JPH03231124A - Apparatus for measuring diameter of light beam - Google Patents

Apparatus for measuring diameter of light beam

Info

Publication number
JPH03231124A
JPH03231124A JP2751090A JP2751090A JPH03231124A JP H03231124 A JPH03231124 A JP H03231124A JP 2751090 A JP2751090 A JP 2751090A JP 2751090 A JP2751090 A JP 2751090A JP H03231124 A JPH03231124 A JP H03231124A
Authority
JP
Japan
Prior art keywords
light beam
slits
light
slit
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2751090A
Other languages
Japanese (ja)
Inventor
Hideyuki Ishimaru
秀行 石丸
Masahiro Nakashiro
正裕 中城
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP2751090A priority Critical patent/JPH03231124A/en
Publication of JPH03231124A publication Critical patent/JPH03231124A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To measure the shapes and the diameters of light beams in the two directions on the same cross section at the same time by providing two slits which are not in parallel to each other on one plane that is orthogonal to the light axes of the light beams, moving the slits, and detecting the amount of transmitted light. CONSTITUTION:Slits 2a and 2b are provided so that the slits are intersected as a right angle. The amount of a light beam 1 to be measured which has passed through each slit is detected with a photodetector 3 and inputted into an amplifier circuit 6. A device 4 linearly moves the slits 2a and 2b so that each slit forms 45 deg. with respect to the longitudinal direction. A position detector 5 obtains the relative positions of the slits 2a and 2b. In this way, the light beam 1 is made to scan in the two orthogonally intersecting directions at the same cross section. Since the amount of each light beams passing through the slits 2a and 2b is sequentially changed, the shapes and the diameters of the light beam in the X and Y directions can be measured.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、光ビームを発生する機器における光ビーム径
を測定する測定装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a measuring device for measuring the diameter of a light beam in a device that generates a light beam.

従来の技術 以下、従来のスリットを用いた光ビーム径の従来の測定
装置について図面を参照して説明する。
2. Description of the Related Art Hereinafter, a conventional measuring device for measuring the diameter of a light beam using a conventional slit will be described with reference to the drawings.

第4図において、1はレーザ光などの光ビーム、2はス
リットで、X軸方向に移動可能になっている。3は、光
検出器である。
In FIG. 4, 1 is a light beam such as a laser beam, and 2 is a slit, which is movable in the X-axis direction. 3 is a photodetector.

以上のように構成された従来例について、以下その動作
について説明する。
The operation of the conventional example configured as described above will be described below.

レーザ光などの光ビーム1は、ビーム径測定位置に設け
た光軸と垂直な方向にXに移動可能になっているスリッ
ト2の存在する平面に入射する。スリット2の移動によ
り、光検出器3で検出され条光量は変化する。その光量
の信号とスリット2の移動量から光、ビームの形状及び
ビーム径を測定することができる。
A light beam 1 such as a laser beam is incident on a plane in which a slit 2, which is movable in the direction X perpendicular to the optical axis, is provided at a beam diameter measurement position. As the slit 2 moves, the amount of light detected by the photodetector 3 changes. The light, the shape of the beam, and the beam diameter can be measured from the signal of the amount of light and the amount of movement of the slit 2.

発明が解決しようとする課題 しかしながら上記のような構成では、同一断面上で一度
に1方向の光ビーム径しか測定できないので、これと異
なった方向の光ビーム径を測定するためにはスリットを
その方向に回転させて測定する必要があり、同一平面上
の2方向のビーム径をほぼ同時に測定することは機械的
に困難であるという問題点を有していた。
Problems to be Solved by the Invention However, with the above configuration, the diameter of the light beam can only be measured in one direction at a time on the same cross section, so in order to measure the diameter of the light beam in a different direction, the slit must be The problem is that it is mechanically difficult to measure beam diameters in two directions on the same plane almost simultaneously.

本発明は上記問題点に鑑み、同一断面上で2方向の光ビ
ーム径を同時に測定することができる光ビーム径測定装
置を提供するものである。
In view of the above-mentioned problems, the present invention provides a light beam diameter measuring device that can simultaneously measure light beam diameters in two directions on the same cross section.

課題を解決するための手段 上記課題を解決するために本発明の光ビーム径測定装置
は、光ビームの光軸と垂直な同一平面内において互いに
平行でない2つのスリットと、これら2つのスリットを
光ビームの光軸と垂直方向に移動させる移動装置と、ス
リットを透過してくる光ビームの透過光量を検出する光
検出器とを有するものである。
Means for Solving the Problems In order to solve the above problems, the light beam diameter measuring device of the present invention has two slits that are not parallel to each other in the same plane perpendicular to the optical axis of the light beam, and a light beam that connects these two slits. It has a moving device that moves the beam in a direction perpendicular to the optical axis of the beam, and a photodetector that detects the amount of transmitted light of the light beam that passes through the slit.

作   用 本発明は上記構成によって、1方向の直線運動で光ビー
ムに対して2方向にスリットを走査できるため、同一断
面上で2方向の光ビームの形状及び径を同時に測定でき
る。
Operation With the above configuration, the present invention can scan the slit in two directions with respect to the light beam by linear movement in one direction, so that the shape and diameter of the light beam in two directions can be measured simultaneously on the same cross section.

実  施  例 以下本発明の一実施例における光ビーム径測定装置につ
いて、図面を参照しながら説明する。第1図において、
1は被測定光ビーム、2aはX方向のビーム形状及び径
を測定するスリット、2bはY方向のビーム形状及び径
を測定するスリットでこれらスリット2a、2bは互い
に直交するように設けられている。3は光検出器でスリ
ット2a。
Embodiment A light beam diameter measuring device according to an embodiment of the present invention will be described below with reference to the drawings. In Figure 1,
1 is a light beam to be measured, 2a is a slit for measuring the beam shape and diameter in the X direction, and 2b is a slit for measuring the beam shape and diameter in the Y direction.These slits 2a and 2b are provided to be orthogonal to each other. . 3 is a photodetector with a slit 2a.

2bを透過してきた光ビームの光量を検出し電気信号に
変換する。その後検出器3の光信号は、増幅回路6で増
幅されることによって光ビーム形状に相当する信号が得
られる。また4はスリット2a。
The amount of light beam transmitted through 2b is detected and converted into an electrical signal. Thereafter, the optical signal from the detector 3 is amplified by an amplifier circuit 6 to obtain a signal corresponding to the shape of the optical beam. Also, 4 is the slit 2a.

2bをそれぞれの長手方向と45°をなす方向に直線運
動させるための移動装置であり、例えばステッピングモ
ータ、セラミック振動子等を用いることができる。そし
て、位置検出器5により得られたスリットの相対位置か
ら光ビーム径が求められる。
This is a moving device for linearly moving 2b in a direction making 45° with respect to each longitudinal direction, and for example, a stepping motor, a ceramic vibrator, etc. can be used. Then, the light beam diameter is determined from the relative position of the slit obtained by the position detector 5.

以上のように構成された光ビーム径測定装置について、
以下第2図a −iを用いてその動作原理を説明する。
Regarding the light beam diameter measuring device configured as above,
The principle of operation will be explained below using FIGS. 2a-i.

スリット2a、2bをそれぞれの長手方向と45゜をな
す方向に直線運動させることによって被測定光ビーム1
とスリット2a、2bの関係は、同図aからiのように
変化する。まず同図aでは被測定光ビーム1は、全く透
過しない。b、c、deではスリット2aによって被測
定光ビーム1の透過光量は、順次変化し、X方向の光ビ
ーム形状及び径を測定したことになる。次のf、g、h
iは、スリット2bによって被測定光ビーム1のY方向
のビーム形状及び径を測定したことになる。
By linearly moving the slits 2a and 2b in a direction making a 45° angle with the respective longitudinal directions, the light beam 1 to be measured is
The relationship between the slits 2a and 2b changes from a to i in the figure. First, in figure a, the light beam 1 to be measured is not transmitted at all. In b, c, and de, the amount of transmitted light of the light beam 1 to be measured changes sequentially through the slit 2a, and the shape and diameter of the light beam in the X direction are measured. Next f, g, h
i means that the beam shape and diameter in the Y direction of the light beam 1 to be measured are measured by the slit 2b.

従って、被測定光ビーム1を同一断面において直交する
2方向から走査したことになる。
Therefore, the light beam 1 to be measured is scanned from two orthogonal directions in the same cross section.

またiからaに変化する場合も同じで、Y方向に走査し
た後にX方向に走査することができる。
The same applies to the case of changing from i to a, and it is possible to scan in the Y direction and then scan in the X direction.

以上のように本実施例によれば、光ビーム1の光軸と直
交する同一平面内において、互いに直交する2つのスリ
ット2a、2bを設けたことにより、同一断面上でX及
びY方向の2方向の光ビーム1の形状及び径を同時に測
定することができる。
As described above, according to this embodiment, by providing two slits 2a and 2b orthogonal to each other in the same plane orthogonal to the optical axis of the light beam 1, two slits in the X and Y directions are provided on the same cross section. The shape and diameter of the light beam 1 in the direction can be measured simultaneously.

本発明は上記実施例に示すほか、種々の態様に構成する
ことができる。例えば2つのスリットが長手方向におい
て互いになす角度や、2つのスリットの移動方向は上記
実施例に示すものに限定されず必要に応じて適宜設定す
ることができる。
The present invention can be configured in various ways other than those shown in the above embodiments. For example, the angle that the two slits make with each other in the longitudinal direction and the direction of movement of the two slits are not limited to those shown in the above embodiments, but can be set as appropriate as necessary.

発明の効果 以上のように本発明によれば、同一断面上で、2方向の
光ビームの形状及び径を同時に設定することができる。
Effects of the Invention As described above, according to the present invention, the shape and diameter of the light beam in two directions can be set simultaneously on the same cross section.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例における光ビーム径ある。 1・・・・・・被測定光ビーム、2a、2b・・・・・
・スリット、3・・・・・・光検出器、4・・・・・・
移動装置。
FIG. 1 shows the diameter of a light beam in one embodiment of the present invention. 1... Light beam to be measured, 2a, 2b...
・Slit, 3...Photodetector, 4...
Mobile device.

Claims (1)

【特許請求の範囲】[Claims] 光ビームの光軸と直行する同一平面内において、互いに
平行でない2つのスリットと、これら2つのスリットを
光ビームの光軸と垂直な平面内で移動させる移動装置と
、前記スリットから透過する光ビームの透過光量を検出
する光検出器とを備えたことを特徴とする光ビーム径測
定装置。
two slits that are not parallel to each other in the same plane perpendicular to the optical axis of the light beam, a moving device that moves these two slits in the plane perpendicular to the optical axis of the light beam, and a light beam transmitted from the slits. A light beam diameter measuring device comprising: a photodetector for detecting the amount of transmitted light.
JP2751090A 1990-02-07 1990-02-07 Apparatus for measuring diameter of light beam Pending JPH03231124A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2751090A JPH03231124A (en) 1990-02-07 1990-02-07 Apparatus for measuring diameter of light beam

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2751090A JPH03231124A (en) 1990-02-07 1990-02-07 Apparatus for measuring diameter of light beam

Publications (1)

Publication Number Publication Date
JPH03231124A true JPH03231124A (en) 1991-10-15

Family

ID=12223131

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2751090A Pending JPH03231124A (en) 1990-02-07 1990-02-07 Apparatus for measuring diameter of light beam

Country Status (1)

Country Link
JP (1) JPH03231124A (en)

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