JPH0344242B2 - - Google Patents
Info
- Publication number
- JPH0344242B2 JPH0344242B2 JP58090194A JP9019483A JPH0344242B2 JP H0344242 B2 JPH0344242 B2 JP H0344242B2 JP 58090194 A JP58090194 A JP 58090194A JP 9019483 A JP9019483 A JP 9019483A JP H0344242 B2 JPH0344242 B2 JP H0344242B2
- Authority
- JP
- Japan
- Prior art keywords
- objective lens
- light source
- image
- lens
- alignment mark
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
- 
        - G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
 
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Microscoopes, Condenser (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title | 
|---|---|---|---|
| JP58090194A JPS58213207A (ja) | 1983-05-23 | 1983-05-23 | アライメントマーク検出方法 | 
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title | 
|---|---|---|---|
| JP58090194A JPS58213207A (ja) | 1983-05-23 | 1983-05-23 | アライメントマーク検出方法 | 
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date | 
|---|---|---|---|
| JP50042083A Division JPS593791B2 (ja) | 1975-04-07 | 1975-04-07 | 物体の像認識方法 | 
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date | 
|---|---|---|---|
| JP62035334A Division JPS62201302A (ja) | 1987-02-18 | 1987-02-18 | アライメントマ−ク検出方法 | 
Publications (2)
| Publication Number | Publication Date | 
|---|---|
| JPS58213207A JPS58213207A (ja) | 1983-12-12 | 
| JPH0344242B2 true JPH0344242B2 (en:Method) | 1991-07-05 | 
Family
ID=13991669
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date | 
|---|---|---|---|
| JP58090194A Granted JPS58213207A (ja) | 1983-05-23 | 1983-05-23 | アライメントマーク検出方法 | 
Country Status (1)
| Country | Link | 
|---|---|
| JP (1) | JPS58213207A (en:Method) | 
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title | 
|---|---|---|---|---|
| JPS60235002A (ja) * | 1984-05-08 | 1985-11-21 | Ya Man Ltd | 非接触光学式変位測定装置用ビユワ− | 
| JPS60179806U (ja) * | 1984-05-08 | 1985-11-29 | ヤ−マン株式会社 | 非接触光学式変位測定装置用ビユワ− | 
| JP3385442B2 (ja) * | 1994-05-31 | 2003-03-10 | 株式会社ニュークリエイション | 検査用光学系および検査装置 | 
| JP3404134B2 (ja) * | 1994-06-21 | 2003-05-06 | 株式会社ニュークリエイション | 検査装置 | 
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title | 
|---|---|---|---|---|
| JPS593791B2 (ja) * | 1975-04-07 | 1984-01-26 | キヤノン株式会社 | 物体の像認識方法 | 
- 
        1983
        - 1983-05-23 JP JP58090194A patent/JPS58213207A/ja active Granted
 
Also Published As
| Publication number | Publication date | 
|---|---|
| JPS58213207A (ja) | 1983-12-12 | 
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