JPH0330879U - - Google Patents
Info
- Publication number
- JPH0330879U JPH0330879U JP9125589U JP9125589U JPH0330879U JP H0330879 U JPH0330879 U JP H0330879U JP 9125589 U JP9125589 U JP 9125589U JP 9125589 U JP9125589 U JP 9125589U JP H0330879 U JPH0330879 U JP H0330879U
- Authority
- JP
- Japan
- Prior art keywords
- inspection
- semiconductor integrated
- functions
- semiconductor
- devices
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 claims description 7
- 239000004065 semiconductor Substances 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9125589U JPH0330879U (da) | 1989-08-02 | 1989-08-02 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9125589U JPH0330879U (da) | 1989-08-02 | 1989-08-02 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0330879U true JPH0330879U (da) | 1991-03-26 |
Family
ID=31640753
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9125589U Pending JPH0330879U (da) | 1989-08-02 | 1989-08-02 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0330879U (da) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004111029A (ja) * | 2002-08-30 | 2004-04-08 | Matsushita Electric Ind Co Ltd | 半導体集積回路およびメモリのテスト方法 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6283678A (ja) * | 1985-10-09 | 1987-04-17 | Hitachi Ltd | 試験パタ−ン発生器 |
-
1989
- 1989-08-02 JP JP9125589U patent/JPH0330879U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6283678A (ja) * | 1985-10-09 | 1987-04-17 | Hitachi Ltd | 試験パタ−ン発生器 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004111029A (ja) * | 2002-08-30 | 2004-04-08 | Matsushita Electric Ind Co Ltd | 半導体集積回路およびメモリのテスト方法 |
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