JPH0374806A - Method of measuring temperature coefficient of resistor and method of correcting resistance value - Google Patents

Abstract

PURPOSE:To increase resistance value correcting precision by obtaining a temperature coefficient for resistance correction use, and performing correction to a target setting resistance value during resistance correcting process. CONSTITUTION:The relation between the error ratio of a resistance value after resistance value correction or correction completion position and a correction target setting value and temperature coefficients is expressed in a graph and stored as data. The quantity of error ratio generating to the target value after resistance value correction is measured, thereby obtaining a temperature coefficient from comparison data. A resistor body 5 moves in the lateral direction while rotating in the arrow direction; a cutting disk 4 comes into contact with the resistor body surface while rotating with high speed; a cutting groove pitch is arbitrarily changed; target setting of a cutting end position is determined by selecting a motor speed based on the magnification of the resistance value before resistance value correction and the correction target resistance value and on the relation between the magnification and the motor speed. A measuring instrument is connected between both ends of resistor body electrodes 6; the degree of influence of the temperature coefficient is obtained during the cutting of a resistance coating film, and correction is performed to the target setting value.

Description

[Detailed Description of the Invention] Industrial Application Field The present invention aims to increase the accuracy of resistance value correction of a resistor by adding a temperature coefficient specific to the resistor to the thermal influence caused by a cutting disk or a laser beam during resistance value correction. The present invention relates to a resistor temperature coefficient measuring method and a resistance value correcting method for preventing errors in corrected values.

Conventional technology Conventionally, when measuring the temperature coefficient of this type of resistor, the temperature coefficient was measured by calculating the rate of change in resistance value in a furnace with a dryer set at a temperature 100°C different from room temperature. there were.

Further, in Fig. 3, numeral 4 is a cutting disk for correcting the resistance value of the resistor film, and the cutting disk contacts the resistor 6 to correct the resistance value with cutting grooves, and measures the resistance value at the resistor electrode 6. A measuring device is connected, and the resistor film is cut while comparing it with the target resistance value.

The pitch of the grooves cut at this time is evenly spaced, so the resistance value variation before correction and the heat effect of cutting the resistor (
As shown in FIG. 2, the error due to temperature coefficient) affected the cutting groove end position.

Problems to be Solved by the Invention With such a conventional configuration, it takes time to measure the temperature coefficient, and it is impossible to measure the temperature coefficient of each button during mass production. The resistance value after the resistance value correction has an error due to the influence of this temperature coefficient, and there is a problem that the resistance value correction accuracy cannot be improved.

In addition, because the ends of the cutting grooves are not constant, when current is applied to the resistor, the temperature distribution on the resistor surface is uneven, and when the grooves are concentrated as shown in Figure 2, the temperature rise becomes high, which can cause damage to the resistor. It causes an invitation.

Means for Solving the Problem In order to solve this problem, the present invention 1 utilizes the influence of thermal energy generated when modifying the resistance value of a resistor using a cutting disk or a laser beam. The configuration is such that a temperature coefficient is determined, and the calculation of this temperature coefficient is completed during the resistance value correction to automatically correct the target resistance value.

Effect: With this configuration, it is possible to measure the difference from the target set value when the resistance value correction is completed, and calculate the number of temperature measurements from the comparison data of the temperature coefficient versus the resistance value correction error or the error with the target value at the end position of the resistance value correction. can.

Furthermore, by performing measurement calculations during the resistance value correction and correcting the target set resistance value, the resistance value correction accuracy can be improved.

Embodiment FIG. 1 is a graph showing the relationship between the error rate of the resistance value after correction of the resistance value or the correction completion position and the corrected target set value, and the temperature coefficient of the present invention. This is stored as data and the resistance value is Measure the error rate from the target value after correction,
The temperature coefficient can be determined from the comparison data.

Figure 3 is a structural diagram for correcting the resistance value of a resistor, in which the resistor moves laterally while rotating in the direction of the arrow, and the cutting disk 4 is brought into contact with the surface of the resistor while rotating at high speed. By changing the lateral movement speed and rotational speed of the resistor, the cutting groove pitch can be arbitrarily varied and the cutting end position can be determined. The target setting of the cutting end position is determined by selecting the motor speed from the data of the relationship between the magnification and the motor speed, based on the resistance value before the resistance value correction and the magnification of the corrected target resistance value.

Fig. 2 shows a measurement device connected to both ends of the resistor electrode 6 shown in Fig. 3 when the resistance value is corrected with an arbitrarily determined cutting groove pitch.
The resistance value correction is completed using the measuring instrument, but B in Fig. 2
When the temperature coefficient is + (plus) several tens of ppm, the correction distance becomes shorter than the temperature coefficient o ppm, and furthermore, when the temperature returns to room temperature, the resistance value becomes minus (minus) with respect to the target correction value. Become.

Further, when the temperature coefficient of C is several tens of ppm, the correction distance becomes longer than the temperature coefficient of M, Oppm, and when the temperature returns to normal temperature, the resistance value becomes ten times the target correction value. Therefore, by calculating the influence of the temperature coefficient from the graph shown in Figure 1 while cutting the resistive film and correcting it against the target set value, the resistance value at room temperature can be obtained with high accuracy. becomes.

Effects of the Invention As described above, according to the present invention, the temperature coefficient of each resistor can be determined at the time of resistance value correction, and can be known in a very short time. Since the positioning can be performed effectively with respect to the length, the accuracy of the resistance value is improved, and the heat distribution on the surface of the resistor is not biased when a current is passed through the resistor, making it possible to produce a stable resistor.

[Brief explanation of drawings]

Figure 1 is a characteristic diagram showing the relationship between the error rate and temperature coefficient of the resistance value after correction used in the present invention and the target setting value, and Figure 2 shows the change in correction distance and correction resistance value when resistance value is corrected. The explanatory diagram shown in chronological order, FIG. 3, generally shows the state of resistance value correction of the resistor in the constituent countries.

Claims (2)

[Claims] (1) When correcting the resistance value of a resistor, measure the resistance value before correction, calculate the multiplier with the target correction value, determine the correction end position, and increase the resistance value of the resistor until it reaches the target correction value. A resistor temperature coefficient measurement method that equivalently measures the temperature coefficient by correcting the position and calculating the error between the completed position and the position determined by calculation. (2) A resistance value correction method for a resistor, which calculates the influence of the temperature coefficient until reaching the target correction value using the resistance temperature coefficient measuring method according to claim 1, and corrects the resistance value while correcting to the target correction value.