JPS57122557A - Inspecting device for lead bent of semiconductor device - Google Patents
Inspecting device for lead bent of semiconductor deviceInfo
- Publication number
- JPS57122557A JPS57122557A JP863481A JP863481A JPS57122557A JP S57122557 A JPS57122557 A JP S57122557A JP 863481 A JP863481 A JP 863481A JP 863481 A JP863481 A JP 863481A JP S57122557 A JPS57122557 A JP S57122557A
- Authority
- JP
- Japan
- Prior art keywords
- lead
- inspecting
- light
- semiconductor device
- bent
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Lead Frames For Integrated Circuits (AREA)
Abstract
PURPOSE:To reduce the size of an inspecting device, to simplify the device and to shorten the inspecting time of the device by moving a semiconductor device via a feeding mechanism, projecting a light to the end of a lead, photodetecting the light by a sensor, and judging the counted value of a counter. CONSTITUTION:A semiconductor device 1 is set on rails 8, is moved via a feeding mechanism, and the light from a light source 3 is projected via a reflecting mirror 4 to the end of the lead 2 of the device 1. The projected light is interrupted at every passage of the lead 2 (not bent) at the normal position, is received by a sensor 5, and is counted in number by a counter 6. This counted value is judged by a discriminator 7, thereby inspecting the presence or absence of the bent of the lead. In this manner, the bents of the lead can be inspected by a conveyor line with a small-size and simple device, thereby shortening the inspecting time.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP863481A JPS57122557A (en) | 1981-01-23 | 1981-01-23 | Inspecting device for lead bent of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP863481A JPS57122557A (en) | 1981-01-23 | 1981-01-23 | Inspecting device for lead bent of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57122557A true JPS57122557A (en) | 1982-07-30 |
Family
ID=11698373
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP863481A Pending JPS57122557A (en) | 1981-01-23 | 1981-01-23 | Inspecting device for lead bent of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57122557A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59111001A (en) * | 1982-12-16 | 1984-06-27 | Matsushita Electric Ind Co Ltd | Bending discriminator for lead of parts |
JPS61279146A (en) * | 1985-06-05 | 1986-12-09 | Nhk Spring Co Ltd | Defect detecting apparatus for pin piece of electronic part |
JPS61279144A (en) * | 1985-06-05 | 1986-12-09 | Nhk Spring Co Ltd | Defect detecting apparatus for pin piece of electronic part |
JPS61279143A (en) * | 1985-06-05 | 1986-12-09 | Nhk Spring Co Ltd | Defect detecting apparatus for pin piece of electronic part |
JPS62145755A (en) * | 1985-12-19 | 1987-06-29 | Toshiba Corp | Lead bend inspecting unit for semiconductor device |
JP2011043263A (en) * | 2009-08-19 | 2011-03-03 | Mitsubishi Electric Corp | Refrigerator |
-
1981
- 1981-01-23 JP JP863481A patent/JPS57122557A/en active Pending
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59111001A (en) * | 1982-12-16 | 1984-06-27 | Matsushita Electric Ind Co Ltd | Bending discriminator for lead of parts |
JPS61279146A (en) * | 1985-06-05 | 1986-12-09 | Nhk Spring Co Ltd | Defect detecting apparatus for pin piece of electronic part |
JPS61279144A (en) * | 1985-06-05 | 1986-12-09 | Nhk Spring Co Ltd | Defect detecting apparatus for pin piece of electronic part |
JPS61279143A (en) * | 1985-06-05 | 1986-12-09 | Nhk Spring Co Ltd | Defect detecting apparatus for pin piece of electronic part |
JPH0350417B2 (en) * | 1985-06-05 | 1991-08-01 | Nhk Spring Co Ltd | |
JPS62145755A (en) * | 1985-12-19 | 1987-06-29 | Toshiba Corp | Lead bend inspecting unit for semiconductor device |
JP2011043263A (en) * | 2009-08-19 | 2011-03-03 | Mitsubishi Electric Corp | Refrigerator |
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