JPH034032Y2 - - Google Patents

Info

Publication number
JPH034032Y2
JPH034032Y2 JP14406485U JP14406485U JPH034032Y2 JP H034032 Y2 JPH034032 Y2 JP H034032Y2 JP 14406485 U JP14406485 U JP 14406485U JP 14406485 U JP14406485 U JP 14406485U JP H034032 Y2 JPH034032 Y2 JP H034032Y2
Authority
JP
Japan
Prior art keywords
carrier tape
electrical components
burn
wiring pattern
electrical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP14406485U
Other languages
English (en)
Japanese (ja)
Other versions
JPS6251745U (en, 2012
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14406485U priority Critical patent/JPH034032Y2/ja
Publication of JPS6251745U publication Critical patent/JPS6251745U/ja
Application granted granted Critical
Publication of JPH034032Y2 publication Critical patent/JPH034032Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP14406485U 1985-09-19 1985-09-19 Expired JPH034032Y2 (en, 2012)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14406485U JPH034032Y2 (en, 2012) 1985-09-19 1985-09-19

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14406485U JPH034032Y2 (en, 2012) 1985-09-19 1985-09-19

Publications (2)

Publication Number Publication Date
JPS6251745U JPS6251745U (en, 2012) 1987-03-31
JPH034032Y2 true JPH034032Y2 (en, 2012) 1991-02-01

Family

ID=31054328

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14406485U Expired JPH034032Y2 (en, 2012) 1985-09-19 1985-09-19

Country Status (1)

Country Link
JP (1) JPH034032Y2 (en, 2012)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4855672A (en) * 1987-05-18 1989-08-08 Shreeve Robert W Method and process for testing the reliability of integrated circuit (IC) chips and novel IC circuitry for accomplishing same

Also Published As

Publication number Publication date
JPS6251745U (en, 2012) 1987-03-31

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