JPH0350417B2 - - Google Patents
Info
- Publication number
- JPH0350417B2 JPH0350417B2 JP60121684A JP12168485A JPH0350417B2 JP H0350417 B2 JPH0350417 B2 JP H0350417B2 JP 60121684 A JP60121684 A JP 60121684A JP 12168485 A JP12168485 A JP 12168485A JP H0350417 B2 JPH0350417 B2 JP H0350417B2
- Authority
- JP
- Japan
- Prior art keywords
- leg
- legs
- alignment direction
- detecting
- detection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60121684A JPS61279146A (ja) | 1985-06-05 | 1985-06-05 | 電子部品の脚片の不良検出装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60121684A JPS61279146A (ja) | 1985-06-05 | 1985-06-05 | 電子部品の脚片の不良検出装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61279146A JPS61279146A (ja) | 1986-12-09 |
| JPH0350417B2 true JPH0350417B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1991-08-01 |
Family
ID=14817312
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60121684A Granted JPS61279146A (ja) | 1985-06-05 | 1985-06-05 | 電子部品の脚片の不良検出装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61279146A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57122557A (en) * | 1981-01-23 | 1982-07-30 | Nec Kyushu Ltd | Inspecting device for lead bent of semiconductor device |
| JPS5870110A (ja) * | 1981-08-03 | 1983-04-26 | マイクロコンポ−ネント テクノロジ− インコ−ポレ−テツド | リ−ド整列状態検査装置 |
-
1985
- 1985-06-05 JP JP60121684A patent/JPS61279146A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61279146A (ja) | 1986-12-09 |
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