JPS6028366B2 - How to adjust resistance elements - Google Patents

How to adjust resistance elements

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Publication number
JPS6028366B2
JPS6028366B2 JP55110602A JP11060280A JPS6028366B2 JP S6028366 B2 JPS6028366 B2 JP S6028366B2 JP 55110602 A JP55110602 A JP 55110602A JP 11060280 A JP11060280 A JP 11060280A JP S6028366 B2 JPS6028366 B2 JP S6028366B2
Authority
JP
Japan
Prior art keywords
resistance value
cut
resistance
trimming
length
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55110602A
Other languages
Japanese (ja)
Other versions
JPS5735305A (en
Inventor
昌章 冨士
昌平 秋武
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP55110602A priority Critical patent/JPS6028366B2/en
Publication of JPS5735305A publication Critical patent/JPS5735305A/en
Publication of JPS6028366B2 publication Critical patent/JPS6028366B2/en
Expired legal-status Critical Current

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Description

【発明の詳細な説明】 本発明は抵抗素子の調整方法に関し、特に薄膜又は厚膜
の矩形抵抗素子をL字形にレーザ・トリミングする調整
方法に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for adjusting a resistive element, and more particularly to a method for laser trimming a thin-film or thick-film rectangular resistive element into an L-shape.

一般に薄膜又は厚膜の矩形抵抗素子をレーザ・トリミン
グして抵抗値を調整するには、第1図A乃至第1図Cに
示すような方法が行なわれる。
Generally, in order to adjust the resistance value of a thin film or thick film rectangular resistance element by laser trimming, a method as shown in FIGS. 1A to 1C is performed.

第1図AはLカットと呼ばれ電極2に取付けられた抵抗
素子1に、L字形の切欠き3を入れたものである。同図
Bは同様に抵抗素子1に1本の直線の切欠き3を入れた
ストレートカット、同図Cは抵抗素子1に直線の切欠き
3を入れたSカットと呼ばれるものである。通常、抵抗
素子は電流の局所的な集中が少なく、又調整時の感度が
低い方が良いことから、矩形抵抗素子の調整はLカット
によって行なわれる。このLカットによる抵抗値調整方
法を第1図Aを参照して説明すると、Wは抵抗素子1の
幅、Lは長さ、AはLカットの垂直部分(以下Aカット
)の長さ、Bは水平部分(以下Bカットの長さCは電極
2からLカット開始地点までの距離、Wはしーザ光線に
よる切欠き幅である。
FIG. 1A is called an L-cut, in which an L-shaped notch 3 is made in the resistance element 1 attached to the electrode 2. Similarly, figure B shows a straight cut in which a single straight notch 3 is formed in the resistance element 1, and figure C shows a so-called S cut in which a straight line notch 3 is formed in the resistance element 1. Normally, the adjustment of a rectangular resistance element is performed by L-cutting because the resistance element has less local concentration of current, and the lower the sensitivity during adjustment, the better. This method of adjusting the resistance value by L-cut will be explained with reference to FIG. is the horizontal portion (hereinafter, the length of the B cut, C is the distance from the electrode 2 to the L cut start point, and W is the width of the notch made by the laser beam).

Lカットにおいては、トリミング方向の9びの転換89
点(以下折点)を決めるのは重要な問題で、従来、‘1
1折点までのAカットの長さを、A=WQ(Q=0.2
〜0.6)の式で表わされるように、抵抗素子1の幅か
ら決める方法と、{2ー 目標抵抗値をRo、Lカット
の折点の抵抗値をRtとしてて、RtがRoの50〜7
0%に達する地点を折点とする方法とがある。
In L cut, 9-bit conversion of trimming direction 89
Deciding the point (hereinafter referred to as the break point) is an important problem, and conventionally, '1
The length of A cut to the first fold point is A = WQ (Q = 0.2
~0.6), there is a method of determining from the width of the resistor element 1, and a method of determining it from the width of the resistor element 1, {2-, where the target resistance value is Ro, the resistance value at the break point of the L cut is Rt, and Rt is 50 of Ro. ~7
There is a method in which the point where the value reaches 0% is taken as the breaking point.

しかしながら、抵抗素子1の初期値Riは抵抗膜の比抵
抗、膜厚パターン形成時のバラッキ等により、それぞれ
異なった値を示すので、前者の方法のようにAカットの
長さを抵抗素子1の幅Wから、A=QW(Q=0.2〜
0.6)に固定すると、例えば、初期抵抗値Riが目標
抵抗値Roに近い抵抗素子では、トリミングの方向転換
が行なわれる前に、抵抗値Rtが目標抵抗値Roに達し
てしまって、単なるストレートカットになり、折点付近
での電流の集中を生じて、素子の劣化を招く恐れがある
。又、初期抵抗値Riが目標抵抗値Roよりかなり低い
抵抗素子では、目標抵抗値Roに達する前にBカットが
電極部2に到達してしまい。トリミングが終了しない場
合がある。後者の方法では、折点の抵抗値Rtを目標抵
抗値Roの50〜70%に設定すると、例えば、初期抵
抗値Riが折点の抵抗値Rtより大きい抵抗素子では、
ストレートカットとなりLカットは行なわれない。従っ
て、本発明の目的は、従来のLカットによる抵抗素子の
調整方法では、ストレートカットとなって、抵抗素子に
局所的な電流の集中を生じたり、抵抗値の未調整を招い
たりする欠点を除去して、確実にLカットが行なわれ、
しかもBカットの長さを、初期抵抗値にかかわらず一定
な長さとすることの出来る調整方法を提供することにあ
る。
However, the initial value Ri of the resistor element 1 shows different values depending on the specific resistance of the resistor film, variations in film thickness pattern formation, etc., so as in the former method, the length of the A cut is From the width W, A=QW (Q=0.2~
0.6), for example, in a resistor element whose initial resistance value Ri is close to the target resistance value Ro, the resistance value Rt will reach the target resistance value Ro before the trimming direction is changed, and the resistance value will simply be This results in a straight cut, causing concentration of current near the bending point, which may lead to deterioration of the element. Furthermore, in a resistance element whose initial resistance value Ri is considerably lower than the target resistance value Ro, the B cut reaches the electrode section 2 before reaching the target resistance value Ro. Trimming may not finish. In the latter method, if the resistance value Rt at the break point is set to 50 to 70% of the target resistance value Ro, for example, in a resistance element whose initial resistance value Ri is larger than the resistance value Rt at the break point,
It is a straight cut and no L cut is made. Therefore, an object of the present invention is to solve the drawbacks that the conventional L-cut method for adjusting a resistance element results in a straight cut, which causes local concentration of current in the resistance element and unadjustment of the resistance value. Removed to ensure an L cut,
Furthermore, it is an object of the present invention to provide an adjustment method that allows the length of the B cut to be constant regardless of the initial resistance value.

一般に、長さL、幅Wの矩形抵抗素子の抵抗値Rは、シ
ート抵抗値Rs、縦横比(=L/W)をNsとすれば、
R=R3‐声=RSNS ‘1’ で表わされる。
Generally, the resistance value R of a rectangular resistance element with length L and width W is given by the sheet resistance value Rs and the aspect ratio (=L/W) as Ns.
R=R3-Voice=RSNS Represented by '1'.

この矩形抵抗素子がLカットされた場合、シート抵抗R
sは変らないから、抵抗値戊′は、式‘1)と同様にR
=RsNs′ {21で表
わされ、このときNs′(R′/Rs)は、通常等価縦
横比と呼ばれる。
When this rectangular resistance element is L-cut, the sheet resistance R
Since s does not change, the resistance value ∊′ is R as in equation 1).
=RsNs' {21, where Ns'(R'/Rs) is usually called the equivalent aspect ratio.

Lカットされた矩形抵抗素子の等価縦横比は、数値解析
の手法としてよく知られた「緩和法」と呼ばれる電界分
布の計算手段によって求められることが知られているぐ
プロシーディングス オフ エレクトロニツクコンポー
ネンツ コンファレンス56〜62頁、1973年」(
ProceedingsofElectronic C
ompo船nG Conにre比e pp56〜62、
1973))。
It is known that the equivalent aspect ratio of an L-cut rectangular resistance element can be determined by a calculation method for electric field distribution called the "relaxation method," which is a well-known numerical analysis method. pp. 56-62, 1973” (
Processing of Electronic C
Ompo ship nG Con re ratio pp56-62,
1973)).

本発明の抵抗素子の調整方法は、薄膜又は厚膜の矩形抵
抗素子に、Bカットの長さが常に一定となるようにLカ
ットを施した場合、緩和法により計算された折点の抵抗
値Rfと初期抵抗値Riとの間には、Rt=QRi+3
(Q,8は定数) ‘3’なる直線関係が成立する
という性質に基づき、抵抗素子の初期抵抗値Riから、
折点の抵抗値Rtを求め、Rtに抵抗値が達した時、ト
リミング方向を転換してLカットを行なうことを特徴と
する。
The resistance element adjustment method of the present invention is based on the resistance value at the break point calculated by the relaxation method when an L cut is made on a thin film or thick film rectangular resistance element so that the length of the B cut is always constant. Between Rf and initial resistance value Ri, Rt=QRi+3
(Q, 8 are constants) Based on the property that a linear relationship of '3' is established, from the initial resistance value Ri of the resistance element,
The feature is that the resistance value Rt at the break point is determined, and when the resistance value reaches Rt, the trimming direction is changed and an L cut is performed.

次に本発明による実施例を図面を参照して説明する。第
2図A乃至第2図Dに本発明の一実施例を示す。第2図
Aに長さLが2,35側幅Wが1.7肋、目標抵抗値R
oが300Qの抵抗素子1に、Bカットの長さBが一定
値値0.9肌になるように、電極2からトリミング開始
地点までの距離Cを0.475肋、レーザ光線による切
欠き幅Wを0.05帆でLカットを施す場合を示す。最
初に、矩形抵抗素子1のBカット終了後の等価縦横比N
f及びカット終了後の等価縦横比NtをAカット長が0
.2側から1.2側の間の6点について、前述の「緩和
法」により求めた。こられのLカットによって目標抵抗
値Roが得られたとすれば、そのときの矩形抵抗素子1
のシート抵抗値Rsは、式■よりRs=Ro/Nf
‘41となる。
Next, embodiments according to the present invention will be described with reference to the drawings. An embodiment of the present invention is shown in FIGS. 2A to 2D. In Figure 2 A, length L is 2, 35 side width W is 1.7 ribs, target resistance value R
o is 300Q, the distance C from the electrode 2 to the trimming start point is 0.475, and the width of the notch by the laser beam is set so that the cut length B is a constant value of 0.9. This shows the case of making an L cut with a W of 0.05 sail. First, the equivalent aspect ratio N after B-cut of rectangular resistance element 1 is
f and the equivalent aspect ratio Nt after the cut is completed, A cut length is 0
.. Six points between the 2 side and the 1.2 side were determined using the above-mentioned "relaxation method." If the target resistance value Ro is obtained by these L cuts, then the rectangular resistance element 1
The sheet resistance value Rs of
'41.

従って、このとき初期抵抗値Riは式‘11,{4はり
Ri=RS‐声=馬亭・寿 (51となり、折点
抵抗値Rtは式‘21,‘4’よりRt=RSNt=器
・Nt {6’となる。
Therefore, at this time, the initial resistance value Ri is calculated by the formula '11, {4 Ri = RS - voice = Batei・Koboshi (51), and the break point resistance value Rt is calculated by the formula '21, '4', Rt=RSNt=Kai Nt {6'.

以上の結果よりAカット長をバラメふく夕として、矩形
抵抗素子1のNf及びNtの値と、式{4’〜(6}よ
り計算したRs,Rj,Rtの値を第1表に示す。
Based on the above results, Table 1 shows the values of Nf and Nt of the rectangular resistance element 1, and the values of Rs, Rj, and Rt calculated from equations {4' to (6}), using the A cut length as a variable factor.

第1表 次にRiとRtの値をグラフ上にプロットすると、第2
図Bに示すように、Rt=QRi+8なる直線関係が得
られたので、最小2乗法によりQ及び8の値を決定し、
Rt=0.515鰍i+140.6(Q)
のを求めた。
Table 1 Next, when the values of Ri and Rt are plotted on a graph, the second
As shown in Figure B, the linear relationship Rt=QRi+8 was obtained, so the values of Q and 8 were determined by the least squares method,
Rt = 0.515 tuna i + 140.6 (Q)
I asked for the.

なお、8カット長を変えた場合でも、Q及びBの値は異
なるが、Rt=QRi+8なる直線関係は変らずに保持
された。
Note that even when the cut length was changed by 8, the linear relationship of Rt=QRi+8 was maintained unchanged, although the values of Q and B were different.

トリミングはまず前記抵抗素子1の初期抵抗値Riを測
定し、上式から折点の抵抗値Rtを算出した。次に前記
抵抗素子1の抵抗値を検出しながらトリミングを開始し
、その抵抗値がRtに達した時に、トリミング方向を9
00転換し、更に、前記目標抵抗値3000になった時
点でトリミングを停止させた。第2図Cに前記抵抗素子
1の初期抵抗値Riが108.80の場合のLカットの
軌跡を示す。このとき折点の抵抗値Rtは196.70
、Aカットの長さは1.25肋であった。第2図Dは前
記抵抗素子1の初期抵抗値Riが232.6Qの場合の
Lカットの軌跡で、折点の抵抗値Rtは260.60、
Aカットの長さAは0.50側であった。Bカットの長
さはいずれの場合も約0.9脚と一定値が得られ、調整
後の抵抗値も前記目標抵抗値3000の土0.1%内に
入った。第3図A乃至第3図Dに本発明による第二の実
施例を示す。
For trimming, first, the initial resistance value Ri of the resistance element 1 was measured, and the resistance value Rt at the break point was calculated from the above equation. Next, trimming is started while detecting the resistance value of the resistor element 1, and when the resistance value reaches Rt, the trimming direction is changed to 9.
00, and when the target resistance value reached 3000, trimming was stopped. FIG. 2C shows the locus of the L cut when the initial resistance value Ri of the resistance element 1 is 108.80. At this time, the resistance value Rt at the corner point is 196.70
, the length of the A cut was 1.25 ribs. FIG. 2D shows the locus of the L cut when the initial resistance value Ri of the resistance element 1 is 232.6Q, and the resistance value Rt at the break point is 260.60,
The length A of the A cut was on the 0.50 side. The length of the B cut was a constant value of about 0.9 legs in all cases, and the resistance value after adjustment was also within 0.1% of the target resistance value of 3000. A second embodiment according to the present invention is shown in FIGS. 3A to 3D.

「第3図Aに、長さLが1.5肋、幅Wが2.5柵、目
標抵抗値Roが390の抵抗素子1に、Bカットの長さ
が一定値0.5豚となるように、電極2からトリミング
開始地点までの距離Cを0.3肋、レーザ光線による切
欠き幅Wを0.05帆でLカットを施す場合を示す。ま
ず最初に、第1の実施例の場合と同様な方法で、この矩
形抵抗素子のAカット長が0.25肌から1.75帆の
4点につき、Nf,Nt,Rs,Ri,Rtの値を算出
した。この結果を第2表に示す。第2表 次に、RiとRtの値をグラフ上にプロットすると、第
3図Bに示すように、Rt=QRi+8なる直線関係が
第1の実施例と同様に得られたので、最小2乗法により
Q及び3の値を決定し、Rt=0.293狐i十26.
88(Q) ■を求めた。
``In Figure 3 A, the length L is 1.5 ribs, the width W is 2.5 ribs, the target resistance Ro is 390, and the resistance element 1 has a constant value of 0.5 pigs. As shown in FIG. Using the same method as in the case above, the values of Nf, Nt, Rs, Ri, and Rt were calculated for the four points of the A-cut length of this rectangular resistance element from 0.25 skin to 1.75 skin. Table 2: Next, when the values of Ri and Rt were plotted on a graph, as shown in Figure 3B, a linear relationship of Rt = QRi + 8 was obtained as in the first example. , determine the values of Q and 3 by the least squares method, Rt = 0.293 fox i + 26.
88(Q) ■ was calculated.

なお、Bカット長を変えた場合でも、第1の実施例と同
様に、RiとRtの直線関係は保持された。
Note that even when the B cut length was changed, the linear relationship between Ri and Rt was maintained as in the first example.

トリミングは第1の実施例と同様な方法で行なった。第
3図Cに前記抵抗素子1の初期抵抗値Riが、13.8
0の場合のLカットの軌跡を示す。このときの折点の抵
抗値Rtは30.90、Aカットの長さAは1.75側
であった。第3図Dは前記抵抗素子1の初期抵抗値Ri
が32.80の場合のLカットの軌跡で、所定の抵抗値
Rtは36.50、Aカットの長さAは、0.5肌であ
った。いずれの場合もBカットの長さは約0.5肌と一
定値が得られ、調整後の抵抗値も前記目標抵抗値390
の土0.5%内に入った。Bカット長を一定とした形状
の異なる矩形抵抗素子3の蓮以上について、第1及び第
2の実施例と同機の方法で、Nf,Ntを計算しLRt
とRjの関係を求めたが、いずれもRt=QRj+Bな
る直線関係が得られた。
Trimming was performed in the same manner as in the first example. In FIG. 3C, the initial resistance value Ri of the resistance element 1 is 13.8.
The locus of the L cut in the case of 0 is shown. At this time, the resistance value Rt at the break point was 30.90, and the A-cut length A was on the 1.75 side. FIG. 3D shows the initial resistance value Ri of the resistance element 1.
In the locus of the L cut when is 32.80, the predetermined resistance value Rt was 36.50, and the length A of the A cut was 0.5 skin. In either case, the length of the B cut is a constant value of approximately 0.5 skin, and the resistance value after adjustment is also the target resistance value 390.
It was within 0.5% of soil. For the rectangular resistance elements 3 of different shapes with a constant B cut length, Nf and Nt are calculated using the same method as in the first and second embodiments, and LRt is calculated.
The relationship between Rt and Rj was determined, and a linear relationship of Rt=QRj+B was obtained in both cases.

従って、この直線関係は、Bカット長を一定としてLカ
ットされた矩形抵抗素子の固有の性質であることが確か
められた。
Therefore, it was confirmed that this linear relationship is an inherent property of a rectangular resistance element that is L-cut with a constant B-cut length.

各実施例におけるBカットの長さは、抵抗素子のパター
ン形成時のバラツキ、レーザ・トリミング装置の位置合
せ誤差、抵抗測定器等の原因によって、設定値からのズ
レを生じたが、いずれの場合においても、Bカットの長
さに対して無視出来る範囲内のズレであった。
The length of the B cut in each example deviated from the set value due to variations in pattern formation of the resistive element, alignment errors of the laser trimming device, resistance measuring device, etc., but in any case. Also, the deviation was within a negligible range with respect to the length of the B cut.

かかる方法で調整された抵抗素子は、不完全なLカット
による局所的な電流の集中や、トリミング未終了等がな
く、確実にLカットが行なわれ、しかもBカットの長さ
が、初期抵抗値にかかわらず一定であった。
Resistance elements adjusted by this method have no local current concentration due to incomplete L-cuts or unfinished trimming, and L-cuts are reliably performed, and the length of B-cuts is equal to the initial resistance value. remained constant regardless of

これは、本発明のLカットによる抵抗値の調整方法が、
薄膜又は厚膜の矩形抵抗素子に、Bカットの長さが一定
となるようにLカットを施した場合、初期抵抗値Riと
折点の抵抗値Rtとの間には、Rt=QRi十8(Q,
8は定数) なる直線関係があるという性質を応用して行なわれたた
めの効果と考えられる。
This is because the resistance value adjustment method using L-cut of the present invention is
When an L cut is made on a thin film or thick film rectangular resistance element so that the length of the B cut is constant, the difference between the initial resistance value Ri and the resistance value Rt at the break point is Rt=QRi18 (Q,
8 is a constant) This effect is thought to be due to the application of the property that there is a linear relationship.

本発明のLカットになる抵抗素子の調整方法では、Bカ
ットの長さを初期抵抗値によらず一定とすることが出来
るから、Bカットが電極に達しないようなバラッキの許
容範囲内で、Bカットの長さを長くすれば、そのとき、
その初期抵抗値における最も残りの幅の広いLカットを
行うこと可能である。
In the method of adjusting a resistance element that becomes an L cut according to the present invention, the length of the B cut can be made constant regardless of the initial resistance value, so within the allowable range of variation such that the B cut does not reach the electrode. If the length of B cut is increased, then,
It is possible to make the widest remaining L cut at that initial resistance value.

従って、本発明は、レーザ光線の抵抗秦子に及ぼす熱的
影響が最も少なくて、経時的に安定な抵抗素子を製造出
来る調整方法である。又、抵抗素子の面積を最も広くと
ることが出釆るので本発明が、許容消費電力の最大抵抗
素子の調整方法を提供出来るのはもちろんである。
Therefore, the present invention is an adjustment method that can produce a resistor element that is stable over time and has the least thermal influence of the laser beam on the resistor. Furthermore, since it is possible to maximize the area of the resistive element, the present invention can of course provide a method for adjusting the resistive element with the maximum allowable power consumption.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図A乃至第1図Cは抵抗値調整を行う各種のカット
方法を説明する平面図であり、第2図A乃至第2図Dは
本発明による一実施例を示す平面図であり、第3図A乃
至第3図Dは本発明の他の実施例を示す平面図である。 図において、1・・・…抵抗素子、2・・・・・・電極
、3..・.・・Lカットの軌跡である。弟′図 弟Z図 努3図
1A to 1C are plan views illustrating various cutting methods for adjusting the resistance value, and FIGS. 2A to 2D are plan views showing an embodiment according to the present invention, FIGS. 3A to 3D are plan views showing other embodiments of the present invention. In the figure, 1... resistance element, 2... electrode, 3. ..・.. ...This is the trajectory of the L cut. Younger brother' drawing Younger brother Z drawing Tsutomu 3 drawing

Claims (1)

【特許請求の範囲】[Claims] 1 薄膜又は厚膜の矩形抵抗素子を、L字形にレーザ・
トリミングして抵抗値を調整する方法において、前記L
字形トリミングにおけるトリミング方向転換地点から、
トリミング終了地点までの距離が、予め定められた一定
の値となるように、前記抵抗素子の初期抵抗値から前記
方向転換地点の抵抗値を求め、この抵抗値に前記抵抗素
子の抵抗値が達した時に、トリミング方向を転換してト
リミングすることを特徴とする抵抗素子の調整方法。
1 Thin film or thick film rectangular resistance element is laser-coupled into an L-shape.
In the method of adjusting the resistance value by trimming, the L
From the trimming direction change point in glyph trimming,
The resistance value of the direction change point is determined from the initial resistance value of the resistance element so that the distance to the trimming end point becomes a predetermined constant value, and the resistance value of the resistance element reaches this resistance value. A method for adjusting a resistive element, characterized in that when the trimming direction is changed, the trimming direction is changed and trimmed.
JP55110602A 1980-08-12 1980-08-12 How to adjust resistance elements Expired JPS6028366B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55110602A JPS6028366B2 (en) 1980-08-12 1980-08-12 How to adjust resistance elements

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55110602A JPS6028366B2 (en) 1980-08-12 1980-08-12 How to adjust resistance elements

Publications (2)

Publication Number Publication Date
JPS5735305A JPS5735305A (en) 1982-02-25
JPS6028366B2 true JPS6028366B2 (en) 1985-07-04

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP55110602A Expired JPS6028366B2 (en) 1980-08-12 1980-08-12 How to adjust resistance elements

Country Status (1)

Country Link
JP (1) JPS6028366B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06287859A (en) * 1992-06-05 1994-10-11 Sando Iron Works Co Ltd Specific steaming apparatus for color development
CN106782951B (en) * 2017-01-23 2019-03-22 广东风华高新科技股份有限公司 The resistance trimming method of thin-film thermistor and the manufacturing method of diaphragm type thermistor

Also Published As

Publication number Publication date
JPS5735305A (en) 1982-02-25

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