JPH032244U - - Google Patents

Info

Publication number
JPH032244U
JPH032244U JP6118989U JP6118989U JPH032244U JP H032244 U JPH032244 U JP H032244U JP 6118989 U JP6118989 U JP 6118989U JP 6118989 U JP6118989 U JP 6118989U JP H032244 U JPH032244 U JP H032244U
Authority
JP
Japan
Prior art keywords
detector
comparison
light source
cell
infrared
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6118989U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0623958Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6118989U priority Critical patent/JPH0623958Y2/ja
Publication of JPH032244U publication Critical patent/JPH032244U/ja
Application granted granted Critical
Publication of JPH0623958Y2 publication Critical patent/JPH0623958Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP6118989U 1989-05-27 1989-05-27 赤外線分析計 Expired - Lifetime JPH0623958Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6118989U JPH0623958Y2 (ja) 1989-05-27 1989-05-27 赤外線分析計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6118989U JPH0623958Y2 (ja) 1989-05-27 1989-05-27 赤外線分析計

Publications (2)

Publication Number Publication Date
JPH032244U true JPH032244U (zh) 1991-01-10
JPH0623958Y2 JPH0623958Y2 (ja) 1994-06-22

Family

ID=31589219

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6118989U Expired - Lifetime JPH0623958Y2 (ja) 1989-05-27 1989-05-27 赤外線分析計

Country Status (1)

Country Link
JP (1) JPH0623958Y2 (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007099423A (ja) * 2005-10-03 2007-04-19 Duplo Corp 給紙装置
JP2010210251A (ja) * 2009-03-06 2010-09-24 Yazaki Corp 濃度測定装置

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19925196C2 (de) * 1999-05-26 2001-12-13 Inst Chemo Biosensorik Gassensoranordnung
JP6608514B2 (ja) * 2017-12-22 2019-11-20 旭化成エレクトロニクス株式会社 光学式濃度測定装置および光学式濃度測定装置の制御方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61223633A (ja) * 1985-03-29 1986-10-04 Yokogawa Electric Corp 赤外線ガス分析計

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61223633A (ja) * 1985-03-29 1986-10-04 Yokogawa Electric Corp 赤外線ガス分析計

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007099423A (ja) * 2005-10-03 2007-04-19 Duplo Corp 給紙装置
JP2010210251A (ja) * 2009-03-06 2010-09-24 Yazaki Corp 濃度測定装置

Also Published As

Publication number Publication date
JPH0623958Y2 (ja) 1994-06-22

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