JPH0350417B2 - - Google Patents
Info
- Publication number
- JPH0350417B2 JPH0350417B2 JP60121684A JP12168485A JPH0350417B2 JP H0350417 B2 JPH0350417 B2 JP H0350417B2 JP 60121684 A JP60121684 A JP 60121684A JP 12168485 A JP12168485 A JP 12168485A JP H0350417 B2 JPH0350417 B2 JP H0350417B2
- Authority
- JP
- Japan
- Prior art keywords
- leg
- legs
- alignment direction
- detecting
- detection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000001514 detection method Methods 0.000 claims description 39
- 238000005452 bending Methods 0.000 claims description 20
- 230000007547 defect Effects 0.000 claims description 18
- 230000005856 abnormality Effects 0.000 claims description 5
- 238000011144 upstream manufacturing Methods 0.000 claims description 3
- 230000005484 gravity Effects 0.000 claims description 2
- 230000008030 elimination Effects 0.000 claims 1
- 238000003379 elimination reaction Methods 0.000 claims 1
- 230000001678 irradiating effect Effects 0.000 claims 1
- 230000002950 deficient Effects 0.000 description 13
- 239000000047 product Substances 0.000 description 12
- 238000010586 diagram Methods 0.000 description 9
- 238000006073 displacement reaction Methods 0.000 description 5
- 238000000605 extraction Methods 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 230000002441 reversible effect Effects 0.000 description 3
- 239000012467 final product Substances 0.000 description 2
- 238000003780 insertion Methods 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60121684A JPS61279146A (ja) | 1985-06-05 | 1985-06-05 | 電子部品の脚片の不良検出装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60121684A JPS61279146A (ja) | 1985-06-05 | 1985-06-05 | 電子部品の脚片の不良検出装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61279146A JPS61279146A (ja) | 1986-12-09 |
| JPH0350417B2 true JPH0350417B2 (de) | 1991-08-01 |
Family
ID=14817312
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60121684A Granted JPS61279146A (ja) | 1985-06-05 | 1985-06-05 | 電子部品の脚片の不良検出装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61279146A (de) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57122557A (en) * | 1981-01-23 | 1982-07-30 | Nec Kyushu Ltd | Inspecting device for lead bent of semiconductor device |
| JPS5870110A (ja) * | 1981-08-03 | 1983-04-26 | マイクロコンポ−ネント テクノロジ− インコ−ポレ−テツド | リ−ド整列状態検査装置 |
-
1985
- 1985-06-05 JP JP60121684A patent/JPS61279146A/ja active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57122557A (en) * | 1981-01-23 | 1982-07-30 | Nec Kyushu Ltd | Inspecting device for lead bent of semiconductor device |
| JPS5870110A (ja) * | 1981-08-03 | 1983-04-26 | マイクロコンポ−ネント テクノロジ− インコ−ポレ−テツド | リ−ド整列状態検査装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61279146A (ja) | 1986-12-09 |
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