JPH0343586B2 - - Google Patents

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Publication number
JPH0343586B2
JPH0343586B2 JP61023250A JP2325086A JPH0343586B2 JP H0343586 B2 JPH0343586 B2 JP H0343586B2 JP 61023250 A JP61023250 A JP 61023250A JP 2325086 A JP2325086 A JP 2325086A JP H0343586 B2 JPH0343586 B2 JP H0343586B2
Authority
JP
Japan
Prior art keywords
frequency
wave number
circuit
variable
transmission
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP61023250A
Other languages
Japanese (ja)
Other versions
JPS62180267A (en
Inventor
Kazuhiro Hajiki
Kenichi Ooriki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP61023250A priority Critical patent/JPS62180267A/en
Publication of JPS62180267A publication Critical patent/JPS62180267A/en
Publication of JPH0343586B2 publication Critical patent/JPH0343586B2/ja
Granted legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は超音波を用いて材料の内部を非破壊
にて検査する装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an apparatus for non-destructively inspecting the inside of a material using ultrasonic waves.

〔従来の技術〕[Conventional technology]

金属等の固体物中に存在する欠陥を見つける手
段として超音波を材料中に入射させて欠陥からの
反射波(以下エコーという)をとらえCRT等の
表示器へ表示することにより欠陥の大きさや材料
中の欠陥の位置を測定する為の装置として超音波
探傷装置がある。
As a means of finding defects in solid objects such as metals, ultrasonic waves are injected into the material, and the reflected waves from the defects (hereinafter referred to as echoes) are captured and displayed on a display such as a CRT to determine the size of the defect and the material. There is an ultrasonic flaw detector as a device for measuring the position of defects inside.

従来、この種の装置として第4図に示すような
超音波探傷装置が提案されている。図において1
は各回路に必要な同期信号を出力する同期部、2
は同期部1からの出力信号をもとに送信信号を発
生する送信部、3は送信部2からの送信信号をも
とに超音波を発生し被検材に超音波を入射させる
とともに被検材からのエコーをとらえて電気信号
に変換する探触子、4は探触子3からの電気信号
を増幅する受信部、5は受信部4の出力信号を表
示する表示器である。
Conventionally, an ultrasonic flaw detection device as shown in FIG. 4 has been proposed as this type of device. In the figure 1
2 is a synchronization section that outputs synchronization signals necessary for each circuit;
3 is a transmitter that generates a transmission signal based on the output signal from the synchronizer 1, and 3 is a transmitter that generates an ultrasonic wave based on the transmitter signal from the transmitter 2 and makes the ultrasonic wave enter the material to be inspected. A probe captures an echo from the material and converts it into an electrical signal; 4 is a receiver that amplifies the electrical signal from the probe 3; and 5 is a display that displays the output signal of the receiver 4.

従来の超音波探傷装置は上記のように構成され
ているので、固定された送信の周波数と送信波数
で探触子3に送信信号を送信部2より印加し、探
傷するようにしていた。
Since the conventional ultrasonic flaw detection apparatus is configured as described above, flaw detection is performed by applying a transmission signal from the transmitter 2 to the probe 3 at a fixed transmission frequency and transmission wave number.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

従来の超音波探傷装置は上記のように固定され
た送信の周波数と波数でのみ送信している為、探
触子の保有している周波数特性上の限定した任意
の一点のみ使用しており、被検材に最適な送信周
波数及び送信波数を送信する事が出来ず、探触子
に表示されている公称周波数のみを情報として探
触子を交換する等を実施し、被検材に最適な周波
数に近い公称周波数の探触子を選択していた。し
かし送信波数については選択出来る手段はなくあ
る任意の数波を発生する超音波探傷装置本体を変
換しているが、いずれも探触子の種類や装置の種
類に限界があり実際はオーステナイト系の被検材
や、粒子の粗い材料等探傷の場合に発生する粒子
からの反射波(これを淋状エコーと呼ぶが、表示
器上のS/Nを悪くしている)がS/Nを悪くし
ている。
Conventional ultrasonic flaw detection equipment only transmits at a fixed transmission frequency and wave number as mentioned above, so it uses only one arbitrary point that is limited to the frequency characteristics of the probe. It was not possible to transmit the optimum transmission frequency and transmission wave number for the material to be tested, so it was necessary to replace the probe using only the nominal frequency displayed on the probe as information. A probe with a nominal frequency close to the frequency was selected. However, there is no way to select the number of transmitted waves, and the main body of the ultrasonic flaw detection device that generates an arbitrary number of waves is converted, but there are limits to the types of probes and devices, and in reality, the number of waves is austenitic. Reflected waves from particles that occur during inspection of materials or flaw detection of materials with coarse particles (this is called a gory echo, which worsens the S/N on the display) degrades the S/N. ing.

この発明はこのような問題点を解消する為にな
されたもので、周波数可変手段と波数可変手段を
設け被検材に最適な周波数を調べるとともに最適
周波数にて送信し、かつ波数を選択し最適なS/
Nで探傷出来る超音波探傷装置を得ることを目的
とするものである。
This invention was made to solve these problems, and includes a frequency variable means and a wave number variable means to find the optimum frequency for the material to be inspected, transmit at the optimum frequency, and select the wave number to obtain the optimum frequency. NaS/
The purpose of this invention is to obtain an ultrasonic flaw detection device that can detect flaws using N.

〔問題点を解決するための手段〕[Means for solving problems]

この発明にかかる超音波探傷装置は送信周波数
を可変する周波数可変回路及び周波数設定手段と
送信波数を可変する波数可変回路及び波数設定手
段とを設けたものである。
The ultrasonic flaw detection apparatus according to the present invention is provided with a frequency variable circuit and frequency setting means for varying the transmission frequency, and a wave number variable circuit and wave number setting means for varying the number of transmitted waves.

〔作用〕[Effect]

この発明においては送信周波数と送信波数を可
変し、被検材に最適な送信を行うことにより淋状
エコー等が発生し、探傷のS/Nを悪くしている
要因を低減し、探傷を容易に行える。
In this invention, by varying the transmission frequency and the number of transmission waves and performing transmission optimally for the material to be inspected, it is possible to reduce the factors that cause blemish-like echoes, which worsen the S/N of flaw detection, and facilitate flaw detection. can be done.

〔実施例〕〔Example〕

第1図はこの発明による超音波探傷装置の一実
施例を示す図である。第1図において1〜5は第
4図に示したものと同様である。6は同期回路1
の出力信号に同期して送信部2へのパルス幅を可
変する周波数可変回路、7は周波数可変回路6へ
の制御信号を出力する周波数設定手段、8は周波
数可変回路6の出力信号の波数を可変する波数可
変回路、9は波数可変回路8への制御信号を出力
する波数設定手段である。
FIG. 1 is a diagram showing an embodiment of an ultrasonic flaw detection apparatus according to the present invention. In FIG. 1, 1 to 5 are the same as those shown in FIG. 6 is synchronous circuit 1
7 is a frequency setting means for outputting a control signal to the frequency variable circuit 6, and 8 is a frequency variable circuit for varying the pulse width to the transmitter 2 in synchronization with the output signal of the frequency variable circuit 6. A variable wave number circuit 9 is a wave number setting means for outputting a control signal to the variable wave number circuit 8.

次に上記実施例の動作を第1図〜第3図を参照
しながら説明する。同期回路1の出力信号をもと
に波数可変回路8は波数設定手段9で設定した設
定値に対応して周波数可変回路6の動作時間制御
信号CLTo(第3図に示すCLTo)を出力する。周
波数可変回路6は波数可変回路8の出力信号
CLToにて制御される時間内に周波数設定手段7
で設定した設定値に対応したパルス(第3図に示
すCLTWno)を送信部2へ出力する。送信部2
は周波数可変回路6の出力信号CLTWno)に対
応した送信信号を探触子3へ出力する。この実施
例では第2図に示すように上記の動作をCLTWn
(m=1、2、3、……)の“m”をある時間帯
{波数可変回路8の出力信号CLToで制御される
波数(n=1、2、3、……)の“n”が最大と
なる迄の時間(第2図に示すnt)}固定しておき
波数可変回路8の出力信号CLToで制御される波
数“n”を順次増加し、周波数可変回路6の出力
信号CLTWnoを得る。また、波数可変回路8の
出力信号CLToで制御される波数“n”を波数設
定手段9で設定し終つたならば波数設定手段9は
n=1を設定する。同時に周波数設定手段7は周
波数可変回路6の出力信号CLTWnoのm=2を
設定し、第3図に示すCLTw21を周波数可変回
路6が出力する。
Next, the operation of the above embodiment will be explained with reference to FIGS. 1 to 3. Based on the output signal of the synchronous circuit 1, the variable wave number circuit 8 outputs an operating time control signal CLT o (CLT o shown in FIG. 3) of the variable frequency circuit 6 in accordance with the set value set by the wave number setting means 9. do. The frequency variable circuit 6 is the output signal of the wave number variable circuit 8.
Frequency setting means 7 within the time controlled by CLT o
A pulse (CLTW no shown in FIG. 3) corresponding to the setting value set in is output to the transmitter 2. Transmitter 2
outputs a transmission signal corresponding to the output signal CLTW no ) of the variable frequency circuit 6 to the probe 3. In this embodiment, the above operation is performed as CLTW n as shown in FIG.
(m=1, 2, 3, . . .) in a certain time period {“n” in the wave number (n= 1, 2, 3, . ” is the maximum (nt shown in Figure 2)} is fixed and the wave number “n” controlled by the output signal CLT o of the variable wave number circuit 8 is increased sequentially, and the output signal of the variable frequency circuit 6 is Get CLTW no . Further, when the wave number setting means 9 has finished setting the wave number "n" controlled by the output signal CLTo of the wave number variable circuit 8, the wave number setting means 9 sets n=1. At the same time, the frequency setting means 7 sets the output signal CLTW no of the frequency variable circuit 6 to m=2, and the frequency variable circuit 6 outputs CLT w 21 shown in FIG.

以上の動作を繰り返す事により、探触子3から
被検材へ入射される超音波は周波数と波数を可変
され、被検材を伝播する。伝播された超音波は再
び探触子3で電気信号に変換され受信部4を介し
表示器5で表示するよう構成されているので表示
器5上のエコーを監視することにより上記周波数
可変回路6の出力信号CLTwの被検材に対する最
適条件(波数設定手段9で設定した値“n”と周
波数設定手段7で設定した値“m”)が明確にな
るとともに被検材への最適条件が選択出来る。次
に波数可変回路8へ周波数可変回路6の動作を第
3図に示す実施例を参照しながら説明する。第3
図aにおいて、波数可変回路8はモノマルチバイ
ブレータ(以下M/Mという。)10、抵抗Ra1
〜Rao(Ra1<Ra2<……<Rao)、抵抗Ra1〜Rao
切換えるセレクタA13およびコンデンサCa
ら構成される。また周波数可変回路6は抵抗RB1
〜RBo(RB1<RB2<……<RBo)、抵抗RB1〜RBo
切換るセレクタB14、抵抗Rc1〜Rco(Rc1<Rc2
<……<Rco)、抵抗Rc1〜Rcoを切換えるセレクタ
C15、コンデンサCB,CcおよびM/MB、C1
1,12から構成されている。
By repeating the above operations, the frequency and wave number of the ultrasonic waves incident on the test material from the probe 3 are varied, and the ultrasound waves propagate through the test material. The propagated ultrasonic wave is again converted into an electric signal by the probe 3 and is displayed on the display 5 via the receiver 4. By monitoring the echo on the display 5, the frequency variable circuit 6 The optimum conditions for the output signal CLT w of the test material (the value "n" set by the wave number setting means 9 and the value "m" set by the frequency setting means 7) are clarified, and the optimum conditions for the test material are determined. You can choose. Next, the operation of the variable wave number circuit 8 and the variable frequency circuit 6 will be explained with reference to the embodiment shown in FIG. Third
In Figure a, the variable wave number circuit 8 includes a mono multivibrator (hereinafter referred to as M/M) 10 and a resistor R a1.
~R ao (R a1 <R a2 <...<R ao ), a selector A13 for switching the resistors R a1 to R ao , and a capacitor C a . Also, the frequency variable circuit 6 is a resistor R B1
~R Bo (R B1 < R B2 <... < R Bo ), selector B14 that switches resistance R B1 ~ R Bo , resistor R c1 ~ R co (R c1 < R c2
<...<R co ), selector C15 that switches resistors R c1 to R co , capacitors C B , C c and M/MB, C1
It consists of 1 and 12.

M/MA10は波数設定手段9で設定された制
御信号に基づきセレクタA13により選択される
Ra1〜Raoの所定抵抗とコンデンサCaにより第3
図bに示すtaの時間幅を有する出力信号CLTo
出力する。M/MC12はM/MA10の出力信
号CLToに同期し、周波数設定手段7で設定され
た制御信号に基づきセレクタC15により選択さ
れるRc1〜Rcoの所定の抵抗とコンデンサCcにより
第3図bに示すtwの時間幅を有する出力信号
CLTWnoを出力する。M/MB11はM/MC1
2の一方の出力信号CLTWnoに同期し周波数設
定手段7で設定された制御信号に基づきセレクタ
B14により選択されるRB1〜RBoの所定の抵抗
とコンデンサCBにより第3図Dに示すtwの時間幅
を有する出力信号CLDwを上記M/MC11の一
方の入力端子へ出力する。
M/MA 10 is selected by selector A 13 based on the control signal set by wave number setting means 9.
The third _
An output signal CLT o having a time width t a shown in FIG. b is output. The M/MC 12 is synchronized with the output signal CLT o of the M/MA 10, and is connected to a third circuit by predetermined resistors R c1 to R co selected by the selector C 15 based on the control signal set by the frequency setting means 7 and a capacitor C c . Output signal with time width tw shown in figure b
Output CLTW no . M/MB11 is M/MC1
t shown in FIG. 3D is selected by the selector B14 based on the control signal set by the frequency setting means 7 in synchronization with one output signal CLTW no of 2. An output signal CLD w having a time width of w is output to one input terminal of the M/MC 11 .

以上のように波数可変回路8、周波数可変回路
6は構成されているので送信周波数と送信波数を
可変し得る信号を送信部2へ出力出来る。
Since the variable wave number circuit 8 and the variable frequency circuit 6 are configured as described above, it is possible to output to the transmitter 2 a signal whose transmission frequency and number of transmission waves can be varied.

送信部2は上記周波数可変回路6の出力信号
CLTWno(第2図に示すCLTW1.1、CLTW1.2、
……CLTWno)に基づき送信信号を発生する。
探触子3は上記送信部2の送信信号に基づき送信
波数n及び送信周波数mを可変し被検材へ超音波
を入射する為、表示器5上に表示されるエコーを
上記波数設定手段9及び周波数設定手段7で設定
される設定値毎に監視することにより被検材に対
し最もS/Nの良い波数設定手段9及び周波数設
定手段7の設定値を知る事が出来るとともに設定
する事も出来る。
The transmitter 2 receives the output signal of the frequency variable circuit 6.
CLTW no (CLTW1.1, CLTW1.2, shown in Figure 2)
...Generates a transmission signal based on CLTW no ).
The probe 3 varies the transmission wave number n and the transmission frequency m based on the transmission signal from the transmitter 2 and injects the ultrasonic wave into the specimen, so the echo displayed on the display 5 is adjusted to the wave number setting means 9. By monitoring each set value set by the frequency setting means 7, it is possible to know and set the set values of the wave number setting means 9 and the frequency setting means 7 that have the best S/N for the material to be inspected. I can do it.

〔発明の効果〕〔Effect of the invention〕

以上のようにこの発明によれば探触子や超音波
探傷装置本体を選択することなく被検材に最適な
送信周波数と送信波数を設定出来る。これにより
被検材に対して最もS/Nの良い周波数及び波数
により探傷出来る他、探触子近傍(近距離音場)
における位相 渉をも知る事が出来るとともに周
波数を可変させることによりさける事も可能にな
る等の特徴を有する。
As described above, according to the present invention, it is possible to set the optimum transmission frequency and transmission wave number for the material to be inspected without selecting the probe or the main body of the ultrasonic flaw detection apparatus. This enables flaw detection at the frequency and wave number with the best S/N for the material to be tested, as well as near the probe (near-field sound field).
It has the characteristics that it is possible to know the phase interference at , and it is also possible to avoid it by varying the frequency.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明による超音波探傷装置のブロ
ツク図、第2図はこの発明の動作タイミング図、
第3図はこの発明による波数可変回路から周波数
可変回路の説明図、第4図は従来の超音波探傷器
のブロツク図である。 図において1は同期部、2は送信部、3は探触
子、4は受信部、5は表示器、6は周波数可変回
路、7は周波数設定手段、8は波数可変回路、9
は波数設定手段、10〜12はモノマルチバイブ
レータ、13〜15はセレクターである。なお図
中同一符号は同一又は相当部分を示す。
FIG. 1 is a block diagram of an ultrasonic flaw detection device according to the present invention, and FIG. 2 is an operation timing diagram of the present invention.
FIG. 3 is an explanatory diagram of a variable wave number circuit to a variable frequency circuit according to the present invention, and FIG. 4 is a block diagram of a conventional ultrasonic flaw detector. In the figure, 1 is a synchronizing section, 2 is a transmitting section, 3 is a probe, 4 is a receiving section, 5 is a display, 6 is a variable frequency circuit, 7 is a frequency setting means, 8 is a variable wave number circuit, 9
10 is a wave number setting means, 10 to 12 are mono multivibrators, and 13 to 15 are selectors. Note that the same reference numerals in the figures indicate the same or equivalent parts.

Claims (1)

【特許請求の範囲】[Claims] 1 所定の繰り返し周波数を発生する同期部と、
この同期部からの出力信号にもとずき送信信号を
発生する送信部と、上記同期部の出力信号に同期
して上記送信部の送信波数を可変する波数可変回
路と、上記波数可変回路へ波数を設定する波数設
定手段と、上記波数可変回路の出力信号にもとづ
き上記送信部の送信周波数を可変する周波数可変
回路と、上記周波数可変回路へ周波数を設定する
周波数設定手段と、上記送信部から生ずる送信信
号を超音波信号に変換して被検材に超音波を入射
させるとともに上記被検材からの反射波を電気信
号に変換する探触子と、上記探触子からの電気信
号を増巾する受信部と、上記受信部の波形を表示
する表示器とを備えたことを特徴とする超音波探
傷装置。
1 a synchronization section that generates a predetermined repetition frequency;
a transmitting section that generates a transmission signal based on the output signal from the synchronizing section; a variable wave number circuit that varies the number of transmission waves of the transmitting section in synchronization with the output signal of the synchronizing section; A wave number setting means for setting a wave number, a frequency variable circuit for varying the transmission frequency of the transmitter based on an output signal of the variable wave number circuit, a frequency setting means for setting a frequency to the frequency variable circuit, A probe that converts the generated transmission signal into an ultrasonic signal and injects the ultrasonic wave into the test material and converts the reflected wave from the test material into an electrical signal, and a probe that increases the electrical signal from the probe. 1. An ultrasonic flaw detection device comprising: a wide receiver; and a display that displays a waveform of the receiver.
JP61023250A 1986-02-05 1986-02-05 Ultrasonic flaw detecting device Granted JPS62180267A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61023250A JPS62180267A (en) 1986-02-05 1986-02-05 Ultrasonic flaw detecting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61023250A JPS62180267A (en) 1986-02-05 1986-02-05 Ultrasonic flaw detecting device

Publications (2)

Publication Number Publication Date
JPS62180267A JPS62180267A (en) 1987-08-07
JPH0343586B2 true JPH0343586B2 (en) 1991-07-03

Family

ID=12105348

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61023250A Granted JPS62180267A (en) 1986-02-05 1986-02-05 Ultrasonic flaw detecting device

Country Status (1)

Country Link
JP (1) JPS62180267A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04348275A (en) * 1990-11-14 1992-12-03 Nkk Corp Ultrasonic flaw detection
JP3327129B2 (en) * 1996-07-22 2002-09-24 松下電器産業株式会社 Ultrasound diagnostic equipment

Also Published As

Publication number Publication date
JPS62180267A (en) 1987-08-07

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