JPH036578U - - Google Patents

Info

Publication number
JPH036578U
JPH036578U JP6755389U JP6755389U JPH036578U JP H036578 U JPH036578 U JP H036578U JP 6755389 U JP6755389 U JP 6755389U JP 6755389 U JP6755389 U JP 6755389U JP H036578 U JPH036578 U JP H036578U
Authority
JP
Japan
Prior art keywords
output
latch
delay line
receives
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6755389U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0729506Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6755389U priority Critical patent/JPH0729506Y2/ja
Publication of JPH036578U publication Critical patent/JPH036578U/ja
Application granted granted Critical
Publication of JPH0729506Y2 publication Critical patent/JPH0729506Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
JP6755389U 1989-06-09 1989-06-09 シフト方式のパターン発生部をもつｉｃテスタ Expired - Lifetime JPH0729506Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6755389U JPH0729506Y2 (ja) 1989-06-09 1989-06-09 シフト方式のパターン発生部をもつｉｃテスタ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6755389U JPH0729506Y2 (ja) 1989-06-09 1989-06-09 シフト方式のパターン発生部をもつｉｃテスタ

Publications (2)

Publication Number Publication Date
JPH036578U true JPH036578U (en:Method) 1991-01-22
JPH0729506Y2 JPH0729506Y2 (ja) 1995-07-05

Family

ID=31601223

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6755389U Expired - Lifetime JPH0729506Y2 (ja) 1989-06-09 1989-06-09 シフト方式のパターン発生部をもつｉｃテスタ

Country Status (1)

Country Link
JP (1) JPH0729506Y2 (en:Method)

Also Published As

Publication number Publication date
JPH0729506Y2 (ja) 1995-07-05

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term