JPH0342658B2 - - Google Patents

Info

Publication number
JPH0342658B2
JPH0342658B2 JP13685A JP13685A JPH0342658B2 JP H0342658 B2 JPH0342658 B2 JP H0342658B2 JP 13685 A JP13685 A JP 13685A JP 13685 A JP13685 A JP 13685A JP H0342658 B2 JPH0342658 B2 JP H0342658B2
Authority
JP
Japan
Prior art keywords
pattern
lmr
resist
monochlorobenzene
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP13685A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61159638A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13685A priority Critical patent/JPS61159638A/ja
Publication of JPS61159638A publication Critical patent/JPS61159638A/ja
Publication of JPH0342658B2 publication Critical patent/JPH0342658B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/022Quinonediazides
    • G03F7/023Macromolecular quinonediazides; Macromolecular additives, e.g. binders
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/30Imagewise removal using liquid means
    • G03F7/32Liquid compositions therefor, e.g. developers
    • G03F7/325Non-aqueous compositions

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
JP13685A 1985-01-07 1985-01-07 レジストパタ−ンの形成方法 Granted JPS61159638A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13685A JPS61159638A (ja) 1985-01-07 1985-01-07 レジストパタ−ンの形成方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13685A JPS61159638A (ja) 1985-01-07 1985-01-07 レジストパタ−ンの形成方法

Publications (2)

Publication Number Publication Date
JPS61159638A JPS61159638A (ja) 1986-07-19
JPH0342658B2 true JPH0342658B2 (enrdf_load_stackoverflow) 1991-06-27

Family

ID=11465613

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13685A Granted JPS61159638A (ja) 1985-01-07 1985-01-07 レジストパタ−ンの形成方法

Country Status (1)

Country Link
JP (1) JPS61159638A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS61159638A (ja) 1986-07-19

Similar Documents

Publication Publication Date Title
US4165395A (en) Process for forming a high aspect ratio structure by successive exposures with electron beam and actinic radiation
KR20040026105A (ko) 미세 패턴 형성 재료, 미세 패턴 형성 방법 및 반도체장치의 제조 방법
JPS6313035A (ja) パタ−ン形成方法
EP0199303B1 (en) Method of forming a photoresist pattern
JPS6239817B2 (enrdf_load_stackoverflow)
JPH05326358A (ja) 微細パターン形成方法
KR0160921B1 (ko) 레지스트 패턴의 형성방법
JP3118887B2 (ja) パターン形成方法
JPH0342658B2 (enrdf_load_stackoverflow)
JPH08272107A (ja) レジストパターンの形成方法
WO1983003485A1 (en) Electron beam-optical hybrid lithographic resist process
JPS63254729A (ja) レジストパタ−ンの形成方法
JPH04249311A (ja) 光リソグラフィーの限界解像度以下の微細パターン形成方法
JPS6169130A (ja) パタ−ン形成方法
JPH03283418A (ja) レジストパターン形成方法
JPH02156244A (ja) パターン形成方法
JP2712407B2 (ja) 2層フォトレジストを用いた微細パターンの形成方法
JPH0342659B2 (enrdf_load_stackoverflow)
JPS61241745A (ja) ネガ型フオトレジスト組成物及びレジストパタ−ン形成方法
JPS646448B2 (enrdf_load_stackoverflow)
JPS61131446A (ja) レジストパタ−ン形成方法
JPH05291130A (ja) 多層レジスト法及び半導体装置の製造方法
JPS63157421A (ja) レジストパタ−ン形成方法
JPH01296620A (ja) パターン形成方法
JPS5898924A (ja) 微細パタ−ン形成方法

Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term