JPH0376139A - Upward pushing movement of semiconductor element - Google Patents

Upward pushing movement of semiconductor element

Info

Publication number
JPH0376139A
JPH0376139A JP1212287A JP21228789A JPH0376139A JP H0376139 A JPH0376139 A JP H0376139A JP 1212287 A JP1212287 A JP 1212287A JP 21228789 A JP21228789 A JP 21228789A JP H0376139 A JPH0376139 A JP H0376139A
Authority
JP
Japan
Prior art keywords
semiconductor element
push
needle
pushing
adhesive tape
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1212287A
Other languages
Japanese (ja)
Inventor
Katsumasa Kosugi
小杉 勝正
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP1212287A priority Critical patent/JPH0376139A/en
Publication of JPH0376139A publication Critical patent/JPH0376139A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68318Auxiliary support including means facilitating the separation of a device or wafer from the auxiliary support
    • H01L2221/68322Auxiliary support including means facilitating the selective separation of some of a plurality of devices from the auxiliary support

Abstract

PURPOSE:To keep semiconductor elements from being damaged in contact with each other by providing a pushing block to move up and down independently of a pushing needle in a cylindrical stage between its needle and in walls of the cylindrical stage, and lifting each semiconductor element horizontally by the above block and after that, pushing up the semiconductor element by the pushing needle. CONSTITUTION:A pushing block 2 is provided in a cylindrical stage 1 and is set so as to surround a needle 3 for pushing up and its upper face is formed into a flat shape. Each semiconductor element 6 that is pasted on an adhesive tape 5 is sucked by a vacuum source through each vacuum suction hole 8 and then, a nozzle 7 lowers to suck the semiconductor element 6. After that, the pushing block 2 is pushed up by a driving source and the element 6 is pushed up horizontally together with the adhesive tape 5. The semiconductor element peripheral part 9 of the adhesive tape on which the element 6 is pasted is separated by the above pushing up action. Then, the element 6 is pushed up by the pushing needle 3 through a pushing needle holder 4 and then, the element 6 is peeled off completely from the adhesive tape 5.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、半導体素子をダイボンディングする際の粘着
テープに貼り付けられた半導体素子の突上げ方法に関し
、特に突上げ針にて半導体素子を剥離する方法に関する
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a method of pushing up a semiconductor element attached to an adhesive tape when die bonding a semiconductor element, and in particular, a method of pushing up a semiconductor element attached to an adhesive tape when die bonding a semiconductor element. Regarding the method of peeling.

〔従来の技術〕[Conventional technology]

従来、この種の突上げ方法は、第5図(a)。 Conventionally, this type of push-up method is shown in FIG. 5(a).

(b)、(c)の突上げユニットの動作断面図に示すよ
うに、粘着テープ5に貼り付けられた半導体素子6を、
粘着テープ5ごと真空吸着穴8があけられた筒状ステー
ジ1に真空吸着し、半導体素子6をピックアップするた
めの吸着用のノズル7が半導体素子6の表面に下降した
後、突上げ針3にて半導体素子6を裏面側から粘着テー
プ5を介して突上げ、粘着テープ5より半導体素子6を
剥離する方法となっていた。
As shown in the operational cross-sectional views of the push-up unit in (b) and (c), the semiconductor element 6 attached to the adhesive tape 5 is
The adhesive tape 5 is vacuum-adsorbed onto a cylindrical stage 1 with vacuum suction holes 8, and after a suction nozzle 7 for picking up the semiconductor element 6 descends to the surface of the semiconductor element 6, it is attached to the push-up needle 3. The conventional method is to push up the semiconductor element 6 from the back side through the adhesive tape 5 and peel the semiconductor element 6 from the adhesive tape 5.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述した従来の突上げ方法は、突上げ針のみで半導体素
子を突上げるため、半導体素子のサイズが大きくなると
針の突上げ量を多くしたり、また針の本数を増やしたり
する必要があった。そのため、第5図(b)、(C)の
ように1本の突上げ針3で突上げる場合は、突上げられ
た半導体装置6の傾きが大きくなるため、隣の素子と接
触して素子にペレット傷11をつけるという欠点があっ
た。
In the conventional push-up method described above, the semiconductor device is pushed up using only the push-up needle, so as the size of the semiconductor device increases, it is necessary to increase the push-up amount of the needle or increase the number of needles. . Therefore, when pushing up with one push-up needle 3 as shown in FIG. There was a drawback that the pellets were scratched 11.

又、第6図の突上げユニットの断面図のように、半導体
素子6を水平に突上げるために複数本の突上げ針3を使
用する場合も、これらの針の高さを均一に合せて使用し
なければならないため、どれか1本でも針が折れた場合
、半導体素子6を水平に突上げることができなくなり、
1本針で突上げた時と同じ様に半導体素子を傷つけてし
まうという欠点があった。
Also, when using a plurality of push-up needles 3 to push up the semiconductor element 6 horizontally, as shown in the cross-sectional view of the push-up unit in FIG. If any one of the needles breaks, it becomes impossible to push up the semiconductor element 6 horizontally.
The drawback was that it damaged the semiconductor element in the same way as when thrusting up with a single needle.

さらに、複数本の針を使用した場合、針金部が半導体素
子を貼りつけている粘着テープを突き破るため、針によ
って開けられる穴が多くなり、筒状ステージにおけるリ
ーク(すなわち剥離不良となる)の原因となっていた。
Furthermore, when multiple needles are used, the wire portion breaks through the adhesive tape that adheres the semiconductor element, which increases the number of holes made by the needles and causes leaks (i.e., poor peeling) in the cylindrical stage. It became.

上述した従来の突上げ方法に対し、本発明の方法は、半
導体素子を突上げ針で突上げる前に、押し上げブロック
を用いて半導体素子を水平に押し上げておくという相違
点を有する。
The method of the present invention differs from the conventional push-up method described above in that a push-up block is used to push up the semiconductor element horizontally before the semiconductor element is pushed up with the push-up needle.

〔課題を解決するための手段〕[Means to solve the problem]

本発明は、ダイボンディング時に半導体素子をピックア
ップする際、半導体素子が貼り付けられた粘着テープを
筒状ステージに真空吸着し、半導体素子を下から突上げ
針で突上げて粘着テープがら剥利するための半導体素子
突上げ方法において、前記筒状ステージ内の突上げ針と
の間に突上げ針と独立して上下動する押し上げブロック
を設け、押し上げブロックにて半導体素子を水平に押し
上げ、その後突上げ針にて半導体素子を突上げる半導体
素子突上げ方法である。
In the present invention, when picking up a semiconductor element during die bonding, the adhesive tape with the semiconductor element attached is vacuum-adsorbed onto a cylindrical stage, the semiconductor element is pushed up from below with a push-up needle, and the adhesive tape is peeled off. In this method, a push-up block that moves up and down independently of the push-up needle is provided between the push-up needle in the cylindrical stage, the push-up block pushes up the semiconductor device horizontally, and then the push-up needle is pushed up. This is a method of pushing up a semiconductor element by pushing up a semiconductor element with a lifting needle.

〔実施例〕〔Example〕

次に本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.

第1図(a)は本発明の第1の実施例に使用する突上げ
ユニットの上面図、第1図(b)はその断面図である。
FIG. 1(a) is a top view of a push-up unit used in a first embodiment of the present invention, and FIG. 1(b) is a sectional view thereof.

第2図(a)〜(C)は本発明の第1の実施例の突上げ
動作を表わした断面図である。
FIGS. 2(a) to 2(C) are cross-sectional views showing the thrusting operation of the first embodiment of the present invention.

押し上げブロック2は、筒状ステージ1内に設けられ、
且つ突上げ針3を囲んでセットされている。そして、そ
の上面は水平面となっている。第2図(a)は、粘着テ
ープ5に貼りつけられた半導体素子6を、真空吸着穴8
より図示されない真空源にて吸着した後、半導体素子6
を吸着するためにノズル7が下降した状態を表している
。その後第2図(b)のように、押し上げブロック2が
図示されない駆動源にて押し上げられ、半導体素子6を
粘着テープ5ごと水平に押し上げる。この押し上げによ
り、半導体素子6を貼り付けていた粘着テープ5の半導
体素子周辺部9が引きはがされる。次に第2図(C)の
ように、突上げ針ホルダー4を介して突上げ針3にて半
導体素子6を突上げ、粘着テープ5より完全に半導体素
子6を剥離させる。第3図(a)〜(c)は、上述した
第1の実施例にて大型の半導体素子6aを突上げる様子
を表わしたものである。この例でわがる様に、半導体素
子のサイズが変っても押し上げブロック2にて押し上げ
られている粘着テープ5の面積は常に一定となっている
ので、突上げ針3のストロークを変えることなく半導体
素子6aを剥離することができる。又、同図(b)がら
もわがるとうり、半導体素子6aを面で押し上げている
ので、大型の半導体素子が傾いて接触するという問題も
発生しない、第4図(a)〜(d)は本発明の第2の実
施例の動作を表わした断面図である。
The push-up block 2 is provided inside the cylindrical stage 1,
Moreover, it is set surrounding the push-up needle 3. The top surface is a horizontal surface. FIG. 2(a) shows the semiconductor device 6 attached to the adhesive tape 5 placed in the vacuum suction hole 8.
After adsorption with a vacuum source (not shown), the semiconductor element 6
This shows a state in which the nozzle 7 is lowered to adsorb the . Thereafter, as shown in FIG. 2(b), the push-up block 2 is pushed up by a drive source (not shown), and the semiconductor element 6 is pushed up horizontally together with the adhesive tape 5. By this pushing up, the semiconductor element peripheral portion 9 of the adhesive tape 5 to which the semiconductor element 6 was attached is torn off. Next, as shown in FIG. 2(C), the semiconductor element 6 is pushed up with the push-up needle 3 via the push-up needle holder 4, and the semiconductor element 6 is completely peeled off from the adhesive tape 5. FIGS. 3(a) to 3(c) show how the large semiconductor element 6a is pushed up in the first embodiment described above. As can be seen in this example, even if the size of the semiconductor element changes, the area of the adhesive tape 5 pushed up by the push-up block 2 is always constant, so the semiconductor element can be removed without changing the stroke of the push-up needle 3. The element 6a can be peeled off. Furthermore, as shown in FIG. 4(b), since the semiconductor element 6a is pushed up by a surface, there is no problem of the large semiconductor element tilting into contact, as shown in FIGS. 4(a) to 4(d). FIG. 2 is a sectional view showing the operation of the second embodiment of the present invention.

本実施例は、コレット10にて半導体素子6を吸着する
場合の動作を表わしたものである。第4図(a>におい
て、半導体素子6を粘着テープ5ごと筒状ステージ1に
吸着する。次に同図(b)に示すように、押し上げブロ
ック2が半導体素子6を粘着テープ5ごと押し上げる。
This embodiment shows the operation when a semiconductor element 6 is attracted by a collet 10. In FIG. 4(a), the semiconductor element 6 together with the adhesive tape 5 is attracted to the cylindrical stage 1. Next, as shown in FIG. 4(b), the push-up block 2 pushes up the semiconductor element 6 together with the adhesive tape 5.

その後同図、(c)のように、コレット1oが下降し半
導体素子6をチャックする。そして同図(d)のように
、コレット10が半導体素子6をチャックした後、突上
げ針3にて半導体素子6を突上げ剥離する。
Thereafter, the collet 1o descends to chuck the semiconductor element 6, as shown in FIG. 6(c). As shown in FIG. 2D, after the collet 10 chucks the semiconductor element 6, the push-up needle 3 pushes up the semiconductor element 6 and peels it off.

この実施例では、ピックアップすべき半導体素子6を、
隣り合う他の半導体素子よりも高く押し上げているので
、コレット1oによって他の半導体素子が傷つけられる
ことがないという利点がある。
In this embodiment, the semiconductor element 6 to be picked up is
Since the collet 1o is pushed up higher than other adjacent semiconductor elements, there is an advantage that other semiconductor elements will not be damaged by the collet 1o.

r発明の効果〕 以上説明したように本発明の突上げ方法は、押[−上げ
ブロックにて半導体素子を傾けることなく押し上げるた
め、半導体素子同志が接触して傷をつけることが全くな
いという効果がある。又、押し上げブロックにて押し上
げられる粘着テープの面積が、半導体素子のサイズに関
係なく一定であるため、針のストローク調整をしなくて
も良いという効果もある。
[Effects of the Invention] As explained above, the push-up method of the present invention has the effect that since the push-up block pushes up the semiconductor device without tilting it, the semiconductor devices do not come into contact with each other and cause damage. There is. Furthermore, since the area of the adhesive tape that is pushed up by the push-up block is constant regardless of the size of the semiconductor element, there is also the advantage that there is no need to adjust the stroke of the needle.

図は従来の突上げユニットでの複数針による突上げ状態
を示す断面図である。
The figure is a sectional view showing a conventional push-up unit in a push-up state using multiple needles.

1・・・筒状ステージ、2・・・押し上げブロック、3
・・・突上げ針、4・・・突上げ針ホルダー、5・・・
粘着テープ、6,6a・・・半導体素子、7・・・ノズ
ル、8・・・真空吸着穴、9・・・半導体素子周辺部、
10・・・コレット、11・・・ベレット傷。
1... Cylindrical stage, 2... Push-up block, 3
... Thrust-up needle, 4... Thrust-up needle holder, 5...
Adhesive tape, 6, 6a... Semiconductor element, 7... Nozzle, 8... Vacuum suction hole, 9... Semiconductor element periphery,
10... Collet, 11... Beret scratch.

Claims (1)

【特許請求の範囲】[Claims] ダイボンディング時に半導体素子をピックアップする際
、半導体素子が貼り付けられた粘着テープを筒状ステー
ジに真空吸着し、半導体素子を下から突上げ針で突上げ
て粘着テープから剥利するための半導体素子突上げ方法
において、前記筒状ステージ内の突上げ針との間に突上
げ針と独立して上下動する押し上げブロックを設け、押
し上げブロックにて半導体素子を水平に押し上げ、その
後突上げ針にて半導体素子を突上げることを特徴とする
半導体素子突上げ方法。
When picking up a semiconductor element during die bonding, the adhesive tape to which the semiconductor element is attached is vacuum-adsorbed onto a cylindrical stage, and the semiconductor element is lifted up from below with a push-up needle to peel off the semiconductor element from the adhesive tape. In the push-up method, a push-up block that moves up and down independently of the push-up needle is provided between the push-up needle in the cylindrical stage, the push-up block pushes up the semiconductor element horizontally, and then the push-up needle A semiconductor device pushing-up method characterized by pushing up a semiconductor device.
JP1212287A 1989-08-18 1989-08-18 Upward pushing movement of semiconductor element Pending JPH0376139A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1212287A JPH0376139A (en) 1989-08-18 1989-08-18 Upward pushing movement of semiconductor element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1212287A JPH0376139A (en) 1989-08-18 1989-08-18 Upward pushing movement of semiconductor element

Publications (1)

Publication Number Publication Date
JPH0376139A true JPH0376139A (en) 1991-04-02

Family

ID=16620101

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1212287A Pending JPH0376139A (en) 1989-08-18 1989-08-18 Upward pushing movement of semiconductor element

Country Status (1)

Country Link
JP (1) JPH0376139A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04137043U (en) * 1991-06-12 1992-12-21 山形日本電気株式会社 Die push-up mechanism of semiconductor die bonding equipment
JPH05121525A (en) * 1991-10-25 1993-05-18 Sharp Corp Picking-up method of chip
WO2005117072A1 (en) * 2004-05-19 2005-12-08 Alphasem Ag Method and device for detaching a component which is attached to a flexible film
JP2010192648A (en) * 2009-02-18 2010-09-02 Canon Machinery Inc Debonding apparatus and debonding method
CN102254852A (en) * 2011-08-23 2011-11-23 南通富士通微电子股份有限公司 Thimble cap of die bonder
CN108133907A (en) * 2017-12-28 2018-06-08 北京中电科电子装备有限公司 A kind of chip peeling apparatus
CN110027905A (en) * 2019-04-19 2019-07-19 王小娟 A kind of chip sorting device for the high reliablity that adsorption effect is good

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6298638A (en) * 1985-10-24 1987-05-08 Shinkawa Ltd Die-bonding device
JPS62166536A (en) * 1986-01-20 1987-07-23 Sanyo Electric Co Ltd Protruding unit for electronic part

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6298638A (en) * 1985-10-24 1987-05-08 Shinkawa Ltd Die-bonding device
JPS62166536A (en) * 1986-01-20 1987-07-23 Sanyo Electric Co Ltd Protruding unit for electronic part

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04137043U (en) * 1991-06-12 1992-12-21 山形日本電気株式会社 Die push-up mechanism of semiconductor die bonding equipment
JPH05121525A (en) * 1991-10-25 1993-05-18 Sharp Corp Picking-up method of chip
WO2005117072A1 (en) * 2004-05-19 2005-12-08 Alphasem Ag Method and device for detaching a component which is attached to a flexible film
CH697213A5 (en) * 2004-05-19 2008-06-25 Alphasem Ag Method and apparatus for peeling a film adhered to a flexible component.
EP2306496A2 (en) 2004-05-19 2011-04-06 Kulicke & Soffa Die Bonding GmbH Method and device for detaching a component which is attached to a flexible film
US7981246B2 (en) 2004-05-19 2011-07-19 Kulicke And Soffa Die Bonding Gmbh Method and device for detaching a component which is attached to a flexible film
EP2306496A3 (en) * 2004-05-19 2012-10-10 Kulicke & Soffa Die Bonding GmbH Method and device for detaching a component which is attached to a flexible film
JP2010192648A (en) * 2009-02-18 2010-09-02 Canon Machinery Inc Debonding apparatus and debonding method
CN102254852A (en) * 2011-08-23 2011-11-23 南通富士通微电子股份有限公司 Thimble cap of die bonder
CN108133907A (en) * 2017-12-28 2018-06-08 北京中电科电子装备有限公司 A kind of chip peeling apparatus
CN108133907B (en) * 2017-12-28 2020-05-01 北京中电科电子装备有限公司 Chip stripping off device
CN110027905A (en) * 2019-04-19 2019-07-19 王小娟 A kind of chip sorting device for the high reliablity that adsorption effect is good

Similar Documents

Publication Publication Date Title
KR100480628B1 (en) Chip pick-up method and device for manufacturing semiconductor device using air blowing
KR100766512B1 (en) Method and device of peeling semiconductor device
JPH0837395A (en) Device and method for supplying semiconductor chip
JP2002270542A (en) Method of picking up die, and picking-up apparatus
JP2002280330A (en) Pickup method of chip-type component
JP2015076410A (en) Bonding method and die bonder
JP2002164305A (en) Pick-up device of semiconductor chip
JP2003229469A (en) Semiconductor chip pickup device
JPH0376139A (en) Upward pushing movement of semiconductor element
JPH09181150A (en) Pickup equipment of semiconductor chip and pickup method using the same
JPH01321650A (en) Pick-up device for semiconductor chip
JP4230178B2 (en) Semiconductor chip peeling apparatus and method
JPS62210635A (en) Method and apparatus for isolating article
JP2004259811A (en) Die pick-up method and device
JP2010062473A (en) Pick-up apparatus for semiconductor chip and pick-up method for semiconductor chip using the same
JPH1092907A (en) Semiconductor chip pickup unit and method therefor
JPH0266957A (en) Pickup device of semiconductor element
JPH0661347A (en) Method and apparatus for separating chip from adhesive tape
JPH0214547A (en) Picking-up apparatus of electronic component
KR102382558B1 (en) Die Pick-up Apparatus and Operating Method of Die Pick-up Apparatus
JPH0128682Y2 (en)
JP2002124525A (en) Semiconductor chip separating device and method therefor
JPH01134944A (en) Picking-up for semiconductor element
JPH04162445A (en) Pushing-up mechanism for pellet
JPH04320046A (en) Pickup device for semiconductor chip