JPH0357940U - - Google Patents
Info
- Publication number
- JPH0357940U JPH0357940U JP11827389U JP11827389U JPH0357940U JP H0357940 U JPH0357940 U JP H0357940U JP 11827389 U JP11827389 U JP 11827389U JP 11827389 U JP11827389 U JP 11827389U JP H0357940 U JPH0357940 U JP H0357940U
- Authority
- JP
- Japan
- Prior art keywords
- cooling tower
- coke dry
- suction zone
- pillars
- extinguishing system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001816 cooling Methods 0.000 claims description 7
- 239000000571 coke Substances 0.000 claims description 6
- 239000000498 cooling water Substances 0.000 claims description 3
- 229910001208 Crucible steel Inorganic materials 0.000 claims description 2
- 239000011449 brick Substances 0.000 claims description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11827389U JPH0650984Y2 (ja) | 1989-10-06 | 1989-10-06 | Icのテストヘッドとハンドラの結合機構 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11827389U JPH0650984Y2 (ja) | 1989-10-06 | 1989-10-06 | Icのテストヘッドとハンドラの結合機構 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0357940U true JPH0357940U (enrdf_load_stackoverflow) | 1991-06-05 |
JPH0650984Y2 JPH0650984Y2 (ja) | 1994-12-21 |
Family
ID=31666450
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11827389U Expired - Lifetime JPH0650984Y2 (ja) | 1989-10-06 | 1989-10-06 | Icのテストヘッドとハンドラの結合機構 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0650984Y2 (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007192578A (ja) * | 2006-01-17 | 2007-08-02 | Nec Electronics Corp | 半導体検査装置 |
WO2010007652A1 (ja) * | 2008-07-14 | 2010-01-21 | 株式会社アドバンテスト | テストヘッド移動装置及び電子部品試験装置 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0715241A (ja) * | 1993-06-23 | 1995-01-17 | Nec Corp | 振幅変調器 |
JP5858312B1 (ja) * | 2014-07-25 | 2016-02-10 | 株式会社東京精密 | プロービング装置及びプローブコンタクト方法 |
-
1989
- 1989-10-06 JP JP11827389U patent/JPH0650984Y2/ja not_active Expired - Lifetime
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007192578A (ja) * | 2006-01-17 | 2007-08-02 | Nec Electronics Corp | 半導体検査装置 |
WO2010007652A1 (ja) * | 2008-07-14 | 2010-01-21 | 株式会社アドバンテスト | テストヘッド移動装置及び電子部品試験装置 |
TWI393891B (zh) * | 2008-07-14 | 2013-04-21 | Advantest Corp | Test head moving device and electronic component testing device |
JP5226072B2 (ja) * | 2008-07-14 | 2013-07-03 | 株式会社アドバンテスト | テストヘッド移動装置及び電子部品試験装置 |
Also Published As
Publication number | Publication date |
---|---|
JPH0650984Y2 (ja) | 1994-12-21 |