JPH03273139A - Inspection device for mounted board - Google Patents

Inspection device for mounted board

Info

Publication number
JPH03273139A
JPH03273139A JP2073712A JP7371290A JPH03273139A JP H03273139 A JPH03273139 A JP H03273139A JP 2073712 A JP2073712 A JP 2073712A JP 7371290 A JP7371290 A JP 7371290A JP H03273139 A JPH03273139 A JP H03273139A
Authority
JP
Japan
Prior art keywords
board
electronic components
image
lighting device
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2073712A
Other languages
Japanese (ja)
Inventor
Nobuyo Kimoto
木元 信余
Motohiro Sugiyama
杉山 基広
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP2073712A priority Critical patent/JPH03273139A/en
Publication of JPH03273139A publication Critical patent/JPH03273139A/en
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Supply And Installment Of Electrical Components (AREA)

Abstract

PURPOSE:To recognize a connection state even when electronic components are superposed on the board by providing an inspection base where the board having electronic components mounted is placed, a lighting device which lights the board form beside and above, and a camera. CONSTITUTION:This device consists of the inspection base 3 where the board 2 which has the electronic components 1 mounted is placed, the side lighting device 4 and upper lighting device 5 which lights the board 2 and electronic components 1 form above, and an image pickup device 6 and a display part 8 which are positioned on the opposite side from the side lighting device 4 across the board 2. Then the electronic components 1 and board 2 are lighted from beside and above and the image pickup device 6 which is installed on the other side picks up their image. In addition to the sideward lighting, they are lighted from above, so shadows except shadows of the electronic components 1 are eliminated and the shadows of the electronic components 1 can accurately by recognized. Consequently, even when the electronic components mount on the mount board are superposed on the optical axis, an the connection state of the electronic components and board 2 can be image-picked up clearly.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は電子部品とその実装基板との接合状態を検査す
る実装基板の検査装置に関する。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a mounting board inspection device for inspecting the bonding state between an electronic component and its mounting board.

従来の技術 従来、電子部品とその実装基板との接合状態を検査する
実装基板の検査装置は、第3図に示すように、検査台1
1の上に置かれた電子部品12を実装した基板13とこ
れらを側方から照明する照明装置14と、電子部品12
が実装された基板13を撮像するカメラ15で構成され
ている。照明装置14から照射した光によって照明され
ている電子部品12と基板13の接合部はカメラ15に
よって撮像され、この画像情報を画像処理部16で二値
化画像にし電子部品12と基板13の接合状態や接合部
に異物が混入しているかどうかを認識させ、表示部17
の画面に表示させて検査している。
BACKGROUND OF THE INVENTION Conventionally, a mounting board inspection device for inspecting the bonding state between an electronic component and its mounting board has a test stand 1 as shown in FIG.
A substrate 13 mounted with electronic components 12 placed on the substrate 1 , a lighting device 14 that illuminates these from the side, and electronic components 12
It is composed of a camera 15 that takes an image of the board 13 on which is mounted. The joint between the electronic component 12 and the board 13 that is illuminated by the light emitted from the illumination device 14 is imaged by the camera 15, and this image information is converted into a binarized image by the image processing unit 16. The joint between the electronic component 12 and the board 13 The display unit 17 allows you to recognize the condition and whether foreign matter is mixed in the joint.
It is displayed on the screen for inspection.

発明が解決しようとする課題 しかしながら上記従来の実装基板の検査装置では、第4
図に示すように基板13上で検査対象とする電子部品1
2等がカメラ15のレンズの光軸上で重なり合っている
場合、前後にある電子部品12の影が重なってしまい、
電子部品12と基板13との接合状態の像の正確な認識
ができず検査できないという課題があった。
Problems to be Solved by the Invention However, in the above-mentioned conventional mounting board inspection apparatus, the fourth
As shown in the figure, an electronic component 1 to be inspected is placed on a board 13.
If the second-class lenses overlap on the optical axis of the camera 15 lens, the shadows of the electronic components 12 in the front and rear will overlap,
There was a problem in that an image of the bonded state between the electronic component 12 and the substrate 13 could not be accurately recognized and inspection could not be performed.

本発明は上記課題を解決するものであり、基板上で電子
部品が重なり合っていても接合状態を認識できる優れた
実装基板の検査装置を提供することを目的とする。
The present invention has been made to solve the above-mentioned problems, and it is an object of the present invention to provide an excellent mounting board inspection device that can recognize the bonding state even when electronic components are overlapped on the board.

課題を解決するための手段 本発明は上記目的を達成するために、電子部品を実装し
た基板を載せる検査台と、前記基板を側方と上方から照
明する照明装置と、カメラからなる撮像装置と表示部と
から構成したものである。
Means for Solving the Problems In order to achieve the above object, the present invention provides an inspection table on which a board on which electronic components are mounted, a lighting device that illuminates the board from the side and above, and an imaging device comprising a camera. It consists of a display section.

作用 したがって本発明によれば、側方から基板上の電子部品
を照明装置で照明するとともに、電子部品上方からも照
明できることによって検査対象である電子部品の画像だ
けを明確に認識し、検査することができる。
Therefore, according to the present invention, it is possible to clearly recognize and inspect only the image of the electronic component to be inspected by illuminating the electronic component on the board from the side with the illumination device and also by illuminating from above the electronic component. I can do it.

実施例 以下、本発明の一実施例について第1図を参照しながら
説明する。図に示すように本実施例は電子部品1が実装
された基板2が載っている検査台3と、偏部照明装置4
と、上方から基板と電子部品を照明する上部照明装置5
と、実装基板をはさんで側部照明装置4の反対例に位置
する撮像装置6と、撮像装置6に接続する表示fs8と
から構成されており、側方からと上方から電子部品1と
基板2を照明し、それを他の側方に設置した撮像装置6
によって撮像する。側方からの照明に加えて上方からも
照明しているため第2図に示すように検査対象としてい
る電子部品1以外の影は消され、電子部品1の影を正確
に認識することができる。
EXAMPLE Hereinafter, an example of the present invention will be described with reference to FIG. As shown in the figure, this embodiment includes an inspection table 3 on which a board 2 on which an electronic component 1 is mounted, and a partial illumination device 4.
and an upper lighting device 5 that illuminates the board and electronic components from above.
, an imaging device 6 located on the opposite side of the side illumination device 4 with the mounting board in between, and a display fs8 connected to the imaging device 6. An imaging device 6 that illuminates 2 and installed it on the other side.
The image is taken by In addition to illumination from the side, it is also illuminated from above, so as shown in Figure 2, shadows other than the electronic component 1 being inspected are erased, making it possible to accurately recognize the shadow of the electronic component 1. .

なお、通常は電子部品1と基板2の接合部を撮像装置6
で撮像し、表示部8に表示して検査するが、撮像装置6
と表示部8の間に画像処理部7を接続して画像情報を二
値化画像とし表示部8に接合部を表示することによりさ
らに高精度に認識でき、検査することが可能である。ま
た直接表示部8に表示して検査する場合、その画面に目
盛を付は検査を容易にすることもできる。
Note that the joint between the electronic component 1 and the board 2 is usually connected to the imaging device 6.
The imaging device 6 captures an image and displays it on the display unit 8 for inspection.
By connecting the image processing section 7 between the display section 8 and the display section 8 to convert the image information into a binary image and displaying the joint on the display section 8, recognition and inspection can be performed with even higher precision. Furthermore, when inspecting by directly displaying on the display section 8, a scale can be added to the screen to facilitate the inspection.

さらに実装基板を検査するために、撮像装置6を2台以
上使用して画像認識の精度を向上することも可能であり
、撮像装置6を固定せずにその他の場所に移動させて撮
像することもできる。
Furthermore, in order to inspect the mounted board, it is possible to improve the accuracy of image recognition by using two or more imaging devices 6, and it is possible to move the imaging device 6 to another location without fixing it to take images. You can also do it.

発明の効果 以上のように本発明の実装基板の検査装置によれば、側
方からの照明と上方からの照明を組み合わせることによ
り、実装基板上に載置された電子部品がカメラの光軸上
で重なり合っていても電子部品と基板との接合状態をは
っきりした画像で撮像することができ、基板上の電子部
品の実装状態を正確に検査することができる。
Effects of the Invention As described above, according to the mounted board inspection apparatus of the present invention, by combining illumination from the side and illumination from above, the electronic components mounted on the mounted board are aligned with the optical axis of the camera. Even if the electronic components and the board overlap, it is possible to capture a clear image of the bonding state between the electronic component and the board, and it is possible to accurately inspect the mounting state of the electronic component on the board.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の実施例における実装基板の検査装置の
構成を示す要部斜視図、第2図は本実施例で得られる接
合部の二値化画像を示す表示部の画面の正面図、第3図
は従来の実装基板の検査装置の構成を示す要部斜視図、
第4図は従来の実装基板の検査装置で得られる接合部の
二値化画像を示す表示部の画面の正面図である。 1・・・・・・電子部品、2・・・・・・基板、3・・
・・・・検査台、4・・・・・・側部照明装置、5・・
・・・・上部照明装置、6・・・・・・撮像装置、7・
・・・・・画像処理部、8・・・・・・表示部。
FIG. 1 is a perspective view of the main parts showing the configuration of a mounting board inspection apparatus according to an embodiment of the present invention, and FIG. 2 is a front view of the screen of a display section showing a binarized image of a joint obtained in this embodiment. , FIG. 3 is a perspective view of main parts showing the configuration of a conventional mounting board inspection device,
FIG. 4 is a front view of the screen of the display section showing a binarized image of the joint section obtained by the conventional mounting board inspection apparatus. 1... Electronic components, 2... Board, 3...
...Inspection table, 4...Side illumination device, 5...
...Top illumination device, 6...Imaging device, 7.
. . . Image processing section, 8 . . . Display section.

Claims (2)

【特許請求の範囲】[Claims] (1)電子部品を実装した基板を載せる検査台と、前記
基板を照明する側部照明装置および上部照明装置と、カ
メラからなる撮像装置と、表示部とから構成された実装
基板の検査装置。
(1) An inspection device for a mounted board that includes an inspection table on which a board on which electronic components are mounted is placed, a side lighting device and a top lighting device that illuminate the board, an imaging device including a camera, and a display section.
(2)カメラからなる撮像装置と表示部との間に画像処
理部を接続した請求項1記載の実装基板の検査装置。
(2) The mounting board inspection device according to claim 1, further comprising an image processing section connected between the imaging device comprising a camera and the display section.
JP2073712A 1990-03-23 1990-03-23 Inspection device for mounted board Pending JPH03273139A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2073712A JPH03273139A (en) 1990-03-23 1990-03-23 Inspection device for mounted board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2073712A JPH03273139A (en) 1990-03-23 1990-03-23 Inspection device for mounted board

Publications (1)

Publication Number Publication Date
JPH03273139A true JPH03273139A (en) 1991-12-04

Family

ID=13526108

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2073712A Pending JPH03273139A (en) 1990-03-23 1990-03-23 Inspection device for mounted board

Country Status (1)

Country Link
JP (1) JPH03273139A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2519991A (en) * 2013-11-04 2015-05-13 Dave Hall Entpr Ltd Apparatus and method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2519991A (en) * 2013-11-04 2015-05-13 Dave Hall Entpr Ltd Apparatus and method
GB2519991B (en) * 2013-11-04 2016-10-12 Dave Hall Entpr Ltd Optical inspection of soldered components

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