JPH0388107U - - Google Patents
Info
- Publication number
- JPH0388107U JPH0388107U JP15031789U JP15031789U JPH0388107U JP H0388107 U JPH0388107 U JP H0388107U JP 15031789 U JP15031789 U JP 15031789U JP 15031789 U JP15031789 U JP 15031789U JP H0388107 U JPH0388107 U JP H0388107U
- Authority
- JP
- Japan
- Prior art keywords
- pancake
- shaped coils
- shaped
- signal channels
- numbered signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 8
- 238000001514 detection method Methods 0.000 claims description 4
- 238000012360 testing method Methods 0.000 claims description 3
- 230000005284 excitation Effects 0.000 claims 2
- 238000004804 winding Methods 0.000 claims 2
- 230000001066 destructive effect Effects 0.000 claims 1
- 230000005674 electromagnetic induction Effects 0.000 claims 1
- 238000011156 evaluation Methods 0.000 claims 1
- 230000006698 induction Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 7
- 230000000149 penetrating effect Effects 0.000 description 1
Landscapes
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Description
第１図は本考案のプローブの外観図、第２図は
同内部構造を示す部分断面図、第３図は同分解斜
視図、第４図はコイルの平面配置図、第５図と第
６図は本考案のプローブアセンブリの電気回路図
、第７図は試験記録例を示す図、第８図は貫通渦
流探傷例の説明図、第９図は相対速度対記録計指
示高さの特性図、第１０図は磁化力対記録指示高
さの特性図、第１１図はｌ／Ｎ対Ｓ／Ｎの特性図
、第１２図はパンケーキ型センサコイルの近接特
性図である。
Fig. 1 is an external view of the probe of the present invention, Fig. 2 is a partial sectional view showing its internal structure, Fig. 3 is an exploded perspective view of the probe, Fig. 4 is a plan view of the coil arrangement, and Figs. 5 and 6. The figure is an electric circuit diagram of the probe assembly of the present invention, Figure 7 is a diagram showing an example of a test record, Figure 8 is an explanatory diagram of an example of penetrating eddy current flaw detection, and Figure 9 is a characteristic diagram of relative velocity versus recorder indicated height. , FIG. 10 is a characteristic diagram of magnetizing force versus recording instruction height, FIG. 11 is a characteristic diagram of l/N versus S/N, and FIG. 12 is a proximity characteristic diagram of a pancake-shaped sensor coil.
Claims (1)
線端に電流検知用の低抵抗を備えた電磁誘導探傷
試験用の相互誘導内挿プローブコイル。 ２ 定電流励磁コイルから被検査対象管軸方向に
所定の距離を保つと共に管内周方向に沿つて複数
のパンケーキ状コイルを備えると共に該パンケー
キ状コイルは隣接差動出力が得られる様に対を形
成せしめた内挿プローブコイル。 ３ 複数のパンケーキ状コイルを管内周方向に沿
つて備える場合、奇数信号チヤンネルのパンケー
キ状コイルは同一平面状に配設すると共に、奇数
信号チヤンネルのパンケーキ状コイルと偶数信号
チヤンネルのパンケーキ状コイルとは異つた平面
状とし、且つ奇数信号チヤンネルのパンケーキ状
コイルと偶数信号チヤンネルのパンケーキ状コイ
ル、コイル捲線軸方向に対して所定の重なり代（
オーバーラツプ）を保つて配設されるきず検出複
数パンケーキ状コイル群を特徴とする（高分解能
）内挿プローブコイル。 ４ パンケーキ状プローブに隣接差動出力回路を
備えて差動動作によつてきずを検出する（公知）
のみならず一対のパンケーキ状コイルの半対から
絶対値信号出力を得ると共に、該出力をメモリー
に蓄積（例えば、データレコーダ）すると共に、
精度の良い非破壊試験評価を可能とする内挿プロ
ーブコイル。[Scope of Claim for Utility Model Registration] 1. A mutual induction interpolation probe coil for electromagnetic induction flaw detection testing, which includes a winding for constant current excitation and a low resistance for current detection at the end of the winding. 2 A predetermined distance is maintained from the constant current excitation coil in the axial direction of the tube to be inspected, and a plurality of pancake-shaped coils are provided along the inner circumferential direction of the tube, and the pancake-shaped coils are arranged so that adjacent differential outputs can be obtained. An interpolated probe coil formed by 3 When a plurality of pancake-shaped coils are provided along the inner circumferential direction of the pipe, the pancake-shaped coils of odd-numbered signal channels are arranged on the same plane, and the pancake-shaped coils of odd-numbered signal channels and the pancake-shaped coils of even-numbered signal channels are arranged on the same plane. The pancake-shaped coils of odd-numbered signal channels and the pancake-shaped coils of even-numbered signal channels have a predetermined overlap margin (
A (high-resolution) interpolation probe coil featuring multiple flaw detection pancake-shaped coil groups that are arranged to maintain overlap (overlap). 4 A pancake-shaped probe is equipped with an adjacent differential output circuit to detect flaws through differential operation (known)
In addition to obtaining an absolute value signal output from a half pair of a pair of pancake-shaped coils, and storing the output in a memory (e.g., a data recorder),
Interpolation probe coil that enables highly accurate non-destructive test evaluation.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15031789U JPH0388107U (en) | 1989-12-27 | 1989-12-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15031789U JPH0388107U (en) | 1989-12-27 | 1989-12-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0388107U true JPH0388107U (en) | 1991-09-09 |
Family
ID=31696669
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15031789U Pending JPH0388107U (en) | 1989-12-27 | 1989-12-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0388107U (en) |
-
1989
- 1989-12-27 JP JP15031789U patent/JPH0388107U/ja active Pending
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