JPH0339272B2 - - Google Patents

Info

Publication number
JPH0339272B2
JPH0339272B2 JP57122518A JP12251882A JPH0339272B2 JP H0339272 B2 JPH0339272 B2 JP H0339272B2 JP 57122518 A JP57122518 A JP 57122518A JP 12251882 A JP12251882 A JP 12251882A JP H0339272 B2 JPH0339272 B2 JP H0339272B2
Authority
JP
Japan
Prior art keywords
bandpass filter
attenuator
partial discharge
series
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57122518A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5912364A (ja
Inventor
Eiichi Tamaoki
Tetsuo Hakata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP57122518A priority Critical patent/JPS5912364A/ja
Publication of JPS5912364A publication Critical patent/JPS5912364A/ja
Publication of JPH0339272B2 publication Critical patent/JPH0339272B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Relating To Insulation (AREA)
JP57122518A 1982-07-12 1982-07-12 電気機器の部分放電測定装置 Granted JPS5912364A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57122518A JPS5912364A (ja) 1982-07-12 1982-07-12 電気機器の部分放電測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57122518A JPS5912364A (ja) 1982-07-12 1982-07-12 電気機器の部分放電測定装置

Publications (2)

Publication Number Publication Date
JPS5912364A JPS5912364A (ja) 1984-01-23
JPH0339272B2 true JPH0339272B2 (OSRAM) 1991-06-13

Family

ID=14837830

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57122518A Granted JPS5912364A (ja) 1982-07-12 1982-07-12 電気機器の部分放電測定装置

Country Status (1)

Country Link
JP (1) JPS5912364A (OSRAM)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0770802A (ja) * 1993-08-31 1995-03-14 Masahiko Yamamoto 靴 下
US7948229B2 (en) * 2008-08-29 2011-05-24 General Electric Company High temperature electronics for passive eddy current sensors

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5916844U (ja) * 1982-07-21 1984-02-01 有限会社味の万世 詰合せ食品容器の蓋兼用包装袋

Also Published As

Publication number Publication date
JPS5912364A (ja) 1984-01-23

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