JPH03214743A - Manufacturing system of semiconductor device - Google Patents

Manufacturing system of semiconductor device

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Publication number
JPH03214743A
JPH03214743A JP970890A JP970890A JPH03214743A JP H03214743 A JPH03214743 A JP H03214743A JP 970890 A JP970890 A JP 970890A JP 970890 A JP970890 A JP 970890A JP H03214743 A JPH03214743 A JP H03214743A
Authority
JP
Japan
Prior art keywords
manufacturing
semi
semiconductor device
control unit
manufacturing apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP970890A
Other languages
Japanese (ja)
Inventor
Toshiaki Onozawa
小野沢 俊明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP970890A priority Critical patent/JPH03214743A/en
Publication of JPH03214743A publication Critical patent/JPH03214743A/en
Pending legal-status Critical Current

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  • General Factory Administration (AREA)

Abstract

PURPOSE:To improve the utilization factor of equipment by a method wherein a reference control part which obtains respective manufacturing conditions in accordance with information from a central control unit is provided and, further, an automatic condition setting part which sets the manufacturing conditions automatically is provided. CONSTITUTION:A storage case 3 in which unfinished goods or finished goods are stored and which has an individual identification mark 31, a central control unit 2 which receives information from each manufacturing apparatus and transmits information corresponding to the received information to each manufacturing apparatus through a communication line 4 and which has a communication control part 21, a communication control part 12 which transmits the detected identification mark 31 from the manufacturing apparatus 1 to the central control unit 2 through the communication line 4, and an automatic condition setting part 15 which sets the conditions for the respective processing means automatically in accordance with the given manufacturing conditions and which is incorporated by the manufacturing apparatus 1 are provided. With this constitution, the equipment utilization factor can be improved and high productivity multiple-type small-quantity production can be realized.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、半導体装置の製造システムに関し、特に少量
多品種の半導体装置の生産に使用される製造システムに
関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a manufacturing system for semiconductor devices, and more particularly to a manufacturing system used for manufacturing a wide variety of semiconductor devices in small quantities.

〔従来の技術〕[Conventional technology]

近年、半導体装置の需要は、家電製品、工業用電子機器
、輸送機器及び通信機器に使用される電子部品のIC化
に伴ない、増々増加の一途を辿っている。また、その品
種は様々で、特に、パッケージの形状あるいはその大き
さとか、ベレットの大きさとが異なり、生産としては、
拡散ずみのウェーハよりペレットである半導体チップを
切り出すグイシング工程から半導体チップを樹脂封止す
る迄のペレット以降の生産については、所謂多品種少量
生産である。従って、効率よく設備を稼働しないかぎり
、生産性が上らず、コストが下らないとい状態である。
In recent years, the demand for semiconductor devices has continued to increase as electronic components used in home appliances, industrial electronic equipment, transportation equipment, and communication equipment have become integrated circuits. In addition, there are various varieties, especially in the shape and size of the package, and the size of the pellet, and in terms of production,
The production process from the guising process of cutting semiconductor chips in the form of pellets from the diffused wafer to the process of sealing the semiconductor chips with resin is so-called high-mix, low-volume production. Therefore, unless equipment is operated efficiently, productivity will not increase and costs will not decrease.

このため、製造ラインの各製造装置を出来るだけ汎用的
な設備に置き変え、バッチ式の生産を行なったり、ある
いはラインに流す品種を出来るだけ統一して、部品を投
入し、ライン生産を行ない能率を上げて実施していた。
For this reason, each manufacturing device on the production line is replaced with general-purpose equipment as much as possible, and batch-type production is performed, or the types of products flowing on the line are unified as much as possible, parts are input, and line production is performed to increase efficiency. It was implemented with a high level of

第3図は従来の半導体装置の製造システムの一例を説明
するための製造装置のブロック図である。
FIG. 3 is a block diagram of a manufacturing apparatus for explaining an example of a conventional semiconductor device manufacturing system.

例えば、通常、この製造システムにおける各製造装置1
bは、同図に示すように、半導体装置の半製品であるペ
レット、リードフレーム及びボンティング材等を収納ず
る収納ケース3bを搭載する供給部3aと、供給された
半製品に必要な加工を与える機構部及び加工ステージ1
6と、これら機構部及び加工ステージ16を制御する制
御装置とから構成されている。また、この半製品を加工
するに際しては、作業者が半製品に付随している管理票
からその半製品の型式名称を知り、あらかじめ定められ
た型式名称と製造加工条件の一覧表から、必要な条件を
見出し、製造装置1bにその製造条件を設定し加工して
いた。
For example, normally each manufacturing device 1 in this manufacturing system
As shown in the figure, b is a supply section 3a equipped with a storage case 3b for storing semiconductor device semi-finished products such as pellets, lead frames, bonding materials, etc., and a supply section 3a for carrying out necessary processing on the supplied semi-finished products. Feeding mechanism and processing stage 1
6, and a control device that controls these mechanical parts and the processing stage 16. In addition, when processing this semi-finished product, the operator learns the model name of the semi-finished product from the control sheet attached to the semi-finished product, and from the list of predetermined model names and manufacturing processing conditions, The conditions were found, and the manufacturing conditions were set in the manufacturing equipment 1b for processing.

第4図は従来の半導体装置の製造システムの他の例を説
明するためのブロック図である。また、別の製造システ
ムとして、例えば、同図に示すように、各製造装置1c
を群管理する上位の制御手段である中央制御装置2aが
ある場合には、半製品あるいは半製品の収納ケース3に
表示された半製品の型式名称を製造装置1bの検出部1
lbが検出し、これを製造装置1bの通信制御部12b
で通信回線4を介して中央制御装置2aの通信制御部2
1aに送ることで、この中央制御装置2aの対応表記憶
部14aにあらかじめ登録された型式名称と製造加工条
件との対応表から、特定の製造加工条件を検索し、これ
を表示装置2oに通信回線4を介して送り、製造加工条
件を表示する。
FIG. 4 is a block diagram for explaining another example of a conventional semiconductor device manufacturing system. In addition, as another manufacturing system, for example, as shown in the same figure, each manufacturing apparatus 1c
If there is a central control device 2a that is a higher-level control means for group management, the detection unit 1 of the manufacturing device 1b detects the model name of the semi-finished product or the semi-finished product displayed on the storage case 3 of the semi-finished product.
lb detects this and transmits it to the communication control unit 12b of the manufacturing apparatus 1b.
communication control section 2 of the central control device 2a via the communication line 4.
1a, specific manufacturing processing conditions are retrieved from the correspondence table between model names and manufacturing processing conditions registered in advance in the correspondence table storage unit 14a of the central control device 2a, and this is communicated to the display device 2o. It is sent via line 4 and the manufacturing processing conditions are displayed.

この表示装置20の表示より作業者が制御装置10を介
して製造装置1bの加工条件を設定し、加工を行ってい
た。
Based on the display on the display device 20, the operator sets processing conditions for the manufacturing apparatus 1b via the control device 10 and performs processing.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

しかしながら、上述した従来の製造システムでは、特に
前者の場合は、作業者が製造加工条件を一覧表より見い
出し、設定するという方法をとっているので、人為的な
ミスによる加工条件の設定不良を起し、加工不良を起す
問題がある。また、品種切り換え時による加工条件の再
設定が多くなり、前述の問題を引起すばかりか、この設
定作業及び収納ケースを換えたり、あるいは工具を交換
したりする準備作業が増加し、装置の稼働率いち5 じるしく低下させる欠点がある。さらに、後者の上位制
御装置を使用した場合では、半製品あるいは半製品収納
ケースに特有の型式名称を表示しなければならないため
、特に半製品収納ケースが繰り返して使用される場合に
は、その都度型式名称を表示し直さなければならないと
いう欠点があった。すなわち、少量多品種生産において
は、その表示をし直す工数は無視出来なくなり、生産効
率を低下するものである。
However, in the conventional manufacturing system described above, especially in the former case, the operator finds the manufacturing processing conditions from a list and sets them, which can lead to incorrect setting of the processing conditions due to human error. However, there is a problem of machining defects. In addition, machining conditions have to be reset more often when switching types, which not only causes the problems mentioned above, but also increases preparatory work such as changing storage cases and tools, which reduces equipment operation. There are drawbacks that seriously reduce the rate. Furthermore, when the latter higher-level control device is used, it is necessary to display a unique model name on the semi-finished product or semi-finished product storage case, so especially when the semi-finished product storage case is used repeatedly, it must be displayed each time. The drawback was that the model name had to be redisplayed. That is, in low-volume, high-mix production, the number of man-hours required to redisplay the display cannot be ignored, which reduces production efficiency.

また、この対策として、例えば、同一型式名称への繰り
返し使用も可能であるが、この同一型式名称毎に仕分け
する作業や、これらを管理する工数が膨大となり、得策
でない。さらに、いずれの製造システムでも、各製造条
件を作業者が設定するため、作業者が取り扱う台数に限
度があり生産性が低下するという欠点がある。
Further, as a countermeasure against this, for example, it is possible to repeatedly use the same model name, but this is not a good idea because the work of sorting by the same model name and the number of man-hours for managing these are enormous. Furthermore, in any of the manufacturing systems, each manufacturing condition is set by the operator, so there is a limit to the number of machines that the operator can handle, which reduces productivity.

本発明の目的は、かかる欠点を解消し、設備稼働率が向
上し、生産性の高い多品種少量生産の半導体装置の製造
システムを提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a high-mix, low-volume manufacturing system for semiconductor devices that eliminates such drawbacks, improves equipment utilization rate, and has high productivity.

〔課題を解決するための手段〕[Means to solve the problem]

6 1.本発明による第1の半導体装置の製造システムは、
品種により重複しない識別表示を備えるとともに未加工
の半製品あるいは加工済みの半製品を収納する収納ケー
スと、前記半製品に所定の加工を施す製造装置と、この
製造装置に付設されるとともに前記識別表示を加工前に
検出する手段と、検出された前記識別表示を通信回線を
介して送るとともに前記製造装置に付設される第1の通
信手段と、この送られた前記識別表示を受ける第2の通
信手段をもつ中央制御装置と、前記識別表示より決定ず
ける半導体装置の型式名称があらかじめ設定された対応
表より検索するとともに前記中央制御装置に付設される
第1の検索手段と、この検索された前記半導体装置の型
式名称の情報を前記第1の通信手段で受け、この情報を
基にあらかじめ設定される個々の半導体装置の型式名称
に対応する製造条件を記憶する対応表記憶部より製造条
件をを引き出すとともに前記製造装置に付設される第2
の検索手段と、この製造条件により前記製造装置の各加
工手段に自動的に条件設定する自動条件設定手段とを有
している。
6 1. The first semiconductor device manufacturing system according to the present invention includes:
A storage case that is provided with identification marks that do not overlap depending on the product type and that stores unprocessed semi-finished products or processed semi-finished products; a manufacturing device that performs a predetermined processing on the semi-finished products; means for detecting the indication before processing; a first communication means attached to the manufacturing apparatus for transmitting the detected identification indication via a communication line; and a second communication means for receiving the transmitted identification indication. a central control unit having a communication means; a first search unit attached to the central control unit; The first communication means receives information on the model name of the semiconductor device, and based on this information, the manufacturing condition is stored in a correspondence table storage unit that stores the manufacturing condition corresponding to the model name of each semiconductor device, which is set in advance. and a second one attached to the manufacturing equipment.
and automatic condition setting means for automatically setting conditions for each processing means of the manufacturing apparatus based on the manufacturing conditions.

2.本発明における第2の半導体装置の製造システムは
、前記第1の半導体装置の製造システムにおいて、加工
済み半製品を収納する収納ケースと、未加工の半製品を
収納する収納ケースとを別に設け、これら収納ケースに
ある識別表示を検出するそれぞれの手段と、これらの識
別表示の情報を通信回線を介して送る各々独立して設け
られる第1の通信手段とを備えることを特徴としている
2. A second semiconductor device manufacturing system according to the present invention includes, in the first semiconductor device manufacturing system, separately providing a storage case for storing processed semi-finished products and a storage case for storing unprocessed semi-finished products. It is characterized by comprising respective means for detecting identification marks on these storage cases, and first communication means provided independently for transmitting information on these identification marks via communication lines.

〔実施例〕〔Example〕

次に、本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.

第1図は本発明の第1の実施例を示す半導体装置の製造
システムのブロック図である。この半導体装置の製造シ
ステムは、半導体装置の半製品に各種加工を施す複数の
製造装置と、これら各製造装置に各半製品に関する情報
を通信交換するための中央制御装置とからなっている。
FIG. 1 is a block diagram of a semiconductor device manufacturing system showing a first embodiment of the present invention. This semiconductor device manufacturing system includes a plurality of manufacturing devices that perform various processing on semiconductor device semi-finished products, and a central control device that communicates and exchanges information regarding each of the semi-finished products with each of these manufacturing devices.

すなわち、この製造システムは、同図に示すように、品
種により重複しない識別表示31が表示されるとともに
半導体装置の半製品である部品を複数個を収納する収納
ケース3と、この半製品に所定の加工を施す加工ステー
ジ16を有する製造装置1と、この半製品の加工前に識
別表示31を検出する製造装置1に付設される検出部1
1と、各製造装置よりの情報を受け、この情報に対応す
る情報を各製造装置に通信回線4を介して送る通信制御
部21を有する中央制御装置2と、検出された識別表示
31を製造装置1より中央制御装置2に通信回線4を介
して送る通信制御部12と、識別表示31より決定ずけ
る半導体装置の型式名称があらかじめ設定された各品種
の対応表を記憶する対応表記憶部23より検索する検索
制御部22と、この検索された半導体装置の型式名称を
通信制御部21により通信制御部12に送り、この送ら
れた情報を基にあらかじめ設定される個々の半導体装置
の型式名称に対応する製造条件の対照表を記憶する対応
表記憶部14より対応する製造条件を検索するとともに
製造装置1に付設される9 検索制御部13と、この製造条件により製造装置1の各
加工手段に自動的に条件設定するとともに製造装置1に
付設される自動条件設定部15とで構成されている。
That is, as shown in the figure, this manufacturing system includes a storage case 3 that displays identification marks 31 that do not overlap depending on the type of product, a storage case 3 that stores a plurality of parts that are semi-finished products of semiconductor devices, and a storage case 3 that stores a plurality of parts that are semi-finished products of semiconductor devices. A manufacturing apparatus 1 having a processing stage 16 for processing the semi-finished product, and a detection unit 1 attached to the manufacturing apparatus 1 for detecting an identification mark 31 before processing this semi-finished product.
1, a central control device 2 having a communication control section 21 that receives information from each manufacturing device and sends information corresponding to this information to each manufacturing device via a communication line 4; A communication control unit 12 that sends data from the device 1 to the central control unit 2 via the communication line 4; and a correspondence table storage unit that stores a correspondence table for each type in which the model name of the semiconductor device determined from the identification display 31 is set in advance. The search control unit 22 performs a search from 23, and the communication control unit 21 sends the model name of the searched semiconductor device to the communication control unit 12, and the model name of each semiconductor device is set in advance based on the sent information. The corresponding manufacturing condition is searched from the correspondence table storage unit 14 that stores a comparison table of manufacturing conditions corresponding to the name, and the search control unit 13 attached to the manufacturing apparatus 1 performs each process of the manufacturing apparatus 1 according to the manufacturing condition. The automatic condition setting section 15 is attached to the manufacturing apparatus 1 and is configured to automatically set conditions in the apparatus.

次に、この製造システムの動作について説明する。まず
、製品の型式名称が個々のコードで表示されたバーコー
ドあるいは記憶された磁気テープ等の識別表示31のあ
る収納ケース3が送られてくる。ここで、このバーコー
ドは収納ケースに付けず、バーコード帳票として運用す
る場合もある。
Next, the operation of this manufacturing system will be explained. First, a storage case 3 with an identification mark 31 such as a bar code or a memorized magnetic tape in which the model name of the product is displayed as an individual code is sent. Here, this barcode may not be attached to the storage case and may be used as a barcode form.

次に、この収納ケース3は製造装置1の供給部17に装
填される。次に、検出部11により識別表示31を読み
込み、この識別表示31の情報を通信制御部12により
通信回線4を介して中央制御装置2の通信制御部21に
送る。
Next, this storage case 3 is loaded into the supply section 17 of the manufacturing apparatus 1. Next, the detection unit 11 reads the identification display 31, and the communication control unit 12 sends information on the identification display 31 to the communication control unit 21 of the central control unit 2 via the communication line 4.

送られた情報を基に検索制御部22は、あらかじめ対応
表が登録されてある対応表記憶部23より情報に対応す
る製品の型式名称を引出す。ここで、この対応表記憶部
23には、前工程において、あらかじめ特定の識別表示
と特定の型式名称の関− 1 0 係を記憶されている。次に、通信制御部21により検索
された情報(型名、ROMコード、ロフトNo等)を通
信回線4を介して製造装置1の通信制御部12に送る。
Based on the sent information, the search control section 22 retrieves the model name of the product corresponding to the information from the correspondence table storage section 23 in which the correspondence table is registered in advance. Here, in this correspondence table storage section 23, a relationship between a specific identification mark and a specific model name is stored in advance in a previous process. Next, the information retrieved by the communication control unit 21 (model name, ROM code, loft number, etc.) is sent to the communication control unit 12 of the manufacturing apparatus 1 via the communication line 4.

次に、この通信制御部12に送られた情報により検索制
御部13は、対応表記憶部14より製造加工条件を引き
出す。ここで対応表記憶部14には、あらかじめ各特定
の製品型式名称に対応する各製造加工条件が記憶されて
いる。次に、この製造加工条件を自動条件設定部15に
入れ、製造装置1の各機構部に条件設定し、加工ステー
ジ16上の半製品に加工し始める。
Next, based on the information sent to the communication control section 12, the search control section 13 retrieves manufacturing processing conditions from the correspondence table storage section 14. Here, the correspondence table storage unit 14 stores in advance each manufacturing processing condition corresponding to each specific product model name. Next, these manufacturing processing conditions are entered into the automatic condition setting section 15, and conditions are set for each mechanical section of the manufacturing apparatus 1, and processing into a semi-finished product on the processing stage 16 is started.

次に、加工が完了したら、付属の検査装置く図示せず)
により加工の良否を判定し、不良数をカウントする。次
に、加工された半製品は、加工ステージ16より再び収
納ケース3に収納される。
Next, when the processing is completed, the attached inspection equipment (not shown)
The quality of machining is judged and the number of defects is counted. Next, the processed semi-finished product is stored in the storage case 3 again from the processing stage 16.

次に、通信制御部12は、作業終了報告として、例えば
、収納ケースの個々のコード、不良数、製造装置のコー
ド等を中央制御装置に送る。次に、加工された半製品が
収納された収納ケースは次工程である製造装置に送られ
、次工程の製造装置は、前述と同様に中央制御装置と情
報を交換して加工を行なう。
Next, the communication control unit 12 sends, for example, the individual code of the storage case, the number of defects, the code of the manufacturing device, etc. to the central control device as a work completion report. Next, the storage case containing the processed semi-finished product is sent to a manufacturing device for the next process, and the manufacturing device for the next process performs the process by exchanging information with the central control unit in the same manner as described above.

このような製造システムであれば、作業者が介在するこ
となく、製造ラインを稼働出来るし、半製品の品種が変
っても、対応する加工条件を即時に検索し、自動的に製
造装置に確実に条件設定出来る利点がある。
With such a manufacturing system, the production line can be operated without operator intervention, and even if the type of semi-finished product changes, the corresponding processing conditions can be immediately searched and the manufacturing equipment can be automatically and reliably installed. It has the advantage of being able to set conditions.

第2図は本発明の第2の実施例を示す半導体装置の製造
システムのブロック図である。この製造システムは、同
図に示すように、前述の第1の実施例の製造システムに
加えて、独立して通信回線4と結ぶ通信制御部12aと
、供給される収納ケース3aの識別表示31aを読み取
る検出部11aを設けたことである。そして、前述の実
施例で説明した検出部11及び通信制御部12は、加工
終了後に加工済みの半製品が収納された収納ケース3の
識別表示及びその他の情報(ロッド番号、不良数等〉を
中央制御装置2に送り、一方、追加した供給される半製
品を収納する収納ケース3aの識別表示31aを検出部
11aで読み取り、通信制御部12aで中央制御装置2
に送ることである。このことにより、前述の実施例と同
様に製造装W1aが中央制御装置2より情報をもらい、
製造装置1aの製造加工条件を設定し加工することが出
来る また、この製造システムは、加工前後で半製品の形状あ
るいは大きさが変る場合に使用する製造システムで、加
工済みの半製品を収納する収納ケース3と供給される未
加工の半製品を収納する収納ゲース3aとは異なる場合
である。このことは、加工された半製品を収納する収納
ゲース3が収納部19にあり、この収納ケース3の識別
表示31を検出部11で検出し、通信制御部12で中央
制御部2に伝達することにより、あらかじめ定めてあっ
た識別表示と特定の型式名称の対応表を更新し、対応表
記憶部23に記憶されている識別表示をこの識別表示3
1に書き換えることである。
FIG. 2 is a block diagram of a semiconductor device manufacturing system showing a second embodiment of the present invention. As shown in the figure, in addition to the manufacturing system of the first embodiment described above, this manufacturing system includes a communication control section 12a that is independently connected to the communication line 4, and an identification display 31a of the supplied storage case 3a. This is because a detecting section 11a is provided to read the information. Then, the detection unit 11 and the communication control unit 12 described in the above-mentioned embodiments detect the identification display and other information (rod number, number of defects, etc.) of the storage case 3 in which the processed semi-finished products are stored after the processing is completed. On the other hand, the detection unit 11a reads the identification display 31a of the storage case 3a that stores the additional semi-finished products to be supplied, and the communication control unit 12a reads the identification mark 31a of the storage case 3a that stores the additional semi-finished products to be supplied.
It is to send it to. As a result, the manufacturing equipment W1a receives information from the central control device 2 as in the above-mentioned embodiment, and
It is possible to set the manufacturing processing conditions of the manufacturing equipment 1a and process the product.In addition, this manufacturing system is a manufacturing system used when the shape or size of the semi-finished product changes before and after processing, and is used to store the processed semi-finished product. This is a case where the storage case 3 is different from the storage case 3a that stores the supplied unprocessed semi-finished products. This means that the storage case 3 for storing processed semi-finished products is located in the storage section 19, the identification display 31 of this storage case 3 is detected by the detection section 11, and transmitted to the central control section 2 by the communication control section 12. By doing so, the correspondence table between the identification indication and the specific model name that has been determined in advance is updated, and the identification indication stored in the correspondence table storage unit 23 is replaced with this identification indication 3.
It is to rewrite it to 1.

すなわち、この製造システムでは、ある工程に半製品を
投入するときに、一度型名と個々のコード1 3 の組合せを入力することにより、あとは自動的に製品の
型名と個々のコードの対応表を更新出来る利点がある。
In other words, in this manufacturing system, when inputting a semi-finished product into a certain process, once the combination of model name and individual code 1 3 is input, the correspondence between the product model name and each code is automatically determined. It has the advantage of being able to update the table.

例えば、製造装置に未加工の半製品を供給するときの個
々のコードと加工済みの収納側の個々のコードと異なる
場合でも、収納側の個々のコードを読み取り、中央制御
装置に通信することで個々のコードを更新出来ることで
ある。従って、次工程の製造装置がコードを読み込んで
も、既に更新されたコードで登録されているので、次工
程の加工には問題がない。
For example, even if the individual codes when supplying unprocessed semi-finished products to manufacturing equipment are different from the individual codes on the processed storage side, the individual codes on the storage side can be read and communicated to the central control unit. The ability to update individual codes. Therefore, even if the manufacturing equipment in the next process reads the code, the updated code has already been registered, so there is no problem in the next process.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は、未加工の半製品あるいは
加工済みの半製品が収納されるとともに個々の識別表示
をもつ収納ケースと、この識別表示を読み取り通信手段
で対応する製品の型式名称を得る中央制御装置と、この
中央制御装置からの情報により各製造条件を得る検索制
御部をもつとともにこの製造条件を自動的に設定する自
動条件設定部をもつ製造装置とを設けることにより、作
業者の介在による人為的なミスがなくなり、不良1 4 品の発生率の低減、収納ケースの表示に対する管理工数
の低減、製品の品種変更により加工条件の設定工数の削
減、工程間の部品の管理工数の削減及び作業者への負担
の削減等が図れることが出来るので、設備稼働率が向上
し、生産性の高い多品種少量生産の半導体装置の製造シ
ステムが得られるという効果がある。
As explained above, the present invention provides a storage case in which unprocessed semi-finished products or processed semi-finished products are stored and which has individual identification marks, and a storage case that reads the identification marks and allows the model name of the corresponding product to be read by communication means. By providing a central control unit that obtains the production conditions, and a manufacturing device that has a search control unit that obtains each manufacturing condition using information from the central control unit, and an automatic condition setting unit that automatically sets the manufacturing conditions, it is possible to Eliminates human errors caused by intervention, reduces the incidence of defective products, reduces man-hours for managing display on storage cases, reduces man-hours for setting processing conditions by changing product types, and man-hours for managing parts between processes. Since it is possible to reduce the amount of noise and reduce the burden on workers, etc., it is possible to improve the equipment utilization rate and obtain a highly productive high-mix, low-volume manufacturing system for semiconductor devices.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の第1の実施例を示す半導体装置の製造
システムのブロック図、第2図は本発明の第2の実施例
を示す半導体装置の製造システムのブロック図、第3図
は従来の半導体装置の製造システムの一例を説明するた
めの製造装置のブロック図、第4図は従来の半導体装置
の製造システムの他の例を説明するためのブロック図で
ある。 1、1a、1b、’1.c−・−製造装置、2、2 a
 −中央制御装置、3、3a、3b・・・収納ケース、
4・・・通信回線、5〜9・・・欠番・、10・・・制
御装置、11、lla、1 l b−・・検出部、12
、12a、12b、21、2 1 a−通信制御部、1
3、2 2 ・・・検索制御部、14、23・・・対応
表記憶部、15・・・自動条件設定部、16・・・加工
ステージ、17、17a、18・・・供給部、19・・
・収納部、20・・・表示装置。
FIG. 1 is a block diagram of a semiconductor device manufacturing system showing a first embodiment of the invention, FIG. 2 is a block diagram of a semiconductor device manufacturing system showing a second embodiment of the invention, and FIG. 3 is a block diagram of a semiconductor device manufacturing system showing a second embodiment of the invention. FIG. 4 is a block diagram of a manufacturing apparatus for explaining an example of a conventional semiconductor device manufacturing system. FIG. 4 is a block diagram for explaining another example of the conventional semiconductor device manufacturing system. 1, 1a, 1b, '1. c--Manufacturing equipment, 2, 2 a
- central control unit, 3, 3a, 3b...storage case;
4... Communication line, 5-9... Missing number, 10... Control device, 11, lla, 1 l b-... Detection unit, 12
, 12a, 12b, 21, 2 1 a-communication control unit, 1
3, 2 2... Search control unit, 14, 23... Correspondence table storage unit, 15... Automatic condition setting unit, 16... Processing stage, 17, 17a, 18... Supply unit, 19・・・
- Storage section, 20...display device.

Claims (1)

【特許請求の範囲】 1、品種により重複しない識別表示を備えるとともに未
加工の半製品あるいは加工済みの半製品を収納する収納
ケースと、前記半製品に所定の加工を施す製造装置と、
この製造装置に付設されるとともに前記識別表示を加工
前に検出する手段と、検出された前記識別表示を通信回
線を介して送るとともに前記製造装置に付設される第1
の通信手段と、この送られた前記識別表示を受ける第2
の通信手段をもつ中央制御装置と、前記識別表示より決
定ずける半導体装置の型式名称があらかじめ設定された
対応表より検索するとともに前記中央制御装置に付設さ
れる第1の検索手段と、この検索された前記半導体装置
の型式名称の情報を前記第1の通信手段で受け、この情
報を基にあらかじめ設定される個々の半導体装置の型式
名称に対応する製造条件を記憶する対応表記憶部より製
造条件をを引き出すとともに前記製造装置に付設される
第2の検索手段と、この製造条件により前記製造装置の
各加工手段に自動的に条件設定する自動条件設定手段と
を有することを特徴とする半導体装置の製造システム。 2、加工済み半製品を収納する収納ケースと、未加工の
半製品を収納する収納ケースとを別に設け、これら収納
ケースにある識別表示を検出するそれぞれの手段と、こ
れらの識別表示の情報を通信回線を介して送る各々独立
して設けられる第1の通信手段とを備えることを特徴と
する請求項1記載の半導体装置の製造システム。
[Scope of Claims] 1. A storage case that is provided with identification marks that do not overlap depending on the product type and that stores unprocessed semi-finished products or processed semi-finished products, and a manufacturing device that performs predetermined processing on the semi-finished products;
means attached to the manufacturing apparatus and detecting the identification mark before processing; and a first means attached to the manufacturing apparatus and transmitting the detected identification mark via a communication line.
and a second communication means for receiving the sent identification indication.
a central control unit having a communication means; a first search unit attached to the central control unit that searches for the model name of the semiconductor device determined from the identification display from a preset correspondence table; and a first search unit attached to the central control unit; The first communication means receives information on the model name of the semiconductor device that has been updated, and manufactures the semiconductor device from a correspondence table storage unit that stores manufacturing conditions corresponding to the model name of each semiconductor device, which is set in advance based on this information. A semiconductor characterized in that it has a second search means attached to the manufacturing apparatus for extracting conditions, and an automatic condition setting means for automatically setting conditions for each processing means of the manufacturing apparatus based on the manufacturing conditions. Equipment manufacturing system. 2. A storage case for storing processed semi-finished products and a storage case for storing unprocessed semi-finished products are provided separately, and respective means for detecting identification markings on these storage cases and information on these identification markings are provided. 2. The semiconductor device manufacturing system according to claim 1, further comprising independently provided first communication means for transmitting data via a communication line.
JP970890A 1990-01-19 1990-01-19 Manufacturing system of semiconductor device Pending JPH03214743A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP970890A JPH03214743A (en) 1990-01-19 1990-01-19 Manufacturing system of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP970890A JPH03214743A (en) 1990-01-19 1990-01-19 Manufacturing system of semiconductor device

Publications (1)

Publication Number Publication Date
JPH03214743A true JPH03214743A (en) 1991-09-19

Family

ID=11727748

Family Applications (1)

Application Number Title Priority Date Filing Date
JP970890A Pending JPH03214743A (en) 1990-01-19 1990-01-19 Manufacturing system of semiconductor device

Country Status (1)

Country Link
JP (1) JPH03214743A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05257944A (en) * 1992-03-11 1993-10-08 Nec Corp Method for determining manufacturing condition by product name
JP2004234237A (en) * 2003-01-29 2004-08-19 Sumitomo Metal Mining Co Ltd Working system

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56100454A (en) * 1980-01-11 1981-08-12 Mitsubishi Electric Corp Manufacture of semiconductor device
JPS5943524A (en) * 1982-09-06 1984-03-10 Hitachi Ltd Method and device for manufacture of semiconductor device
JPS5967638A (en) * 1982-10-09 1984-04-17 Toshiba Corp Manufacturing system of semiconductor device
JPS6249234B2 (en) * 1983-11-04 1987-10-19 Hitachi Construction Machinery
JPS63232921A (en) * 1987-03-19 1988-09-28 Toshiba Corp Manufacturing method and device

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56100454A (en) * 1980-01-11 1981-08-12 Mitsubishi Electric Corp Manufacture of semiconductor device
JPS5943524A (en) * 1982-09-06 1984-03-10 Hitachi Ltd Method and device for manufacture of semiconductor device
JPS5967638A (en) * 1982-10-09 1984-04-17 Toshiba Corp Manufacturing system of semiconductor device
JPS6249234B2 (en) * 1983-11-04 1987-10-19 Hitachi Construction Machinery
JPS63232921A (en) * 1987-03-19 1988-09-28 Toshiba Corp Manufacturing method and device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05257944A (en) * 1992-03-11 1993-10-08 Nec Corp Method for determining manufacturing condition by product name
JP2004234237A (en) * 2003-01-29 2004-08-19 Sumitomo Metal Mining Co Ltd Working system

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