JPH03257539A - Continuous test system for peripheral device - Google Patents

Continuous test system for peripheral device

Info

Publication number
JPH03257539A
JPH03257539A JP2057011A JP5701190A JPH03257539A JP H03257539 A JPH03257539 A JP H03257539A JP 2057011 A JP2057011 A JP 2057011A JP 5701190 A JP5701190 A JP 5701190A JP H03257539 A JPH03257539 A JP H03257539A
Authority
JP
Japan
Prior art keywords
data
data comparison
test
comparison error
peripheral device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2057011A
Other languages
Japanese (ja)
Inventor
Junko Tsutagawa
蔦川 順子
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP2057011A priority Critical patent/JPH03257539A/en
Publication of JPH03257539A publication Critical patent/JPH03257539A/en
Pending legal-status Critical Current

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  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE:To inhibit the continuation of a meaningless test when a data comparison error is produced due to a fixed fault of a peripheral device by ending the test if the data comparison errors exceed continuously a certain level of frequency after the reading actions are carried out in the continuous tests of the peripheral device. CONSTITUTION:The written data are read out and compared with the expected read data. If a data comparison error occurs, a data comparison error message is outputted and then '1' is added to a data comparison error counter. Then the value of this counter is compared with the prescribed value. If the former value is larger than the latter one, a test under execution is ended. Meanwhile it is decided whether a test was carried out to the entire surface of a working medium or not when the counter value is smaller than the prescribed value. If so, the test is ended. Thus it is possible to decrease the meaningless data with which the data comparison error messages are outputted for each reading action of data. Then the test time of a peripheral device is shortened.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、情報処理システムに利用される周辺装置の連
続試験方式に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a continuous testing method for peripheral devices used in information processing systems.

〔従来の技術〕[Conventional technology]

従来、周辺装置の持続性を試験する為に、使用媒体の全
面に対して、書込動作と、書込動作の正常性を調べるの
に行う読出動作とを繰返し行うが、このような周辺装置
の連続試験における終了条件は、使用する媒体の全面に
対して試験が終了することであった。
Conventionally, in order to test the durability of a peripheral device, a write operation and a read operation to check the normality of the write operation are repeatedly performed on the entire surface of the medium used. The termination condition for the continuous test was that the test was completed on the entire surface of the medium used.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述した従来の周辺装置の連続試験方式は、周辺装置の
終了条件が使用した媒体の全面に対して試験が終了する
ことであるため、周辺装置の固定障害が原因でデータ比
較エラーが発生した場合、読出動作毎にデータ比較エラ
ーメツセージが出力されるので無意味なデータが多く出
力され、試験終了までに非常に時間がかかるという欠点
があった。
In the conventional continuous test method for peripheral devices described above, the termination condition for the peripheral device is that the test is completed on the entire surface of the medium used, so if a data comparison error occurs due to a fixed failure in the peripheral device, However, since a data comparison error message is output every time a read operation is performed, a large amount of meaningless data is output, and it takes a very long time to complete the test.

〔課題を解決するための手段〕[Means to solve the problem]

本発明の周辺装置の連続試験方式は、周辺装置から読出
されたデータと期待読出データとでデータ比較を行う手
段と、 該データ比較を行った結果、読出されたデータと期待読
出データとで不一致が生じた際、データ比較エラーメツ
セージを出力する機能と、前記不一致が生じた際、デー
タ比較エラーカウンタに1を加える手段と、 前記データ比較エラーカウンタがある規定値になったら
連続試験を終了させる手段と、読出動作を行った結果、
読出されたデータと期待読出データとが一致した際は前
記データ比較エラーカウンタを0クリアする手段とを含
むことを特徴とする。
The continuous test method for peripheral devices of the present invention includes means for comparing data read from the peripheral device and expected read data, and detecting a mismatch between the read data and the expected read data as a result of the data comparison. a function for outputting a data comparison error message when a discrepancy occurs; a means for adding 1 to a data comparison error counter when the discrepancy occurs; and a means for terminating the continuous test when the data comparison error counter reaches a certain predetermined value. As a result of performing the reading operation,
The method is characterized in that it includes means for clearing the data comparison error counter to 0 when the read data and the expected read data match.

〔実施例〕〔Example〕

次に、本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.

第1図は本発明を適用した周辺装置の試験方式のフロー
チャートであり、第2図は本実施例の機器構成のブロッ
ク図である。本機器はプログラムの制御を行う中央処理
装置1.プログラムを格納するメモリ2.操作者とプロ
グラムのインタフェースをつかさどるシステムコンソー
ル3及び被試験対象装置4から構成される。
FIG. 1 is a flowchart of a peripheral device testing method to which the present invention is applied, and FIG. 2 is a block diagram of the equipment configuration of this embodiment. This device is a central processing unit that controls programs. Memory for storing programs 2. It consists of a system console 3 that controls the interface between the operator and the program, and a device under test 4.

第1図において、まずステップ100でデータ比較エラ
ーカウンタをOクリアする。そしてステップ101で書
込動作を行い、ステップ102でステップ101で書込
まれたデータに対する読出動作を行った後、読出された
データと期待読出データとのデータ比較を行う。
In FIG. 1, first, in step 100, a data comparison error counter is cleared to zero. Then, in step 101, a write operation is performed, and in step 102, a read operation is performed on the data written in step 101, and then a data comparison is performed between the read data and expected read data.

次にステップ103の判断でデータ比較エラーが発生し
たら、ステップ104でデータ比較エラーメツセージを
出力した後、データ比較エラーカウンタに1を加える。
Next, if a data comparison error occurs as determined in step 103, a data comparison error message is output in step 104, and then 1 is added to the data comparison error counter.

その後、ステップ105でデータ比較エラーカウンタを
規定値と比較し、データ比較エラーカウンタの方が大き
ければ試験を終了し、小さければステップ106で使用
媒体の全面に対して試験を行なったかを判断し、全面に
対して行っていれば試験を終了し、行っていなければス
テップ101の書込動作にもどる。
Thereafter, in step 105, the data comparison error counter is compared with a specified value, and if the data comparison error counter is larger, the test is terminated, and if it is smaller, it is determined in step 106 whether the entire surface of the medium to be used has been tested. If the test has been performed on the entire surface, the test ends, and if the test has not been performed, the process returns to step 101 for the write operation.

一方、ステップ103でデータ比較エラーが発生しなか
った場合は、ステップ107でデータ比較エラーカウン
タをOクリアしてステップ106の判断を行う。
On the other hand, if no data comparison error has occurred in step 103, the data comparison error counter is cleared to O in step 107, and the determination in step 106 is made.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は、周辺装置の連続試験で読
出動作を行った結果、データ比較エラーが連続しである
規定回数発生したら試験を終了する処理を追加すること
により、周辺装置の固定障害が原因でデータ比較エラー
が発生した場合に無意味な試験を続行することなく終了
する為、システムを有効に利用できる効果がある。
As explained above, the present invention solves the problem of a fixed fault in a peripheral device by adding a process of terminating the test when a data comparison error occurs a specified number of times in succession as a result of performing a read operation in a continuous test of the peripheral device. If a data comparison error occurs due to this, the system is terminated without continuing a meaningless test, which allows the system to be used more effectively.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の周辺装置の試験方式のフローチャート
、第2図は本実施例の機器構成のブロック図である。 1・・・中央処理装置、2・・・メモリ、3・・・シス
テム第 ! 図
FIG. 1 is a flowchart of a peripheral device testing method according to the present invention, and FIG. 2 is a block diagram of the equipment configuration of this embodiment. 1...Central processing unit, 2...Memory, 3...System number! figure

Claims (1)

【特許請求の範囲】 周辺装置から読出されたデータと期待読出データとでデ
ータ比較を行う手段と、 該データ比較を行った結果、読出されたデータと期待読
出データとで不一致が生じた際、データ比較エラーメッ
セージを出力する機能と、 前記不一致が生じた際、データ比較エラーカウンタに1
を加える手段と、 前記データ比較エラーカウンタがある規定値になったら
連続試験を終了させる手段と、 読出動作を行った結果、読出されたデータと期待読出デ
ータとが一致した際は前記データ比較エラーカウンタを
0クリアする手段とを含むことを特徴とする周辺装置の
連続試験方式。
[Claims] Means for comparing data between data read from a peripheral device and expected read data, and when a mismatch occurs between the read data and the expected read data as a result of the data comparison, The function outputs a data comparison error message, and when the above discrepancy occurs, the data comparison error counter is set to 1.
means for terminating the continuous test when the data comparison error counter reaches a certain predetermined value; and means for terminating the continuous test when the data comparison error counter reaches a certain predetermined value; and means for clearing a counter to zero.
JP2057011A 1990-03-07 1990-03-07 Continuous test system for peripheral device Pending JPH03257539A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2057011A JPH03257539A (en) 1990-03-07 1990-03-07 Continuous test system for peripheral device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2057011A JPH03257539A (en) 1990-03-07 1990-03-07 Continuous test system for peripheral device

Publications (1)

Publication Number Publication Date
JPH03257539A true JPH03257539A (en) 1991-11-18

Family

ID=13043501

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2057011A Pending JPH03257539A (en) 1990-03-07 1990-03-07 Continuous test system for peripheral device

Country Status (1)

Country Link
JP (1) JPH03257539A (en)

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