JPH0328775B2 - - Google Patents
Info
- Publication number
- JPH0328775B2 JPH0328775B2 JP58016635A JP1663583A JPH0328775B2 JP H0328775 B2 JPH0328775 B2 JP H0328775B2 JP 58016635 A JP58016635 A JP 58016635A JP 1663583 A JP1663583 A JP 1663583A JP H0328775 B2 JPH0328775 B2 JP H0328775B2
- Authority
- JP
- Japan
- Prior art keywords
- electric field
- field
- electrode
- electrodes
- uniform magnetic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000005684 electric field Effects 0.000 claims description 40
- 239000000758 substrate Substances 0.000 description 9
- 150000002500 ions Chemical class 0.000 description 8
- 230000004075 alteration Effects 0.000 description 6
- 230000003287 optical effect Effects 0.000 description 6
- 238000010586 diagram Methods 0.000 description 4
- 238000004070 electrodeposition Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000005530 etching Methods 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000010408 sweeping Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58016635A JPS59143252A (ja) | 1983-02-03 | 1983-02-03 | 重畳場質量分析装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58016635A JPS59143252A (ja) | 1983-02-03 | 1983-02-03 | 重畳場質量分析装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59143252A JPS59143252A (ja) | 1984-08-16 |
| JPH0328775B2 true JPH0328775B2 (enExample) | 1991-04-22 |
Family
ID=11921814
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58016635A Granted JPS59143252A (ja) | 1983-02-03 | 1983-02-03 | 重畳場質量分析装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59143252A (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61110957A (ja) * | 1984-11-06 | 1986-05-29 | Jeol Ltd | 重畳場質量分析装置 |
| GB8912580D0 (en) * | 1989-06-01 | 1989-07-19 | Vg Instr Group | Charged particle energy analyzer and mass spectrometer incorporating it |
| JP3867048B2 (ja) | 2003-01-08 | 2007-01-10 | 株式会社日立ハイテクノロジーズ | モノクロメータ及びそれを用いた走査電子顕微鏡 |
-
1983
- 1983-02-03 JP JP58016635A patent/JPS59143252A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS59143252A (ja) | 1984-08-16 |
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