JPH03252826A - Test data processing system - Google Patents

Abstract

PURPOSE:To easily know the changes of a program during execution of a test and the test data by executing directly the test data at a memory position shown in a program list. CONSTITUTION:When a test is over at a test executing part 12, a display deciding means 13 is started and discriminates the display added to the test data. When the execution of a rewriting job is confirmed from the deciding result of the means 13, the next save area restoring means 14 is driven to store the test data saved in a saving area 18 of a memory into an original load area 17. Thus the contents of the area 17 having the contents changed with the execution of a test are erased and the original test data are restored. Thus it is possible to know the state of the test data as necessary during the execution of a test with the use of an address designated by a program.

Description

[Detailed Description of the Invention] [Summary] This invention relates to a test data processing method for a data processing device that performs a test by loading test data indicating test conditions and a test program that executes the test according to the instructions of the test data into memory. .

The purpose of the present invention is to provide a test data processing method that allows easy reference to memory contents during the execution of a test using a test program and test data, and also allows tests to be repeatedly executed under the same test conditions.

The test data saving means that is activated before the test execution saves the test data in the memory load area to the save area, and the test execution unit that executes the test using the test program and test data in the memory load area rewrites the test data. Determines whether or not the test data that is currently being tested is rewritten by the determination means, and the display addition means adds an indication identifying the determination result to the test data, and displays the identification indication of the test data used at the end of the test. The test data is determined by the determination means, and when there is a rewriting identification display, the save area return means is driven and the test data in the save area is stored in the original load area.

[Industrial application field] The present invention uses test data that indicates test conditions.

The present invention relates to a test data processing method for a data processing device that performs a test by loading a test program into a memory to execute a test according to instructions of the test data.

In recent years, test programs for testing the functions of various electronic devices controlled by programs such as the information processing device 9 and the communication device have been prepared to test the devices. In that case, the test program is loaded from an external storage device into a processing device that executes the test, and then execution conditions are set for the device to be tested and the test program is executed.

The procedure is to determine whether the execution result matches preset result check conditions and to output the test result. Data such as execution conditions and result check conditions among these are called test data.

This test data may include data that changes during test execution, and if there is data that changes, at the end of the test, the test data will be different from the original loaded content.

If the test data has different contents, it becomes difficult to test other test target devices of the same type under the same conditions, so a countermeasure is desired.

[Conventional technology] FIG. 4 is an explanatory diagram of a conventional example.

As shown at A in FIG. 4, a test program (including test data) stored in a file such as a magnetic tape 40 is loaded onto the memory 41 of the processing device. By this loading, a test program 411 and test data 412 are stored in areas a and b, respectively, on the memory 41.

As shown in FIG. 4B, the test program (corresponding to the test item) is, for example, an interpretive format program, and has a configuration in which control words are arranged. The control words are decoded (by an interpreter) during test execution to issue corresponding operating instructions to the device being tested. Also,
Test data includes execution conditions for setting the states of related parts during test execution and result check conditions for determining when the test results are good and when they result in a failure (error). is stipulated.

Note that the test data can be used by dividing it into a plurality of blocks (2), (2), (2), etc. corresponding to a plurality of test items.

To explain the operation during conventional test execution, the magnetic tape 40
Test program 4 loaded into memory 41 from
11 and the contents of the test data 412 are required to be able to perform tests under the same conditions any number of times until another test data program is loaded.

For this reason, conventionally, each time a test was executed, the test was carried out using the data that was pulled up after being pulled up to the work area 410 for test execution.

That is, when a test is executed, a test operation is performed according to a test program using the test data stored in the 9 work area 410. The contents of the original test data 412 at the loaded location are then unaffected by the test execution.

Even if the contents of the test data are rewritten by the test execution using such a method, only the contents of one work area 410 are rewritten, and the contents of the original test data 412 do not change at all.

When such a test is executed again on the same device (test target device) using the contents of the memory 41, or when the same test is executed on another device of the same type, the contents of the dual test data 412 are used. Since the test data has not changed, it is possible to always execute the test under the same conditions by re-uploading the test data to the work area 410.

[Problem II to be Solved by the Invention] According to the conventional example described above, test data is collected in two work areas, and test processing by a test program is performed using the data in the work areas.

However, in a test such as debugging using a test program, there are cases where it is desired to check the test data indexing process on the memory, the content of the test data, etc. during the test execution.

In that case, conventionally the original position shown on the program list (the position in the original test data 412 in FIG. 4A)
Since the processing is being performed in the work area 410, which is a memory area different from that of the work area 410, it is not possible to refer to the memory using the address directly specified by the program list.In such cases, conventionally, the start address of the work area 410 and It was necessary to perform calculation work such as obtaining and compiling a relative address from the start position to the required test data.

However, there is a problem in that the address calculation work complicates debugging and other work, and also causes work errors.

The present invention provides a test data processing method that allows easy reference to memory contents during execution of a test using a test program and test data, and allows repeated execution of tests under the same test conditions. purpose.

[I! [Means to solve the problem] FIG. 1 is a diagram showing the principle configuration of the present invention.

In FIG. 1, 10 is a processing device, 11 is a test data saving means, 12 is a test execution unit, 121 is a test data rewriting determining means, 122 is a display adding means, 13 is a display determining means, 14 is a save area return means, 15 is memory, 1
Reference numeral 6 represents a load area where a test program is stored during loading, 17 represents a load area where test data is stored during loading, and 18 represents a save area where test data is saved.

The present invention saves the test data loaded into memory to another area in memory before executing the test.

The test is executed on the test data loaded in the memory, and if the test data is rewritten during the test, that display is added to the test data, and when the test is finished, the display is checked and if it has been rewritten, it is saved. This returns the contents of the area to the original test data area in memory.

[Function] When performing a test, the memory 15 is saved from the file as before.
Test programs and test data are stored in respective load areas 16 and 17. Load area 1 in this
7 is called the original area of the test data.

When the processing device IO executes the test, it first activates the test data saving means 11. The test data saving means 11 saves the test data in the load area 17 of the memory 15 to a save area 18 in another location in the memory.
Save to.

Next, the test execution unit 12 is driven to execute the test. The test is executed using the test program in the load area 16 and the test data in the load area 17 of the memory 15. First, the test data rewriting determining means 121 determines whether or not the test data is to be rewritten in the execution of the test program, and if rewriting is to be performed, the display adding means 122 is driven to identify the fact. A display is added to the test data in the load area 17. This rewriting determination and display addition may be performed by examining the test program before the test is executed, or may be performed when the test is executed.

When the test in the test execution unit 12 is completed, the 9 display determination means 13 is activated and determines the display added to the test data. If it is found in this judgment that rewriting has been performed, the ninth save area return means 14 is driven. The save area restoration means 14 stores the test data saved in the save area 18 of the memory in the original load area 17.

As a result, the contents of the load area 17 that have changed due to the test execution are erased, and the original test data is restored.

In this way, tests can be performed on other devices using the restored original test data (under the same conditions). Also, if you want to know the state of the test data during test execution, you can do so using the address specified by the program.

[Embodiment] FIG. 2 is a processing flow diagram of an embodiment, and FIG. 3 is a configuration example of an information processing apparatus in which the present invention is implemented.

First, to explain the configuration example in FIG. 3, 30 is a CPU;
Reference numeral 1 represents a memory, 32 an interface, 33 a test target device such as a communication control device or a terminal device that performs processing by a program, 34 a magnetic tape control device, and 35 a magnetic tape device.

The test program and test data stored in the magnetic tape device 35 are loaded into the memory 31.
It is stored in each area A and B in the area. In area B where the test data is stored, the test data is divided into test execution units (2), (2), (2), etc. corresponding to each test phase.

As the test phase, tests are prepared in advance corresponding to the device under test 33, such as a basic test for checking basic functions, a data write test, and a read test.

In the system as described above, the processing flow executed after the test program and test data are loaded into the memory 31 will be explained with reference to FIG.

Upon starting the test, test data saving processing (20 in FIG. 2) is first performed. In the example in Figure 3.

Save area C where the first test execution unit ■ is predetermined
Shifts to the 0th order test execution process (21) stored in
The test program in area A (using an interpretive format program) performs test execution processing on the test data of test execution unit (2) in area B. In the process of this process, it is determined whether or not the test data has been rewritten (210), and if the test data is changed, a test data recovery necessary display flag is added to a part of the test data. (220), specifically, a 1-bit display flag is provided.

Turn on that content.

Thereafter, the test execution continues, and if the test data is not rewritten during the test, the display flag remains off.

When the test execution process for test execution unit ■ is completed,
The test results are processed in the same manner as in the past, such as being stored in another area of the memory or being output and displayed on an input/output device (not shown).

When the test execution process is completed, it is determined whether or not test data recovery is necessary (step 22).This determination is made by checking the above-mentioned display flag and if it is on.

The contents of test execution unit (■) in area B have been changed from the original contents, and recovery is required. In this case, the test data recovery process (23) is executed.

Through this process, the original test data of the test execution unit ■ saved in the save area C of the memo 1J31 in FIG. 3 is written to the position of the test execution unit ■ in the area B. As a result, even after the test is finished, the test data that remains unchanged is stored in the original area B.

When this test data recovery is not necessary or when test data recovery is necessary and the process is completed, it is determined that the test has ended (see 24).This determination determines whether all the specified test execution units have been executed. , if there are still remaining test execution units, the next test execution unit is tested. In this example, 2
Next, test data save processing (
21), and the above-mentioned processing flow is executed in the same way, and when it is completed, the next test execution unit ■ Each of the following tests is executed, and when the tests of all the determined test execution units are completed, the test is executed. finish.

[Effects of the Invention] According to the present invention, by directly executing test data at the memory location indicated in the program list, it is possible to easily know how the program and test data change during test execution.

After the test is completed, the test data is returned to its original initial content, making it possible to perform tests on other devices under the same conditions, making it possible to perform highly reliable and efficient test program debugging and maintenance work.

[Brief explanation of drawings]

FIG. 1 is a diagram showing the principle configuration of the present invention, FIG. 2 is a processing flow diagram of an embodiment, FIG. 3 is a configuration example of an information processing device in which the present invention is implemented, and FIG. 4 is an explanatory diagram of a conventional example. . In Figure 1. 10: Processing device 11: Test data saving means 12: Test execution unit 121: Test data rewriting determining means 122: Display adding means 13: Display determining means 14: Save area return means 15: Memory 16: Program loading area 17: Test Data load area 18: Test data save area

Claims (1)

[Claims] In a data processing device that performs a test by loading test data that specifies test conditions and a test program that executes the test according to the instructions of the test data into memory, the test data is started before the test is executed. Save means (11)
saves the test data in the load area (17) of the memory (15) to the save area (18), and executes the test using the test program and test data in the memory load area (16, 17). 1
2), the test data rewriting determining means (121) determines whether the test data being tested is to be rewritten, and the display adding means (122) adds a display identifying the determination result to the test data; The identification display of the test data used at the end of the test is determined by the display judgment means (13), and if there is an identification display for rewriting, the save area return means (14)
) is driven to store the test data in the save area (18) into the original load area (17).