JPH03263706A - Dielectric porcelain composition - Google Patents
Dielectric porcelain compositionInfo
- Publication number
- JPH03263706A JPH03263706A JP2061461A JP6146190A JPH03263706A JP H03263706 A JPH03263706 A JP H03263706A JP 2061461 A JP2061461 A JP 2061461A JP 6146190 A JP6146190 A JP 6146190A JP H03263706 A JPH03263706 A JP H03263706A
- Authority
- JP
- Japan
- Prior art keywords
- temperature coefficient
- dielectric
- dielectric constant
- porcelain composition
- static capacity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000203 mixture Substances 0.000 title claims abstract description 15
- 229910052573 porcelain Inorganic materials 0.000 title abstract description 8
- 229910052779 Neodymium Inorganic materials 0.000 claims abstract description 8
- 229910052777 Praseodymium Inorganic materials 0.000 claims abstract description 8
- 229910052746 lanthanum Inorganic materials 0.000 claims abstract description 7
- 229910052761 rare earth metal Inorganic materials 0.000 claims abstract description 4
- 239000000919 ceramic Substances 0.000 claims description 3
- 238000009413 insulation Methods 0.000 abstract description 11
- 230000015556 catabolic process Effects 0.000 abstract description 10
- 230000003068 static effect Effects 0.000 abstract description 4
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 abstract 2
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 abstract 2
- 229910052788 barium Inorganic materials 0.000 abstract 1
- 229910052791 calcium Inorganic materials 0.000 abstract 1
- 229910052719 titanium Inorganic materials 0.000 abstract 1
- 229910052726 zirconium Inorganic materials 0.000 abstract 1
- 238000005259 measurement Methods 0.000 description 7
- 230000000694 effects Effects 0.000 description 5
- 230000005686 electrostatic field Effects 0.000 description 5
- 239000000843 powder Substances 0.000 description 5
- 239000013078 crystal Substances 0.000 description 4
- 230000007423 decrease Effects 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- -1 BaTi0) Chemical class 0.000 description 1
- 229910001369 Brass Inorganic materials 0.000 description 1
- 101100496968 Caenorhabditis elegans ctc-1 gene Proteins 0.000 description 1
- BVKZGUZCCUSVTD-UHFFFAOYSA-L Carbonate Chemical compound [O-]C([O-])=O BVKZGUZCCUSVTD-UHFFFAOYSA-L 0.000 description 1
- 101100221647 Neurospora crassa (strain ATCC 24698 / 74-OR23-1A / CBS 708.71 / DSM 1257 / FGSC 987) cox-1 gene Proteins 0.000 description 1
- 101150062589 PTGS1 gene Proteins 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 239000010951 brass Substances 0.000 description 1
- 239000003985 ceramic capacitor Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 235000013399 edible fruits Nutrition 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-M hydroxide Chemical compound [OH-] XLYOFNOQVPJJNP-UHFFFAOYSA-M 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 229920002545 silicone oil Polymers 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Landscapes
- Compositions Of Oxide Ceramics (AREA)
- Inorganic Insulating Materials (AREA)
Abstract
Description
【発明の詳細な説明】
産業上の利用分野
本発明は誘電率、絶縁抵抗、絶縁破壊電圧が高く、良好
度Qにすぐれ、静電容量温度係数が小さい誘電体磁器組
成物に関するものである。DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention relates to a dielectric ceramic composition that has a high dielectric constant, high insulation resistance, high dielectric breakdown voltage, excellent Q quality, and low temperature coefficient of capacitance.
従来の技術
従来から、誘電率、絶縁抵抗が高く、良好度Qにすぐれ
、静電容量温度係数が小さい誘電体磁器組成物として下
記のような系が知られている。BACKGROUND OF THE INVENTION Conventionally, the following systems have been known as dielectric ceramic compositions that have high dielectric constant and insulation resistance, excellent quality Q, and small temperature coefficient of capacitance.
・BaOTi0z Nd’tOs系・[laOTi
0g Saw’s系発明が解決しようとする課題
しかし、これらの組成は、例えば0.09BaOO,5
6TiOz 0.35NdOzzxの組成比からな
る誘電体材料を使用し、円板形磁器コンデンサを作製す
ると、誘電率二67、良好度Q : 3000、静電容
量温度係数: N40ppm /”c、絶縁抵抗: 8
.0XlO”Ωであり、また結晶粒径が1〜5μmと大
きいため、素体中の気孔率が大きくなるとともに結晶粒
子1個当たりにかかる電界強度が大きくなり、絶縁破壊
強度:30kv/mであり、満足のできる値ではない。・BaOTi0z Nd'tOs system・[laOTi
However, these compositions, for example, 0.09BaOO, 5
When a disk-shaped ceramic capacitor is manufactured using a dielectric material with a composition ratio of 6TiOz 0.35NdOzzx, the dielectric constant is 267, the goodness Q: 3000, the capacitance temperature coefficient: N40ppm/''c, and the insulation resistance: 8
.. 0XlO''Ω, and the crystal grain size is large, 1 to 5 μm, so the porosity in the element body increases and the electric field strength applied to each crystal grain increases, resulting in a dielectric breakdown strength of 30 kv/m. , not a satisfactory value.
課題を解決するための手段
これらの課題を解決するために本発明は、一般式
%式%
(ZrOz)a l zRe037gと表した時(
ただし、X+y + z−1−rn呉0.30、O,0
01$n≦0.200 、ReはLa、 Pr、 Nd
、 Swaから選ばれる−・種以上の希土類元素。Means for Solving the Problems In order to solve these problems, the present invention provides a general formula % (ZrOz)al zRe037g when expressed as (
However, X + y + z-1-rn 0.30, O, 0
01$n≦0.200, Re is La, Pr, Nd
, Swa - species or more of rare earth elements selected from Swa.
)、x、y−zが以1゛に表1′□各点a、b、c、d
、e、ffで囲まれるモル比の範囲からなることを特徴
とする誘電体磁器組成物を提案するものである。), x, y-z are shown in Table 1'□ Each point a, b, c, d
, e, and ff.
作用
第1図は本発明にかかる組成物の4゛戒分の組成範囲を
示す二元図であり、主成分の組成範囲41Il定した理
lJpを第1図を参照しながら説明する。ずな才つち、
穴領域では焼結が署しく困難である。j、た、■3領域
では良好度Qが低下し実用的でなくなる。さらに、C,
D領域では静電界を温度係数がマイナス側に大きくなり
すぎて実用的でなくなる。FIG. 1 is a binary diagram showing the composition range of the four precepts of the composition according to the present invention, and the principle of determining the composition range of the main components will be explained with reference to FIG. Zuna Saitsuchi,
Sintering is marked and difficult in the hole region. In the j, ta, and 3 areas, the quality Q decreases and becomes impractical. Furthermore, C,
In region D, the temperature coefficient of the electrostatic field becomes too large on the negative side, making it impractical.
そしく、R領域では静電界量温度係数がプラス力向に移
行するが、誘電率が小さく実用的でなくなる。また、R
eZLa、 Pr、 Ni1. Smから選ぶことによ
り、La、 Pr、 Nd、 S−の類C誘電率を大き
く下げることなく、静電容量温度係数をブラスブJ向に
移行することが勾能であり、41、a、 Pr、 Nd
、軸の1種あるいはそれらの組合せにより静電界量温度
係数の調節が61能である。In the R region, the electrostatic field temperature coefficient shifts to a positive force direction, but the dielectric constant is too small to be practical. Also, R
eZLa, Pr, Ni1. By selecting from Sm, it is possible to shift the capacitance temperature coefficient toward brass J without significantly lowering the class C permittivity of La, Pr, Nd, S-41, a, Pr, Nd
, the electrostatic field temperature coefficient can be adjusted by one type of axis or a combination thereof.
また、BaOをCaOで置ttA5“ることにより、誘
電率、静1を容JHX度係数、絶縁破壊強度の41豹を
大Δく変えることなく、良好度Ωを1iil 、、hさ
旺、絶縁抵IAを高くする効果をイイしているが、その
許換串n1が0.01未満では置換効果はなく、一方0
.30を超えると良好度Ω、絶縁抵抗が低下し、4静電
界M温度係数もマイナス側に大きくなりすぎ実用的でな
(なる。In addition, by replacing BaO with CaO, the degree of goodness Ω can be reduced to 1iil, 1iil, hsaou, insulation, without significantly changing the dielectric constant, static 1, capacity JHX degree coefficient, and dielectric breakdown strength. Although the effect of increasing the resistance IA is good, if the tolerance n1 is less than 0.01, there is no substitution effect;
.. If it exceeds 30, the degree of goodness Ω and the insulation resistance will decrease, and the temperature coefficient of the 4 electrostatic field M will also become too large on the negative side, making it impractical.
さらに、Tie、をZrOzで置換することにより、誘
電率、良好度Q、静電容置温度係数、絶縁抵tJ′14
の値を大券く変えることなく、結晶粒往を小さくし、絶
縁破壊強度を大きくする効果を有して(1)るが、モ
置換車 7 未満 ′II換効果はなく2−・方
0.200を超えると誘電率、長杆度Ω、絶縁抵抗が低
下する。Furthermore, by replacing Tie with ZrOz, the dielectric constant, goodness Q, capacitance temperature coefficient, and insulation resistance tJ'14
It has the effect of reducing crystal grain size and increasing dielectric breakdown strength without significantly changing the value of
Replacement wheel Less than 7' There is no conversion effect, and if it exceeds 0.200, the dielectric constant, length Ω, and insulation resistance will decrease.
実施例 以下に、本発明を具体的実施例により説明゛づる。Example The present invention will be explained below using specific examples.
(実施例1)
まず、出発原糾番こは化学的に高純度のBJI COs
rCaCOs+丁Log、 ZrO*+ La=03
. PF*0+t+ Ndz03およびS、m1O1粉
末を一ト記の第1表に示す11威比しなるように押目し
、めのうボールを備えたゴム内張りのポール泉ルに純水
εεもに入れ、湿式混合後、脱水乾燥した。この乾燥粉
末を高アルミJ・質のルツボC,″入れ、す気巾で目0
0℃に゛(2時間仮焼した。(Example 1) First, the starting material is chemically high-purity BJI COs.
rCaCOs+DingLog, ZrO*+ La=03
.. PF*0+t+ Ndz03, S, and m1O1 powders were pressed into 11 ratios as shown in Table 1, and placed in pure water εε in a rubber-lined pole fountain equipped with an agate ball, and wet mixed. After that, it was dehydrated and dried. Put this dry powder into a high-aluminum J/quality crucible C, and use an air cloth to
Calcined at 0°C for 2 hours.
ごの仮焼粉、$:、i:、めのうポールを鑞えたゴム内
張りのボルル逅ルに純水とともに入れ、湿式粉砕後、脱
水乾燥した。こ0)粉砕粉果に、有機バインダーを加え
、χJWとした後1,32メンシ10)ふるいを通しで
Vt1(、、金製と油性ブレスを用いて酸形圧力l t
on / eJ−ご直径15mm、 PI:み0.4m
mに成形し、た。次いで、成形円板をシルク:−7粉宋
を敷いたアルミナ質のサヤに入れ、空気中に゛ζ下記σ
〕第1表に示す温度で2時間焼成j2、第1表に示ずl
l戒比の誘電体磁器を得た。Calcined powder, $:, i:, Agate poles were placed in a brazed rubber-lined bowl with pure water, wet-pulverized, and then dehydrated and dried. 0) Add an organic binder to the crushed fruit powder to make χJW, and then pass it through a sieve to Vt1 (,, acid form pressure l t using a metal and oily breather.
on/eJ-diameter 15mm, PI: diameter 0.4m
Mold into m. Next, the formed disk was placed in an alumina pod lined with silk: -7 powder, and the σ below ゛ζ was placed in the air.
] Baking for 2 hours at the temperature shown in Table 1J2, Not shown in Table 1L
A dielectric porcelain of 1 prestige was obtained.
二〇)ようにして得られた講電体研器円板は、j9みと
直径を測定し、誘電率、良好度Q、Ill電容植温度係
数測定用試料は、誘電体磁!iiP]板の両開全体に銀
電極を焼き伺け、絶縁抵抗、絶U破壊強度測定用試料は
、誘電体磁器円板の外周より内側に1mの暢で!!電極
のなむ)部分を設の、銀電極を焼き(4げた。そして、
誘電率、良好度Ω、静電界量温度係数心よ、横側・ヒx
L/ツト・バンカー1′卸製デジタルi、、 c r、
’メータのモデル4275八杏使用り、。20) The diameter of the electric field test disk obtained in the above manner was measured, and the sample for measuring the dielectric constant, goodness Q, and temperature coefficient of Ill charge was dielectric magnetic! [iiP] Burn a silver electrode over the entire opening of the plate, and the sample for measuring insulation resistance and absolute U breakdown strength should be placed 1m inward from the outer periphery of the dielectric porcelain disk! ! The silver electrode was burnt (4 times) by setting the part of the electrode (named).
Dielectric constant, degree of goodness Ω, electrostatic field temperature coefficient center, side/hysteresis
L/Tuto Bunker 1' wholesale digital i,, cr,
'Using meter model 4275 Yakan.
測定温度20″C5測定電圧1 、OVrms、測定周
波数IMHzでの測定より求めた。なお、静電容量温度
係数は、20゛Cと85°Cの静電容量を測定し、次式
により求めた。It was determined by measurement at a measurement temperature of 20''C5, a measurement voltage of 1, OVrms, and a measurement frequency of IMHz.The capacitance temperature coefficient was determined by measuring the capacitance at 20°C and 85°C and using the following formula. .
TC= (C−Co)/CoX1/65X10″TC:
静電容量温度係数(ρpm/”C)Co:2Q°Cでの
静電容量(pF)
C:85°Cでの静電容量(pF)
また、誘電率は次式より求めた。TC= (C-Co)/CoX1/65X10″TC:
Temperature coefficient of capacitance (ρpm/''C) Co: Capacitance at 2Q°C (pF) C: Capacitance at 85°C (pF) The dielectric constant was determined from the following formula.
K= 143.8XCoXt/D”
K :誘電率
Co:20℃での静電容量(pP)
D :誘電体磁器の直径(III)
t :誘電体磁器の厚み(閣)
さらに、絶縁抵抗は、横側・ヒユーレット・パラカード
■製HRメータのモデル4329 Aを使用し、測定電
圧50V、D、C,、測定時間1分間による測定より求
めた。K = 143.8XCoXt/D” K: Dielectric constant Co: Capacitance at 20°C (pP) D: Diameter of dielectric porcelain (III) t: Thickness of dielectric porcelain (Kaku) Furthermore, the insulation resistance is It was determined by measurements using an HR meter model 4329 A made by Horizontal/Hyulet/Paracard ■ at a measurement voltage of 50V, D, C, and a measurement time of 1 minute.
そして、絶縁破壊強度は、菊水電子工業株製高電圧電源
PH535に一3形を使用し、試料をシリコンオイル中
に入れ、昇圧速度50V/seeにより求めた絶縁破壊
電圧を誘電体厚みで除算し、l陽当りの絶縁破壊強度と
した。The dielectric breakdown strength was determined by using a type 13 high voltage power supply PH535 manufactured by Kikusui Electronics Co., Ltd., placing the sample in silicone oil, and dividing the dielectric breakdown voltage determined by a voltage increase rate of 50 V/see by the dielectric thickness. , the dielectric breakdown strength per 1 yen.
また、結晶粒径は、倍率400での光学顕微鏡観察より
求めた。Further, the crystal grain size was determined by optical microscope observation at a magnification of 400.
試験条件を第1表に併せて示し、試験結果を下記の第2
表に示す。The test conditions are also shown in Table 1, and the test results are shown in Table 2 below.
Shown in the table.
(以下余白)
く第1表〉
〈第2表〉
なお、実施例における誘電体磁器の作製方法では、Ba
COx、 CaC0!+ Ti1t、 Zr01. L
at、1Pr*O+++Ndオ0.および5mg02を
使用したが、この方法に限定されるものではなく、所望
のm酸比になるように、BaTi0)などの化合物、あ
るいは炭酸塩、水酸化物など空気中での加熱により、B
ad、 Cab、 Ti01ZrOz+ LazOz+
Pr1O+++ Nd*OsおよびSs@02となる
化合物を使用しても実施例と同程度の特性を得ることが
できる。(Left below) Table 1〉〈Table 2〉 In addition, in the method for producing dielectric porcelain in the example, Ba
COx, CaC0! + Tilt, Zr01. L
at, 1Pr*O+++NdO0. and 5mg02 were used, but the method is not limited to this method, and by heating in air a compound such as BaTi0), carbonate, hydroxide, etc., to obtain the desired m-acid ratio.
ad, Cab, Ti01ZrOz+ LazOz+
Characteristics comparable to those of the examples can be obtained even by using the compounds Pr1O+++ Nd*Os and Ss@02.
また、上述の基本組成のほかに、SiO□MnO□Pe
gOz、 ZnOなど一般にフラックスと考えられてい
る塩類、酸化物などを、特性を損なわない範囲で加える
こともできる。In addition to the basic composition mentioned above, SiO□MnO□Pe
Salts, oxides, etc., which are generally considered to be fluxes, such as gOz and ZnO, can also be added to the extent that the properties are not impaired.
発明の効果
以上のように本発明によれば、誘電率、絶縁抵抗、絶縁
破壊電圧が高く、良好度Qにすぐれ、静電容量温度係数
が小さいため、製品の小型化、大容量化、特性向上が可
能である。Effects of the Invention As described above, according to the present invention, the dielectric constant, insulation resistance, and dielectric breakdown voltage are high, the quality Q is excellent, and the temperature coefficient of capacitance is small, so that the product can be made smaller, have a larger capacity, and have better characteristics. Improvement is possible.
第1図は本発明にかかる組成物の主成分の組威範囲を説
明する
元図である。FIG. 1 is a diagram illustrating the composition range of the main components of the composition according to the present invention.
Claims (1)
−y[(TiO_2)_(_1_−_n_)(ZrO_
2)_n]−zReO_3_/_2と表した時(ただし
、x+y+z=1.00、0.01≦m≦0.30、0
.001≦n≦0.200、ReはLa,Pr,Nd,
Smから選ばれる一種以上の希土類元素。)、x,y,
zが以下に表す各点a,b,c,d,e,fで囲まれる
モル比の範囲からなることを特徴とする誘電体磁器組成
物。[Claims] General formula x [(BaO)_(_1_-_m_)(CaO)_m]
−y[(TiO_2)_(_1_-_n_)(ZrO_
2)_n]-zReO_3_/_2 (where x+y+z=1.00, 0.01≦m≦0.30, 0
.. 001≦n≦0.200, Re is La, Pr, Nd,
One or more rare earth elements selected from Sm. ), x, y,
A dielectric ceramic composition characterized in that z consists of a molar ratio range surrounded by points a, b, c, d, e, and f shown below.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2061461A JPH03263706A (en) | 1990-03-13 | 1990-03-13 | Dielectric porcelain composition |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2061461A JPH03263706A (en) | 1990-03-13 | 1990-03-13 | Dielectric porcelain composition |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH03263706A true JPH03263706A (en) | 1991-11-25 |
Family
ID=13171698
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2061461A Pending JPH03263706A (en) | 1990-03-13 | 1990-03-13 | Dielectric porcelain composition |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH03263706A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007261893A (en) * | 2006-03-29 | 2007-10-11 | Ntn Corp | Dielectric ceramic and method of producing the same |
-
1990
- 1990-03-13 JP JP2061461A patent/JPH03263706A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007261893A (en) * | 2006-03-29 | 2007-10-11 | Ntn Corp | Dielectric ceramic and method of producing the same |
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