JPH0342734A - Automatic debugging system for hardware - Google Patents
Automatic debugging system for hardwareInfo
- Publication number
- JPH0342734A JPH0342734A JP1178557A JP17855789A JPH0342734A JP H0342734 A JPH0342734 A JP H0342734A JP 1178557 A JP1178557 A JP 1178557A JP 17855789 A JP17855789 A JP 17855789A JP H0342734 A JPH0342734 A JP H0342734A
- Authority
- JP
- Japan
- Prior art keywords
- correct value
- data
- circuit
- answer
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 claims description 19
- 238000000034 method Methods 0.000 claims description 5
- 230000004044 response Effects 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000012795 verification Methods 0.000 description 2
- 230000004913 activation Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000011990 functional testing Methods 0.000 description 1
- 230000000276 sedentary effect Effects 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Landscapes
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
Description
【発明の詳細な説明】 〔座業上の利用分野〕 本発明はハードウェア自動デバッグ方式に関する。[Detailed description of the invention] [Field of use in sedentary work] The present invention relates to a hardware automatic debugging method.
従来、ハードウェアテバッグ方式は試験結果をリスト出
力し、試験項目に沿って順番に正解値をリストに照らし
合わせて確認していた。したがって試験項目が多くなれ
ばリストの童も多くなると共に、リスト出力に時間がか
かり、リストの費用も膨大になる。また同時に試験項目
に沿って解析を行うのも多大の工数がかかる欠点がある
。Traditionally, the hardware test method outputs test results in a list and checks the correct answer values against the list in order according to the test items. Therefore, as the number of test items increases, the number of children on the list increases, it takes time to output the list, and the cost of the list increases. At the same time, it also has the disadvantage of requiring a large amount of man-hours to perform analysis according to the test items.
本発明が解決しようとする問題点、換言すれば本発明の
目的は試験結果データ金正解値と自動照合するようにし
て上記の欠点を改善したハードウェア自動テバッグ力式
全提供すること((ある。The problem to be solved by the present invention, in other words, the purpose of the present invention is to provide a complete hardware automatic testing system that improves the above drawbacks by automatically comparing the test result data with the correct value. .
本発明のハードウェア自動デバッグ方式は、コンピュー
タ上にプロセッサ、メインメモリ、制御回路、入出力回
路によりブロック横取された回路及び被試験回路會ソフ
トモデル化し前記プロセッサによって前記被試嗅回路を
制御するハードウェア自動テバッグ万式LIc′J?い
て、前記プロセッサの制御プログラムを格納する制御プ
ログラム格納メモリの内容に従って前記被試験回路を前
記コンピュータ上にて動作させ、正解値読み出し信号に
て正解値格納メモリエリアよりメモリ内容に’fJt、
み出し、前記被試1験回路の実行結果を前記正解値と自
動的に照合するようにして実現される。The automatic hardware debugging method of the present invention creates a software model of the circuit whose block has been stolen by a processor, main memory, control circuit, and input/output circuit and the circuit under test on a computer, and controls the olfactory circuit under test by the processor. Hardware automatic Tebag Manshiki LIc'J? Then, the circuit under test is operated on the computer according to the contents of the control program storage memory that stores the control program of the processor, and the memory contents are read from the correct value storage memory area in response to the correct value read signal.
This is realized by automatically comparing the execution result of the first circuit under test with the correct value.
次に、本発明について四面を参照して説明する。 Next, the present invention will be explained with reference to four aspects.
第1図はソフト記述された内容を機能的に現した本発明
の一実施例を示すブロック図である。同図にかいて擬似
制御部@1は制御部2とタイミング制御部3と制御プロ
グラム格納メモリ部4とバスインターフェース部5と照
合回路7と會有し、メインメモリ装置10は記憶部11
と制御部15とバスインターフェース@16とを有して
いる。FIG. 1 is a block diagram showing an embodiment of the present invention functionally representing the contents described in software. In the figure, the pseudo control unit @1 has a control unit 2, a timing control unit 3, a control program storage memory unit 4, a bus interface unit 5, and a collation circuit 7, and a main memory device 10 has a storage unit 11.
It has a control unit 15 and a bus interface @16.
なに記憶部11!dライトテータエリア12とり−1デ
ータエリア13と正!Ili直データエリア14とを含
む。筐た被試験回路17はプロセッサバス9を介して擬
似制御装置1とメインメモリ装置10とに接続される。What is the storage part 11? d light data area 12 - 1 data area 13 and positive! Ili direct data area 14. The enclosed circuit under test 17 is connected to the pseudo control device 1 and the main memory device 10 via the processor bus 9.
起動信号6により制御部2が即動され、制?i11部2
からタイミング制御部3訃よび制御プログラム格納メモ
リ部4へ制御信号を出す事により制御プログシム格納メ
モリ部4に入っている制御データが出力される。この制
御データは制御情報、アドレス情報、データ情報の各パ
ートに分かれ、バスインターフェース部5よVプロセッ
バス9會通り被試、倹回路17に与えられる。被試験回
路17はこの制御データにより機能試験を実行する。ま
たこの制御データに含1れた正解値読み出し信号18に
よって正解値格納エリア14より正解値金読み出し、照
合回路7の中(c、 、1.るレジスター8に蓄える。The control unit 2 is immediately activated by the activation signal 6, and the control unit 2 is activated immediately. i11 part 2
By outputting a control signal from the timing controller 3 to the control program storage memory section 4, the control data stored in the control program storage memory section 4 is output. This control data is divided into each part of control information, address information, and data information, and is applied to the bus interface section 5, the V processor bus 9, the test circuit 17, and the saving circuit 17. The circuit under test 17 executes a functional test using this control data. In addition, the correct value is read out from the correct value storage area 14 by the correct value readout signal 18 included in this control data, and stored in the register 8 in the verification circuit 7 (c, , 1.).
ここで被試験回路17ばこの制御データを受けた事業擬
似制御装置1へ知らせる信号、すなθもアンサ−信号1
9を返送すると同時にアン返
サーデータを沙送するので、このアン−’j”−Gjl
t9をトリガに照合回g457の中にあるレジスター8
に蓄えた正解値データとアンサ−ブールk照合回路71
Cより照合し、正解ならば次の制御データを順次実行す
る。また、不一致ならばエラーを報告して終了する。Here, a signal to be sent to the business pseudo control device 1 that has received the control data of the circuit under test 17, ie, θ, is also an answer signal 1.
Since the answer data is sent at the same time as 9 is returned, this un-'j"-Gjl
Register 8 in g457 is checked using t9 as a trigger.
Correct value data stored in and answer Boolean k matching circuit 71
If the answer is correct, the next control data is sequentially executed. If there is a mismatch, an error is reported and the process ends.
以上説明したように本発明によればコンピュータ上に回
路および正解値格納エリアを設は擬似制御部より正解値
読み出し信号を出すことにより、正解値格納エリアより
正解データを読み出し、アンサ−データを自動的に照合
でき、人手によるチエツクを無くし、工数釦よびリスト
費用全軽減することができるという効果がある。As explained above, according to the present invention, a circuit and a correct value storage area are set up on a computer, and by outputting a correct value readout signal from the pseudo control section, correct answer data is read from the correct value storage area and answer data is automatically generated. This has the effect of eliminating the need for manual checking and reducing the total cost of man-hour buttons and lists.
第1図は本発明の一実施例を示すブロック図である。
1・・・・・・擬似制御装置、2・・・・・・制御部、
4・・・・・・制御プログラム格納メモリ部、5・・・
・・・バスインターフェース部、7・・・・・・照合回
路、9・・・・・・プロセッサ5−
バス、10・・・・・・メインメモリ装置、11・・・
・・記憶部、14・・・・・・正解値データエリア、1
7・・・・・・被試験回路、18・・・・・・正解値読
み出し信号、19・・・・・・アンサ−信号。FIG. 1 is a block diagram showing one embodiment of the present invention. 1...Pseudo control device, 2...Control unit,
4... Control program storage memory section, 5...
. . . Bus interface section, 7 . . . Verification circuit, 9 . . . Processor 5-bus, 10 .
...Storage unit, 14...Correct value data area, 1
7...Circuit under test, 18...Correct value read signal, 19...Answer signal.
Claims (1)
、入出力回路によりブロック構成された回路及び被試験
回路をソフトモデル化し前記プロセッサによって/前記
被試験回路を制御するハードウェアデバッグ方式におい
て、前記プロセッサの制御プログラムを格納する制御プ
ログラム格納メモリの内容に従って前記被試験回路を前
記コンピュータ上にて動作させ、正解値読み出し信号に
て正解値格納メモリエリアよりメモリ内容を読み出し、
前記被試験回路の実行結果を前記正解値と自動的に照合
することを特徴とするハードウェア自動デバッグ方式。In a hardware debugging method in which a circuit configured as a block consisting of a processor, a main memory, a control circuit, and an input/output circuit and a circuit under test are made into a software model on a computer and the processor controls/controls the circuit under test, a control program for the processor is provided. operating the circuit under test on the computer according to the contents of a control program storage memory storing the above, and reading the memory contents from the correct value storage memory area in response to a correct value read signal;
An automatic hardware debugging method characterized in that the execution result of the circuit under test is automatically compared with the correct value.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1178557A JPH0342734A (en) | 1989-07-10 | 1989-07-10 | Automatic debugging system for hardware |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1178557A JPH0342734A (en) | 1989-07-10 | 1989-07-10 | Automatic debugging system for hardware |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0342734A true JPH0342734A (en) | 1991-02-22 |
Family
ID=16050570
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1178557A Pending JPH0342734A (en) | 1989-07-10 | 1989-07-10 | Automatic debugging system for hardware |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0342734A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006335514A (en) * | 2005-06-01 | 2006-12-14 | Shibuya Kogyo Co Ltd | Container conveying device |
-
1989
- 1989-07-10 JP JP1178557A patent/JPH0342734A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006335514A (en) * | 2005-06-01 | 2006-12-14 | Shibuya Kogyo Co Ltd | Container conveying device |
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