JPH0332745B2 - - Google Patents
Info
- Publication number
- JPH0332745B2 JPH0332745B2 JP57211164A JP21116482A JPH0332745B2 JP H0332745 B2 JPH0332745 B2 JP H0332745B2 JP 57211164 A JP57211164 A JP 57211164A JP 21116482 A JP21116482 A JP 21116482A JP H0332745 B2 JPH0332745 B2 JP H0332745B2
- Authority
- JP
- Japan
- Prior art keywords
- magnetic field
- field strength
- mass
- ion
- computer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57211164A JPS5999349A (ja) | 1982-11-30 | 1982-11-30 | 質量分析計における磁場設定装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57211164A JPS5999349A (ja) | 1982-11-30 | 1982-11-30 | 質量分析計における磁場設定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5999349A JPS5999349A (ja) | 1984-06-08 |
JPH0332745B2 true JPH0332745B2 (enrdf_load_stackoverflow) | 1991-05-14 |
Family
ID=16601456
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57211164A Granted JPS5999349A (ja) | 1982-11-30 | 1982-11-30 | 質量分析計における磁場設定装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5999349A (enrdf_load_stackoverflow) |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5914861B2 (ja) * | 1979-12-20 | 1984-04-06 | 日本電子株式会社 | 質量分析装置 |
-
1982
- 1982-11-30 JP JP57211164A patent/JPS5999349A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5999349A (ja) | 1984-06-08 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPWO2012017548A1 (ja) | 四重極型質量分析装置 | |
EP3231004A2 (en) | Control of magnetic sector mass spectrometer magnet | |
CA2014138A1 (en) | Method and apparatus for enhanced ion spectra generation and detection in ion mobility spectrometry | |
JPH0332745B2 (enrdf_load_stackoverflow) | ||
JPH0542106B2 (enrdf_load_stackoverflow) | ||
JPS6341185B2 (enrdf_load_stackoverflow) | ||
JP2000243344A (ja) | アイソトポマー質量分析装置 | |
JP2616637B2 (ja) | 質量分析方法 | |
JPH10112282A (ja) | 四重極質量分析装置 | |
JPH08111203A (ja) | 高分解能質量分析計 | |
JPS59123155A (ja) | 四重極質量分析装置 | |
JPH1027570A (ja) | 四重極質量分析装置 | |
JP2556842B2 (ja) | 質量分析計 | |
JP2748933B2 (ja) | Sim測定装置 | |
JPS5851621B2 (ja) | 質量分析計 | |
JPS5638761A (en) | Setting of magnetic field in mass spectrometer | |
JPH083988B2 (ja) | 二次イオン質量分析方法 | |
JPH03108656A (ja) | 質量分析方法 | |
JPH04337232A (ja) | イオン電流経時変化検出方法 | |
JPS6381749A (ja) | 磁場形質量分析計 | |
JPS63281338A (ja) | 一次イオン照射装置 | |
JPH0570256B2 (enrdf_load_stackoverflow) | ||
JPH0574782B2 (enrdf_load_stackoverflow) | ||
JPH11183439A (ja) | 液体クロマトグラフ質量分析装置 | |
JPH04338B2 (enrdf_load_stackoverflow) |