 A JP H0395893A JP 1232531 A JP1232531 A JP 1232531A JP 23253189 A JP23253189 A JP 23253189A JP H0395893 A JPH0395893 A JP H0395893A
Authority
JP
Japan
Prior art keywords
thin film
alkaline earth
earth metal
less
phosphor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1232531A
Other languages
Japanese (ja)
Inventor
Takao Toda
任田 隆夫
Mutsumi Yamamoto
睦 山本
Tomizo Matsuoka
富造 松岡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP1232531A priority Critical patent/JPH0395893A/en
Publication of JPH0395893A publication Critical patent/JPH0395893A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To obtain a phosphor thin film excellent in the properties of crystallization, orientation, and stoichiometry by limiting pressure of S or gas containing S contained in a thin film accumulated, base temperature, and the speed at which the thin film is accumulated to respective specific conditions. CONSTITUTION:A thin film 4 composed mainly of alkaline earth metal sulfide is accumulated on a base 1 by evaporation of at least alkaline earth metal or alkaline earth metal halide and luminescent impurities or compounds of luminescent impurities in S or gas atmosphere containing S. In this case, pressure of S or gas containing S contained in the thin film accumulated is more than 3X10<-5>Torr and less than 3X10<-4> and the base 1 temperature is more than 400 deg.C and less than 700 deg.C, and the speed at which the thin film is accumulated is more than 5nm/min and less than 40nm/min. Using this phosphor thin film, a thin film electroluminescent element of excellent quality is manufactured.

Description

【発明の詳細な説明】 産業上の利用分野 本発明1*EL素子用硫化物蛍光体薄膜に関するもので
あり、とりわCナ、発光輝嵐 効率が優れたカラーEL
用硫化物蛍光体薄膜の製造方法およびそれを用いた薄膜
EL素子に関するものであも従来の技術 近抵  コンピュータ端末などに用いるフラットディス
プレイとして、薄膜EL素子が盛んに研究されていも 黄橙色発光のマンガン添加硫化亜鉛からなる蛍光体薄膜
を用いたモノクロ薄膜ELディスプレイは既に実用化さ
れていも ディスプレイとしての広汎な用途に対応するためにはカ
ラー化が必要不可欠であり、赤色 緑色青色の3原色に
発光するEL用蛍光体の開発に多大の力が注がれている
。この中で青色発光蛍光体としては SrS:Ce、赤
色発光蛍光体としてはCaS:Eu、緑色発光蛍光体と
してはCaS:Ceなど、アルカリ土類金属硫化物から
なる蛍光体が盛んに研究されている。
[Detailed Description of the Invention] Industrial Field of Application The present invention 1* relates to a sulfide phosphor thin film for EL devices, especially color EL with excellent luminescence efficiency.
Regarding manufacturing methods of sulfide phosphor thin films for use in sulfide phosphors and thin film EL devices using the same, conventional technology is not yet available. Although monochrome thin-film EL displays using phosphor thin films made of manganese-doped zinc sulfide have already been put into practical use, colorization is essential to support a wide range of uses as displays, and the three primary colors of red, green, and blue have been developed. Much effort is being put into developing phosphors for EL that emit light. Among these, phosphors made of alkaline earth metal sulfides are being actively researched, such as SrS:Ce as a blue-emitting phosphor, CaS:Eu as a red-emitting phosphor, and CaS:Ce as a green-emitting phosphor. There is.

発明が解決しようとする課題 これらの赤色 緑色 青色の3原色に発光するアルカリ
土類金属硫化物からなる蛍光体薄膜は発光輝度 効率が
不十分であり、現在 実用的なカラーELパネルは形成
されていな鶏 本発明はアルカリ土類硫化物を主成分とする蛍光体薄膜
を再現性よく製造できる製造方法と、性能の優れた薄膜
EL素子を提供することを目的とする。
Problems to be Solved by the Invention Phosphor thin films made of alkaline earth metal sulfides that emit light in the three primary colors of red, green, and blue have insufficient luminance efficiency, and currently no practical color EL panels have been formed. An object of the present invention is to provide a method for manufacturing a phosphor thin film containing alkaline earth sulfide as a main component with good reproducibility, and a thin film EL device with excellent performance.

課題を解決するための手段 少なくともアルカリ土類金属あるいはアルカリ土類金属
のハロゲン化物と、発光不純物あるいは発光不純物の化
合物とを、硫黄あるいは硫黄を含むガス雰囲気中で蒸発
させることにより基板上にアルカリ土類金属硫化物を主
成分とする薄膜を形成する蛍光体薄膜の製造方法におい
て、薄膜堆積中の硫黄あるいは硫黄を含むガスの圧力を
3xlO −6Torr以上 3 x 1 0−6To
rr以下とし、 基板温度を400℃以上 700℃以
下とし 薄膜堆積速度を5nrn/min以上 40n
m/min以下として形成する蛍光体薄膜の製造方汰 
およびこの製造方法で形成された蛍光体薄膜の少なくと
も一方の面に誘電体薄膜が形威され さらにその外側か
ら電圧を印加する手段が配設されている薄膜EL素子に
よって、上記課題を解決するものである。
Means for Solving the Problems Alkaline earth metal or alkaline earth metal halide and luminescent impurity or luminescent impurity compound are evaporated in sulfur or a gas atmosphere containing sulfur to form an alkaline earth metal on a substrate. In a method for manufacturing a phosphor thin film that forms a thin film mainly composed of similar metal sulfides, the pressure of sulfur or sulfur-containing gas during thin film deposition is set to 3xlO -6Torr or more.
rr or less, the substrate temperature is 400°C or more and 700°C or less, and the thin film deposition rate is 5nrn/min or more 40n.
Manufacturing method of phosphor thin film formed at m/min or less
The above-mentioned problems are solved by a thin film EL element in which a dielectric thin film is formed on at least one surface of a phosphor thin film formed by this manufacturing method, and a means for applying a voltage from the outside is provided. It is.

作用 アルカリ土類金属あるいはアルカリ土類金属のハロゲン
化物と、発光不純物あるいは発光不純物の化合物とを、
硫黄あるいは硫黄を含むガス雰囲気中で蒸発させること
により基板上にアルカリ土類金属硫化物を主成分とする
薄膜を形戒する蛍光体薄膜の製造方法において、薄膜堆
積中の硫黄あるいは硫黄を含むガスの圧九 基板温度お
よび薄膜堆積速度を特定の条件に限定することにより、
結晶性、配向怯 ストイキオメトリ即ち化学量論性がE
L用蛍光体薄膜としての優れた特性を発揮できる状態に
なったためと考えられも 実施例 第1図に本発明のEL素子の一実施例を説明するための
素子構造を示も ガラス基板1上にスパッタリング法に
より厚さ300nmのITO薄膜からなる透明電極2を
形成し1,  その上番t 酸素を10%含むアルゴン
雰囲気+i  450℃の基板温度でチタン酸ストロン
チウム(SrTiOs) ヲr fスパッタリングする
ことにより、厚さ500nmの第1絶縁体層3を形成し
た 第1絶縁体層3の上に(よ 基板温度500℃で、8X
 10”6Torrの硫化水素(Has)ガス雰囲気中
で金属ストロンチウム(Sr)’と、発光不純物を含む
化合物である塩化セリウム(CeC1g)とを、別々の
蒸発源から同時に蒸発させることにより、厚さ600n
mの蛍光体薄膜4を形成し九 このとき、蒸発源の温度
をそれぞれ530℃および720℃に保つことにより0
.2原子%のCeを含む3rS薄膜が再現性よく形戒で
きた その上に 酸素をlO%含むアルゴン雰囲気屯室温でタ
ンタル酸バリウム( BaTaeO●)をrfスパッタ
リングすることにより、厚さ200nmの第2絶縁体層
5を形成した 最後に厚さ250nmのA1からなる背面電極6を形戒
することによりEL素子を完或しfQ,本発明のEL素
子(よ パルス幅30μs,  1kHzの交流電圧を
印加することにより、緑青色で600cd/m2の発光
輝度が再現性よく得られ1,第2図は基板温度を550
a 薄膜堆積速度を20nm/minとしたときQEL
発光強度の硫化水素ガス圧力依存性を示づ; 第2図よ
り3×1 0 −6Torr以上 3 X 1 0 −
6Torr以下の圧力領域で発光強度の高いEL素子が
得られることがわかる。
an alkaline earth metal or an alkaline earth metal halide and a luminescent impurity or a compound of luminescent impurities,
In a method for producing a phosphor thin film in which a thin film mainly composed of alkaline earth metal sulfides is formed on a substrate by evaporation in an atmosphere of sulfur or a gas containing sulfur, sulfur or a gas containing sulfur is used during thin film deposition. By limiting the substrate temperature and thin film deposition rate to specific conditions,
Crystallinity, orientational stoichiometry, stoichiometry is E
This is thought to be due to the state in which it is now in a state where it can exhibit excellent characteristics as a phosphor thin film for L. A transparent electrode 2 made of an ITO thin film with a thickness of 300 nm is formed by a sputtering method, and strontium titanate (SrTiOs) is sputtered on top of the electrode in an argon atmosphere containing 10% oxygen at a substrate temperature of 450°C. The first insulator layer 3 with a thickness of 500 nm was formed on the first insulator layer 3 (with a substrate temperature of 500°C, 8X
By simultaneously evaporating metal strontium (Sr)' and cerium chloride (CeC 1 g), a compound containing luminescent impurities, from separate evaporation sources in a hydrogen sulfide (Has) gas atmosphere of 10"6 Torr, a 600 nm thick film was produced.
At this time, by keeping the temperature of the evaporation source at 530°C and 720°C, respectively,
.. A 3rS thin film containing 2 atomic % Ce was formed with good reproducibility. On top of it, barium tantalate (BaTaeO●) was RF sputtered at room temperature in an argon atmosphere containing 10 % oxygen to form a 200 nm thick second film. After forming the insulator layer 5, a back electrode 6 made of A1 with a thickness of 250 nm is formed to complete the EL element. By doing so, a green-blue emission luminance of 600 cd/m2 was obtained with good reproducibility.
a QEL when the thin film deposition rate is 20 nm/min
The dependence of the luminescence intensity on hydrogen sulfide gas pressure is shown; from Figure 2, it is 3 × 10 -6 Torr or more 3 × 10 -
It can be seen that an EL element with high emission intensity can be obtained in a pressure region of 6 Torr or less.

薄膜堆積速度は40nm/minより大きいと、薄膜表
面が荒れ緻密な膜ができなかった また5nm/min
より小さい場合ILEL発光強度が不十分であり、堆積
時間も長くかかり実用的でない。
When the thin film deposition rate was higher than 40 nm/min, the thin film surface became rough and a dense film could not be formed.
If it is smaller, the ILEL emission intensity will be insufficient and the deposition time will take a long time, making it impractical.

第3図は薄膜堆積速度を20nm/minとし硫化水素
ガス圧力を8 X 1 0−”TorrとしたときのE
L発光強度の基板温度依存性を示九 第3図より400
℃以上で高輝度で発光するEL素子が得られることがわ
かん 700℃より高温の場合(よ発光輝度は高いがガ
ラス基板が変形する場合があり実際的でない。
Figure 3 shows E when the thin film deposition rate is 20 nm/min and the hydrogen sulfide gas pressure is 8 x 10-”Torr.
The dependence of the L emission intensity on the substrate temperature is shown in Figure 3.
I do not know that it is possible to obtain an EL element that emits light with high brightness at temperatures above 700°C (although the luminance is high, it is not practical because the glass substrate may be deformed).

硫黄の供給源として硫黄固体を用いた場合L硫化水素ガ
スを用いたときと変わらない優れた品質の蛍光体薄膜を
形成することができた本実施例では蛍光体薄膜としてセ
リウム添加硫化ストロンチウムを用いた場合について説
明した力支 蛍光体母体として硫化カルシウムや硫化バ
リウムあるいはこれらの混晶を用t,%  発光不純物
としては希土類元魚 希土類元素のハロゲン化物や5族
元素との化合物を用いた場合も同様の特性が得られた 
またアルカリ金属の供給源としてストロンチウム金属固
体を用いた場合について説明した力t アルカリ金属の
塩化物やヨウ化物などのハロゲン化物を用いても同様の
効果が得られf.発明の効果 本発明は 少なくともアルカリ土類金属あるいはアルカ
リ土類金属のハロゲン化物と、発光不純物あるいは発光
不純物の化合物とを、硫黄あるいは硫黄を含むガス雰囲
気中で蒸発させることにより基板上にアルカリ土類金属
硫化物を主成分とする薄膜を堆積する薄膜の製造方法に
おいて、前記薄膜堆積中の前記硫黄あるいは前記硫黄を
含むガスの圧力を3×l04TOrr以上 3 x 1
 0 −6Torr以下とし 基板温度を400℃以上
 700℃以下とし 薄膜堆積速度を5nm/min以
上 40nm/min以下とする蛍光体薄膜の製造方法
及び上記蛍光体薄膜を用いたEL素子であるた取優れた
品質のアルカリ土類硫化物を主成分とする蛍光体薄膜を
再現性よく製造することができる効果があり、また こ
のような硫化物蛍光体薄膜を用いて性能の優れた薄膜E
L素子を製造することができる効果があも したがって、とりわけアルカリ土類硫化物蛍光体薄膜を
必要とする多色EL素子やフルカラーEL素子を形成す
る暇 特に実用的価値は大きし1
When solid sulfur was used as the sulfur source, a phosphor thin film with the same excellent quality as when using L-hydrogen sulfide gas could be formed.In this example, cerium-doped strontium sulfide was used as the phosphor thin film. Calcium sulfide, barium sulfide, or a mixed crystal of these is used as the phosphor matrix.The luminescent impurity is a rare earth element.Also, halides of rare earth elements or compounds with group 5 elements are used. Similar characteristics were obtained
Moreover, similar effects can be obtained by using halides of alkali metals such as chlorides and iodides. Effects of the Invention The present invention provides alkaline earth metals on a substrate by evaporating at least an alkaline earth metal or an alkaline earth metal halide and a luminescent impurity or a compound of luminescent impurities in sulfur or a gas atmosphere containing sulfur. In the thin film manufacturing method of depositing a thin film containing metal sulfide as a main component, the pressure of the sulfur or the sulfur-containing gas during the thin film deposition is set to 3 x 104 TOrr or more.
0 -6 Torr or less, the substrate temperature is 400°C or more and 700°C or less, and the thin film deposition rate is 5 nm/min or more and 40 nm/min or less, and an EL device using the above phosphor thin film. It has the effect of being able to produce a phosphor thin film containing alkaline earth sulfide as a main component with high quality with good reproducibility, and it is also possible to produce a thin film E with excellent performance using such a sulfide phosphor thin film.
Therefore, the practical value is great because the effect of being able to manufacture L elements is great, especially the time needed to form multicolor EL elements or full color EL elements that require alkaline earth sulfide phosphor thin films.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例のEL素子の構或を説明する
断面& 第2図は本発明のELJiE子の発光強度の硫
化水素ガス圧力依存性を示す阻 第3図は発光強度の基
板温度依存性を示す図である。 ■・・・ガラス基楓 2・・・透明電楓3・・・第l絶
縁体慝 4蛍光体薄[5・・第2絶縁体# 6・・・背
面電極
FIG. 1 is a cross-sectional diagram illustrating the structure of an EL device according to an embodiment of the present invention, and FIG. 2 is a cross-sectional diagram showing the hydrogen sulfide gas pressure dependence of the luminescence intensity of an EL element according to the present invention. FIG. 3 is a diagram showing substrate temperature dependence. ■...Glass base maple 2...Transparent electric maple 3...1st insulator 4. Phosphor thin material [5...2nd insulator #6...Back electrode

Claims (4)

【特許請求の範囲】[Claims] (1)少なくともアルカリ土類金属あるいはアルカリ土
類金属のハロゲン化物と、発光不純物あるいは発光不純
物の化合物とを、硫黄あるいは硫黄を含むガス雰囲気中
で蒸発させることにより基板上にアルカリ土類金属硫化
物を主成分とする薄膜を堆積する薄膜の製造方法におい
て、前記薄膜堆積中の前記硫黄あるいは前記硫黄を含む
ガスの圧力を3×10^−^6Torr以上、3×10
^−^4Torr以下とし、基板温度を400℃以上、
700℃以下とし、薄膜堆積速度を5nm/min以、
40nm/min以下とする蛍光体薄膜の製造方法。
(1) Alkaline earth metal sulfide is formed on the substrate by evaporating at least an alkaline earth metal or an alkaline earth metal halide and a luminescent impurity or a compound of luminescent impurities in sulfur or a gas atmosphere containing sulfur. In the thin film manufacturing method of depositing a thin film mainly composed of
^-^4Torr or less, substrate temperature 400℃ or more,
The temperature is 700°C or less, and the thin film deposition rate is 5 nm/min or more.
A method for producing a phosphor thin film at a rate of 40 nm/min or less.
(2)アルカリ土類金属がカルシウム、ストロンチウム
、バリウム、あるいはこれらの内2種以上からなる請求
項1に記載の蛍光体薄膜の製造方法。
(2) The method for producing a phosphor thin film according to claim 1, wherein the alkaline earth metal is calcium, strontium, barium, or two or more of these.
(3)硫黄を含むガスが硫化水素ガスである請求項1に
記載の蛍光体薄膜の製造方法。
(3) The method for producing a phosphor thin film according to claim 1, wherein the sulfur-containing gas is hydrogen sulfide gas.
(4)少なくともアルカリ土類金属あるいはアルカリ土
類金属のハロゲン化物と、発光不純物あるいは発光不純
物の化合物とを、硫黄あるいは硫黄を含むガスの圧力が
3×10^−^5Torr以上3×10^−^4Tor
r以下の雰囲気中で、基板温度が400℃以上700℃
以下で、堆積速度を5nm/min以上40nm/mi
n以下で蒸発して形成された蛍光体薄膜の、少なくとも
一方の面に誘電体薄膜が形成され、さらに前記誘電体薄
膜の外側から電圧を印加する手段が配設されていること
を特徴とする薄膜EL素子。
(4) At least an alkaline earth metal or an alkaline earth metal halide and a luminescent impurity or a compound of luminescent impurities are mixed at a pressure of sulfur or a gas containing sulfur of 3×10^-^5 Torr or more. ^4 Tor
In an atmosphere of r or less, the substrate temperature is 400℃ or higher and 700℃
Below, the deposition rate is set to 5 nm/min or more and 40 nm/min.
A dielectric thin film is formed on at least one surface of a phosphor thin film formed by evaporation at n or less, and a means for applying a voltage from the outside of the dielectric thin film is further provided. Thin film EL element.
JP1232531A 1989-09-07 1989-09-07 Manufacture of phosphor thin film and thin film electroluminescent element Pending JPH0395893A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1232531A JPH0395893A (en) 1989-09-07 1989-09-07 Manufacture of phosphor thin film and thin film electroluminescent element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1232531A JPH0395893A (en) 1989-09-07 1989-09-07 Manufacture of phosphor thin film and thin film electroluminescent element

Publications (1)

Publication Number Publication Date
JPH0395893A true JPH0395893A (en) 1991-04-22

Family

ID=16940799

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1232531A Pending JPH0395893A (en) 1989-09-07 1989-09-07 Manufacture of phosphor thin film and thin film electroluminescent element

Country Status (1)

Country Link
JP (1) JPH0395893A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002270371A (en) * 2001-03-14 2002-09-20 Denso Corp El element and display panel using it

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002270371A (en) * 2001-03-14 2002-09-20 Denso Corp El element and display panel using it

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