JPH0391293A - Manufacturing method of printed wiring board - Google Patents

Manufacturing method of printed wiring board

Info

Publication number
JPH0391293A
JPH0391293A JP1227716A JP22771689A JPH0391293A JP H0391293 A JPH0391293 A JP H0391293A JP 1227716 A JP1227716 A JP 1227716A JP 22771689 A JP22771689 A JP 22771689A JP H0391293 A JPH0391293 A JP H0391293A
Authority
JP
Japan
Prior art keywords
solder resist
photo solder
circuit
photo
conductor circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1227716A
Other languages
Japanese (ja)
Other versions
JP2687616B2 (en
Inventor
Kazutomo Higa
比嘉 一智
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP1227716A priority Critical patent/JP2687616B2/en
Publication of JPH0391293A publication Critical patent/JPH0391293A/en
Application granted granted Critical
Publication of JP2687616B2 publication Critical patent/JP2687616B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Application Of Or Painting With Fluid Materials (AREA)
  • Non-Metallic Protective Coatings For Printed Circuits (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)

Abstract

PURPOSE:To eliminate positioning process of a mask film and an insulation board and vacuum suction to improve productivity and accuracy by applying a photo solder resist onto parts or the whole surface of the insulation printed-circuit board where a conductor circuit is formed, irradiating a specific wavelengthlight from the end face of the insulation printed-circuit board to cure resist on the surface, and then to remove non-exposed resist on the conductor circuit during a development process dissolving and eliminating. CONSTITUTION:A conductor circuit 12 is formed on a glass-epoxy base 11. A photo solder resist 13 is applied on the circuit-forming surface side of that base 11 and a specified treatment such as tentative drying is performed. After that, an ultraviolet rays 14 with a specific wavelength are allowed to irradiate from four directions of the printed-circuit board end faces to be transmitted through the base 11, thus enabling the photo solder resist 13 on the surface to be cured by photo polymerization. Then, the printed circuit board after curing is developed by a specified development liquid. At this time, the photo solder resist 13 on the conductor circuit 12 is not cured since light is screened by the conductor circuit 2 so that it is dissolved and eliminated by development, thus forming a solder resist film. Then, a heat-curing type solder resist 14 is formed to enable an exposed conductor 12' to be applied and is heat-cured along with a photo solder resist 13'.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、電子機器等に使用されるプリント配線板の製
造方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a method for manufacturing printed wiring boards used in electronic equipment and the like.

従来の技術 従来、高密度のプリント配線板のンルダレジストの形成
方法は一般的に、フォト法による形成力2ベーノ 法で行われている。すなわち、第2図に示すように、絶
縁基板1上に導体回路2を形威し、その上に、フォトレ
ジスト3金塗布し、溶剤の一部を除去し乾燥被膜を形成
する(第2図a)。次に、マスクフィルム6を密着させ
紫外光4を照射して露光した後(第2図b)、所定の現
像液で未露光部分を溶解除去する(第2図C)。そして
、残部の露光部のフォトレジスト膜の溶剤除去及び重合
硬化のため熱硬化を行う。
BACKGROUND OF THE INVENTION Conventionally, a method for forming a resist for high-density printed wiring boards has generally been carried out by a two-bene process using a photo method. That is, as shown in Fig. 2, a conductive circuit 2 is formed on an insulating substrate 1, a photoresist 3 gold is applied thereon, and a part of the solvent is removed to form a dry film (Fig. 2). a). Next, the mask film 6 is brought into close contact and exposed to ultraviolet light 4 (FIG. 2B), after which the unexposed portions are dissolved and removed using a predetermined developer (FIG. 2C). Then, heat curing is performed to remove the solvent and polymerize and harden the photoresist film in the remaining exposed areas.

発明が解決しようとする課題 このようなプリント配線板の製造方法においては、露光
の際、マスクフィルムと絶縁基板との位置合わせが通常
片側0.05〜Q、1 mmと極めて高い精度を要する
工程であシ、また、光の回シ込み及び解像性向上のため
、フィルムと基板とを密着させるのに、一般には真空吸
着を用いておジ、露光前のセツティングに30〜60秒
、真空密着に10〜20秒、露光に20〜40秒の時間
を要し、生産性を著しく悪くするものである。
Problems to be Solved by the Invention In this method of manufacturing printed wiring boards, during exposure, alignment between the mask film and the insulating substrate is a process that requires extremely high precision, usually 0.05 to Q, 1 mm on one side. In addition, in order to improve light penetration and resolution, vacuum suction is generally used to bring the film and substrate into close contact. It takes 10 to 20 seconds for vacuum contact and 20 to 40 seconds for exposure, which significantly impairs productivity.

本発明は、これらの課題を解決するため、露光3ベーノ
゛ の際、マスクフィルムを必要とせず、マスクフィルムと
絶縁基板の位置合わせ、及び真空吸着を省略することに
よって、生産性、精度を飛躍的に向上させることを目的
としたものである。
In order to solve these problems, the present invention dramatically improves productivity and accuracy by eliminating the need for a mask film, the alignment of the mask film and the insulating substrate, and the vacuum suction during the 3-vane exposure process. The purpose is to improve the

課題を解決するための手段 この課題を解決するために本発明は、導体回路を形成し
た絶縁基板上の一部又は全面にフォトソルダレジストを
塗布し、フォトソルダレジストの硬化に適する波長を有
する光線を絶縁基板端面より入射し、絶縁基板中より絶
縁基板表面へ伝わった光線で、表面のフォトソルダレジ
ストを硬化させ、導体回路上の未露光のフォトソルダレ
ジストを現像にて溶解・除去し、フォトソルダレジスト
膜を形成する方法とするものである。
Means for Solving the Problem In order to solve this problem, the present invention applies a photo solder resist to a part or the entire surface of an insulating substrate on which a conductive circuit is formed, and then applies a light beam having a wavelength suitable for curing the photo solder resist. The light enters from the end face of the insulating substrate and is transmitted from inside the insulating substrate to the surface of the insulating substrate, hardening the photo solder resist on the surface, dissolving and removing the unexposed photo solder resist on the conductor circuit by developing, and This is a method for forming a solder resist film.

作用 この製造方法によれば、フォトソルダレジスト塗布面の
導体回路がマスクフィルムの遮光部の役目をなし、導体
回路のない部分のフォトソルダレジストを硬化させマス
クフィルムを用いず、しかも真空吸着、位置合わせ、も
することなく、高速で、高精度なソルダレジストヲ形成
することができる。
Function: According to this manufacturing method, the conductor circuit on the surface coated with the photo solder resist serves as a light-shielding part of the mask film, and the photo solder resist in the area where there is no conductor circuit is cured, and no mask film is used. High-speed, high-precision solder resist can be formed without the need for alignment.

実施例 以下、本発明の一実施例を第1図h −dの図面を用い
て説明する。
EXAMPLE Hereinafter, an example of the present invention will be described using the drawings of FIGS. 1 h to d.

365nmの波長の紫外線透過率が40%〜60%で、
かつ一定の厚みを保ったガラス−エポキシ基材(以下、
基材という)11上に導体回路12t−形成する。その
基材11の回路形rfc面側に適正露光量soo 〜e
oomJ/cJ(塗膜厚:20〜30μm)で、しかも
、365 nilの感光波長ピーク金有するフォトソル
ダレジスト13f:、塗布し、仮乾燥等の所定の処理を
行う(第1図a)。その後、4方向の基板端面から、3
65nmの波長を有する紫外線14を入射し、基材11
中を透過させ、表面のフォトソルダレジスト13を光重
合により硬化させてフォトソルダレジスト13を形gす
る(第1図b)。この際、入射する露光量は基材11の
紫外線透過率に応じて、フォトソルダレジスト13の適
正露光量に達するように設定する。
Ultraviolet transmittance of 365 nm wavelength is 40% to 60%,
A glass-epoxy base material (hereinafter referred to as
A conductor circuit 12t- is formed on the substrate 11 (referred to as a base material). Appropriate exposure amount soo to e on the circuit type RFC side of the base material 11
oomJ/cJ (coating film thickness: 20 to 30 μm) and a photo-solder resist 13f having a photosensitive wavelength peak of 365 nil is applied and predetermined treatments such as temporary drying are performed (FIG. 1a). Then, from the end face of the board in four directions, 3
Ultraviolet light 14 having a wavelength of 65 nm is incident on the base material 11.
The photo solder resist 13 on the surface is cured by photopolymerization to form the photo solder resist 13 (FIG. 1b). At this time, the amount of incident exposure light is set according to the ultraviolet transmittance of the base material 11 so as to reach the appropriate exposure amount of the photo solder resist 13.

6ページ 次に、硬化後の基板を所定の現像液(変性1−1−1ト
リクロロエタン)を有する現像槽にて、1.5〜2.6
kg/cdのスプレー圧力で30〜60秒の条件で現像
する。このとき導体回路12上のフォトソルダレジスト
13は導体回路2に遮光されて未硬化となるため、現像
にて溶解・除去され、第1図Gに示したようなソルダレ
ジストの被膜を形成する。そして、露出した導体12′
ヲ被覆するため、スクリーン印刷法を用いて、第1図d
に示したような熱硬化型ソルダレジスト16を形成し、
フォトソルダレジスト13′とともに熱硬化を行う。
Page 6 Next, the cured substrate was heated in a developer tank containing a specified developer (modified 1-1-1 trichloroethane) for 1.5 to 2.6 hours.
Develop at a spray pressure of kg/cd for 30 to 60 seconds. At this time, the photo solder resist 13 on the conductive circuit 12 is shielded from light by the conductive circuit 2 and becomes uncured, so it is dissolved and removed by development to form a solder resist film as shown in FIG. 1G. Then, the exposed conductor 12'
1d using a screen printing method to coat the
A thermosetting solder resist 16 as shown in is formed,
Heat curing is performed together with the photo solder resist 13'.

熱硬化型ソルダレジスト15の形状においては、本発明
のフォトソルダレジスト13によって、高密度部分の形
成が終了しているため、スクリーンと基板の合致精度は
、片側0.16〜0.25mm程度となり、一般のソル
ダレジストの印刷条件で容易に形成することができる。
In the shape of the thermosetting solder resist 15, since the formation of the high-density portion is completed by the photo solder resist 13 of the present invention, the matching accuracy between the screen and the substrate is approximately 0.16 to 0.25 mm on one side. , can be easily formed under general solder resist printing conditions.

なか、本発明に使用するフォトソルダレジストは、従来
のものようも露光感度金高くしたものを用いることが望
ましく、また、基材の紫外線透過6ページ 率を高くすることによって一層生産性の向上を図ること
ができる。さらに、熱硬化型ソルダレジスト16は、ス
クリーン印刷法の紫外線硬化型ソルダレジストに置き換
えることもできる。
The photo solder resist used in the present invention is preferably one with higher exposure sensitivity than conventional ones, and productivity can be further improved by increasing the UV transmittance of the base material. can be achieved. Furthermore, the thermosetting solder resist 16 can be replaced with an ultraviolet curable solder resist using a screen printing method.

発明の効果 以上のように、本発明によれば、従来のフォト法による
プリント配線板のソルダレジストの形成で、マスクフィ
ルムや基板との位置合わせ金必要とせず、また接触露光
型における真空吸着も必要としないことから、生産性は
2倍以上向上させることができる。さらに、導体が露光
の際の遮光部を形成していることから、導体回路とソル
ダレジストの合わせズレは皆無となジ、極めて精度の高
いソルダレジストを容易に形成することができる。
Effects of the Invention As described above, according to the present invention, a solder resist for a printed wiring board can be formed using the conventional photo method without requiring a mask film or an alignment metal with the substrate, and vacuum suction in a contact exposure type is also possible. Since this is not necessary, productivity can be more than doubled. Furthermore, since the conductor forms a light-shielding portion during exposure, there is no misalignment between the conductor circuit and the solder resist, and a solder resist with extremely high precision can be easily formed.

【図面の簡単な説明】[Brief explanation of drawings]

レジストの製造方法を示す断面図である。 11・・・・・・ガラス−エポキシ基材、12・・・・
・・導体回路、13・・・・・・フォトソルダレジスト
、14・・・・・・紫77゜ 外光、 6・・・・・・熱硬化型ソルダレジスト。
FIG. 2 is a cross-sectional view showing a method for manufacturing a resist. 11...Glass-epoxy base material, 12...
...Conductor circuit, 13...Photo solder resist, 14...Purple 77° external light, 6...Thermosetting solder resist.

Claims (1)

【特許請求の範囲】[Claims]  導体回路を形成した絶縁基板上に前記回路を含む一部
又は全面にフォトソルダレジストを塗布し、フォトソル
ダレジストの硬化に適する波長を有する光線を絶縁基板
端面より入射し、絶縁基板中より絶縁基板表面へ伝わっ
た光線で、表面のフォトソルダレジストを硬化させ、導
体回路上の未露光のフォトソルダレジストを現像にて溶
解・除去してフォトソルダレジスト膜を形成するプリン
ト配線板の製造方法。
A photo solder resist is applied to a part or the entire surface including the circuit on an insulating substrate on which a conductive circuit is formed, and a light beam having a wavelength suitable for curing the photo solder resist is incident from the end surface of the insulating substrate, and the insulating substrate is removed from inside the insulating substrate. A method for manufacturing printed wiring boards in which the photo solder resist on the surface is hardened by the light beam transmitted to the surface, and the unexposed photo solder resist on the conductor circuit is dissolved and removed by development to form a photo solder resist film.
JP1227716A 1989-09-01 1989-09-01 Manufacturing method of printed wiring board Expired - Fee Related JP2687616B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1227716A JP2687616B2 (en) 1989-09-01 1989-09-01 Manufacturing method of printed wiring board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1227716A JP2687616B2 (en) 1989-09-01 1989-09-01 Manufacturing method of printed wiring board

Publications (2)

Publication Number Publication Date
JPH0391293A true JPH0391293A (en) 1991-04-16
JP2687616B2 JP2687616B2 (en) 1997-12-08

Family

ID=16865234

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1227716A Expired - Fee Related JP2687616B2 (en) 1989-09-01 1989-09-01 Manufacturing method of printed wiring board

Country Status (1)

Country Link
JP (1) JP2687616B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105246265A (en) * 2015-11-06 2016-01-13 高德(江苏)电子科技有限公司 Manufacturing method for rigid-flex board photosensitive film productive flexible board

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105246265A (en) * 2015-11-06 2016-01-13 高德(江苏)电子科技有限公司 Manufacturing method for rigid-flex board photosensitive film productive flexible board

Also Published As

Publication number Publication date
JP2687616B2 (en) 1997-12-08

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