JPH035019B2 - - Google Patents

Info

Publication number
JPH035019B2
JPH035019B2 JP59099378A JP9937884A JPH035019B2 JP H035019 B2 JPH035019 B2 JP H035019B2 JP 59099378 A JP59099378 A JP 59099378A JP 9937884 A JP9937884 A JP 9937884A JP H035019 B2 JPH035019 B2 JP H035019B2
Authority
JP
Japan
Prior art keywords
scanning
electron beam
objective lens
supplied
dynamic focus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59099378A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60243951A (ja
Inventor
Seiichi Nakagawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Denshi KK filed Critical Nihon Denshi KK
Priority to JP59099378A priority Critical patent/JPS60243951A/ja
Publication of JPS60243951A publication Critical patent/JPS60243951A/ja
Publication of JPH035019B2 publication Critical patent/JPH035019B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Sources, Ion Sources (AREA)
JP59099378A 1984-05-17 1984-05-17 電子線装置における軸合せ方法 Granted JPS60243951A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59099378A JPS60243951A (ja) 1984-05-17 1984-05-17 電子線装置における軸合せ方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59099378A JPS60243951A (ja) 1984-05-17 1984-05-17 電子線装置における軸合せ方法

Publications (2)

Publication Number Publication Date
JPS60243951A JPS60243951A (ja) 1985-12-03
JPH035019B2 true JPH035019B2 (pm) 1991-01-24

Family

ID=14245860

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59099378A Granted JPS60243951A (ja) 1984-05-17 1984-05-17 電子線装置における軸合せ方法

Country Status (1)

Country Link
JP (1) JPS60243951A (pm)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS531180B2 (pm) * 1974-10-14 1978-01-17

Also Published As

Publication number Publication date
JPS60243951A (ja) 1985-12-03

Similar Documents

Publication Publication Date Title
US4983832A (en) Scanning electron microscope
US4608491A (en) Electron beam instrument
JP3101114B2 (ja) 走査電子顕微鏡
JPH0122705B2 (pm)
JP3970656B2 (ja) 透過電子顕微鏡による試料観察方法
JPS6134221B2 (pm)
JPS614144A (ja) 電子顕微鏡による回折パタ−ン表示方法
JPH035019B2 (pm)
JP2964873B2 (ja) 電子線光軸合わせ装置
JPH07302564A (ja) 走査電子顕微鏡
JPH035020B2 (pm)
JPH035022B2 (pm)
US4820921A (en) Method of beam centering
JP2020166939A (ja) 透過電子顕微鏡の制御方法および透過電子顕微鏡
JP2726538B2 (ja) 電子顕微鏡
US4221992A (en) Scanning area rotation device for an image pickup tube
JPH027506B2 (pm)
JPS6134222B2 (pm)
JP7027538B2 (ja) 電子線装置
JPH0542102B2 (pm)
JPS5914222B2 (ja) 走査電子顕微鏡等用倍率制御装置
JPS6332220B2 (pm)
JPS5847825B2 (ja) 電子顕微鏡
JPH06230315A (ja) ビーム発生ユニットの調整方法
JPH07120414A (ja) 電子線回折装置