JPH0376139A - Upward pushing movement of semiconductor element - Google Patents
Upward pushing movement of semiconductor elementInfo
- Publication number
- JPH0376139A JPH0376139A JP1212287A JP21228789A JPH0376139A JP H0376139 A JPH0376139 A JP H0376139A JP 1212287 A JP1212287 A JP 1212287A JP 21228789 A JP21228789 A JP 21228789A JP H0376139 A JPH0376139 A JP H0376139A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor element
- push
- needle
- pushing
- adhesive tape
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 63
- 239000002390 adhesive tape Substances 0.000 claims abstract description 24
- 238000000034 method Methods 0.000 claims description 12
- 230000002093 peripheral effect Effects 0.000 abstract description 2
- 230000000694 effects Effects 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 239000008188 pellet Substances 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68318—Auxiliary support including means facilitating the separation of a device or wafer from the auxiliary support
- H01L2221/68322—Auxiliary support including means facilitating the selective separation of some of a plurality of devices from the auxiliary support
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、半導体素子をダイボンディングする際の粘着
テープに貼り付けられた半導体素子の突上げ方法に関し
、特に突上げ針にて半導体素子を剥離する方法に関する
。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a method of pushing up a semiconductor element attached to an adhesive tape when die bonding a semiconductor element, and in particular, a method of pushing up a semiconductor element attached to an adhesive tape when die bonding a semiconductor element. Regarding the method of peeling.
従来、この種の突上げ方法は、第5図(a)。 Conventionally, this type of push-up method is shown in FIG. 5(a).
(b)、(c)の突上げユニットの動作断面図に示すよ
うに、粘着テープ5に貼り付けられた半導体素子6を、
粘着テープ5ごと真空吸着穴8があけられた筒状ステー
ジ1に真空吸着し、半導体素子6をピックアップするた
めの吸着用のノズル7が半導体素子6の表面に下降した
後、突上げ針3にて半導体素子6を裏面側から粘着テー
プ5を介して突上げ、粘着テープ5より半導体素子6を
剥離する方法となっていた。As shown in the operational cross-sectional views of the push-up unit in (b) and (c), the semiconductor element 6 attached to the adhesive tape 5 is
The adhesive tape 5 is vacuum-adsorbed onto a cylindrical stage 1 with vacuum suction holes 8, and after a suction nozzle 7 for picking up the semiconductor element 6 descends to the surface of the semiconductor element 6, it is attached to the push-up needle 3. The conventional method is to push up the semiconductor element 6 from the back side through the adhesive tape 5 and peel the semiconductor element 6 from the adhesive tape 5.
上述した従来の突上げ方法は、突上げ針のみで半導体素
子を突上げるため、半導体素子のサイズが大きくなると
針の突上げ量を多くしたり、また針の本数を増やしたり
する必要があった。そのため、第5図(b)、(C)の
ように1本の突上げ針3で突上げる場合は、突上げられ
た半導体装置6の傾きが大きくなるため、隣の素子と接
触して素子にペレット傷11をつけるという欠点があっ
た。In the conventional push-up method described above, the semiconductor device is pushed up using only the push-up needle, so as the size of the semiconductor device increases, it is necessary to increase the push-up amount of the needle or increase the number of needles. . Therefore, when pushing up with one push-up needle 3 as shown in FIG. There was a drawback that the pellets were scratched 11.
又、第6図の突上げユニットの断面図のように、半導体
素子6を水平に突上げるために複数本の突上げ針3を使
用する場合も、これらの針の高さを均一に合せて使用し
なければならないため、どれか1本でも針が折れた場合
、半導体素子6を水平に突上げることができなくなり、
1本針で突上げた時と同じ様に半導体素子を傷つけてし
まうという欠点があった。Also, when using a plurality of push-up needles 3 to push up the semiconductor element 6 horizontally, as shown in the cross-sectional view of the push-up unit in FIG. If any one of the needles breaks, it becomes impossible to push up the semiconductor element 6 horizontally.
The drawback was that it damaged the semiconductor element in the same way as when thrusting up with a single needle.
さらに、複数本の針を使用した場合、針金部が半導体素
子を貼りつけている粘着テープを突き破るため、針によ
って開けられる穴が多くなり、筒状ステージにおけるリ
ーク(すなわち剥離不良となる)の原因となっていた。Furthermore, when multiple needles are used, the wire portion breaks through the adhesive tape that adheres the semiconductor element, which increases the number of holes made by the needles and causes leaks (i.e., poor peeling) in the cylindrical stage. It became.
上述した従来の突上げ方法に対し、本発明の方法は、半
導体素子を突上げ針で突上げる前に、押し上げブロック
を用いて半導体素子を水平に押し上げておくという相違
点を有する。The method of the present invention differs from the conventional push-up method described above in that a push-up block is used to push up the semiconductor element horizontally before the semiconductor element is pushed up with the push-up needle.
本発明は、ダイボンディング時に半導体素子をピックア
ップする際、半導体素子が貼り付けられた粘着テープを
筒状ステージに真空吸着し、半導体素子を下から突上げ
針で突上げて粘着テープがら剥利するための半導体素子
突上げ方法において、前記筒状ステージ内の突上げ針と
の間に突上げ針と独立して上下動する押し上げブロック
を設け、押し上げブロックにて半導体素子を水平に押し
上げ、その後突上げ針にて半導体素子を突上げる半導体
素子突上げ方法である。In the present invention, when picking up a semiconductor element during die bonding, the adhesive tape with the semiconductor element attached is vacuum-adsorbed onto a cylindrical stage, the semiconductor element is pushed up from below with a push-up needle, and the adhesive tape is peeled off. In this method, a push-up block that moves up and down independently of the push-up needle is provided between the push-up needle in the cylindrical stage, the push-up block pushes up the semiconductor device horizontally, and then the push-up needle is pushed up. This is a method of pushing up a semiconductor element by pushing up a semiconductor element with a lifting needle.
次に本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.
第1図(a)は本発明の第1の実施例に使用する突上げ
ユニットの上面図、第1図(b)はその断面図である。FIG. 1(a) is a top view of a push-up unit used in a first embodiment of the present invention, and FIG. 1(b) is a sectional view thereof.
第2図(a)〜(C)は本発明の第1の実施例の突上げ
動作を表わした断面図である。FIGS. 2(a) to 2(C) are cross-sectional views showing the thrusting operation of the first embodiment of the present invention.
押し上げブロック2は、筒状ステージ1内に設けられ、
且つ突上げ針3を囲んでセットされている。そして、そ
の上面は水平面となっている。第2図(a)は、粘着テ
ープ5に貼りつけられた半導体素子6を、真空吸着穴8
より図示されない真空源にて吸着した後、半導体素子6
を吸着するためにノズル7が下降した状態を表している
。その後第2図(b)のように、押し上げブロック2が
図示されない駆動源にて押し上げられ、半導体素子6を
粘着テープ5ごと水平に押し上げる。この押し上げによ
り、半導体素子6を貼り付けていた粘着テープ5の半導
体素子周辺部9が引きはがされる。次に第2図(C)の
ように、突上げ針ホルダー4を介して突上げ針3にて半
導体素子6を突上げ、粘着テープ5より完全に半導体素
子6を剥離させる。第3図(a)〜(c)は、上述した
第1の実施例にて大型の半導体素子6aを突上げる様子
を表わしたものである。この例でわがる様に、半導体素
子のサイズが変っても押し上げブロック2にて押し上げ
られている粘着テープ5の面積は常に一定となっている
ので、突上げ針3のストロークを変えることなく半導体
素子6aを剥離することができる。又、同図(b)がら
もわがるとうり、半導体素子6aを面で押し上げている
ので、大型の半導体素子が傾いて接触するという問題も
発生しない、第4図(a)〜(d)は本発明の第2の実
施例の動作を表わした断面図である。The push-up block 2 is provided inside the cylindrical stage 1,
Moreover, it is set surrounding the push-up needle 3. The top surface is a horizontal surface. FIG. 2(a) shows the semiconductor device 6 attached to the adhesive tape 5 placed in the vacuum suction hole 8.
After adsorption with a vacuum source (not shown), the semiconductor element 6
This shows a state in which the nozzle 7 is lowered to adsorb the . Thereafter, as shown in FIG. 2(b), the push-up block 2 is pushed up by a drive source (not shown), and the semiconductor element 6 is pushed up horizontally together with the adhesive tape 5. By this pushing up, the semiconductor element peripheral portion 9 of the adhesive tape 5 to which the semiconductor element 6 was attached is torn off. Next, as shown in FIG. 2(C), the semiconductor element 6 is pushed up with the push-up needle 3 via the push-up needle holder 4, and the semiconductor element 6 is completely peeled off from the adhesive tape 5. FIGS. 3(a) to 3(c) show how the large semiconductor element 6a is pushed up in the first embodiment described above. As can be seen in this example, even if the size of the semiconductor element changes, the area of the adhesive tape 5 pushed up by the push-up block 2 is always constant, so the semiconductor element can be removed without changing the stroke of the push-up needle 3. The element 6a can be peeled off. Furthermore, as shown in FIG. 4(b), since the semiconductor element 6a is pushed up by a surface, there is no problem of the large semiconductor element tilting into contact, as shown in FIGS. 4(a) to 4(d). FIG. 2 is a sectional view showing the operation of the second embodiment of the present invention.
本実施例は、コレット10にて半導体素子6を吸着する
場合の動作を表わしたものである。第4図(a>におい
て、半導体素子6を粘着テープ5ごと筒状ステージ1に
吸着する。次に同図(b)に示すように、押し上げブロ
ック2が半導体素子6を粘着テープ5ごと押し上げる。This embodiment shows the operation when a semiconductor element 6 is attracted by a collet 10. In FIG. 4(a), the semiconductor element 6 together with the adhesive tape 5 is attracted to the cylindrical stage 1. Next, as shown in FIG. 4(b), the push-up block 2 pushes up the semiconductor element 6 together with the adhesive tape 5.
その後同図、(c)のように、コレット1oが下降し半
導体素子6をチャックする。そして同図(d)のように
、コレット10が半導体素子6をチャックした後、突上
げ針3にて半導体素子6を突上げ剥離する。Thereafter, the collet 1o descends to chuck the semiconductor element 6, as shown in FIG. 6(c). As shown in FIG. 2D, after the collet 10 chucks the semiconductor element 6, the push-up needle 3 pushes up the semiconductor element 6 and peels it off.
この実施例では、ピックアップすべき半導体素子6を、
隣り合う他の半導体素子よりも高く押し上げているので
、コレット1oによって他の半導体素子が傷つけられる
ことがないという利点がある。In this embodiment, the semiconductor element 6 to be picked up is
Since the collet 1o is pushed up higher than other adjacent semiconductor elements, there is an advantage that other semiconductor elements will not be damaged by the collet 1o.
r発明の効果〕
以上説明したように本発明の突上げ方法は、押[−上げ
ブロックにて半導体素子を傾けることなく押し上げるた
め、半導体素子同志が接触して傷をつけることが全くな
いという効果がある。又、押し上げブロックにて押し上
げられる粘着テープの面積が、半導体素子のサイズに関
係なく一定であるため、針のストローク調整をしなくて
も良いという効果もある。[Effects of the Invention] As explained above, the push-up method of the present invention has the effect that since the push-up block pushes up the semiconductor device without tilting it, the semiconductor devices do not come into contact with each other and cause damage. There is. Furthermore, since the area of the adhesive tape that is pushed up by the push-up block is constant regardless of the size of the semiconductor element, there is also the advantage that there is no need to adjust the stroke of the needle.
図は従来の突上げユニットでの複数針による突上げ状態
を示す断面図である。The figure is a sectional view showing a conventional push-up unit in a push-up state using multiple needles.
1・・・筒状ステージ、2・・・押し上げブロック、3
・・・突上げ針、4・・・突上げ針ホルダー、5・・・
粘着テープ、6,6a・・・半導体素子、7・・・ノズ
ル、8・・・真空吸着穴、9・・・半導体素子周辺部、
10・・・コレット、11・・・ベレット傷。1... Cylindrical stage, 2... Push-up block, 3
... Thrust-up needle, 4... Thrust-up needle holder, 5...
Adhesive tape, 6, 6a... Semiconductor element, 7... Nozzle, 8... Vacuum suction hole, 9... Semiconductor element periphery,
10... Collet, 11... Beret scratch.
Claims (1)
、半導体素子が貼り付けられた粘着テープを筒状ステー
ジに真空吸着し、半導体素子を下から突上げ針で突上げ
て粘着テープから剥利するための半導体素子突上げ方法
において、前記筒状ステージ内の突上げ針との間に突上
げ針と独立して上下動する押し上げブロックを設け、押
し上げブロックにて半導体素子を水平に押し上げ、その
後突上げ針にて半導体素子を突上げることを特徴とする
半導体素子突上げ方法。When picking up a semiconductor element during die bonding, the adhesive tape to which the semiconductor element is attached is vacuum-adsorbed onto a cylindrical stage, and the semiconductor element is lifted up from below with a push-up needle to peel off the semiconductor element from the adhesive tape. In the push-up method, a push-up block that moves up and down independently of the push-up needle is provided between the push-up needle in the cylindrical stage, the push-up block pushes up the semiconductor element horizontally, and then the push-up needle A semiconductor device pushing-up method characterized by pushing up a semiconductor device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1212287A JPH0376139A (en) | 1989-08-18 | 1989-08-18 | Upward pushing movement of semiconductor element |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1212287A JPH0376139A (en) | 1989-08-18 | 1989-08-18 | Upward pushing movement of semiconductor element |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0376139A true JPH0376139A (en) | 1991-04-02 |
Family
ID=16620101
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1212287A Pending JPH0376139A (en) | 1989-08-18 | 1989-08-18 | Upward pushing movement of semiconductor element |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0376139A (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04137043U (en) * | 1991-06-12 | 1992-12-21 | 山形日本電気株式会社 | Die push-up mechanism of semiconductor die bonding equipment |
JPH05121525A (en) * | 1991-10-25 | 1993-05-18 | Sharp Corp | Picking-up method of chip |
WO2005117072A1 (en) * | 2004-05-19 | 2005-12-08 | Alphasem Ag | Method and device for detaching a component which is attached to a flexible film |
JP2010192648A (en) * | 2009-02-18 | 2010-09-02 | Canon Machinery Inc | Debonding apparatus and debonding method |
CN102254852A (en) * | 2011-08-23 | 2011-11-23 | 南通富士通微电子股份有限公司 | Thimble cap of die bonder |
CN108133907A (en) * | 2017-12-28 | 2018-06-08 | 北京中电科电子装备有限公司 | A kind of chip peeling apparatus |
CN110027905A (en) * | 2019-04-19 | 2019-07-19 | 王小娟 | A kind of chip sorting device for the high reliablity that adsorption effect is good |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6298638A (en) * | 1985-10-24 | 1987-05-08 | Shinkawa Ltd | Die-bonding device |
JPS62166536A (en) * | 1986-01-20 | 1987-07-23 | Sanyo Electric Co Ltd | Protruding unit for electronic part |
-
1989
- 1989-08-18 JP JP1212287A patent/JPH0376139A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6298638A (en) * | 1985-10-24 | 1987-05-08 | Shinkawa Ltd | Die-bonding device |
JPS62166536A (en) * | 1986-01-20 | 1987-07-23 | Sanyo Electric Co Ltd | Protruding unit for electronic part |
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04137043U (en) * | 1991-06-12 | 1992-12-21 | 山形日本電気株式会社 | Die push-up mechanism of semiconductor die bonding equipment |
JPH05121525A (en) * | 1991-10-25 | 1993-05-18 | Sharp Corp | Picking-up method of chip |
WO2005117072A1 (en) * | 2004-05-19 | 2005-12-08 | Alphasem Ag | Method and device for detaching a component which is attached to a flexible film |
CH697213A5 (en) * | 2004-05-19 | 2008-06-25 | Alphasem Ag | Method and apparatus for peeling a film adhered to a flexible component. |
EP2306496A2 (en) | 2004-05-19 | 2011-04-06 | Kulicke & Soffa Die Bonding GmbH | Method and device for detaching a component which is attached to a flexible film |
US7981246B2 (en) | 2004-05-19 | 2011-07-19 | Kulicke And Soffa Die Bonding Gmbh | Method and device for detaching a component which is attached to a flexible film |
EP2306496A3 (en) * | 2004-05-19 | 2012-10-10 | Kulicke & Soffa Die Bonding GmbH | Method and device for detaching a component which is attached to a flexible film |
JP2010192648A (en) * | 2009-02-18 | 2010-09-02 | Canon Machinery Inc | Debonding apparatus and debonding method |
CN102254852A (en) * | 2011-08-23 | 2011-11-23 | 南通富士通微电子股份有限公司 | Thimble cap of die bonder |
CN108133907A (en) * | 2017-12-28 | 2018-06-08 | 北京中电科电子装备有限公司 | A kind of chip peeling apparatus |
CN108133907B (en) * | 2017-12-28 | 2020-05-01 | 北京中电科电子装备有限公司 | Chip stripping off device |
CN110027905A (en) * | 2019-04-19 | 2019-07-19 | 王小娟 | A kind of chip sorting device for the high reliablity that adsorption effect is good |
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