JPH0380266B2 - - Google Patents
Info
- Publication number
- JPH0380266B2 JPH0380266B2 JP60157267A JP15726785A JPH0380266B2 JP H0380266 B2 JPH0380266 B2 JP H0380266B2 JP 60157267 A JP60157267 A JP 60157267A JP 15726785 A JP15726785 A JP 15726785A JP H0380266 B2 JPH0380266 B2 JP H0380266B2
- Authority
- JP
- Japan
- Prior art keywords
- current
- load
- capacitor
- voltage
- voltage source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000003990 capacitor Substances 0.000 claims description 52
- 238000009499 grossing Methods 0.000 claims description 22
- 238000001514 detection method Methods 0.000 claims description 15
- 238000012360 testing method Methods 0.000 description 13
- 238000010586 diagram Methods 0.000 description 8
- 238000013459 approach Methods 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- 230000007423 decrease Effects 0.000 description 3
- 230000010355 oscillation Effects 0.000 description 3
- 230000003247 decreasing effect Effects 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 230000003111 delayed effect Effects 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
- 230000002950 deficient Effects 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- NUHSROFQTUXZQQ-UHFFFAOYSA-N isopentenyl diphosphate Chemical compound CC(=C)CCO[P@](O)(=O)OP(O)(O)=O NUHSROFQTUXZQQ-UHFFFAOYSA-N 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60157267A JPS6217666A (ja) | 1985-07-17 | 1985-07-17 | 電圧印加電流測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60157267A JPS6217666A (ja) | 1985-07-17 | 1985-07-17 | 電圧印加電流測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6217666A JPS6217666A (ja) | 1987-01-26 |
| JPH0380266B2 true JPH0380266B2 (enrdf_load_stackoverflow) | 1991-12-24 |
Family
ID=15645919
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60157267A Granted JPS6217666A (ja) | 1985-07-17 | 1985-07-17 | 電圧印加電流測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6217666A (enrdf_load_stackoverflow) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07104366B2 (ja) * | 1986-09-26 | 1995-11-13 | 日立電子エンジニアリング株式会社 | 電流測定回路 |
| JPH0826837B2 (ja) * | 1990-12-28 | 1996-03-21 | 本田技研工業株式会社 | 内燃エンジンの点火時期制御装置 |
| JP2551928B2 (ja) * | 1990-12-28 | 1996-11-06 | 本田技研工業株式会社 | 内燃エンジンの点火時期制御装置 |
| JP3599256B2 (ja) * | 1996-02-29 | 2004-12-08 | 株式会社アドバンテスト | 電圧印加電流測定回路 |
| JPH10124159A (ja) * | 1996-10-18 | 1998-05-15 | Advantest Corp | 電圧印加回路 |
| US7973543B2 (en) * | 2008-07-11 | 2011-07-05 | Advantest Corporation | Measurement apparatus, test apparatus and measurement method |
| US20240310411A1 (en) * | 2023-03-16 | 2024-09-19 | Texas Instruments Incorporated | Methods and apparatus for source measurement unit (smu) operation |
-
1985
- 1985-07-17 JP JP60157267A patent/JPS6217666A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6217666A (ja) | 1987-01-26 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| EXPY | Cancellation because of completion of term |